Pub Date : 2012-10-22DOI: 10.1109/AUTEST.2012.6334537
Sok Lao
From a hardware standpoint, integrating mobile devices into ATE Systems is relatively simple. All that is needed is a wireless access point (WAP), a WiFi enabled mobile device, and an ATE System that has accessible network connection to the WAP. From a software standpoint, things are considerably different and more complex.
{"title":"Integration of mobile devices and ATE systems","authors":"Sok Lao","doi":"10.1109/AUTEST.2012.6334537","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334537","url":null,"abstract":"From a hardware standpoint, integrating mobile devices into ATE Systems is relatively simple. All that is needed is a wireless access point (WAP), a WiFi enabled mobile device, and an ATE System that has accessible network connection to the WAP. From a software standpoint, things are considerably different and more complex.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"282 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131651982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-22DOI: 10.1109/AUTEST.2012.6334585
A. Kozminski
The operator interface is the critical link between a test system and its operator. When a test fails, the operator must quickly process the results and decide whether to troubleshoot, rerun or halt the test based on information displayed by the software. An effective and well-designed operator interface can increase productivity, reduce testing time and operator error as well as improve adoption of the software. Whether the interface displays a simple pass/fail status or offers sophisticated troubleshooting operations, implementing a good user interface experience can be a challenging task. Windows Presentation Foundation (WPF) is a user interface framework for building Windows client applications with immersive and intuitive user experiences. WPF combines the application user interface, 2D graphics, 3D graphics, documents and multimedia into one single framework to help developers create rich and interactive applications. This framework was created to help developers meet increasing expectations of the experience and usability of software applications. WPF facilitates the creation of high-quality user interfaces that stand out amongst competitors and help test operators accomplish their tasks faster with less opportunity for error. Windows Presentation Foundation provides developers with the tools needed to more rapidly iterate on the UI and reach a better quality user interface in a shorter amount of time. This paper discusses the fundamental principles behind Windows Presentation Foundation technology and demonstrates the advantages of building test operator interfaces using this modern design framework.
操作界面是测试系统与其操作人员之间的关键环节。当测试失败时，操作员必须快速处理结果，并根据软件显示的信息决定是否进行故障排除、重新运行或停止测试。一个有效且设计良好的操作界面可以提高生产率，减少测试时间和操作错误，并提高软件的采用率。无论界面显示简单的通过/失败状态还是提供复杂的故障排除操作，实现良好的用户界面体验都可能是一项具有挑战性的任务。Windows Presentation Foundation (WPF)是一个用户界面框架，用于构建具有沉浸式和直观用户体验的Windows客户端应用程序。WPF将应用程序用户界面、2D图形、3D图形、文档和多媒体结合到一个框架中，以帮助开发人员创建丰富的交互式应用程序。创建这个框架是为了帮助开发人员满足对软件应用程序的体验和可用性日益增长的期望。WPF有助于创建在竞争对手中脱颖而出的高质量用户界面，并帮助测试操作员更快地完成任务，减少出错的机会。Windows Presentation Foundation为开发人员提供了所需的工具，以更快地迭代UI，并在更短的时间内获得更高质量的用户界面。本文讨论了Windows Presentation Foundation技术背后的基本原理，并演示了使用这种现代设计框架构建测试操作员界面的优点。
{"title":"Windows Presentation Foundation (WPF) technology meets the challenges of operator interface design in automatic test systems","authors":"A. Kozminski","doi":"10.1109/AUTEST.2012.6334585","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334585","url":null,"abstract":"The operator interface is the critical link between a test system and its operator. When a test fails, the operator must quickly process the results and decide whether to troubleshoot, rerun or halt the test based on information displayed by the software. An effective and well-designed operator interface can increase productivity, reduce testing time and operator error as well as improve adoption of the software. Whether the interface displays a simple pass/fail status or offers sophisticated troubleshooting operations, implementing a good user interface experience can be a challenging task. Windows Presentation Foundation (WPF) is a user interface framework for building Windows client applications with immersive and intuitive user experiences. WPF combines the application user interface, 2D graphics, 3D graphics, documents and multimedia into one single framework to help developers create rich and interactive applications. This framework was created to help developers meet increasing expectations of the experience and usability of software applications. WPF facilitates the creation of high-quality user interfaces that stand out amongst competitors and help test operators accomplish their tasks faster with less opportunity for error. Windows Presentation Foundation provides developers with the tools needed to more rapidly iterate on the UI and reach a better quality user interface in a shorter amount of time. This paper discusses the fundamental principles behind Windows Presentation Foundation technology and demonstrates the advantages of building test operator interfaces using this modern design framework.