Pub Date : 2023-01-01DOI: 10.12677/jisp.2023.121002
思鲁 刘
{"title":"Color Characteristics Analysis and Restoration for Chinese Painting and Calligraphy","authors":"思鲁 刘","doi":"10.12677/jisp.2023.121002","DOIUrl":"https://doi.org/10.12677/jisp.2023.121002","url":null,"abstract":"","PeriodicalId":69487,"journal":{"name":"图像与信号处理","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66119686","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.12677/jisp.2023.122017
佳宸 邹
Obtaining the temperature distribution of porcelain insulator steel cap is a key link in the patrol inspection of zero-value defects of transmission and distribution line insulators. It is difficult to obtain the temperature of insulator steel cap automatically in infrared image under complex background. Combining the respective advantages of visible and infrared images, insulator strings in visible light images are detected based on Faster-RCNN deep learning network algorithm, with a detection rate of 98.3%. The improved Sobel operator is used to detect the insulator edge based on the insulator strength edge feature. The rectangular shape feature and gradual spacing feature of insulator steel caps are used to extract and correct all steel caps. The coordinate conversion relationship between visible light and infrared image of insulator in the same scene is studied, and the steel cap extraction in infrared image is realized. When detecting zero-value defects of 110 kV and 220 kV insulators, this method can accurately extract the temperature of insulator steel cap and find zero-value insulators, which has good effectiveness and practicability.
{"title":"Research on Temperature Extraction of Porcelain Insulator Steel Cap and Zero Insulator Detection Based on Visible Light Image and Infrared Image","authors":"佳宸 邹","doi":"10.12677/jisp.2023.122017","DOIUrl":"https://doi.org/10.12677/jisp.2023.122017","url":null,"abstract":"Obtaining the temperature distribution of porcelain insulator steel cap is a key link in the patrol inspection of zero-value defects of transmission and distribution line insulators. It is difficult to obtain the temperature of insulator steel cap automatically in infrared image under complex background. Combining the respective advantages of visible and infrared images, insulator strings in visible light images are detected based on Faster-RCNN deep learning network algorithm, with a detection rate of 98.3%. The improved Sobel operator is used to detect the insulator edge based on the insulator strength edge feature. The rectangular shape feature and gradual spacing feature of insulator steel caps are used to extract and correct all steel caps. The coordinate conversion relationship between visible light and infrared image of insulator in the same scene is studied, and the steel cap extraction in infrared image is realized. When detecting zero-value defects of 110 kV and 220 kV insulators, this method can accurately extract the temperature of insulator steel cap and find zero-value insulators, which has good effectiveness and practicability.","PeriodicalId":69487,"journal":{"name":"图像与信号处理","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66119958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.12677/jisp.2023.123023
兴 魏
In order to improve the efficiency of mountain city surveying, the accuracy analysis of mountain cities based on oblique photogrammetry by UAV is studied, the two basic methods of oblique photogrammetry and RTK measurement are summarized, the corresponding formula analysis of the data adjustment principle is carried out, and the equipment required for the project is relevant
{"title":"Brief Analysis of UAV Based on Oblique Photogrammetry to Carry Out Accurate Analysis of Mountain Cities","authors":"兴 魏","doi":"10.12677/jisp.2023.123023","DOIUrl":"https://doi.org/10.12677/jisp.2023.123023","url":null,"abstract":"In order to improve the efficiency of mountain city surveying, the accuracy analysis of mountain cities based on oblique photogrammetry by UAV is studied, the two basic methods of oblique photogrammetry and RTK measurement are summarized, the corresponding formula analysis of the data adjustment principle is carried out, and the equipment required for the project is relevant","PeriodicalId":69487,"journal":{"name":"图像与信号处理","volume":"139 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66120576","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.12677/jisp.2023.121003
皓辰 王
{"title":"Research on Point Cloud Upsampling Algorithms Based on Deep Learning","authors":"皓辰 王","doi":"10.12677/jisp.2023.121003","DOIUrl":"https://doi.org/10.12677/jisp.2023.121003","url":null,"abstract":"","PeriodicalId":69487,"journal":{"name":"图像与信号处理","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66119406","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.12677/jisp.2023.122013
彦鹏 刘
{"title":"Research on Classification and Recognition of Container Logo Image of China-Europe Train Based on ViT","authors":"彦鹏 刘","doi":"10.12677/jisp.2023.122013","DOIUrl":"https://doi.org/10.12677/jisp.2023.122013","url":null,"abstract":"","PeriodicalId":69487,"journal":{"name":"图像与信号处理","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66119898","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.12677/jisp.2023.123021
原嫄 田
The parametric active contour model (Snake) has a wide range of applications in the field of computer vision and image processing. The traditional Snake model has many shortcomings, including high computational effort and failure to converge to the specific target when multiple targets exist. Although the boundary vector field (BVF) Snake reduces the computational intensity, it still fails to converge to the specific target when there are multiple targets. In this paper, the force field is in-spected to determine the reasons why the BVF Snake is not applicable to the segmentation of an image with multiple targets, and improvements are made to propose an improved directional BVF (DBVF) Snake model. In this model, a directional vector field is obtained by adding one point inside a specific target to determine the convergence direction of the Snake, so that it can converge to a specific target in the presence of multiple targets. In the paper, the DBVF Snake model is compared with the common Snake models in two aspects of increasing the capture range and adding different noises, and the sonar images are segmented and segmented results show that the DBVF Snake model is valid for the segmentation of an image with multiple targets.
