首页 > 最新文献

Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)最新文献

英文 中文
Semi-formal test generation with Genevieve 用Genevieve生成半正式测试
J. Dushina, M. Benjamin, D. Geist
This paper describes the first application of the Genevieve test generation methodology. The Genevieve approach uses semi-formal techniques derived from "model-checking" to generate test suites for specific behaviours of the design under test. An "interesting" behaviour is claimed to be unreachable. If a path from an initial state to the state of interest does exist, a counter-example is generated. The sequence of states specifies a test for the desired behaviour. To highlight real problems that could appear during test generation, we chose the Store Data Unit (SDU) of the ST100, a new high performance digital signal processor (DSP) developed by STMicroelectronics. This unit is specifically selected because of the following key issues: 1. big data structures that can not be directly modelled without state explosion, 2. complex control logic that would require an excessive number of tests to exercise exhaustively, 3. a design where it is difficult to determine how to drive the complete system to ensure a given behaviour in the unit under test. The Genevieve methodology allowed us to define a coverage model specifically devoted to covering corner cases of the design. Hence the generated test suite achieved very efficient coverage of corner cases, and checked not only functional correctness but also whether the implementation matched design intent. As a result the Genevieve tests discovered some subtle performance bugs which would otherwise be very difficult to find.
本文描述了Genevieve测试生成方法的第一个应用。Genevieve方法使用源自“模型检查”的半形式化技术,为被测试设计的特定行为生成测试套件。一种“有趣”的行为被认为是无法达到的。如果从初始状态到感兴趣状态的路径确实存在,则生成一个反例。状态序列指定了对所需行为的测试。为了突出在测试生成过程中可能出现的实际问题,我们选择了ST100的存储数据单元(SDU),这是意法半导体开发的一种新型高性能数字信号处理器(DSP)。特别选择本单元是因为以下几个关键问题:1 .没有状态爆炸就无法直接建模的大数据结构;复杂的控制逻辑,将需要大量的测试来彻底地执行,2。一种难以确定如何驱动整个系统以确保被测单元的给定行为的设计。Genevieve方法允许我们定义一个专门用于覆盖设计的边缘案例的覆盖模型。因此,生成的测试套件实现了对角落用例的非常有效的覆盖,并且不仅检查功能正确性,而且检查实现是否与设计意图匹配。因此,Genevieve测试发现了一些微妙的性能错误,否则很难发现这些错误。
{"title":"Semi-formal test generation with Genevieve","authors":"J. Dushina, M. Benjamin, D. Geist","doi":"10.1145/378239.379035","DOIUrl":"https://doi.org/10.1145/378239.379035","url":null,"abstract":"This paper describes the first application of the Genevieve test generation methodology. The Genevieve approach uses semi-formal techniques derived from \"model-checking\" to generate test suites for specific behaviours of the design under test. An \"interesting\" behaviour is claimed to be unreachable. If a path from an initial state to the state of interest does exist, a counter-example is generated. The sequence of states specifies a test for the desired behaviour. To highlight real problems that could appear during test generation, we chose the Store Data Unit (SDU) of the ST100, a new high performance digital signal processor (DSP) developed by STMicroelectronics. This unit is specifically selected because of the following key issues: 1. big data structures that can not be directly modelled without state explosion, 2. complex control logic that would require an excessive number of tests to exercise exhaustively, 3. a design where it is difficult to determine how to drive the complete system to ensure a given behaviour in the unit under test. The Genevieve methodology allowed us to define a coverage model specifically devoted to covering corner cases of the design. Hence the generated test suite achieved very efficient coverage of corner cases, and checked not only functional correctness but also whether the implementation matched design intent. As a result the Genevieve tests discovered some subtle performance bugs which would otherwise be very difficult to find.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123550003","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Chaff: engineering an efficient SAT solver 谷壳:工程一个有效的SAT求解器
M. Moskewicz, Conor F. Madigan, Ying Zhao, Lintao Zhang, S. Malik
Boolean satisfiability is probably the most studied of the combinatorial optimization/search problems. Significant effort has been devoted to trying to provide practical solutions to this problem for problem instances encountered in a range of applications in electronic design automation (EDA), as well as in artificial intelligence (AI). This study has culminated in the development of several SAT packages, both proprietary and in the public domain (e.g. GRASP, SATO) which find significant use in both research and industry. Most existing complete solvers are variants of the Davis-Putnam (DP) search algorithm. In this paper we describe the development of a new complete solver, Chaff which achieves significant performance gains through careful engineering of all aspects of the search-especially a particularly efficient implementation of Boolean constraint propagation (BCP) and a novel low overhead decision strategy. Chaff has been able to obtain one to two orders of magnitude performance improvement on difficult SAT benchmarks in comparison with other solvers (DP or otherwise), including GRASP and SATO.