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128880530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-22DOI: 10.1109/AUTEST.2012.6334527
S. Strasser, E. Howard, J. Sheppard
Today's diagnostic systems can generate a large amount data. Data from sources such as onboard reasoners and historical maintenance data are often stored in heterogeneous systems and cannot be collected immediately and aggregated for use. In our previous work we described a software visualization tool that allowed integration of different data sources and displayed the data with elements organized according to maintenance-oriented ontologies. This tool allows users to search quickly through available data to locate interesting relationships in the sequences of maintenance events. Additional previous work described a diagnostic maturation tool, called ModelMat, that updates causal relationships in a Timed Failure Propagation Graph based on historical diagnostic session data. In this paper, we present an update to both of these projects discussing enhancements to each as well as work in progress to create a single, integrated toolset, called Bobcat, to support ontology-guided diagnostic knowledge discovery.
{"title":"An integrated toolset for ontology-guided diagnostic knowledge discovery","authors":"S. Strasser, E. Howard, J. Sheppard","doi":"10.1109/AUTEST.2012.6334527","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334527","url":null,"abstract":"Today's diagnostic systems can generate a large amount data. Data from sources such as onboard reasoners and historical maintenance data are often stored in heterogeneous systems and cannot be collected immediately and aggregated for use. In our previous work we described a software visualization tool that allowed integration of different data sources and displayed the data with elements organized according to maintenance-oriented ontologies. This tool allows users to search quickly through available data to locate interesting relationships in the sequences of maintenance events. Additional previous work described a diagnostic maturation tool, called ModelMat, that updates causal relationships in a Timed Failure Propagation Graph based on historical diagnostic session data. In this paper, we present an update to both of these projects discussing enhancements to each as well as work in progress to create a single, integrated toolset, called Bobcat, to support ontology-guided diagnostic knowledge discovery.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131864783","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-22DOI: 10.1109/AUTEST.2012.6334541
P. F. Austin
Automatic Test Equipment (ATE) Engineering often involves modernization of legacy test systems. With anticipated reductions in the DoD budgets and increasing system test complexity, modernization can be quite challenging. Most of the time these legacy systems have minimal or occasionally no documentation. How do you get from an aging legacy system lacking documentation to an updated modern test system that is highly capable and fully documented and validated? The challenges are many. Missing test requirements, outdated software revisions, partial product specifications, no Test Program Set (TPS) definition, lack of operating system updates, outdated vendor-supplied software drivers, instrument and component obsolescence, customer data system compatibility requirements issues, and system build software not defined, just to name a few. This paper will discuss getting from a confused, unorganized place to one that's meaningful, containing complete requirements, design, and validation documentation using a robust Systems Engineering (SE) design approach. This paper will trace how to efficiently achieve good performance and suggest a logical way to get there, employing modular principles for today and be able to reuse them for tomorrow's challenges. What are good and bad approaches to this problem? Information about design choices and how they can lead to success will be discussed.
