Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2018.37
H. Alexander
Many calibration laboratory managers, who plan to become accredited or re-accredited to the new ISO/IEC 17025:2017 standard, worry about how to address a new requirement of the standard: considering the risks and opportunities associated with laboratory activities. They may not realize that a well-run calibration tivities. Practical examples of consideration of risks and opportunities in routine laboratory activities such as calibration interval determination, out-of-tolerance investigations, root cause analysis of nonconformity incidences, etc., will be addressed, and suggestions on how to enhance, monitor and document such activities will be provided. Laboratory personnel will find that they do not have to start from scratch in order to comply with this new aspect of ISO/IEC 17025, but they can leverage and improve upon existing best practices.
{"title":"Risk-Based Thinking in the Calibration Laboratory: Practical Examples","authors":"H. Alexander","doi":"10.51843/wsproceedings.2018.37","DOIUrl":"https://doi.org/10.51843/wsproceedings.2018.37","url":null,"abstract":"Many calibration laboratory managers, who plan to become accredited or re-accredited to the new ISO/IEC 17025:2017 standard, worry about how to address a new requirement of the standard: considering the risks and opportunities associated with laboratory activities. They may not realize that a well-run calibration tivities. Practical examples of consideration of risks and opportunities in routine laboratory activities such as calibration interval determination, out-of-tolerance investigations, root cause analysis of nonconformity incidences, etc., will be addressed, and suggestions on how to enhance, monitor and document such activities will be provided. Laboratory personnel will find that they do not have to start from scratch in order to comply with this new aspect of ISO/IEC 17025, but they can leverage and improve upon existing best practices.","PeriodicalId":120844,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2018","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122370819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2018.39
Shaikh Sajid Ahmed
This paper is written from the perspective of either third party commercial or an internal calibration lab. While it is recognized that some companies communications go through multiple departments (both for the customer and for the calibration service provider), these experiences and solutions may also be applied to any lab needing outsourced calibration services. It is imperative that both the customer and the vendor take equal responsibility for communicating with each other to ensure complete customer satisfaction. Both the customer and vendor should be familiar with the requirements of ISO/IEC 17025:2005 section 4.41 Review of requests, tenders and contracts, 4.61 Purchasing services and supplies, and Section 4.71 Service to the customer. This paper addresses common frustrations between customers and their vendor’s, it also explains the relationship between different factors and processes involve in delivering the best quality services. Moreover, it also offers valuable suggestions to overcome the current and future challenges that are faced by calibration laboratories. Apart from this, certain solutions are also offered in this manuscript for closing various gaps that affects the service quality by integrating services gap model to the real scenarios and also explains how this model can help us to deliver best services within the calibration, inspection and testing laboratories.
{"title":"Calibration Laboratories Challenges - Service Quality","authors":"Shaikh Sajid Ahmed","doi":"10.51843/wsproceedings.2018.39","DOIUrl":"https://doi.org/10.51843/wsproceedings.2018.39","url":null,"abstract":"This paper is written from the perspective of either third party commercial or an internal calibration lab. While it is recognized that some companies communications go through multiple departments (both for the customer and for the calibration service provider), these experiences and solutions may also be applied to any lab needing outsourced calibration services. It is imperative that both the customer and the vendor take equal responsibility for communicating with each other to ensure complete customer satisfaction. Both the customer and vendor should be familiar with the requirements of ISO/IEC 17025:2005 section 4.41 Review of requests, tenders and contracts, 4.61 Purchasing services and supplies, and Section 4.71 Service to the customer. This paper addresses common frustrations between customers and their vendor’s, it also explains the relationship between different factors and processes involve in delivering the best quality services. Moreover, it also offers valuable suggestions to overcome the current and future challenges that are faced by calibration laboratories. Apart from this, certain solutions are also offered in this manuscript for closing various gaps that affects the service quality by integrating services gap model to the real scenarios and also explains how this model can help us to deliver best services within the calibration, inspection and testing laboratories.","PeriodicalId":120844,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2018","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125329951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2018.13
C. Hung
Regression analysis is a practical statistical technique. It is mainly used to estimate the relationship among variables and then predict the unknown observations. In metrology, the calibration curve is an application of regression analysis, which describes the relationship between standard values and indications, or nominal values and standard values. According to ISO/IEC 17025:2005, the calibration certificates shall include the measurement uncertainty. Thus, when the standard value is obtained by a calibration curve, the uncertainty of the predicted value should be considered as an additional uncertainty component. The regression line can be fitted by estimating the regression coefficients from the observed data set. However, the observed data set may have different forms, such as one value of the independent variable against one observation of the dependent variable, and one value of the independent variable against repeated observations of the dependent variable. The latter form always confuses the laboratory staffs about calculation of the fitted regression line and evaluation of the measurement uncertainty. For this reason, this paper will focus on how to evaluate the measurement uncertainty of the predicted value in a simple linear regression line based on repeated observations. In addition, the analysis of variance (ANOVA) technique will be used to determine which uncertainty evaluation method is selected to avoid underestimating the measurement uncertainty.
