{"title":"Session details: Inspections","authors":"D. Pfahl","doi":"10.1145/3247181","DOIUrl":"https://doi.org/10.1145/3247181","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116813883","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Empirical evidence and systematic review","authors":"D. Caivano","doi":"10.1145/3247190","DOIUrl":"https://doi.org/10.1145/3247190","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129289098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Experience in process improvement","authors":"T. Gorschek","doi":"10.1145/3247189","DOIUrl":"https://doi.org/10.1145/3247189","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115332055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: From the programmers' trenches","authors":"H. Erdogmus","doi":"10.1145/3247180","DOIUrl":"https://doi.org/10.1145/3247180","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130991225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: From the manager's trenches","authors":"P. Runeson","doi":"10.1145/3247185","DOIUrl":"https://doi.org/10.1145/3247185","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131564896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Keynote address","authors":"S. Elbaum","doi":"10.1145/3247179","DOIUrl":"https://doi.org/10.1145/3247179","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115968816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Estimation models I","authors":"C. Seaman","doi":"10.1145/3247177","DOIUrl":"https://doi.org/10.1145/3247177","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"133 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133460594","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Metrics and methodology","authors":"M. Oivo","doi":"10.1145/3247182","DOIUrl":"https://doi.org/10.1145/3247182","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128832824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Modeling and architecture","authors":"J. Carver","doi":"10.1145/3247178","DOIUrl":"https://doi.org/10.1145/3247178","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131800977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Keynote address","authors":"J. Münch","doi":"10.1145/3247174","DOIUrl":"https://doi.org/10.1145/3247174","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123830846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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