{"title":"Applying system engineering processes to legacy test program set modernization","authors":"P. F. Austin","doi":"10.1109/AUTEST.2012.6334541","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334541","url":null,"abstract":"Automatic Test Equipment (ATE) Engineering often involves modernization of legacy test systems. With anticipated reductions in the DoD budgets and increasing system test complexity, modernization can be quite challenging. Most of the time these legacy systems have minimal or occasionally no documentation. How do you get from an aging legacy system lacking documentation to an updated modern test system that is highly capable and fully documented and validated? The challenges are many. Missing test requirements, outdated software revisions, partial product specifications, no Test Program Set (TPS) definition, lack of operating system updates, outdated vendor-supplied software drivers, instrument and component obsolescence, customer data system compatibility requirements issues, and system build software not defined, just to name a few. This paper will discuss getting from a confused, unorganized place to one that's meaningful, containing complete requirements, design, and validation documentation using a robust Systems Engineering (SE) design approach. This paper will trace how to efficiently achieve good performance and suggest a logical way to get there, employing modular principles for today and be able to reuse them for tomorrow's challenges. What are good and bad approaches to this problem? Information about design choices and how they can lead to success will be discussed.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"733 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128308171","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-22DOI: 10.1109/AUTEST.2012.6334549
R. G. Wright
This paper describes the exploitation of spurious unwanted electromagnetic emissions from electronic circuits as a means to test and diagnose failures and performance anomalies within circuit cards and assemblies. Enhanced diagnostic capability with order-of-magnitude reduction in development and recurring costs as well as development time are likely outcomes of the successful realization of this approach. Testing is accomplished using non-contact methods providing a means to establish virtual test connectors throughout multi-layer circuit cards. Signals within electromagnetic fields that emanate across the frequency spectrum can be acquired and measured without removing protective conformal coatings. Signal propagation through the circuit card and between components is readily discernible using this technique, and the information content and intelligence contained within these signals can be used to determine the existence and the nature of faults, and probable fault location(s). Results achieved to date also indicate that electromagnetic field anomalies can reveal the existence of marginally performing components that may fail prematurely or where failure is imminent.
{"title":"Circuit card test and diagnosis using electromagnetic emission analysis","authors":"R. G. Wright","doi":"10.1109/AUTEST.2012.6334549","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334549","url":null,"abstract":"This paper describes the exploitation of spurious unwanted electromagnetic emissions from electronic circuits as a means to test and diagnose failures and performance anomalies within circuit cards and assemblies. Enhanced diagnostic capability with order-of-magnitude reduction in development and recurring costs as well as development time are likely outcomes of the successful realization of this approach. Testing is accomplished using non-contact methods providing a means to establish virtual test connectors throughout multi-layer circuit cards. Signals within electromagnetic fields that emanate across the frequency spectrum can be acquired and measured without removing protective conformal coatings. Signal propagation through the circuit card and between components is readily discernible using this technique, and the information content and intelligence contained within these signals can be used to determine the existence and the nature of faults, and probable fault location(s). Results achieved to date also indicate that electromagnetic field anomalies can reveal the existence of marginally performing components that may fail prematurely or where failure is imminent.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114230321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-22DOI: 10.1109/AUTEST.2012.6334583
T. Lopes
Most Automatic Test System environments create an abstraction layer that sits between the test program and the instruments drivers, a wrapper. This paper provides an overview of existing wrapper implementations, describes the benefits of abstraction layers, primarily to facilitate instrument replacement, and explores using the architecture defined by IVI to implement wrappers. Use of both existing IVI classes and new custom classes are discussed.
{"title":"Leveraging IVI for instrument wrapper development","authors":"T. Lopes","doi":"10.1109/AUTEST.2012.6334583","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334583","url":null,"abstract":"Most Automatic Test System environments create an abstraction layer that sits between the test program and the instruments drivers, a wrapper. This paper provides an overview of existing wrapper implementations, describes the benefits of abstraction layers, primarily to facilitate instrument replacement, and explores using the architecture defined by IVI to implement wrappers. Use of both existing IVI classes and new custom classes are discussed.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114532672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-22DOI: 10.1109/AUTEST.2012.6334580
Chetan S. Kulkarni, J. Celaya, G. Biswas, K. Goebel
This paper discusses experimental setups for health monitoring and prognostics of electrolytic capacitors under nominal operation and accelerated aging conditions. Electrolytic capacitors have higher failure rates than other components in electronic systems like power drives, power converters etc. Our current work focuses on developing first-principles-based degradation models for electrolytic capacitors under varying electrical and thermal stress conditions. Prognostics and health management for electronic systems aims to predict the onset of faults, study causes for system degradation, and accurately compute remaining useful life. Accelerated life test methods are often used in prognostics research as a way to model multiple causes and assess the effects of the degradation process through time. It also allows for the identification and study of different failure mechanisms and their relationships under different operating conditions. Experiments are designed for aging of the capacitors such that the degradation pattern induced by the aging can be monitored and analyzed. Experimental setups and data collection methods are presented to demonstrate this approach.
