Pub Date : 2023-02-02DOI: 10.1109/LEMCPA.2023.3240621
Jaber Al Rashid;Mohsen Koohestani;Richard Perdriau;Laurent Saintis;Mihaela Barreau
This letter compares the electromagnetic compatibility (EMC) performance of three different voltage regulator integrated circuits (ICs) (i.e., UA78L05, L78L05, and MC78L05) developed by three different manufacturers, with similar functionality and pin compatibility, under the influence of low and high temperature stress conditions (i.e., −30 °C and +100 °C). Direct power injection (DPI) was performed on these ICs to analyze the impact of applying thermal stress on the conducted immunity to the injection of a single-tone RF disturbance signal. The DPI immunity parameters were measured and recorded in real time for an incident amplified power, while the ICs were exposed to low and high thermal stress conditions. It was demonstrated that the minimum injected power required to reach the defined failure threshold voltage criterion $(pm 4$ %) varied over frequency depending on the ICs. Moreover, these functionally identical ICs showed significant evolution of their conducted immunity in all the considered temperatures, depending on their manufacturer. Input impedance curves were monitored at low, high, and nominal temperatures, showing a noticeable decline of impedance at high frequencies. Moreover, the equivalent $RLC$ values of the lumped elements (i.e., resistor, inductor, and capacitor) were extracted and compared at these aforementioned temperature conditions to model the power supply network impedance for the selected ICs. The immunity behavior of these ICs was further investigated by generating lookup table data from the DPI measurements.
{"title":"Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems","authors":"Jaber Al Rashid;Mohsen Koohestani;Richard Perdriau;Laurent Saintis;Mihaela Barreau","doi":"10.1109/LEMCPA.2023.3240621","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3240621","url":null,"abstract":"This letter compares the electromagnetic compatibility (EMC) performance of three different voltage regulator integrated circuits (ICs) (i.e., UA78L05, L78L05, and MC78L05) developed by three different manufacturers, with similar functionality and pin compatibility, under the influence of low and high temperature stress conditions (i.e., −30 °C and +100 °C). Direct power injection (DPI) was performed on these ICs to analyze the impact of applying thermal stress on the conducted immunity to the injection of a single-tone RF disturbance signal. The DPI immunity parameters were measured and recorded in real time for an incident amplified power, while the ICs were exposed to low and high thermal stress conditions. It was demonstrated that the minimum injected power required to reach the defined failure threshold voltage criterion \u0000<inline-formula> <tex-math>$(pm 4$ </tex-math></inline-formula>\u0000%) varied over frequency depending on the ICs. Moreover, these functionally identical ICs showed significant evolution of their conducted immunity in all the considered temperatures, depending on their manufacturer. Input impedance curves were monitored at low, high, and nominal temperatures, showing a noticeable decline of impedance at high frequencies. Moreover, the equivalent \u0000<inline-formula> <tex-math>$RLC$ </tex-math></inline-formula>\u0000 values of the lumped elements (i.e., resistor, inductor, and capacitor) were extracted and compared at these aforementioned temperature conditions to model the power supply network impedance for the selected ICs. The immunity behavior of these ICs was further investigated by generating lookup table data from the DPI measurements.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 1","pages":"27-32"},"PeriodicalIF":0.0,"publicationDate":"2023-02-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67856109","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-16DOI: 10.1109/LEMCPA.2022.3229251
Presents the 2022 author/subject index for this issue of the publication.
为本期出版物提供2022年作者/主题索引。
{"title":"2022 Index IEEE Letters on Electromagnetic Compatibility Practice and Applications Vol. 4","authors":"","doi":"10.1109/LEMCPA.2022.3229251","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3229251","url":null,"abstract":"Presents the 2022 author/subject index for this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 4","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2022-12-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/9980833/09989517.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67853818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-12DOI: 10.1109/LEMCPA.2022.3221229
Summary form only: Abstracts of articles presented in this issue of the publication.
