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Light-Emitting Devices, Materials, and Applications XXVIII最新文献

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Novel photonics dielectric substrate process integration development cycle time reduction by Inline Xe Plasma FIB 通过内联氙等离子体 FIB 缩短新型光电介质基板工艺集成开发周期
Pub Date : 2024-03-13 DOI: 10.1117/12.3001337
Mona Susanne Feige, Daniel Schmitt, Ute Vogler, Haim Pearl, Allen Lee, Thomas Schubert
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引用次数: 0
CMOS compatible microLED epitaxy for display applications 用于显示应用的 CMOS 兼容型 microLED 外延技术
Pub Date : 2024-03-13 DOI: 10.1117/12.3013978
Lewis Kastein, Hugues Marchand, Mark Furlong, Rodney Pelzel
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引用次数: 0
Advancing brightness in colloidal quantum dot-based light-emitting diodes beyond boundaries of displays 提升基于胶体量子点的发光二极管的亮度,超越显示器的界限
Pub Date : 2024-03-13 DOI: 10.1117/12.3000673
Taesoo Lee, Byongyeon Kim, Hyunkoo Lee, Donghyo Hahm, W. Bae, Jaehoon Lim, Jeonghun Kwak
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引用次数: 0
Cutting-edge single wafer MOCVD technology enabling advanced nitride applications with high performance 尖端的单晶片 MOCVD 技术可实现高性能的先进氮化物应用
Pub Date : 2024-03-13 DOI: 10.1117/12.3003504
Soo Min Lee, Bumjoon Kim, R. Bubber, Ming Pan, Michael Coco, Rudy Parekh, Drew Hanser
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引用次数: 0
B containing quantum wells for ultraviolet light emitting devices 用于紫外线发光器件的含 B 量子阱
Pub Date : 2024-03-13 DOI: 10.1117/12.3002651
Peter Parbrook, Peter Milner, V. Zubialevich, Thomas O'Connor, Sandeep M. Singh, Brian Corbett
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引用次数: 0
Fabrication and characterizations of GaN-based nanowire/multi-quantum shell (MQS) LEDs 基于氮化镓的纳米线/多量子壳 (MQS) LED 的制造和特性分析
Pub Date : 2024-03-13 DOI: 10.1117/12.3001286
S. Kamiyama, T. Takeuchi, M. Iwaya
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引用次数: 0
Recent advances in micron scale III-nitrides based RGB MicroLEDs 基于微米级 III-氮化物的 RGB MicroLED 最新进展
Pub Date : 2024-03-13 DOI: 10.1117/12.3004035
S. Denbaars, S. Nakamura, M. Wong, Jordan M. Smith, Panpan Li, Jake Ewing
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引用次数: 0
quantum dot based III-N LED on 200mm Si(100) for display applications 基于量子点的 III-N LED,采用 200mm Si(100) 硅材料,适用于显示应用
Pub Date : 2024-03-13 DOI: 10.1117/12.3012678
Andrew Clark, R. Dargis, Mark Furlong, Rodney Pelzel
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引用次数: 0
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress 高温、大电流应力下大功率白光 LED 的稳健性和可靠性
Pub Date : 2024-03-13 DOI: 10.1117/12.3005352
A. Caria, R. Fraccaroli, G. Pierobon, T. Castellaro, Giovanna Mura, P. C. Ricci, C. de Santi, M. Buffolo, N. Trivellin, E. Zanoni, G. Meneghesso, M. Meneghini
{"title":"Robustness and reliability of high-power white LEDs under high-temperature, high-current stress","authors":"A. Caria, R. Fraccaroli, G. Pierobon, T. Castellaro, Giovanna Mura, P. C. Ricci, C. de Santi, M. Buffolo, N. Trivellin, E. Zanoni, G. Meneghesso, M. Meneghini","doi":"10.1117/12.3005352","DOIUrl":"https://doi.org/10.1117/12.3005352","url":null,"abstract":"","PeriodicalId":517866,"journal":{"name":"Light-Emitting Devices, Materials, and Applications XXVIII","volume":"86 S369","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140394372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Surface profile inspection system using image sensor and two laser devices 使用图像传感器和两个激光装置的表面轮廓检测系统
Pub Date : 2024-03-13 DOI: 10.1117/12.3002014
T. Nishino, Yuji Inoue, Hiroshi Kuriyama, Yoshihiro Nagamine, Hiroshi Tanigawa
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引用次数: 0
期刊
Light-Emitting Devices, Materials, and Applications XXVIII
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