布尔可满足性可能是研究最多的组合优化/搜索问题。对于在电子设计自动化(EDA)和人工智能(AI)的一系列应用中遇到的问题实例,已经投入了大量的努力,试图为这个问题提供实际的解决方案。这项研究最终开发了几个SAT软件包,包括专有的和公共领域的(例如GRASP, SATO),这些软件包在研究和工业中都有重要的用途。大多数现有的完全求解器是戴维斯-普特南(DP)搜索算法的变体。在本文中,我们描述了一个新的完整求解器的发展,Chaff通过仔细设计搜索的各个方面,特别是布尔约束传播(BCP)的特别有效的实现和一种新的低开销决策策略,实现了显著的性能提升。与其他求解器(DP或其他)(包括GRASP和SATO)相比,Chaff已经能够在困难的SAT基准上获得一到两个数量级的性能改进。
{"title":"Chaff: engineering an efficient SAT solver","authors":"M. Moskewicz, Conor F. Madigan, Ying Zhao, Lintao Zhang, S. Malik","doi":"10.1145/378239.379017","DOIUrl":"https://doi.org/10.1145/378239.379017","url":null,"abstract":"Boolean satisfiability is probably the most studied of the combinatorial optimization/search problems. Significant effort has been devoted to trying to provide practical solutions to this problem for problem instances encountered in a range of applications in electronic design automation (EDA), as well as in artificial intelligence (AI). This study has culminated in the development of several SAT packages, both proprietary and in the public domain (e.g. GRASP, SATO) which find significant use in both research and industry. Most existing complete solvers are variants of the Davis-Putnam (DP) search algorithm. In this paper we describe the development of a new complete solver, Chaff which achieves significant performance gains through careful engineering of all aspects of the search-especially a particularly efficient implementation of Boolean constraint propagation (BCP) and a novel low overhead decision strategy. Chaff has been able to obtain one to two orders of magnitude performance improvement on difficult SAT benchmarks in comparison with other solvers (DP or otherwise), including GRASP and SATO.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128263964","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3715
Dynamic power management in a mobile multimedia system with guaranteed quality-of-service 移动多媒体系统中保证服务质量的动态电源管理
Pub Date : 2001-06-22 DOI: 10.1109/DAC.2001.156252
Qinru Qiu, Qing Wu, Massoud Pedram
In this paper we address the problem of dynamic power management in a distributed multimedia system with a required quality of service (QoS). Using a generalized stochastic Petri net model where the non-exponential inter-arrival time distribution of the incoming requests is captured by the "stage method", we provide a detailed model of the power-managed multimedia system under general QoS constraints. Based on this mathematical model, the power-optimal policy is obtained by solving a linear programming problem. We compare the new problem formulation and solution technique to previous dynamic power management techniques that can only optimize power under delay constraints. We then demonstrate that these other techniques yield policies with higher power dissipation by over-constraining the delay target in an attempt to indirectly satisfy the QoS constraints. In contrast, our new method correctly formulates the power management problem under QoS constraints and obtains the optimal solution.