仅限摘要形式：本期出版物中的文章摘要。
{"title":"Synopsis of the December 2022 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2022.3221229","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3221229","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 4","pages":"89-91"},"PeriodicalIF":0.0,"publicationDate":"2022-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/9980833/09980835.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67853854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-09DOI: 10.1109/LEMCPA.2022.3228199
Shuqi Zhang;Kengo Iokibe;Yoshitaka Toyota
The black-box equivalent-circuit model is generally used to predict electromagnetic interference (EMI) from dc–dc converters for assisting with filter design. We previously proposed a Norton-based two-port equivalent-circuit model excluding load to investigate the load effect on EMI. The EMI prediction presupposes constant internal impedances independent of the load change with only the noise current source change dependent on the load change. Under these conditions, the noise current source at any load can be calculated by using the numerical interpolation method. In this work, we used a dc–dc buck converter with a switching frequency of 200 kHz and identified the model parameters precisely by applying the waveform decomposition method. The internal admittances were found to be almost constant with respect to load change and only the input-port current source decreased with load. We then applied the cubic spline interpolation method to fit the input-port current source and calculate it at any load. This approach was verified by predicting the input-port noise voltage for loads between 3.3 and $15.6~Omega $ . Below 80 MHz, where the input-port current source decreased with load, the input-port voltage predicted using the input-port current source fitted by interpolation was in good agreement with the measured one.
{"title":"An Approach to Identify Noise-Source Parameters of DC–DC Converter and Predict Conducted Emissions With Different Loads","authors":"Shuqi Zhang;Kengo Iokibe;Yoshitaka Toyota","doi":"10.1109/LEMCPA.2022.3228199","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3228199","url":null,"abstract":"The black-box equivalent-circuit model is generally used to predict electromagnetic interference (EMI) from dc–dc converters for assisting with filter design. We previously proposed a Norton-based two-port equivalent-circuit model excluding load to investigate the load effect on EMI. The EMI prediction presupposes constant internal impedances independent of the load change with only the noise current source change dependent on the load change. Under these conditions, the noise current source at any load can be calculated by using the numerical interpolation method. In this work, we used a dc–dc buck converter with a switching frequency of 200 kHz and identified the model parameters precisely by applying the waveform decomposition method. The internal admittances were found to be almost constant with respect to load change and only the input-port current source decreased with load. We then applied the cubic spline interpolation method to fit the input-port current source and calculate it at any load. This approach was verified by predicting the input-port noise voltage for loads between 3.3 and \u0000<inline-formula> <tex-math>$15.6~Omega $ </tex-math></inline-formula>\u0000. Below 80 MHz, where the input-port current source decreased with load, the input-port voltage predicted using the input-port current source fitted by interpolation was in good agreement with the measured one.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 1","pages":"5-9"},"PeriodicalIF":0.0,"publicationDate":"2022-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10079119/09978542.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67856111","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-07DOI: 10.1109/LEMCPA.2022.3227409
C. Spindelberger;H. Arthaber
In this letter, a highly linear front end to improve the performance of software-defined radio (SDRs) for radiated precompliance measurements is presented. In CISPR band C/D, the test receiver needs to fulfill stringent requirements for using the quasi-peak detector. Usually, an expensive preselection filter bank is necessary to make fully compliant measurements of broadband transients. Direct-conversion-based SDRs show a limited out-of-the-box performance for precompliance measurements caused by, e.g., harmonic mixing and saturation effects. With the use of a triple-balanced mixer, a highly linear upconversion stage is built, eliminating the need for a filter bank. The dynamic range (DR) requirements for the SDR are strongly reduced by a narrowband intermediate frequency filter, making CISPR 16-1-1 compliant measurements possible. The sensitivity of the front end is comparable to professional receivers on the market, although no low-noise amplifier is implemented. The performance is verified by continuous wave (CW) and transient signals according to CISPR norms. The broadband measurement results are compared with traditional characterizations of the DR using the compression level and the noise figure. It shows that assumptions on the RF-link budget for a compliant design can be made with CW measurements. Based on our results, the requirements for the SDR front end are derived.
