Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495237
D. P. Ray
{"title":"Basics of Medical EMC","authors":"D. P. Ray","doi":"10.1109/EMCSI.2018.8495237","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495237","url":null,"abstract":"","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121356677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495332
M. Ashritha, M. Sudheer
This paper presents a new technique to minimize high-frequency CM conducted EMI noise in offline flyback SMPS and Near Unity Power Factor (NUPF) converter. In this technique, separate ground paths are provided for noise sources on the primary and secondary side of the high-frequency transformer. This is achieved by splitting the Cz capacitor of line filter into Cm1 and Cm2 with their mid-point grounded. By this method, a considerable reduction in CM conducted EMI in the high-frequency range can be achieved. Hence the size of the EMI line filter can be reduced. Experimentation and simulations are carried out with Cm1, Cm2 and Cz capacitor for offline flyback configured NUPF and SMPS in the critical conduction mode. The experimental and simulation results are presented and are found to be in close agreement.
{"title":"Mitigation of High-Frequency CM Conducted EMI in Offline Switching Power Supplies","authors":"M. Ashritha, M. Sudheer","doi":"10.1109/EMCSI.2018.8495332","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495332","url":null,"abstract":"This paper presents a new technique to minimize high-frequency CM conducted EMI noise in offline flyback SMPS and Near Unity Power Factor (NUPF) converter. In this technique, separate ground paths are provided for noise sources on the primary and secondary side of the high-frequency transformer. This is achieved by splitting the C<inf>z</inf> capacitor of line filter into C<inf>m</inf><inf>1</inf> and C<inf>m</inf><inf>2</inf> with their mid-point grounded. By this method, a considerable reduction in CM conducted EMI in the high-frequency range can be achieved. Hence the size of the EMI line filter can be reduced. Experimentation and simulations are carried out with C<inf>m</inf><inf>1</inf>, C<inf>m</inf><inf>2</inf> and C<inf>z</inf> capacitor for offline flyback configured NUPF and SMPS in the critical conduction mode. The experimental and simulation results are presented and are found to be in close agreement.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126579303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495220
R. Procopio
Introduction
介绍
{"title":"Lightning performance and protection systems","authors":"R. Procopio","doi":"10.1109/EMCSI.2018.8495220","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495220","url":null,"abstract":"Introduction","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125854479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/emcsi.2018.8495281
G. Kiemel
This article consists only of a collection of slides from the author's conference presentation.
本文仅由作者在会议上发表的一些幻灯片组成。
{"title":"An Update on U.S. and Canada Wireless Rulemakings","authors":"G. Kiemel","doi":"10.1109/emcsi.2018.8495281","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495281","url":null,"abstract":"This article consists only of a collection of slides from the author's conference presentation.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124062124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495234
F. Leferink
{"title":"Workshop, WED-PM-5 EMC for Home Appliances, Including Power Converters Applications","authors":"F. Leferink","doi":"10.1109/EMCSI.2018.8495234","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495234","url":null,"abstract":"","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126601101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495173
F. Ling, Kevin Cai, Bidyut Sen
Crosstalk analysis for high speed PCB design becomes more and more important due to the high data rate and tightly coupled routing. Traditional circuit-based analysis can not meet the accuracy demand. Three-dimensional (3D) full-wave electromagnetic solver is required to capture the complex 3D PCB environment and the frequency-dependent phenomena. However it is prohibitively expensive to simulate the practical large board cases and the resultant tabulated S-parameter cannot be directly used to quantify the crosstalk level. This paper introduces a novel hybrid solver techniques with improved speed and accuracy. The new crosstalk metrics to quantify the crosstalk level are also developed by post-processing S-parameter. Combining these two techniques allows designers to achieve full board crosstalk in a few hours as planned intended with using the tool, which significantly reduces the post-layout review time, allows layout optimization and ensures a timely sign-off.
{"title":"Fast Full Board Crosstalk Scan for Signal Integrity Sign-Off for High Speed PCB Designs","authors":"F. Ling, Kevin Cai, Bidyut Sen","doi":"10.1109/EMCSI.2018.8495173","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495173","url":null,"abstract":"Crosstalk analysis for high speed PCB design becomes more and more important due to the high data rate and tightly coupled routing. Traditional circuit-based analysis can not meet the accuracy demand. Three-dimensional (3D) full-wave electromagnetic solver is required to capture the complex 3D PCB environment and the frequency-dependent phenomena. However it is prohibitively expensive to simulate the practical large board cases and the resultant tabulated S-parameter cannot be directly used to quantify the crosstalk level. This paper introduces a novel hybrid solver techniques with improved speed and accuracy. The new crosstalk metrics to quantify the crosstalk level are also developed by post-processing S-parameter. Combining these two techniques allows designers to achieve full board crosstalk in a few hours as planned intended with using the tool, which significantly reduces the post-layout review time, allows layout optimization and ensures a timely sign-off.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117341124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/emcsi.2018.8495431
K. Armstrong
Contents Introduction to Functional Safety IEC 61508 and ISO 14971 EMC immunity testing: it's deficiencies for Risk Management Ed.4's requirements for Risk Managing EM disturbances The first practical approach to Risk-Managing EM disturbances Applying the first practical approach to complying with 60601-1-2 Ed.4 60601-1-2 Ed.4 and compliance with Product Liability Legislation
{"title":"Long Beach Tutorial WED-PM-4 Introduction to Medical EMC Risk Management of Electromagnetic Disturbances, or EMI","authors":"K. Armstrong","doi":"10.1109/emcsi.2018.8495431","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495431","url":null,"abstract":"Contents Introduction to Functional Safety IEC 61508 and ISO 14971 EMC immunity testing: it's deficiencies for Risk Management Ed.4's requirements for Risk Managing EM disturbances The first practical approach to Risk-Managing EM disturbances Applying the first practical approach to complying with 60601-1-2 Ed.4 60601-1-2 Ed.4 and compliance with Product Liability Legislation","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127480838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/emcsi.2018.8495308
A. Mceachern
2kHz-150kHz Emissions
2 khz - 150千赫的排放
{"title":"Special Issues Related to the Frequency Range 2kHz-150kHz","authors":"A. Mceachern","doi":"10.1109/emcsi.2018.8495308","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495308","url":null,"abstract":"2kHz-150kHz Emissions","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129062390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/EMCSI.2018.8495226
Shuo Wang
A. EMI Measurement
A.电磁干扰测量
{"title":"EMI Modeling and Reduction in Modern Power Electronics Systems","authors":"Shuo Wang","doi":"10.1109/EMCSI.2018.8495226","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495226","url":null,"abstract":"A. EMI Measurement","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130322545","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-01DOI: 10.1109/emcsi.2018.8495440
D. Senic, K. Remley
This article consists only of a collection of slides from the author's conference presentation.
本文仅由作者在会议上发表的一些幻灯片组成。
{"title":"Measurements of Wireless Devices in Reverberation Chambers","authors":"D. Senic, K. Remley","doi":"10.1109/emcsi.2018.8495440","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495440","url":null,"abstract":"This article consists only of a collection of slides from the author's conference presentation.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130620521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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