Pub Date : 2024-03-01DOI: 10.1109/mrl.2024.3353701
Jason Rupe, Chris Laplante
A new repository for failure events, called FailureDB.IO (Failure Database), is a website built for you to enter failure events from your own experience or research, browse documented failures, and find inspiration for your reliability-centered research. Send your browser to FailureDB.IO and find out more.
{"title":"Introducing the Reliability Society Failure Database","authors":"Jason Rupe, Chris Laplante","doi":"10.1109/mrl.2024.3353701","DOIUrl":"https://doi.org/10.1109/mrl.2024.3353701","url":null,"abstract":"A new repository for failure events, called FailureDB.IO (Failure Database), is a website built for you to enter failure events from your own experience or research, browse documented failures, and find inspiration for your reliability-centered research. Send your browser to FailureDB.IO and find out more.","PeriodicalId":517825,"journal":{"name":"IEEE Reliability Magazine","volume":"103 7","pages":"5-9"},"PeriodicalIF":0.0,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140405517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-03-01DOI: 10.1109/MRL.2024.3356457
Jon M. Quigley
Five approaches to product testing: How we test, ideally, will inform us about the product. That is the point of testing the product: to learn as much as possible before it makes it to the customer. An overreliance on a single approach will limit that learning. This article provides an overview of five approaches.
{"title":"Five Approaches to Product Testing","authors":"Jon M. Quigley","doi":"10.1109/MRL.2024.3356457","DOIUrl":"https://doi.org/10.1109/MRL.2024.3356457","url":null,"abstract":"Five approaches to product testing: How we test, ideally, will inform us about the product. That is the point of testing the product: to learn as much as possible before it makes it to the customer. An overreliance on a single approach will limit that learning. This article provides an overview of five approaches.","PeriodicalId":517825,"journal":{"name":"IEEE Reliability Magazine","volume":"21 21","pages":"30-36"},"PeriodicalIF":0.0,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140286512","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-03-01DOI: 10.1109/MRL.2024.3354900
Robert V. Binder
To Measure Software dependability and its components—reliability, availability, supportability, and recoverability—certain basic operational questions must be answered.
{"title":"Introducing the In-Service Reference Model","authors":"Robert V. Binder","doi":"10.1109/MRL.2024.3354900","DOIUrl":"https://doi.org/10.1109/MRL.2024.3354900","url":null,"abstract":"To Measure Software dependability and its components—reliability, availability, supportability, and recoverability—certain basic operational questions must be answered.","PeriodicalId":517825,"journal":{"name":"IEEE Reliability Magazine","volume":"6 4","pages":"47-50"},"PeriodicalIF":0.0,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140398984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：