本文研究了分布式多媒体系统中动态电源管理的问题,该系统具有一定的服务质量要求。利用广义随机Petri网模型,通过“阶段法”捕获传入请求的非指数间到达时间分布,我们提供了在一般QoS约束下电源管理多媒体系统的详细模型。在此数学模型的基础上,通过求解线性规划问题得到了功率最优策略。我们比较了新的问题表述和解决技术与以前的动态功率管理技术,后者只能在延迟约束下优化功率。然后,我们证明了这些其他技术通过过度约束延迟目标来间接满足QoS约束,从而产生具有更高功耗的策略。相比之下,新方法正确地提出了QoS约束下的电源管理问题,并得到了最优解。
{"title":"Dynamic power management in a mobile multimedia system with guaranteed quality-of-service","authors":"Qinru Qiu, Qing Wu, Massoud Pedram","doi":"10.1109/DAC.2001.156252","DOIUrl":"https://doi.org/10.1109/DAC.2001.156252","url":null,"abstract":"In this paper we address the problem of dynamic power management in a distributed multimedia system with a required quality of service (QoS). Using a generalized stochastic Petri net model where the non-exponential inter-arrival time distribution of the incoming requests is captured by the \"stage method\", we provide a detailed model of the power-managed multimedia system under general QoS constraints. Based on this mathematical model, the power-optimal policy is obtained by solving a linear programming problem. We compare the new problem formulation and solution technique to previous dynamic power management techniques that can only optimize power under delay constraints. We then demonstrate that these other techniques yield policies with higher power dissipation by over-constraining the delay target in an attempt to indirectly satisfy the QoS constraints. In contrast, our new method correctly formulates the power management problem under QoS constraints and obtains the optimal solution.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125667402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 53
Teaching future verification engineers: the forgotten side of logic design 教导未来的验证工程师:逻辑设计被遗忘的一面
F. Özgüner, D. Marhefka, J. DeGroat, Bruce Wile, Jennifer Stofer, Lyle Hanrahan
This paper describes a senior/graduate level course in hardware logic verification being offered by The Ohio State University in cooperation with IBM. The need for the course is established through the growing importance of logic verification to users of custom logic designs. We discuss the short-term and long-term goals for the course, and describe the course content and format. The course relies heavily on lab projects to illustrate the main concepts. Three projects and a final project review are described.
本文描述了俄亥俄州立大学与IBM合作开设的一门硬件逻辑验证的高级/研究生课程。对于自定义逻辑设计的用户来说,逻辑验证越来越重要,因此需要开设这门课程。我们讨论了课程的短期和长期目标,并描述了课程的内容和形式。本课程主要依靠实验项目来阐述主要概念。描述了三个项目和最后的项目评审。
{"title":"Teaching future verification engineers: the forgotten side of logic design","authors":"F. Özgüner, D. Marhefka, J. DeGroat, Bruce Wile, Jennifer Stofer, Lyle Hanrahan","doi":"10.1145/378239.378477","DOIUrl":"https://doi.org/10.1145/378239.378477","url":null,"abstract":"This paper describes a senior/graduate level course in hardware logic verification being offered by The Ohio State University in cooperation with IBM. The need for the course is established through the growing importance of logic verification to users of custom logic designs. We discuss the short-term and long-term goals for the course, and describe the course content and format. The course relies heavily on lab projects to illustrate the main concepts. Three projects and a final project review are described.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130263917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
A framework for object oriented hardware specification, verification, and synthesis 一个面向对象硬件规范、验证和综合的框架
T. Kuhn, Tobias Oppold, M. Winterholer, W. Rosenstiel, Mark Edwards, Y. Kashai
We describe two things. First, we present a uniform framework for object oriented specification and verification of hardware. For this purpose the object oriented language 'e' is introduced along with a powerful run-time environment that enables the designer to perform the verification task. Second, we present an object oriented synthesis that enhances 'e' and its dedicated run-time environment into a framework for specification, verification, and synthesis. The usability of our approach is demonstrated by real-world examples.
我们描述两件事。首先,提出了面向对象规范和硬件验证的统一框架。为此,引入了面向对象语言“e”以及一个强大的运行时环境,使设计人员能够执行验证任务。其次,我们提出了一个面向对象的合成,它将“e”及其专用的运行时环境增强为规范、验证和合成的框架。现实世界的例子证明了我们方法的可用性。
{"title":"A framework for object oriented hardware specification, verification, and synthesis","authors":"T. Kuhn, Tobias Oppold, M. Winterholer, W. Rosenstiel, Mark Edwards, Y. Kashai","doi":"10.1145/378239.378537","DOIUrl":"https://doi.org/10.1145/378239.378537","url":null,"abstract":"We describe two things. First, we present a uniform framework for object oriented specification and verification of hardware. For this purpose the object oriented language 'e' is introduced along with a powerful run-time environment that enables the designer to perform the verification task. Second, we present an object oriented synthesis that enhances 'e' and its dedicated run-time environment into a framework for specification, verification, and synthesis. The usability of our approach is demonstrated by real-world examples.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126296102","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 34
Inductance 101: modeling and extraction 电感101:建模和提取
M. Beattie, L. Pileggi
Modeling magnetic interactions for on-chip interconnect has become an issue of great interest for integrated circuit design in recent years. This tutorial paper describes the basic concepts of magnetic interaction, loop and partial inductance, along with some of the high frequency effects such as the skin and proximity effect.