{"title":"Uncertainty Evaluation of the Predicted Value in Regression Analysis Based on Repeated Observations","authors":"C. Hung","doi":"10.51843/wsproceedings.2018.13","DOIUrl":"https://doi.org/10.51843/wsproceedings.2018.13","url":null,"abstract":"Regression analysis is a practical statistical technique. It is mainly used to estimate the relationship among variables and then predict the unknown observations. In metrology, the calibration curve is an application of regression analysis, which describes the relationship between standard values and indications, or nominal values and standard values. According to ISO/IEC 17025:2005, the calibration certificates shall include the measurement uncertainty. Thus, when the standard value is obtained by a calibration curve, the uncertainty of the predicted value should be considered as an additional uncertainty component. The regression line can be fitted by estimating the regression coefficients from the observed data set. However, the observed data set may have different forms, such as one value of the independent variable against one observation of the dependent variable, and one value of the independent variable against repeated observations of the dependent variable. The latter form always confuses the laboratory staffs about calculation of the fitted regression line and evaluation of the measurement uncertainty. For this reason, this paper will focus on how to evaluate the measurement uncertainty of the predicted value in a simple linear regression line based on repeated observations. In addition, the analysis of variance (ANOVA) technique will be used to determine which uncertainty evaluation method is selected to avoid underestimating the measurement uncertainty.","PeriodicalId":120844,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2018","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121535340","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2018.01
S. Sidney
After taking more than six years to establish and get off the ground, the National Laboratory Association • South Africa (NLA-SA) established a Certification for Persons Scheme for calibration technicians in 2008. During 2010 the first metrologist/calibration technicians were certified under this scheme which was aptly named MetCert (Metrologist Certification). Whilst adoption was initially slow, certification gathered substantial momentum once professional recognition became a requirement by local regulations and the local accreditor adopted MetCert as one of three mechanisms to satisfy this requirement. The paper will provide statistics on how many technicians and which fields they hold which certifications will be reported; difficulties and challenges that have been encountered and how they have been dealt with, as well as how to deal with ongoing competency requirements will also be highlighted. The authors of this paper have been intimately involved in the scheme’s development and they will reflect on its current status as well as the positive impact it has had on the South African calibration laboratory environment.
