By focusing on regions exhibiting maximum electromagnetic (EM) emission levels, the duration required for standard EM emissions measurements can be substantially reduced. This letter outlines a rapid prescan technique that adheres to conventional measurement procedures. The proposed method considerably minimizes measurement time by identifying areas where emissions approach, or exceed, threshold limits. Furthermore, real-time visualization of EM emissions from the time-domain data enables testers to select a more effective scanning trajectory, thus diminishing the likelihood of overlooking areas with high-intensity EM emissions and time-variance sources.
{"title":"On-Site Radiated Emissions Result Visualization Using Augmented Reality","authors":"Denys Pokotilov;Robert Vogt-Ardatjew;Frank Leferink","doi":"10.1109/LEMCPA.2023.3324267","DOIUrl":"10.1109/LEMCPA.2023.3324267","url":null,"abstract":"By focusing on regions exhibiting maximum electromagnetic (EM) emission levels, the duration required for standard EM emissions measurements can be substantially reduced. This letter outlines a rapid prescan technique that adheres to conventional measurement procedures. The proposed method considerably minimizes measurement time by identifying areas where emissions approach, or exceed, threshold limits. Furthermore, real-time visualization of EM emissions from the time-domain data enables testers to select a more effective scanning trajectory, thus diminishing the likelihood of overlooking areas with high-intensity EM emissions and time-variance sources.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"108-112"},"PeriodicalIF":0.0,"publicationDate":"2023-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10283900","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136303849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-09-22DOI: 10.1109/LEMCPA.2023.3315564
{"title":"IEEE ELECTROMAGNETIC COMPATIBILITY SOCIETY","authors":"","doi":"10.1109/LEMCPA.2023.3315564","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3315564","url":null,"abstract":"","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"C2-C2"},"PeriodicalIF":0.0,"publicationDate":"2023-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10260712/10260728.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-09-22DOI: 10.1109/LEMCPA.2023.3308279
Summary form only: Abstracts of articles presented in this issue of the publication.
仅限摘要形式：本期出版物中的文章摘要。
{"title":"Synopsis of the September 2023 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2023.3308279","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3308279","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"63-66"},"PeriodicalIF":0.0,"publicationDate":"2023-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10260712/10260692.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67867180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-09-18DOI: 10.1109/LEMCPA.2023.3316714
Viral B. Rathod;Ganesh B. Kumbhar;Bhavesh R. Bhalja
This letter introduces a new technique based on electromagnetic time reversal (EMTR) theory to locate partial discharge (PD) in transformer windings. The technique involves measuring PD signals at both ends of the winding, creating a ladder network model of the winding, and subsequently time-reversing and back-injecting the measured PD signals into the ladder network model. The PD current signal energy is then calculated for different guessed PD locations (GPDLs) using the ladder network model, and the actual PD location is identified as the location that corresponds to the maximum energy concentration. Ultimately, the simulation-based validation confirms the capability of the technique to accurately identify the location of PD within transformer winding.
{"title":"An Electromagnetic Time Reversal Technique to Locate Partial Discharge in Transformer Winding","authors":"Viral B. Rathod;Ganesh B. Kumbhar;Bhavesh R. Bhalja","doi":"10.1109/LEMCPA.2023.3316714","DOIUrl":"10.1109/LEMCPA.2023.3316714","url":null,"abstract":"This letter introduces a new technique based on electromagnetic time reversal (EMTR) theory to locate partial discharge (PD) in transformer windings. The technique involves measuring PD signals at both ends of the winding, creating a ladder network model of the winding, and subsequently time-reversing and back-injecting the measured PD signals into the ladder network model. The PD current signal energy is then calculated for different guessed PD locations (GPDLs) using the ladder network model, and the actual PD location is identified as the location that corresponds to the maximum energy concentration. Ultimately, the simulation-based validation confirms the capability of the technique to accurately identify the location of PD within transformer winding.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"149-153"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135502434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-09-18DOI: 10.1109/LEMCPA.2023.3316712
Pablo J. Gardella;Daniel Lamela;Philippe Dutriez;Eduardo Mariani
The direct power injection (DPI) test method was developed with the intention of achieving a strong correlation and repeatability in measuring the conducted immunity (CI) of integrated circuits (ICs). Nonetheless, in practical implementation, this goal can be compromised by different factors. For example, it is not uncommon to come across DPI tests performed in 3-dB increments. However, this level of uncertainty at 27 dBm could result in peak voltage amplitudes ranging from 5 to 10 V when considering an infinitely high impedance. Furthermore, in the process of finding a failure, only the performance at the threshold where the failure is observed is typically recorded, while the behavior of the IC (before the failure occurs) is ignored. However, this trend carries significant value for IC designers, as failure modes demonstrate a stronger correlation to simulations than absolute levels. This letter introduces a series of enhancements to the DPI flow, specifically targeting the reduction of the result uncertainty, the extraction of maximum information from each test, and the achievement of time-efficient execution. Furthermore, these improvements can be seamlessly extended to accommodate any other conducted or acrlong RI test. Focused on the day-to-day challenges of technicians and engineers, this letter is addressed to individuals interested in enhancing preexisting methodologies for reducing DPI uncertainty, improving test repeatability and its efficiency.