{"title":"Improving the Performance of Direct-Conversion SDRs for Radiated Precompliance Measurements","authors":"C. Spindelberger;H. Arthaber","doi":"10.1109/LEMCPA.2022.3227409","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3227409","url":null,"abstract":"In this letter, a highly linear front end to improve the performance of software-defined radio (SDRs) for radiated precompliance measurements is presented. In CISPR band C/D, the test receiver needs to fulfill stringent requirements for using the quasi-peak detector. Usually, an expensive preselection filter bank is necessary to make fully compliant measurements of broadband transients. Direct-conversion-based SDRs show a limited out-of-the-box performance for precompliance measurements caused by, e.g., harmonic mixing and saturation effects. With the use of a triple-balanced mixer, a highly linear upconversion stage is built, eliminating the need for a filter bank. The dynamic range (DR) requirements for the SDR are strongly reduced by a narrowband intermediate frequency filter, making CISPR 16-1-1 compliant measurements possible. The sensitivity of the front end is comparable to professional receivers on the market, although no low-noise amplifier is implemented. The performance is verified by continuous wave (CW) and transient signals according to CISPR norms. The broadband measurement results are compared with traditional characterizations of the DR using the compression level and the noise figure. It shows that assumptions on the RF-link budget for a compliant design can be made with CW measurements. Based on our results, the requirements for the SDR front end are derived.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 1","pages":"22-26"},"PeriodicalIF":0.0,"publicationDate":"2022-12-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10079119/09973334.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67856110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-01DOI: 10.1109/LEMCPA.2022.3226151
Jinjun Bai;Yulei Liu;Dewu Kong;Kaibin Guo
The core idea of the credibility evaluation method of electromagnetic simulation results is to replace the experts with an electromagnetic computing professional background to evaluate the credibility of simulation results. The representative algorithm is the feature selective validation (FSV) method proposed by the IEEE Standards Association. However, the existing credibility assessment methods all use statistical indicators or signal processing methods to simulate the real thoughts of experts and have not achieved true artificial intelligence. In this letter, a credibility evaluation method of simulation results based on a convolutional neural network is proposed, which aims to integrate the real ideas of experts (background knowledge of electromagnetic calculation) into the evaluation, instead of just mechanical numerical calculation, and to avoid evaluation errors caused by nonprofessional.
{"title":"Credibility Evaluation of Electromagnetic Simulation Results Based on Convolutional Neural Network","authors":"Jinjun Bai;Yulei Liu;Dewu Kong;Kaibin Guo","doi":"10.1109/LEMCPA.2022.3226151","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3226151","url":null,"abstract":"The core idea of the credibility evaluation method of electromagnetic simulation results is to replace the experts with an electromagnetic computing professional background to evaluate the credibility of simulation results. The representative algorithm is the feature selective validation (FSV) method proposed by the IEEE Standards Association. However, the existing credibility assessment methods all use statistical indicators or signal processing methods to simulate the real thoughts of experts and have not achieved true artificial intelligence. In this letter, a credibility evaluation method of simulation results based on a convolutional neural network is proposed, which aims to integrate the real ideas of experts (background knowledge of electromagnetic calculation) into the evaluation, instead of just mechanical numerical calculation, and to avoid evaluation errors caused by nonprofessional.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 1","pages":"16-21"},"PeriodicalIF":0.0,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67856114","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The method of electrostatic discharge (ESD) damage test for common-mode chokes has been standardized in IEC 62228–5 Annex E. However, there is a concern about the reproducibility of the ESD damage test using the ESD gun described therein. Against this background, the possibility of replacing the ESD gun with a transmission line pulse–human metal model (TLP-HMM) was investigated. The results of the ESD damage test using the ESD gun and TLP-HMM are found to be similar but not exactly the same, especially at low frequencies. Moreover, due to the different waveform generation principles and circuit configurations of the ESD gun and TLP-HMM, even if a load of the same structure is used to calibrate the ESD gun and TLP-HMM, when they are applied to other loads, it is still difficult to guarantee that the discharge currents are the same. The findings raise an issue on how to define a standard TLP-HMM so that it could provide the worst test result compared to the ESD gun.
