Pub Date : 2017-01-01DOI: 10.1016/BS.AIEP.2017.05.001
G. Dupouy
{"title":"Electron Microscopy at Very High Voltages","authors":"G. Dupouy","doi":"10.1016/BS.AIEP.2017.05.001","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2017.05.001","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":"201 1","pages":"261-340"},"PeriodicalIF":0.0,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.05.001","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54028299","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2017-01-01DOI: 10.1016/BS.AIEP.2017.06.001
A. Septier
{"title":"Chapter Three - The Struggle to Overcome Spherical Aberration in Electron Optics","authors":"A. Septier","doi":"10.1016/BS.AIEP.2017.06.001","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2017.06.001","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":"202 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.06.001","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54028434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2017-01-01DOI: 10.1016/BS.AIEP.2017.01.002
L. Tizei, M. Kociak
{"title":"Chapter Four - Quantum Nanooptics in the Electron Microscope","authors":"L. Tizei, M. Kociak","doi":"10.1016/BS.AIEP.2017.01.002","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2017.01.002","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":"199 1","pages":"185-235"},"PeriodicalIF":0.0,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.01.002","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54027463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2017-01-01DOI: 10.1016/BS.AIEP.2017.02.001
I. J. Taneja
{"title":"Information Measures, Mean Differences, and Inequalities","authors":"I. J. Taneja","doi":"10.1016/BS.AIEP.2017.02.001","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2017.02.001","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":"201 1","pages":"137-260"},"PeriodicalIF":0.0,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.02.001","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54027530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2017-01-01DOI: 10.1016/BS.AIEP.2017.01.001
M. Haschke, S. Boehm
{"title":"Chapter One - Micro-XRF in Scanning Electron Microscopes","authors":"M. Haschke, S. Boehm","doi":"10.1016/BS.AIEP.2017.01.001","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2017.01.001","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":"43 1","pages":"1-60"},"PeriodicalIF":0.0,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.01.001","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54027927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2017-01-01DOI: 10.1016/BS.AIEP.2017.09.004
J. V. D. Gronde, J. Roerdink
{"title":"Nonscalar Mathematical Morphology","authors":"J. V. D. Gronde, J. Roerdink","doi":"10.1016/BS.AIEP.2017.09.004","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2017.09.004","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":"204 1","pages":"111-145"},"PeriodicalIF":0.0,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.09.004","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54028184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2017-01-01DOI: 10.1016/BS.AIEP.2017.01.004
I. Kopaev, D. Grinfeld, M. Monastyrskiy, R. S. Ablizen, S. S. Alimpiev, A. A. Trubitsyn
{"title":"Chapter Two - A Variational Approach for Simulation of Equilibrium Ion Distributions in Ion Traps With Regard to Coulomb Interaction","authors":"I. Kopaev, D. Grinfeld, M. Monastyrskiy, R. S. Ablizen, S. S. Alimpiev, A. A. Trubitsyn","doi":"10.1016/BS.AIEP.2017.01.004","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2017.01.004","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":"199 1","pages":"61-73"},"PeriodicalIF":0.0,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.01.004","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54027494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2017-01-01DOI: 10.1016/BS.AIEP.2017.03.001
E. Ruska
{"title":"Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope","authors":"E. Ruska","doi":"10.1016/BS.AIEP.2017.03.001","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2017.03.001","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":"200 1","pages":"1-59"},"PeriodicalIF":0.0,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.03.001","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54028208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2017-01-01DOI: 10.1016/BS.AIEP.2017.05.002
A. Ashrafi
{"title":"Walsh–Hadamard Transforms: A Review","authors":"A. Ashrafi","doi":"10.1016/BS.AIEP.2017.05.002","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2017.05.002","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":"201 1","pages":"1-55"},"PeriodicalIF":0.0,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.05.002","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54028363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2017-01-01DOI: 10.1016/BS.AIEP.2017.01.006
I. Lazić, E. Bosch
{"title":"Chapter Three – Analytical Review of Direct Stem Imaging Techniques for Thin Samples","authors":"I. Lazić, E. Bosch","doi":"10.1016/BS.AIEP.2017.01.006","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2017.01.006","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":"199 1","pages":"75-184"},"PeriodicalIF":0.0,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2017.01.006","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54027511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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