{"title":"A Comprehensive Flowchart to Maximize the Outcome of Direct Power Injection Tests","authors":"Pablo J. Gardella;Daniel Lamela;Philippe Dutriez;Eduardo Mariani","doi":"10.1109/LEMCPA.2023.3316712","DOIUrl":"10.1109/LEMCPA.2023.3316712","url":null,"abstract":"The direct power injection (DPI) test method was developed with the intention of achieving a strong correlation and repeatability in measuring the conducted immunity (CI) of integrated circuits (ICs). Nonetheless, in practical implementation, this goal can be compromised by different factors. For example, it is not uncommon to come across DPI tests performed in 3-dB increments. However, this level of uncertainty at 27 dBm could result in peak voltage amplitudes ranging from 5 to 10 V when considering an infinitely high impedance. Furthermore, in the process of finding a failure, only the performance at the threshold where the failure is observed is typically recorded, while the behavior of the IC (before the failure occurs) is ignored. However, this trend carries significant value for IC designers, as failure modes demonstrate a stronger correlation to simulations than absolute levels. This letter introduces a series of enhancements to the DPI flow, specifically targeting the reduction of the result uncertainty, the extraction of maximum information from each test, and the achievement of time-efficient execution. Furthermore, these improvements can be seamlessly extended to accommodate any other conducted or acrlong RI test. Focused on the day-to-day challenges of technicians and engineers, this letter is addressed to individuals interested in enhancing preexisting methodologies for reducing DPI uncertainty, improving test repeatability and its efficiency.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"154-158"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135502432","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-02DOI: 10.1109/LEMCPA.2023.3301431
Taiki Kitazawa;Hiroyuki Kubo;Yuichi Hayashi
Threats of compromising emanations, which allow malicious eavesdroppers to screen information through electromagnetic (EM) waves that have leaked from video display units (VDUs), are expanding their target devices with the development of low-cost and portable measurement setups. On the other hand, such low-cost instruments have a lower sampling rate than the pixel clock in VDUs; pixel information is lost in the image reconstructed from the measured EM waves, and the quality of the image is also degraded. In this letter, we propose a novel method to reconstruct high-quality images from lower sampling rate observations by a nonnegative linear optimization. Our method can recover clear images even when measuring EM leakage at low sampling rates and fluctuating sampling clocks. To obtain a stable and plausible solution to the optimization problem, we focus on fluctuations in sample points caused by clock jitter in devices and instruments and use pixel information obtained by observing multiple frames. To verify the proposed method, we generated simulated data from leaked EM waves, including screen information, and evaluated the visibility of the reconstructed images. Consequently, the images reconstructed using the proposed method were of the same quality as those reconstructed by applying conventional methods to data measured at a high sampling rate sufficient for information recovery. Moreover, we confirmed that even if the image quality is degraded by a decrease in the signal-to-noise ratio of the observed signal and an increase in the clock jitter, the proposed method can still be used to obtain high-quality reconstructed images by increasing the number of observed frames.