{"title":"Accelerated aging experiments for capacitor health monitoring and prognostics","authors":"Chetan S. Kulkarni, J. Celaya, G. Biswas, K. Goebel","doi":"10.1109/AUTEST.2012.6334580","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334580","url":null,"abstract":"This paper discusses experimental setups for health monitoring and prognostics of electrolytic capacitors under nominal operation and accelerated aging conditions. Electrolytic capacitors have higher failure rates than other components in electronic systems like power drives, power converters etc. Our current work focuses on developing first-principles-based degradation models for electrolytic capacitors under varying electrical and thermal stress conditions. Prognostics and health management for electronic systems aims to predict the onset of faults, study causes for system degradation, and accurately compute remaining useful life. Accelerated life test methods are often used in prognostics research as a way to model multiple causes and assess the effects of the degradation process through time. It also allows for the identification and study of different failure mechanisms and their relationships under different operating conditions. Experiments are designed for aging of the capacitors such that the degradation pattern induced by the aging can be monitored and analyzed. Experimental setups and data collection methods are presented to demonstrate this approach.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123383181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-22DOI: 10.1109/AUTEST.2012.6334579
T. Fay
IPv6 has been an evolving, relatively mature, but poorly-adopted internet protocol standard for a number of years. The original motivation for IPv6 was to work around exhausting the IPv4 address space used by the original internet protocol. Already, the last large free blocks of IPv4 addresses have been allocated to particular geographic regions for them to sub-allocate within their regions. In many regions of the world, IPv6 addresses will soon become the only addresses available for remote access to new devices, including remote access to instruments supporting LAN control connections. IPv6 brings advantages of its own, as well. Stateless address autoconfiguration (SLAAC) makes it easier to set up IPv6 devices with stable global and local IPv6 addresses with nothing but IPv6-enabled routers, which are becoming much more common. Coupled with LXI-supported zero configuration hostnames via mDNS, that reduces the administration required to set up LAN-based instruments in a test system. In practical terms, IPv4 will continue to see wide use, so LXI instruments will maintain support for IPv4 while adding support for IPv6. Most LAN-based instruments are used only on the local subnet, which can continue to use and re-use the local DHCPsupplied IPv4 addresses for instruments. It is only when subnets become IPv6-only or when instrument connections must be made over the WAN that IPv6 becomes more important. This paper describes key aspects of IPv6 as they relate to instrument control and how the LXI Consortium has adopted a new LXI IPv6 standard to make observing and controlling LXI instruments over IPv6 easy. Among the IPv6 aspects covered are real-world experiences setting up IPv6 access to instruments with existing networking infrastructure.
{"title":"Preparing for an IPv6 world with LXI instruments","authors":"T. Fay","doi":"10.1109/AUTEST.2012.6334579","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334579","url":null,"abstract":"IPv6 has been an evolving, relatively mature, but poorly-adopted internet protocol standard for a number of years. The original motivation for IPv6 was to work around exhausting the IPv4 address space used by the original internet protocol. Already, the last large free blocks of IPv4 addresses have been allocated to particular geographic regions for them to sub-allocate within their regions. In many regions of the world, IPv6 addresses will soon become the only addresses available for remote access to new devices, including remote access to instruments supporting LAN control connections. IPv6 brings advantages of its own, as well. Stateless address autoconfiguration (SLAAC) makes it easier to set up IPv6 devices with stable global and local IPv6 addresses with nothing but IPv6-enabled routers, which are becoming much more common. Coupled with LXI-supported zero configuration hostnames via mDNS, that reduces the administration required to set up LAN-based instruments in a test system. In practical terms, IPv4 will continue to see wide use, so LXI instruments will maintain support for IPv4 while adding support for IPv6. Most LAN-based instruments are used only on the local subnet, which can continue to use and re-use the local DHCPsupplied IPv4 addresses for instruments. It is only when subnets become IPv6-only or when instrument connections must be made over the WAN that IPv6 becomes more important. This paper describes key aspects of IPv6 as they relate to instrument control and how the LXI Consortium has adopted a new LXI IPv6 standard to make observing and controlling LXI instruments over IPv6 easy. Among the IPv6 aspects covered are real-world experiences setting up IPv6 access to instruments with existing networking infrastructure.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131500470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-22DOI: 10.1109/AUTEST.2012.6334522
F. J. Maldonado, S. Oonk, T. Politopoulos
This paper discusses a Structural Health Monitoring framework developed for aircraft airframes, where the objective is high performance vibration-based diagnostics using validated data from low power and miniaturized smart sensors. Although considerable research has been devoted to the structural health monitoring discipline, successful field implementations have not been widely achieved. This research presents a new embedded solution by integrating several state-of-the-art technologies. The system architecture is divided into two levels, with the low level built on embedded smart sensors capable of: self-diagnostics; high performance data acquisition; advanced vibration analysis; embedded admittance measurements; elastic wave generation; and wireless communications. A key capability is sensor data validation using an electromechanical impedance method, where failures in piezoelectric transducer elements as well as damage to the host structure are detected. Then, at the next level is a computation system hosting a graphical user interface with visualization methods, a feature extraction toolset, and advanced artificial neural network diagnostics. The overall goal of this research effort was to develop a system architecture with smart sensors and intelligent processing to be deployed in aircraft for the detection and isolation of global and incipient failures.
