Pub Date : 1989-01-01DOI: 10.1016/0146-3535(89)90014-2
M. Weyers
{"title":"MOMBE and MOVPE—A comparison of growth techniques","authors":"M. Weyers","doi":"10.1016/0146-3535(89)90014-2","DOIUrl":"10.1016/0146-3535(89)90014-2","url":null,"abstract":"","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"19 1","pages":"Pages 83-96"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(89)90014-2","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84628820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-01-01DOI: 10.1016/0146-3535(89)90026-9
B. Buras , L. Gerward
{"title":"Application of X-ray energy-dispersive diffraction for characterization of materials under high pressure","authors":"B. Buras , L. Gerward","doi":"10.1016/0146-3535(89)90026-9","DOIUrl":"10.1016/0146-3535(89)90026-9","url":null,"abstract":"","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"18 ","pages":"Pages 93-138"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(89)90026-9","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81938922","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-01-01DOI: 10.1016/0146-3535(89)90028-2
S. Weissmann , L.H. Lee
{"title":"Applications of the divergent beam X-ray technique","authors":"S. Weissmann , L.H. Lee","doi":"10.1016/0146-3535(89)90028-2","DOIUrl":"10.1016/0146-3535(89)90028-2","url":null,"abstract":"","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"18 ","pages":"Pages 205-226"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(89)90028-2","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87571823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-01-01DOI: 10.1016/0146-3535(89)90025-7
G. Sankar, G.U. Kulkarni, C.N.R. Rao
{"title":"EXAFS of catalytic materials","authors":"G. Sankar, G.U. Kulkarni, C.N.R. Rao","doi":"10.1016/0146-3535(89)90025-7","DOIUrl":"10.1016/0146-3535(89)90025-7","url":null,"abstract":"","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"18 ","pages":"Pages 67-92"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(89)90025-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79848797","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-01-01DOI: 10.1016/0146-3535(89)90024-5
Armin Segmüller , I.C. Noyan , V.S. Speriosu
Analytical methods for the nondestructive characterization of thin epitaxial films, multilayers and superlattices by x-ray diffraction that have been developed in the last decade are reviewed in three sections:
1.
I. Description of the strain state by the strain tensor and determination of homogeneous strains and stresses by double-crystal diffractometry in Bragg case reflection;
2.
II. Determination of inhomogeneous strains, such as strain gradients or periodic strain modulations, by double-crystal diffractometry in Bragg case reflection;
3.
III. Characterization parallel to the surface by grazing-incidence x-ray diffraction.
{"title":"X-ray diffraction studies of thin films and multilayer structures","authors":"Armin Segmüller , I.C. Noyan , V.S. Speriosu","doi":"10.1016/0146-3535(89)90024-5","DOIUrl":"10.1016/0146-3535(89)90024-5","url":null,"abstract":"<div><p>Analytical methods for the nondestructive characterization of thin epitaxial films, multilayers and superlattices by x-ray diffraction that have been developed in the last decade are reviewed in three sections: </p><ul><li><span>1.</span><span><p>I. Description of the strain state by the strain tensor and determination of homogeneous strains and stresses by double-crystal diffractometry in Bragg case reflection;</p></span></li><li><span>2.</span><span><p>II. Determination of inhomogeneous strains, such as strain gradients or periodic strain modulations, by double-crystal diffractometry in Bragg case reflection;</p></span></li><li><span>3.</span><span><p>III. Characterization parallel to the surface by grazing-incidence x-ray diffraction.</p></span></li></ul></div>","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"18 ","pages":"Pages 21-66"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(89)90024-5","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88759844","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-01-01DOI: 10.1016/0146-3535(89)90006-3
{"title":"International School on Crystal Growth and Crystallographic Assessment of Industrial Materials","authors":"","doi":"10.1016/0146-3535(89)90006-3","DOIUrl":"https://doi.org/10.1016/0146-3535(89)90006-3","url":null,"abstract":"","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"19 3","pages":"Page 247"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(89)90006-3","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72288609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-01-01DOI: 10.1016/0146-3535(89)90002-6
P. Capper
{"title":"Bridgman growth of CdxHg1−xTe— A review","authors":"P. Capper","doi":"10.1016/0146-3535(89)90002-6","DOIUrl":"https://doi.org/10.1016/0146-3535(89)90002-6","url":null,"abstract":"","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"95 1","pages":"259-293"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76658583","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-01-01DOI: 10.1016/0146-3535(89)90001-4
Mary Halliwell
This paper describes the double and triple axis diffractometers available for characterising heteroepitaxial layer structures in the laboratory environment. The relative merits of the techniques are described.
To demonstrate the materials information available from the diffractometer data (usually referred to as rocking curves) examples are given of the analysis of layer thickness and lattice parameter values for single heteroepitaxial layers, two layer structures and multiquantum well structures. For layers with a defect density of less than 105 per cm2 detailed analysis of rocking curve data is carried out by comparing experimental results with simulated data.
X-ray diffraction also offers a non-destructive means of fully characterising the state of relaxation of strained layer systems.
{"title":"Characterisation of structures grown by Movpe using x-ray diffraction","authors":"Mary Halliwell","doi":"10.1016/0146-3535(89)90001-4","DOIUrl":"https://doi.org/10.1016/0146-3535(89)90001-4","url":null,"abstract":"<div><p>This paper describes the double and triple axis diffractometers available for characterising heteroepitaxial layer structures in the laboratory environment. The relative merits of the techniques are described.</p><p>To demonstrate the materials information available from the diffractometer data (usually referred to as rocking curves) examples are given of the analysis of layer thickness and lattice parameter values for single heteroepitaxial layers, two layer structures and multiquantum well structures. For layers with a defect density of less than 10<sup>5</sup> per cm<sup>2</sup> detailed analysis of rocking curve data is carried out by comparing experimental results with simulated data.</p><p>X-ray diffraction also offers a non-destructive means of fully characterising the state of relaxation of strained layer systems.</p></div>","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"19 4","pages":"Pages 249-257"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(89)90001-4","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91678955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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