{"title":"Comparison of ESD Damage Test for Common-Mode Chokes With ESD Gun and TLP-HMM","authors":"Hironori Ito;Masahiro Yoshida;Yusuke Yano;Jianqing Wang;Takeshi Ishida;Masanori Sawada","doi":"10.1109/LEMCPA.2022.3222019","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3222019","url":null,"abstract":"The method of electrostatic discharge (ESD) damage test for common-mode chokes has been standardized in IEC 62228–5 Annex E. However, there is a concern about the reproducibility of the ESD damage test using the ESD gun described therein. Against this background, the possibility of replacing the ESD gun with a transmission line pulse–human metal model (TLP-HMM) was investigated. The results of the ESD damage test using the ESD gun and TLP-HMM are found to be similar but not exactly the same, especially at low frequencies. Moreover, due to the different waveform generation principles and circuit configurations of the ESD gun and TLP-HMM, even if a load of the same structure is used to calibrate the ESD gun and TLP-HMM, when they are applied to other loads, it is still difficult to guarantee that the discharge currents are the same. The findings raise an issue on how to define a standard TLP-HMM so that it could provide the worst test result compared to the ESD gun.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 1","pages":"10-15"},"PeriodicalIF":0.0,"publicationDate":"2022-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67856113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-11-01DOI: 10.1109/LEMCPA.2022.3218320
Alexander Matthee;Niek Moonen;Frank Leferink
Increased implementation of power electronics devices as well as high penetration of micro grids and embedded generation with low-supply inertia is resulting in grid stability problems, especially in transient or startup situations. The electromagnetic compatibility of these systems with regards to transients can be difficult to diagnose due to the short time duration and often intermittent nature of events. This letter proposes a multichannel measurement system which is able to measure voltage and current waveforms in multiple locations with synchronization and sample rates in the megahertz range. The overall design, characteristics, as well as applications are showcased in this letter.
{"title":"Synchronous Multipoint Low-Frequency EMI Measurement and Applications","authors":"Alexander Matthee;Niek Moonen;Frank Leferink","doi":"10.1109/LEMCPA.2022.3218320","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3218320","url":null,"abstract":"Increased implementation of power electronics devices as well as high penetration of micro grids and embedded generation with low-supply inertia is resulting in grid stability problems, especially in transient or startup situations. The electromagnetic compatibility of these systems with regards to transients can be difficult to diagnose due to the short time duration and often intermittent nature of events. This letter proposes a multichannel measurement system which is able to measure voltage and current waveforms in multiple locations with synchronization and sample rates in the megahertz range. The overall design, characteristics, as well as applications are showcased in this letter.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 4","pages":"120-124"},"PeriodicalIF":0.0,"publicationDate":"2022-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67853817","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-09-30DOI: 10.1109/LEMCPA.2022.3210876
Alexandre Boyer
Direct power injection (DPI) is a convenient method to characterize the conducted susceptibility of integrated circuits (ICs). However, a practical issue of this test is that the voltage, current, and impedance of the tested pin remain unknown during the test, even though it can provide valuable information to IC designers about IC failures. This letter presents an enhancement of the standard DPI test based on a commercial and affordable radiofrequency detector, which covers the frequency range of 5 MHz–3 GHz. The proposed approach does not require specific measurement probes and board design constraints. It can be easily inserted in a conventional DPI test bench without any influence on the test results.