{"title":"Enhancing vibration analysis by embedded sensor data validation technologies","authors":"F. J. Maldonado, S. Oonk, T. Politopoulos","doi":"10.1109/AUTEST.2012.6334522","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334522","url":null,"abstract":"This paper discusses a Structural Health Monitoring framework developed for aircraft airframes, where the objective is high performance vibration-based diagnostics using validated data from low power and miniaturized smart sensors. Although considerable research has been devoted to the structural health monitoring discipline, successful field implementations have not been widely achieved. This research presents a new embedded solution by integrating several state-of-the-art technologies. The system architecture is divided into two levels, with the low level built on embedded smart sensors capable of: self-diagnostics; high performance data acquisition; advanced vibration analysis; embedded admittance measurements; elastic wave generation; and wireless communications. A key capability is sensor data validation using an electromechanical impedance method, where failures in piezoelectric transducer elements as well as damage to the host structure are detected. Then, at the next level is a computation system hosting a graphical user interface with visualization methods, a feature extraction toolset, and advanced artificial neural network diagnostics. The overall goal of this research effort was to develop a system architecture with smart sensors and intelligent processing to be deployed in aircraft for the detection and isolation of global and incipient failures.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126843145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-22DOI: 10.1109/AUTEST.2012.6334568
L. Bustamante, H. Al-Asaad
As technology trends keep pushing cell dimensions in semiconductors to smaller geometries and higher densities, modern digital systems are increasingly becoming more vulnerable to reliability issues originated by soft errors. Various techniques used to detect soft errors are accomplished by incorporating redundancy into the hardware or software, but the penalty associated with the added redundancy can be measured by the high cost of the extra hardware or the degradation in performance for software-added redundancy. We are proposing a technique that compromise between hardware and software redundancy approaches. This approach is based on a software time redundancy combined with some hardware assistance. This hybrid technique has the potential to improve performance by adding a limited amount of hardware assistance when compared with a common time redundancy approach. It is also designed to set a foundation for further investigation into variations of this technique to improve soft error detection with better performance and less hardware.
{"title":"Soft error detection via double execution with hardware assistance","authors":"L. Bustamante, H. Al-Asaad","doi":"10.1109/AUTEST.2012.6334568","DOIUrl":"https://doi.org/10.1109/AUTEST.2012.6334568","url":null,"abstract":"As technology trends keep pushing cell dimensions in semiconductors to smaller geometries and higher densities, modern digital systems are increasingly becoming more vulnerable to reliability issues originated by soft errors. Various techniques used to detect soft errors are accomplished by incorporating redundancy into the hardware or software, but the penalty associated with the added redundancy can be measured by the high cost of the extra hardware or the degradation in performance for software-added redundancy. We are proposing a technique that compromise between hardware and software redundancy approaches. This approach is based on a software time redundancy combined with some hardware assistance. This hybrid technique has the potential to improve performance by adding a limited amount of hardware assistance when compared with a common time redundancy approach. It is also designed to set a foundation for further investigation into variations of this technique to improve soft error detection with better performance and less hardware.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130362476","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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