片上互连的磁相互作用建模已成为近年来集成电路设计领域的热点问题。本教程介绍了磁相互作用的基本概念,环路和部分电感,以及一些高频效应,如趋肤效应和接近效应。
{"title":"Inductance 101: modeling and extraction","authors":"M. Beattie, L. Pileggi","doi":"10.1145/378239.378500","DOIUrl":"https://doi.org/10.1145/378239.378500","url":null,"abstract":"Modeling magnetic interactions for on-chip interconnect has become an issue of great interest for integrated circuit design in recent years. This tutorial paper describes the basic concepts of magnetic interaction, loop and partial inductance, along with some of the high frequency effects such as the skin and proximity effect.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126059404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 86
Reticle enhancement technology: implications and challenges for physical design 光栅增强技术:物理设计的意义和挑战
W. Grobman, M. Thompson, R. Wang, C. Yuan, Ruiqi Tian, E. Demircan
In this paper, we review phase shift lithography, rule vs. model based methods for OPC and model-based tiling, and discuss their implications for layout and verification. We will discuss novel approaches, using polarizing films on reticles, which change the game for phase-shift coloring, and could lead to a new direction in c:PSM constraints on physical design. We emphasize the need to do tiling that is model-driven and uses optimization techniques to achieve planarity for better manufacturing tolerance in the subwavelength dimensions era. Electromagnetic solver results will be presented which estimate the effect of tiling on circuit timing.
在本文中,我们回顾了相移光刻、基于规则与基于模型的OPC方法和基于模型的平铺方法,并讨论了它们对布局和验证的影响。我们将讨论新的方法,在线上使用偏光膜,这将改变相移着色的游戏,并可能导致c:PSM物理设计约束的新方向。我们强调需要进行模型驱动的平铺,并使用优化技术来实现平面性,以便在亚波长尺寸时代获得更好的制造公差。给出了估算平铺对电路定时影响的电磁求解结果。
{"title":"Reticle enhancement technology: implications and challenges for physical design","authors":"W. Grobman, M. Thompson, R. Wang, C. Yuan, Ruiqi Tian, E. Demircan","doi":"10.1145/378239.378332","DOIUrl":"https://doi.org/10.1145/378239.378332","url":null,"abstract":"In this paper, we review phase shift lithography, rule vs. model based methods for OPC and model-based tiling, and discuss their implications for layout and verification. We will discuss novel approaches, using polarizing films on reticles, which change the game for phase-shift coloring, and could lead to a new direction in c:PSM constraints on physical design. We emphasize the need to do tiling that is model-driven and uses optimization techniques to achieve planarity for better manufacturing tolerance in the subwavelength dimensions era. Electromagnetic solver results will be presented which estimate the effect of tiling on circuit timing.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126810712","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 33
Using symbolic algebra in algorithmic level DSP synthesis 符号代数在算法级DSP合成中的应用
A. Peymandoust, G. Micheli
Current multimedia applications require the design of data-path intensive circuits. Unfortunately, current design tools and methods support design abstraction at a level that is inferior to the expectation of designers. Namely, most arithmetic-level optimizations are not supported and they are left to the designers' ingenuity. In this paper, we show how symbolic algebra can be used to construct an arithmetic-level decomposition algorithm. We also introduce our tool, SymSyn, that performs arithmetic library mapping and optimization of data-flow descriptions into data paths using arithmetic components.