{"title":"The Metcert Cetification Scheme for Calibration Technicians","authors":"S. Sidney","doi":"10.51843/wsproceedings.2018.01","DOIUrl":"https://doi.org/10.51843/wsproceedings.2018.01","url":null,"abstract":"After taking more than six years to establish and get off the ground, the National Laboratory Association • South Africa (NLA-SA) established a Certification for Persons Scheme for calibration technicians in 2008. During 2010 the first metrologist/calibration technicians were certified under this scheme which was aptly named MetCert (Metrologist Certification). Whilst adoption was initially slow, certification gathered substantial momentum once professional recognition became a requirement by local regulations and the local accreditor adopted MetCert as one of three mechanisms to satisfy this requirement. The paper will provide statistics on how many technicians and which fields they hold which certifications will be reported; difficulties and challenges that have been encountered and how they have been dealt with, as well as how to deal with ongoing competency requirements will also be highlighted. The authors of this paper have been intimately involved in the scheme’s development and they will reflect on its current status as well as the positive impact it has had on the South African calibration laboratory environment.","PeriodicalId":120844,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2018","volume":"2021 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123312632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2018.21
Hau Wah Lai
The operation of electrical and electronic equipment may be affected by disturbances in the supply network. Voltage dips and short interruptions are common disturbances that involve sudden reduction of the supply voltage below a certain voltage level followed by restoration after a short interval. They are usually caused by faults in the electricity supply network such as presence of short circuit or by sudden large variation in electric loading. These unwanted electromagnetic interferences may cause malfunctioning of or even damage to the equipment. Therefore, it is important to conduct voltage dips and short interruptions immunity tests on electrical and electronic products. Voltage dips and short interruptions generators are key equipment for conducting immunity tests and these generators need to be verified. This paper describes a computer aided system developed by the Standards and Calibration Laboratory (SCL) for verification of voltage dips and short interruptions generators in accordance with the international standard IEC 61000-4-11 (2004-03). The parameters that can be calibrated are: ratios of the residual voltages to the rated voltage; the rise time, fall time, overshoot and undershoot of the switching waveform; and the accuracy of the phase angle at switching. A specially built adapter is used to convert the high voltage output waveforms of the generators to lower level signal to be acquired by a digital oscilloscope. An in-house developed software then analyses the captured signal to calculate the required parameters. The paper also discusses the uncertainty evaluations for the measured parameters.
{"title":"Computer Aided Verification of Voltage Dips and Short Interruptions Generators for Electromagnetic Compatibility Immunity Test in Accordance with IEC 61000-4-11:2004 + AMD: 2017","authors":"Hau Wah Lai","doi":"10.51843/wsproceedings.2018.21","DOIUrl":"https://doi.org/10.51843/wsproceedings.2018.21","url":null,"abstract":"The operation of electrical and electronic equipment may be affected by disturbances in the supply network. Voltage dips and short interruptions are common disturbances that involve sudden reduction of the supply voltage below a certain voltage level followed by restoration after a short interval. They are usually caused by faults in the electricity supply network such as presence of short circuit or by sudden large variation in electric loading. These unwanted electromagnetic interferences may cause malfunctioning of or even damage to the equipment. Therefore, it is important to conduct voltage dips and short interruptions immunity tests on electrical and electronic products. Voltage dips and short interruptions generators are key equipment for conducting immunity tests and these generators need to be verified. This paper describes a computer aided system developed by the Standards and Calibration Laboratory (SCL) for verification of voltage dips and short interruptions generators in accordance with the international standard IEC 61000-4-11 (2004-03). The parameters that can be calibrated are: ratios of the residual voltages to the rated voltage; the rise time, fall time, overshoot and undershoot of the switching waveform; and the accuracy of the phase angle at switching. A specially built adapter is used to convert the high voltage output waveforms of the generators to lower level signal to be acquired by a digital oscilloscope. An in-house developed software then analyses the captured signal to calculate the required parameters. The paper also discusses the uncertainty evaluations for the measured parameters.","PeriodicalId":120844,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2018","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126151372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2018.06
Matthew Aloisio, Leah Lindstrom, Justin Gilbert, Jennifer Fleenor, Travis Grossman
As part of the 157 Committee's vision to develop opportunities for young professionals, we continue to offer material based on our four core pillars: Technical training, job search, military connection, & mentoring. There are three sub-categories of technical training this paper will address: Training tools, techniques for retaining material, & continuous training. Plus, a special highlight will be given on a STEM initiative titled “Project 2061.”