{"title":"A Method for Extracting Plausible Images From EM Leakage Measured at Low Sampling Rates","authors":"Taiki Kitazawa;Hiroyuki Kubo;Yuichi Hayashi","doi":"10.1109/LEMCPA.2023.3301431","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3301431","url":null,"abstract":"Threats of compromising emanations, which allow malicious eavesdroppers to screen information through electromagnetic (EM) waves that have leaked from video display units (VDUs), are expanding their target devices with the development of low-cost and portable measurement setups. On the other hand, such low-cost instruments have a lower sampling rate than the pixel clock in VDUs; pixel information is lost in the image reconstructed from the measured EM waves, and the quality of the image is also degraded. In this letter, we propose a novel method to reconstruct high-quality images from lower sampling rate observations by a nonnegative linear optimization. Our method can recover clear images even when measuring EM leakage at low sampling rates and fluctuating sampling clocks. To obtain a stable and plausible solution to the optimization problem, we focus on fluctuations in sample points caused by clock jitter in devices and instruments and use pixel information obtained by observing multiple frames. To verify the proposed method, we generated simulated data from leaked EM waves, including screen information, and evaluated the visibility of the reconstructed images. Consequently, the images reconstructed using the proposed method were of the same quality as those reconstructed by applying conventional methods to data measured at a high sampling rate sufficient for information recovery. Moreover, we confirmed that even if the image quality is degraded by a decrease in the signal-to-noise ratio of the observed signal and an increase in the clock jitter, the proposed method can still be used to obtain high-quality reconstructed images by increasing the number of observed frames.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"87-91"},"PeriodicalIF":0.0,"publicationDate":"2023-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/8566057/10260712/10201909.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1109/LEMCPA.2023.3300896
Chung-Yen Hsu;Lih-Shan Chen
Unwanted high-frequency electromagnetic interference from signal transmission lines or electromagnetic waves adversely affects the performance of electronic systems. Due to electromagnetic wave interference, filters and shields need to be designed to reduce noise and avoid damage to electronic devices. In this letter, 3-D printing is used to create stair-like layers on a microstrip line, which is utilized as a high-frequency power noise attenuator. Polylactic acid with added carbon is used in 3-D printing to prepare the conduction noise suppression layers. The effect of the stair-like 3-D-printed layers on power absorption, which enables high-frequency devices to function correctly, is discussed. The experimental results reveal that the power absorption range of the stair-like 3-D-printed layers is 80%–95% in the frequency range of 1.3–4.5 GHz for 1.21/3.23 mm specimens.
{"title":"Analysis of Stair-Like 3-D-Printed Layers for Suppression of Conduction Noise on Microstrip Line","authors":"Chung-Yen Hsu;Lih-Shan Chen","doi":"10.1109/LEMCPA.2023.3300896","DOIUrl":"10.1109/LEMCPA.2023.3300896","url":null,"abstract":"Unwanted high-frequency electromagnetic interference from signal transmission lines or electromagnetic waves adversely affects the performance of electronic systems. Due to electromagnetic wave interference, filters and shields need to be designed to reduce noise and avoid damage to electronic devices. In this letter, 3-D printing is used to create stair-like layers on a microstrip line, which is utilized as a high-frequency power noise attenuator. Polylactic acid with added carbon is used in 3-D printing to prepare the conduction noise suppression layers. The effect of the stair-like 3-D-printed layers on power absorption, which enables high-frequency devices to function correctly, is discussed. The experimental results reveal that the power absorption range of the stair-like 3-D-printed layers is 80%–95% in the frequency range of 1.3–4.5 GHz for 1.21/3.23 mm specimens.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"137-141"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76916590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-27DOI: 10.1109/LEMCPA.2023.3299244
Jinjun Bai;Bing Hu;Zhengyu Xue
These days, uncertainty analysis methods have become a hot research topic in the electromagnetic compatibility (EMC) field. The uncertainty analysis method based on the Kriging surrogate model has the unique advantage of not being affected by “dimensional disasters,” and has gradually attracted the attention of researchers. However, the traditional Kriging surrogate model uses a Latin hypercube sampling strategy to select training sets, which is a relatively passive sampling method, and the computational efficiency and accuracy in the practical application process are uncontrollable. This letter proposes an active sampling strategy based on stochastic reduced-order models (SROMs). By improving the fitness function of the genetic algorithm when complete clustering, a new Kriging model is constructed to complete the EMC uncertainty simulation. In the example of parallel cable crosstalk prediction in the published reference, the mean equivalent area method and feature selection verification methods were used to quantitatively evaluate the results, verifying the accuracy improvement of the proposed improvement strategy.