当前的多媒体应用要求设计数据路径密集的电路。不幸的是,当前的设计工具和方法所支持的设计抽象水平低于设计者的期望。也就是说,大多数算术级别的优化是不支持的,它们留给设计师的独创性。在本文中,我们展示了如何使用符号代数来构造一个算术级分解算法。我们还介绍了我们的工具SymSyn,它执行算术库映射,并使用算术组件将数据流描述优化到数据路径。
{"title":"Using symbolic algebra in algorithmic level DSP synthesis","authors":"A. Peymandoust, G. Micheli","doi":"10.1145/378239.378485","DOIUrl":"https://doi.org/10.1145/378239.378485","url":null,"abstract":"Current multimedia applications require the design of data-path intensive circuits. Unfortunately, current design tools and methods support design abstraction at a level that is inferior to the expectation of designers. Namely, most arithmetic-level optimizations are not supported and they are left to the designers' ingenuity. In this paper, we show how symbolic algebra can be used to construct an arithmetic-level decomposition algorithm. We also introduce our tool, SymSyn, that performs arithmetic library mapping and optimization of data-flow descriptions into data paths using arithmetic components.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122894462","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 48
Watermarking graph partitioning solutions 水印图划分解决方案
Gregory Wolfe, J. Wong, M. Potkonjak
Trends in the semiconductor industry towards extensive design and code reuse motivate a need for adequate intellectual property protection (IPP) schemes. We offer a new general IPP scheme called constraint-based watermarking and analyze it in the context of the graph partitioning problem. Graph partitioning is a critical optimization problem that has many applications, particularly in the semiconductor design process. Our IPP technique for graph partitioning watermarks solutions to graph partitioning problems so that they carry an author's signature. Our technique is transparent to the actual CAD tool which does the partitioning. Our technique produces solutions that have very low quality degradation levels, yet carry signatures that are convincingly unambiguous, extremely unlikely to be present by coincidence, and difficult to detect or remove without completely resolving the partitioning problem.
在半导体工业的趋势向广泛的设计和代码重用激发了需要足够的知识产权保护(IPP)方案。提出了一种新的通用IPP方案——基于约束的水印,并结合图划分问题对其进行了分析。图划分是一个关键的优化问题,有许多应用,特别是在半导体设计过程中。我们的IPP图分区技术为图分区问题的解决方案加了水印,使它们带有作者的签名。我们的技术对于进行分区的实际CAD工具是透明的。我们的技术产生的解决方案具有非常低的质量退化水平,但携带的签名令人信服地明确,极不可能偶然出现,并且在不完全解决分区问题的情况下难以检测或删除。
{"title":"Watermarking graph partitioning solutions","authors":"Gregory Wolfe, J. Wong, M. Potkonjak","doi":"10.1145/378239.378567","DOIUrl":"https://doi.org/10.1145/378239.378567","url":null,"abstract":"Trends in the semiconductor industry towards extensive design and code reuse motivate a need for adequate intellectual property protection (IPP) schemes. We offer a new general IPP scheme called constraint-based watermarking and analyze it in the context of the graph partitioning problem. Graph partitioning is a critical optimization problem that has many applications, particularly in the semiconductor design process. Our IPP technique for graph partitioning watermarks solutions to graph partitioning problems so that they carry an author's signature. Our technique is transparent to the actual CAD tool which does the partitioning. Our technique produces solutions that have very low quality degradation levels, yet carry signatures that are convincingly unambiguous, extremely unlikely to be present by coincidence, and difficult to detect or remove without completely resolving the partitioning problem.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127021573","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 50
Concurrent error detection of fault-based side-channel cryptanalysis of 128-bit symmetric block ciphers 基于故障的128位对称分组密码侧信道并发错误检测
R. Karri, Kaijie Wu, P. Mishra, Yongkook Kim
Fault-based side channel cryptanalysis is very effective against symmetric and asymmetric encryption algorithms. Although straightforward hardware and time redundancy based concurrent error detection (CED) architectures can be used to thwart such attacks, they entail significant overhead (either area or performance). In this paper we investigate systematic approaches to low-cost, low-latency CED for symmetric encryption algorithms based on the inverse relationship that exists between encryption and decryption at algorithm level, round level and operation level and develop CED architectures that explore the trade-off between area overhead, performance penalty and error detection latency. The proposed techniques have been validated on FPGA implementations of AES finalist 128-bit symmetric encryption algorithms.