{"title":"A Low-Cost RF Detector to Enhance the Direct Power Injection Conducted Immunity Setup","authors":"Alexandre Boyer","doi":"10.1109/LEMCPA.2022.3210876","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3210876","url":null,"abstract":"Direct power injection (DPI) is a convenient method to characterize the conducted susceptibility of integrated circuits (ICs). However, a practical issue of this test is that the voltage, current, and impedance of the tested pin remain unknown during the test, even though it can provide valuable information to IC designers about IC failures. This letter presents an enhancement of the standard DPI test based on a commercial and affordable radiofrequency detector, which covers the frequency range of 5 MHz–3 GHz. The proposed approach does not require specific measurement probes and board design constraints. It can be easily inserted in a conventional DPI test bench without any influence on the test results.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 4","pages":"108-113"},"PeriodicalIF":0.0,"publicationDate":"2022-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67853820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-09-28DOI: 10.1109/LEMCPA.2022.3210020
Awanish Kumar;G. Shrikanth Reddy;Jyotibhusan P.
This work presents an optically transparent frequency-selective surface (FSS)-based electromagnetic (EM) wave absorber that is polarization insensitive and offers a wide-band absorption bandwidth of 9 GHz within the C, X, and Ku bands. A slotted unit cell of an annular ring integrated with a cross exhibits fourfold symmetry, which makes it polarization insensitive. The proposed absorber is compact as the surface area of the unit cell is $0.25 {mathrm {lambda }} _{c},, {times },,0.25 {mathrm {lambda }} _{c}$ with a thickness of $0.015 {mathrm {lambda }} _{c}~( {mathrm {lambda }} _{c}$ is the wavelength at 10.95 GHz). In this work, the absorbance mechanism is presented using an electric and magnetic coupling, along with an effective input impedance plot of the unit cell. The theoretical analysis indicates that the proposed EM-wave absorber provides an absorption bandwidth of 9 GHz for normal incidence with 90% absorption. Theoretical results presented here further suggests that the proposed EM-wave absorber is polarization insensitive and angular stable up to 50° and 70° for TE and TM polarization, respectively. A prototype of the proposed EM-wave absorber is experimentally tested for its absorbance at different polarization angles. It is observed that the experimental results match well with the theoretical analysis.
{"title":"Highly Angular-Stable Optically Transparent Microwave Absorber With Wide Absorption Bandwidth","authors":"Awanish Kumar;G. Shrikanth Reddy;Jyotibhusan P.","doi":"10.1109/LEMCPA.2022.3210020","DOIUrl":"https://doi.org/10.1109/LEMCPA.2022.3210020","url":null,"abstract":"This work presents an optically transparent frequency-selective surface (FSS)-based electromagnetic (EM) wave absorber that is polarization insensitive and offers a wide-band absorption bandwidth of 9 GHz within the C, X, and Ku bands. A slotted unit cell of an annular ring integrated with a cross exhibits fourfold symmetry, which makes it polarization insensitive. The proposed absorber is compact as the surface area of the unit cell is \u0000<inline-formula> <tex-math>$0.25 {mathrm {lambda }} _{c},, {times },,0.25 {mathrm {lambda }} _{c}$ </tex-math></inline-formula>\u0000 with a thickness of \u0000<inline-formula> <tex-math>$0.015 {mathrm {lambda }} _{c}~( {mathrm {lambda }} _{c}$ </tex-math></inline-formula>\u0000 is the wavelength at 10.95 GHz). In this work, the absorbance mechanism is presented using an electric and magnetic coupling, along with an effective input impedance plot of the unit cell. The theoretical analysis indicates that the proposed EM-wave absorber provides an absorption bandwidth of 9 GHz for normal incidence with 90% absorption. Theoretical results presented here further suggests that the proposed EM-wave absorber is polarization insensitive and angular stable up to 50° and 70° for TE and TM polarization, respectively. A prototype of the proposed EM-wave absorber is experimentally tested for its absorbance at different polarization angles. It is observed that the experimental results match well with the theoretical analysis.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 4","pages":"114-119"},"PeriodicalIF":0.0,"publicationDate":"2022-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67853821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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