The pulse height distribution (PHD) functions of partial discharges (PDs) generated by AC voltage in air are investigated. The electrode systems used allow the investigation of single-source PDs and/or multiple-source discharges. Because voltage and the electrode configuration alter the PHD functions of even a single PD source, the overall effect of voltage an multiple-source discharges is rather complicated. The results indicate that the PHD functions of the multiple-source discharges are the superposition of the distribution functions of the discharges and the component sources acting alone. Knowledge of the PHD functions of the typical PD sources together with some kind of deconvolution technique could help in interpreting the results of PD measurements performed on more complex, real insulation systems and, perhaps, identify the main sources of PD in those systems. >
{"title":"Pulse height analysis of partial discharges in air","authors":"B. Florkowska, R. Włodek","doi":"10.1109/14.249366","DOIUrl":"https://doi.org/10.1109/14.249366","url":null,"abstract":"The pulse height distribution (PHD) functions of partial discharges (PDs) generated by AC voltage in air are investigated. The electrode systems used allow the investigation of single-source PDs and/or multiple-source discharges. Because voltage and the electrode configuration alter the PHD functions of even a single PD source, the overall effect of voltage an multiple-source discharges is rather complicated. The results indicate that the PHD functions of the multiple-source discharges are the superposition of the distribution functions of the discharges and the component sources acting alone. Knowledge of the PHD functions of the typical PD sources together with some kind of deconvolution technique could help in interpreting the results of PD measurements performed on more complex, real insulation systems and, perhaps, identify the main sources of PD in those systems. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1993-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90664257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A variety of definitions related to partial discharge (PD) phenomena are discussed. There is no general agreement at this time of writing as to the definitions of the various regimes of PD. A certain confusion exists which may be due to the multitude of PD manifestations. An attempt is made to elucidate some aspects of the PD definitions. Related problems needing more work are noted. >
{"title":"The definitions used for partial discharge phenomena","authors":"M. Danikas","doi":"10.1109/14.249381","DOIUrl":"https://doi.org/10.1109/14.249381","url":null,"abstract":"A variety of definitions related to partial discharge (PD) phenomena are discussed. There is no general agreement at this time of writing as to the definitions of the various regimes of PD. A certain confusion exists which may be due to the multitude of PD manifestations. An attempt is made to elucidate some aspects of the PD definitions. Related problems needing more work are noted. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1993-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73197722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Partial discharges measurements in power capacitors have been carried out using a digital technique. The advantages of the use of this digital technique are discussed. The digital equipment design is presented. Test results on industrial all-film power capacitors with high capacitance values are presented together with measurements of the PDIV before and after the endurance tests. >
{"title":"Digital measurement of partial discharges in full-sized power capacitors","authors":"C. Hantouche, D. Fortune","doi":"10.1109/14.249376","DOIUrl":"https://doi.org/10.1109/14.249376","url":null,"abstract":"Partial discharges measurements in power capacitors have been carried out using a digital technique. The advantages of the use of this digital technique are discussed. The digital equipment design is presented. Test results on industrial all-film power capacitors with high capacitance values are presented together with measurements of the PDIV before and after the endurance tests. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1993-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75129680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This paper proposes that the injection of an impulse, at a suitable time on a power frequency voltage wave, can trigger the inception of partial discharges. In this way a deterministic component is introduced into the observation of partial discharge activity and the ability to minimize the influence of noise in a measurement is enhanced considerably. Two simple experiments are described which demonstrate the triggered inception of partial discharges and the strong 'focusing' effect of the triggering impulse, whereby the discharge activity is concentrated immediately after the injection of the impulse and a significant 'quiet' period follows in which minimal discharge activity occurs. >