{"title":"Technical Training - Early Career Professionals: Industry and Military","authors":"Matthew Aloisio, Leah Lindstrom, Justin Gilbert, Jennifer Fleenor, Travis Grossman","doi":"10.51843/wsproceedings.2018.06","DOIUrl":"https://doi.org/10.51843/wsproceedings.2018.06","url":null,"abstract":"As part of the 157 Committee's vision to develop opportunities for young professionals, we continue to offer material based on our four core pillars: Technical training, job search, military connection, & mentoring. There are three sub-categories of technical training this paper will address: Training tools, techniques for retaining material, & continuous training. Plus, a special highlight will be given on a STEM initiative titled “Project 2061.”","PeriodicalId":120844,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2018","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122939183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2018.18
Efrin Busquets Silva
{"title":"Methodology for Estimating the Impact of Metrology in the Manufacturing Industry: Case Study of an Automotive Original Equipment Manufacturer","authors":"Efrin Busquets Silva","doi":"10.51843/wsproceedings.2018.18","DOIUrl":"https://doi.org/10.51843/wsproceedings.2018.18","url":null,"abstract":"","PeriodicalId":120844,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2018","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124747590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2018.36
Michael Rusnack
The CDC’s publication entitled, "Guidelines for Storage and Temperature Monitoring of Refrigerated Vaccines" recommends using a glycol bottle for refrigerator applications. As the glycol acts as a thermal buffer, it reduces probe sensitivity to air temperature fluctuations within the refrigerator cabinet. NIST studies have demonstrated that temperature probes in glycol-filled bottles can more closely approximate vaccine vial temperatures when placed in the same refrigerated area where the vaccine is stored. Current CDC guidance does not specify a specific volume or geometry for the buffer. This leaves open to interpretation the specifics of the buffering methodology. Our review of physical thermal buffers currently utilized in the general industry shows little consistency in the geometric shape, with volumes ranging from 10 to 300 ml. It was also observed that pre-filled syringes as small as 0.25 ml were being stored, which is significantly smaller than the volumes of physical buffering being used. This is especially important with respect to freezing, as the volume of physical buffering would not provide accurate notification of compromised vaccines. The use of telemetry in the measurement and monitoring of equipment is not only necessary but essential to the successful prediction of the unit operation as well as the demonstration of a close approximation of the contents. The telemetry available from the raw air temperature probe will provide valuable information on the unit’s performance both near and long term. One of the multiple telemetry streams that can be derived from the raw air temperature is virtual temperature buffering. That is an algorithmic based representation of the volume to be represented. A fixed buffer assumes the entire content is a single volume, where this is rarely accurate. The application of a virtual temperature buffer, one can accurately simulate any volume and shape that is maintained in the storage unit. With virtual buffering, the effect of an excursion can be accurately applied to each volume rather than a blanket assumption that all volumes are affected the same. This presentation describes the development and evaluation process of a virtual buffering process that has been demonstrated to be highly accurate and repeatable.
