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Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement最新文献

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Session details: Coordination and communication 会议内容:协调沟通
F. Lanubile
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引用次数: 0
Session details: Testing and analysis 会话细节:测试和分析
S. Vegas
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引用次数: 0
Session details: Faults and failures 会话详细信息:故障和失败
L. Williams
{"title":"Session details: Faults and failures","authors":"L. Williams","doi":"10.1145/3247183","DOIUrl":"https://doi.org/10.1145/3247183","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"8 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126125124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Estimation models II 会议细节:评估模型II
M. Ciolkowski
{"title":"Session details: Estimation models II","authors":"M. Ciolkowski","doi":"10.1145/3247184","DOIUrl":"https://doi.org/10.1145/3247184","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124702158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Development of predictive models 会议细节:预测模型的发展
Ó. Dieste
{"title":"Session details: Development of predictive models","authors":"Ó. Dieste","doi":"10.1145/3247188","DOIUrl":"https://doi.org/10.1145/3247188","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"56 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126766231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Evaluation and comparison of techniques and models 会议细节:技术和模型的评估和比较
M. Genero
{"title":"Session details: Evaluation and comparison of techniques and models","authors":"M. Genero","doi":"10.1145/3247186","DOIUrl":"https://doi.org/10.1145/3247186","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114575315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Empirical s`tudies of processes and products 会议细节:过程和产品的实证研究
D. Winkler
{"title":"Session details: Empirical s`tudies of processes and products","authors":"D. Winkler","doi":"10.1145/3247187","DOIUrl":"https://doi.org/10.1145/3247187","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122216458","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
期刊
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement
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