{"title":"Partial discharge measurements using tailored excitation waveforms","authors":"C. G. Jenkinson, J. Reynders","doi":"10.1109/14.249380","DOIUrl":"https://doi.org/10.1109/14.249380","url":null,"abstract":"This paper proposes that the injection of an impulse, at a suitable time on a power frequency voltage wave, can trigger the inception of partial discharges. In this way a deterministic component is introduced into the observation of partial discharge activity and the ability to minimize the influence of noise in a measurement is enhanced considerably. Two simple experiments are described which demonstrate the triggered inception of partial discharges and the strong 'focusing' effect of the triggering impulse, whereby the discharge activity is concentrated immediately after the injection of the impulse and a significant 'quiet' period follows in which minimal discharge activity occurs. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1993-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82669774","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Two different methods for classifying partial discharge (PD) phenomena by a personal-computer-aided system are described. The first is concerned with common minimum distance classification, using statistical data on pulse quantities such as apparent charge, energy and phase. Applying the correct algorithms and features, such a system is able to discriminate between unknown defects using conventional discharge patterns. Classification with neural networks, which offers the possibility of classifying the shape of the PD pulses without using statistical tools for data reduction, is also discussed. Examples of diagnostic decisions are shown for a gas-insulated-switchgear system with several artificially introduced defects. The reliability of the diagnosis is estimated for both time-resolved detection evaluated by neural networks and classic phase-resolved PD evaluation. A two-step strategy of time-resolved preclassification and automated phase-resolved evaluation is introduced. >
{"title":"Diagnosis of partial discharge signals using neural networks and minimum distance classification","authors":"H. Kranz","doi":"10.1109/14.249375","DOIUrl":"https://doi.org/10.1109/14.249375","url":null,"abstract":"Two different methods for classifying partial discharge (PD) phenomena by a personal-computer-aided system are described. The first is concerned with common minimum distance classification, using statistical data on pulse quantities such as apparent charge, energy and phase. Applying the correct algorithms and features, such a system is able to discriminate between unknown defects using conventional discharge patterns. Classification with neural networks, which offers the possibility of classifying the shape of the PD pulses without using statistical tools for data reduction, is also discussed. Examples of diagnostic decisions are shown for a gas-insulated-switchgear system with several artificially introduced defects. The reliability of the diagnosis is estimated for both time-resolved detection evaluated by neural networks and classic phase-resolved PD evaluation. A two-step strategy of time-resolved preclassification and automated phase-resolved evaluation is introduced. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1993-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87608890","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The need for improved standardization procedures for use on different types of partial discharge (PD) measuring systems is discussed. This requirement is examined using recording and processing data of complex PD signals obtained from in-service electrical apparatus. It is concluded that more fundamental knowledge of the PD mechanisms must be gained before any significant changes in existing calibration procedures can be made. >
{"title":"A critique of present calibration procedures for partial discharge measurements","authors":"W. Zaengl, K. Lehmann","doi":"10.1109/14.249377","DOIUrl":"https://doi.org/10.1109/14.249377","url":null,"abstract":"The need for improved standardization procedures for use on different types of partial discharge (PD) measuring systems is discussed. This requirement is examined using recording and processing data of complex PD signals obtained from in-service electrical apparatus. It is concluded that more fundamental knowledge of the PD mechanisms must be gained before any significant changes in existing calibration procedures can be made. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1993-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84870432","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The significance of memory propagation in controlling the stochastic behavior of partial-discharge phenomena is demonstrated by determination of various conditional amplitude and phase-of-occurrence distributions for both measured and simulated discharge pulses. A system that can be used to measure directly a set of both conditional and unconditional pulse amplitude and phase distributions needed to reveal memory effects and quantify the phase-resolved stochastic properties of partial-discharge pulses, is briefly described. It is argued that not only is an unraveling of memory effects essential in any attempt to understand the physical basis for the observed stochastic behavior of partial-discharge phenomena, but also that the data on conditional distributions provide additional statistical information that may be needed to optimize the reliability of partial-discharge pattern recognition schemes now being considered for use in insulation testing. >