{"title":"Accurate Temperature Representation of Stored Goods Using an Algorithm as a Replacement to a Physical Buffer","authors":"Michael Rusnack","doi":"10.51843/wsproceedings.2018.36","DOIUrl":"https://doi.org/10.51843/wsproceedings.2018.36","url":null,"abstract":"The CDC’s publication entitled, \"Guidelines for Storage and Temperature Monitoring of Refrigerated Vaccines\" recommends using a glycol bottle for refrigerator applications. As the glycol acts as a thermal buffer, it reduces probe sensitivity to air temperature fluctuations within the refrigerator cabinet. NIST studies have demonstrated that temperature probes in glycol-filled bottles can more closely approximate vaccine vial temperatures when placed in the same refrigerated area where the vaccine is stored. Current CDC guidance does not specify a specific volume or geometry for the buffer. This leaves open to interpretation the specifics of the buffering methodology. Our review of physical thermal buffers currently utilized in the general industry shows little consistency in the geometric shape, with volumes ranging from 10 to 300 ml. It was also observed that pre-filled syringes as small as 0.25 ml were being stored, which is significantly smaller than the volumes of physical buffering being used. This is especially important with respect to freezing, as the volume of physical buffering would not provide accurate notification of compromised vaccines. The use of telemetry in the measurement and monitoring of equipment is not only necessary but essential to the successful prediction of the unit operation as well as the demonstration of a close approximation of the contents. The telemetry available from the raw air temperature probe will provide valuable information on the unit’s performance both near and long term. One of the multiple telemetry streams that can be derived from the raw air temperature is virtual temperature buffering. That is an algorithmic based representation of the volume to be represented. A fixed buffer assumes the entire content is a single volume, where this is rarely accurate. The application of a virtual temperature buffer, one can accurately simulate any volume and shape that is maintained in the storage unit. With virtual buffering, the effect of an excursion can be accurately applied to each volume rather than a blanket assumption that all volumes are affected the same. This presentation describes the development and evaluation process of a virtual buffering process that has been demonstrated to be highly accurate and repeatable.","PeriodicalId":120844,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2018","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125026621","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2018.27
N. Kaneko
We have been developing a compact Zener voltage generating system as a secondary standard of DC voltage. The main unit of the system includes a temperature-controlled Zener diode module driven with a built-in battery. The module is detachable from an expansion unit with larger battery packs for longer-time battery operation. This system realizes a compact DC voltage standard with maintaining state-of-the-art temporal stability and temperature stability performances of the output voltage. The results of the precise measurements based on a Josephson voltage standard show excellent drift characteristics within 2 ppm/year, small temperature coefficient less than 0.01 ppm/°C and negligible pressure coefficient. This DC voltage standard can be used in laboratories, inter-laboratory comparisons, and beyond such conventional purposes, the main Zener diode module can be installed in a measurement devices, such as digital multimeters, for further improvement of measurement capabilities.
{"title":"Prototype of a Compact Detachable Zener Module for DC Voltage Standard","authors":"N. Kaneko","doi":"10.51843/wsproceedings.2018.27","DOIUrl":"https://doi.org/10.51843/wsproceedings.2018.27","url":null,"abstract":"We have been developing a compact Zener voltage generating system as a secondary standard of DC voltage. The main unit of the system includes a temperature-controlled Zener diode module driven with a built-in battery. The module is detachable from an expansion unit with larger battery packs for longer-time battery operation. This system realizes a compact DC voltage standard with maintaining state-of-the-art temporal stability and temperature stability performances of the output voltage. The results of the precise measurements based on a Josephson voltage standard show excellent drift characteristics within 2 ppm/year, small temperature coefficient less than 0.01 ppm/°C and negligible pressure coefficient. This DC voltage standard can be used in laboratories, inter-laboratory comparisons, and beyond such conventional purposes, the main Zener diode module can be installed in a measurement devices, such as digital multimeters, for further improvement of measurement capabilities.","PeriodicalId":120844,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2018","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129752211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2018.14
C. Tsui, A. Yan, H.M. Lai
The GUM Supplement 2 deals with measurement models with more than one output quantities, which may be mutually correlated. Such measurement models are common in electrical metrology where the measurand can be complex-valued quantities, such as S-parameters. The GUM Supplement 2 describes a Monte Carlo Method (MCM) for evaluating the output quantities, their standard uncertainties, the covariances between them and the coverage region. The Standards and Calibration Laboratory (SCL) has developed six years ago a software tool for evaluation of measurement models for complex-valued quantities in accordance with GUM Supplement 2. The SCL software tool was written in Visual C++ and Visual Basic for Application (VBA), with Microsoft Excel as frontend user interface. As MCM involves large number of repetitive computations, this old SCL software tool has long processing time especially for complicated measurement models such as coaxial airline. Nowadays many personal computers are equipped with Graphics Processing Unit (GPU) containing massive number of floating point cores. A high end GPU may have nearly 2000 cores while the main CPU normally has only up to 4 cores. As MCM is well suited to parallel processing, to speed up the uncertainty computation, SCL has ported the algorithm to GPU using the Open Computing Language (OpenCL) which was specially designed to support parallel computing. The new SCL tool is an add-on module to Microsoft Excel which allows uncertainty budget listed in spreadsheet table to be calculated by MCM. GPU from the major suppliers Nvidia, AMD and Intel are supported. The uncertainty computation time can be reduced by more than ten times. This paper describes the design and implementation of this new software tool.