{"title":"Improved BVF Snake Model for the Segmentation of an Image with Multiple Targets","authors":"原嫄 田","doi":"10.12677/jisp.2023.123021","DOIUrl":"https://doi.org/10.12677/jisp.2023.123021","url":null,"abstract":"The parametric active contour model (Snake) has a wide range of applications in the field of computer vision and image processing. The traditional Snake model has many shortcomings, including high computational effort and failure to converge to the specific target when multiple targets exist. Although the boundary vector field (BVF) Snake reduces the computational intensity, it still fails to converge to the specific target when there are multiple targets. In this paper, the force field is in-spected to determine the reasons why the BVF Snake is not applicable to the segmentation of an image with multiple targets, and improvements are made to propose an improved directional BVF (DBVF) Snake model. In this model, a directional vector field is obtained by adding one point inside a specific target to determine the convergence direction of the Snake, so that it can converge to a specific target in the presence of multiple targets. In the paper, the DBVF Snake model is compared with the common Snake models in two aspects of increasing the capture range and adding different noises, and the sonar images are segmented and segmented results show that the DBVF Snake model is valid for the segmentation of an image with multiple targets.","PeriodicalId":69487,"journal":{"name":"图像与信号处理","volume":"23 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66120402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.12677/jisp.2023.124033
雅雅 徐
{"title":"Active Contour Model Based on MAP Combining Local and Global Statistical Regularization","authors":"雅雅 徐","doi":"10.12677/jisp.2023.124033","DOIUrl":"https://doi.org/10.12677/jisp.2023.124033","url":null,"abstract":"","PeriodicalId":69487,"journal":{"name":"图像与信号处理","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135799546","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.12677/jisp.2023.123025
博闻 许
In the lithography process, the stability of lithography conditions plays a crucial role in stabilizing the image quality on the wafer. The current approach for monitoring the stability of lithography conditions is to use a scatterometer and specially designed grating patterns to infer the actual lithography process conditions from the scattering profile curve. This method requires special scat-terometer tools and is sensitive to changes in the film stacking layer under the photoresist. To address the aforementioned challenges, this article proposes an image-based offline lithography process stability monitoring method. We propose the use of neural networks to extract feature information from CDSEM images under different lithography processes firstly. And match the
{"title":"Offline Lithography Process Stability Control Method Based on Image","authors":"博闻 许","doi":"10.12677/jisp.2023.123025","DOIUrl":"https://doi.org/10.12677/jisp.2023.123025","url":null,"abstract":"In the lithography process, the stability of lithography conditions plays a crucial role in stabilizing the image quality on the wafer. The current approach for monitoring the stability of lithography conditions is to use a scatterometer and specially designed grating patterns to infer the actual lithography process conditions from the scattering profile curve. This method requires special scat-terometer tools and is sensitive to changes in the film stacking layer under the photoresist. To address the aforementioned challenges, this article proposes an image-based offline lithography process stability monitoring method. We propose the use of neural networks to extract feature information from CDSEM images under different lithography processes firstly. And match the","PeriodicalId":69487,"journal":{"name":"图像与信号处理","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66120289","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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