{"title":"Importance of unraveling memory propagation effects in interpreting data on partial discharge statistics","authors":"R. J. Brunt, E. W. Cernyar, P. V. Glahn","doi":"10.1109/14.249364","DOIUrl":"https://doi.org/10.1109/14.249364","url":null,"abstract":"The significance of memory propagation in controlling the stochastic behavior of partial-discharge phenomena is demonstrated by determination of various conditional amplitude and phase-of-occurrence distributions for both measured and simulated discharge pulses. A system that can be used to measure directly a set of both conditional and unconditional pulse amplitude and phase distributions needed to reveal memory effects and quantify the phase-resolved stochastic properties of partial-discharge pulses, is briefly described. It is argued that not only is an unraveling of memory effects essential in any attempt to understand the physical basis for the observed stochastic behavior of partial-discharge phenomena, but also that the data on conditional distributions provide additional statistical information that may be needed to optimize the reliability of partial-discharge pattern recognition schemes now being considered for use in insulation testing. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1993-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89426416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The author points out that hot electrons generated in dielectrics subjected to high electrical field strengths can produce highly reactive chemical species which contribute to the aging process. The study of the interaction of such low energy (0 to 15 eV) electrons near the surface of dielectrics in experiments combining cryogenic thin film deposition and high-resolution low-energy electron-beam techniques is discussed. Examples of the results obtained with thin film atomic and molecular solids are used to illustrate the basic mechanisms which control the electron-dielectric interactions and provide a description of the basic degradation processes involved during electronic aging. It is shown that elastic and quasi-elastic scattering of hot electrons in dielectrics can be described in terms of band structure parameters, whereas inelastic scattering is often governed by the formation of transient anions. These anions can decay by stabilization, by producing vibrationally and electronically excited molecules, or by dissociating into a stable anion and a neutral radical. These latter species usually initiate other reactions with nearby molecules, causing further chemical damage. >
{"title":"Electronic aging and related electron interactions in thin-film dielectrics","authors":"L. Sanche","doi":"10.1109/14.237742","DOIUrl":"https://doi.org/10.1109/14.237742","url":null,"abstract":"The author points out that hot electrons generated in dielectrics subjected to high electrical field strengths can produce highly reactive chemical species which contribute to the aging process. The study of the interaction of such low energy (0 to 15 eV) electrons near the surface of dielectrics in experiments combining cryogenic thin film deposition and high-resolution low-energy electron-beam techniques is discussed. Examples of the results obtained with thin film atomic and molecular solids are used to illustrate the basic mechanisms which control the electron-dielectric interactions and provide a description of the basic degradation processes involved during electronic aging. It is shown that elastic and quasi-elastic scattering of hot electrons in dielectrics can be described in terms of band structure parameters, whereas inelastic scattering is often governed by the formation of transient anions. These anions can decay by stabilization, by producing vibrationally and electronically excited molecules, or by dissociating into a stable anion and a neutral radical. These latter species usually initiate other reactions with nearby molecules, causing further chemical damage. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1993-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88667975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The author comments on some of the statements made about the aging compensation effect (ACE) correlation by J.P. Crine (ibid., vol.26, pp.811-818, 1991) and on discussions of it elsewhere in the literature. >
{"title":"The compensation law revisited: application to dielectric aging","authors":"P. Dávid","doi":"10.1109/14.237750","DOIUrl":"https://doi.org/10.1109/14.237750","url":null,"abstract":"The author comments on some of the statements made about the aging compensation effect (ACE) correlation by J.P. Crine (ibid., vol.26, pp.811-818, 1991) and on discussions of it elsewhere in the literature. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1993-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90282942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Alternatives to the method proposed by F. Yildirim and C. Korasli (ibid., vol.27, no.6, pp.1186-1192, 1992) for estimation of parameters of a three-parameter Weibull distribution are given. Corrections are also given for formulas presented in that paper. Yildirim and Korasli, in a reply, point out that their calculations utilized corrected formulas. >
F. Yildirim和C. Korasli提出的方法的替代方案(同上，第27卷，第7号)。给出了三参数威布尔分布的参数估计。对文中提出的公式也作了修正。耶尔德勒姆和科拉斯利在回复中指出，他们的计算使用了修正后的公式。>
{"title":"Statistical approach for determining breakdown voltage of gas-insulated cables","authors":"G. Montanari, M. Cacciari","doi":"10.1109/14.237749","DOIUrl":"https://doi.org/10.1109/14.237749","url":null,"abstract":"Alternatives to the method proposed by F. Yildirim and C. Korasli (ibid., vol.27, no.6, pp.1186-1192, 1992) for estimation of parameters of a three-parameter Weibull distribution are given. Corrections are also given for formulas presented in that paper. Yildirim and Korasli, in a reply, point out that their calculations utilized corrected formulas. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1993-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73456523","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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