GUM补充2处理具有多个输出量的测量模型，这些输出量可能是相互相关的。这种测量模型在电气计量中很常见，其中被测量量可以是复值量，例如s参数。GUM补充2描述了一种蒙特卡罗方法(MCM)，用于评估输出量、它们的标准不确定度、它们与覆盖区域之间的协方差。标准及校正实验所(标准校正实验所)于六年前开发了一套软件工具，用于根据GUM补充条例2评估复杂数值的测量模型。SCL软件工具使用Visual c++和Visual Basic for Application (VBA)编写，前端用户界面采用Microsoft Excel。由于MCM涉及大量的重复计算，这种旧的SCL软件工具处理时间长，特别是对于同轴航线等复杂的测量模型。如今，许多个人计算机都配备了包含大量浮点核的图形处理单元(GPU)。高端GPU可能有近2000个核心，而主CPU通常只有4个核心。由于MCM非常适合并行处理，为了加快不确定性计算的速度，SCL使用专门为支持并行计算而设计的开放计算语言(OpenCL)将该算法移植到GPU上。新的SCL工具是Microsoft Excel的附加模块，它允许MCM计算电子表格中列出的不确定性预算。支持主要供应商英伟达、AMD和英特尔的GPU。不确定度计算时间可减少十倍以上。本文描述了这一新的软件工具的设计与实现。
{"title":"Speeding up Monte Carlo Computations by Parallel Processing Using GPU for Uncertainty Evaluation in Accordance with GUM Supplement 2","authors":"C. Tsui, A. Yan, H.M. Lai","doi":"10.51843/wsproceedings.2018.14","DOIUrl":"https://doi.org/10.51843/wsproceedings.2018.14","url":null,"abstract":"The GUM Supplement 2 deals with measurement models with more than one output quantities, which may be mutually correlated. Such measurement models are common in electrical metrology where the measurand can be complex-valued quantities, such as S-parameters. The GUM Supplement 2 describes a Monte Carlo Method (MCM) for evaluating the output quantities, their standard uncertainties, the covariances between them and the coverage region. The Standards and Calibration Laboratory (SCL) has developed six years ago a software tool for evaluation of measurement models for complex-valued quantities in accordance with GUM Supplement 2. The SCL software tool was written in Visual C++ and Visual Basic for Application (VBA), with Microsoft Excel as frontend user interface. As MCM involves large number of repetitive computations, this old SCL software tool has long processing time especially for complicated measurement models such as coaxial airline. Nowadays many personal computers are equipped with Graphics Processing Unit (GPU) containing massive number of floating point cores. A high end GPU may have nearly 2000 cores while the main CPU normally has only up to 4 cores. As MCM is well suited to parallel processing, to speed up the uncertainty computation, SCL has ported the algorithm to GPU using the Open Computing Language (OpenCL) which was specially designed to support parallel computing. The new SCL tool is an add-on module to Microsoft Excel which allows uncertainty budget listed in spreadsheet table to be calculated by MCM. GPU from the major suppliers Nvidia, AMD and Intel are supported. The uncertainty computation time can be reduced by more than ten times. This paper describes the design and implementation of this new software tool.","PeriodicalId":120844,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2018","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129280489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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