基于故障的侧信道密码分析对对称和非对称加密算法非常有效。尽管直接的基于硬件和时间冗余的并发错误检测(CED)体系结构可用于阻止此类攻击,但它们会带来巨大的开销(无论是面积还是性能)。在本文中,我们研究了基于算法级,轮级和操作级加密和解密之间存在的反比关系的对称加密算法的低成本,低延迟CED的系统方法,并开发了探索面积开销,性能损失和错误检测延迟之间权衡的CED架构。所提出的技术已在AES最终128位对称加密算法的FPGA实现上得到验证。
{"title":"Concurrent error detection of fault-based side-channel cryptanalysis of 128-bit symmetric block ciphers","authors":"R. Karri, Kaijie Wu, P. Mishra, Yongkook Kim","doi":"10.1145/378239.379027","DOIUrl":"https://doi.org/10.1145/378239.379027","url":null,"abstract":"Fault-based side channel cryptanalysis is very effective against symmetric and asymmetric encryption algorithms. Although straightforward hardware and time redundancy based concurrent error detection (CED) architectures can be used to thwart such attacks, they entail significant overhead (either area or performance). In this paper we investigate systematic approaches to low-cost, low-latency CED for symmetric encryption algorithms based on the inverse relationship that exists between encryption and decryption at algorithm level, round level and operation level and develop CED architectures that explore the trade-off between area overhead, performance penalty and error detection latency. The proposed techniques have been validated on FPGA implementations of AES finalist 128-bit symmetric encryption algorithms.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132553150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 64
期刊
Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)
全部 Acc. Chem. Res. ACS Applied Bio Materials ACS Appl. Electron. Mater. ACS Appl. Energy Mater. ACS Appl. Mater. Interfaces ACS Appl. Nano Mater. ACS Appl. Polym. Mater. ACS BIOMATER-SCI ENG ACS Catal. ACS Cent. Sci. ACS Chem. Biol. ACS Chemical Health & Safety ACS Chem. Neurosci. ACS Comb. Sci. ACS Earth Space Chem. ACS Energy Lett. ACS Infect. Dis. ACS Macro Lett. ACS Mater. Lett. ACS Med. Chem. Lett. ACS Nano ACS Omega ACS Photonics ACS Sens. ACS Sustainable Chem. Eng. ACS Synth. Biol. Anal. Chem. BIOCHEMISTRY-US Bioconjugate Chem. BIOMACROMOLECULES Chem. Res. Toxicol. Chem. Rev. Chem. Mater. CRYST GROWTH DES ENERG FUEL Environ. Sci. Technol. Environ. Sci. Technol. Lett. Eur. J. Inorg. Chem. IND ENG CHEM RES Inorg. Chem. J. Agric. Food. Chem. J. Chem. Eng. Data J. Chem. Educ. J. Chem. Inf. Model. J. Chem. Theory Comput. J. Med. Chem. J. Nat. Prod. J PROTEOME RES J. Am. Chem. Soc. LANGMUIR MACROMOLECULES Mol. Pharmaceutics Nano Lett. Org. Lett. ORG PROCESS RES DEV ORGANOMETALLICS J. Org. Chem. J. Phys. Chem. J. Phys. Chem. A J. Phys. Chem. B J. Phys. Chem. C J. Phys. Chem. Lett. Analyst Anal. Methods Biomater. Sci. Catal. Sci. Technol. Chem. Commun. Chem. Soc. Rev. CHEM EDUC RES PRACT CRYSTENGCOMM Dalton Trans. Energy Environ. Sci. ENVIRON SCI-NANO ENVIRON SCI-PROC IMP ENVIRON SCI-WAT RES Faraday Discuss. Food Funct. Green Chem. Inorg. Chem. Front. Integr. Biol. J. Anal. At. Spectrom. J. Mater. Chem. A J. Mater. Chem. B J. Mater. Chem. C Lab Chip Mater. Chem. Front. Mater. Horiz. MEDCHEMCOMM Metallomics Mol. Biosyst. Mol. Syst. Des. Eng. Nanoscale Nanoscale Horiz. Nat. Prod. Rep. New J. Chem. Org. Biomol. Chem. Org. Chem. Front. PHOTOCH PHOTOBIO SCI PCCP Polym. Chem.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1