{"title":"EMC Uncertainty Simulation Method Based on Improved Kriging Model","authors":"Jinjun Bai;Bing Hu;Zhengyu Xue","doi":"10.1109/LEMCPA.2023.3299244","DOIUrl":"10.1109/LEMCPA.2023.3299244","url":null,"abstract":"These days, uncertainty analysis methods have become a hot research topic in the electromagnetic compatibility (EMC) field. The uncertainty analysis method based on the Kriging surrogate model has the unique advantage of not being affected by “dimensional disasters,” and has gradually attracted the attention of researchers. However, the traditional Kriging surrogate model uses a Latin hypercube sampling strategy to select training sets, which is a relatively passive sampling method, and the computational efficiency and accuracy in the practical application process are uncontrollable. This letter proposes an active sampling strategy based on stochastic reduced-order models (SROMs). By improving the fitness function of the genetic algorithm when complete clustering, a new Kriging model is constructed to complete the EMC uncertainty simulation. In the example of parallel cable crosstalk prediction in the published reference, the mean equivalent area method and feature selection verification methods were used to quantitatively evaluate the results, verifying the accuracy improvement of the proposed improvement strategy.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"127-130"},"PeriodicalIF":0.0,"publicationDate":"2023-07-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91248202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-13DOI: 10.1109/LEMCPA.2023.3294129
Roelof Grootjans;Niek Moonen
Multinode measurement systems are required to evaluate electromagnetic interference (EMI) propagation and power-quality (PQ) issues in microgrids or large buildings. PQ issues are a subset of electromagnetic compatibility (EMC), and identifying them can help track down problems in large networks. Commercial-off-the-shelf (COTS) sensors range from cheap smart plugs, with limited functionality and accuracy, to high-end measurement devices. For large-scale deployment and future research, a cost-effective solution is needed for distributed measurements. This letter discusses designing and evaluating a cost-effective PQ sensor that fits the gap between cheap smart plugs and high-end measurement devices. It is designed with expandability in mind while keeping the cost down. This allows the device to log other EMI parameters in the future by adding sensors without redesigning the device. An energy measurement accuracy of smaller than 1% is achieved, comparable to a class B energy meter of the EN-50470 standard. It can measure all the elementary electrical parameters so deviations to the EN-50160 can be logged in a (sub)second scale.
{"title":"Design of Cost-Effective Power Quality and EMI Sensor for Multinode Network","authors":"Roelof Grootjans;Niek Moonen","doi":"10.1109/LEMCPA.2023.3294129","DOIUrl":"10.1109/LEMCPA.2023.3294129","url":null,"abstract":"Multinode measurement systems are required to evaluate electromagnetic interference (EMI) propagation and power-quality (PQ) issues in microgrids or large buildings. PQ issues are a subset of electromagnetic compatibility (EMC), and identifying them can help track down problems in large networks. Commercial-off-the-shelf (COTS) sensors range from cheap smart plugs, with limited functionality and accuracy, to high-end measurement devices. For large-scale deployment and future research, a cost-effective solution is needed for distributed measurements. This letter discusses designing and evaluating a cost-effective PQ sensor that fits the gap between cheap smart plugs and high-end measurement devices. It is designed with expandability in mind while keeping the cost down. This allows the device to log other EMI parameters in the future by adding sensors without redesigning the device. An energy measurement accuracy of smaller than 1% is achieved, comparable to a class B energy meter of the EN-50470 standard. It can measure all the elementary electrical parameters so deviations to the EN-50160 can be logged in a (sub)second scale.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 4","pages":"131-136"},"PeriodicalIF":0.0,"publicationDate":"2023-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76876609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This letter deals with the research and comparative analyses of the traction power system and electromagnetic interference (EMI) in the return traction current on the railways of Ukraine, Europe, and the U.K. The spectral compositions of return traction current were evaluated experimentally. The main ideas of this letter are to determine possible EMI in the return traction current at the different traction systems of world railways and evaluate their influence on railway automatics. The following tasks were decided: comparing world power traction systems of railways and their automatics devices, estimating EMIs in the return traction current, and making conclusions for the future. The sources of external EMIs in the automatics and telecommunication circuits are very diverse: traction networks with harmonics and pulses, high-voltage power lines; lightning discharges, which have both dangerous and interfering effects under various conditions; and various industrial sources of electromagnetic fields (motors, generators, and welding units).
{"title":"Analysis of Electrified Systems and Electromagnetic Interference on the Railways","authors":"Tetiana Serdiuk;Kseniia Serdiuk;Volodymyr Profatylov;Hafte Hayelom Adhena;David Thomas;Steve Greedy","doi":"10.1109/LEMCPA.2023.3290101","DOIUrl":"https://doi.org/10.1109/LEMCPA.2023.3290101","url":null,"abstract":"This letter deals with the research and comparative analyses of the traction power system and electromagnetic interference (EMI) in the return traction current on the railways of Ukraine, Europe, and the U.K. The spectral compositions of return traction current were evaluated experimentally. The main ideas of this letter are to determine possible EMI in the return traction current at the different traction systems of world railways and evaluate their influence on railway automatics. The following tasks were decided: comparing world power traction systems of railways and their automatics devices, estimating EMIs in the return traction current, and making conclusions for the future. The sources of external EMIs in the automatics and telecommunication circuits are very diverse: traction networks with harmonics and pulses, high-voltage power lines; lightning discharges, which have both dangerous and interfering effects under various conditions; and various industrial sources of electromagnetic fields (motors, generators, and welding units).","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"5 3","pages":"67-71"},"PeriodicalIF":0.0,"publicationDate":"2023-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67867182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：