Pub Date : 2008-06-01DOI: 10.1142/S1793617908000057
Tao Liu, Xingyu Gao, A. Wee, Y. Ping, H. Moser
The capability of thin film measurement and performance at low energy using XAFS at the X-ray demonstration and development beamline (XDD) at SSLS has been explored. XDD is supplied with synchrotron radiation from one of the two superconducting dipoles of the Helios 2 storage ring. The photon energy is tunable from 2.5 keV to 10 keV using a channel-cut Si(111) monochromator and the photon flux is of the order of 109 photons/s at energies of several keV. The energy resolution, detector, and control system required by XAFS were optimized. As a demonstration, the XAFS spectra of Mn-doped ZnO thin films at Mn K-edge and chlorine aqueous solution at Cl K-edge were measured and discussed.
{"title":"STUDY OF THIN FILMS AND AQUEOUS CHLORINE SOLUTION USING X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY","authors":"Tao Liu, Xingyu Gao, A. Wee, Y. Ping, H. Moser","doi":"10.1142/S1793617908000057","DOIUrl":"https://doi.org/10.1142/S1793617908000057","url":null,"abstract":"The capability of thin film measurement and performance at low energy using XAFS at the X-ray demonstration and development beamline (XDD) at SSLS has been explored. XDD is supplied with synchrotron radiation from one of the two superconducting dipoles of the Helios 2 storage ring. The photon energy is tunable from 2.5 keV to 10 keV using a channel-cut Si(111) monochromator and the photon flux is of the order of 109 photons/s at energies of several keV. The energy resolution, detector, and control system required by XAFS were optimized. As a demonstration, the XAFS spectra of Mn-doped ZnO thin films at Mn K-edge and chlorine aqueous solution at Cl K-edge were measured and discussed.","PeriodicalId":166807,"journal":{"name":"Advances in Synchrotron Radiation","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124816437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2008-06-01DOI: 10.1142/S1793617908000082
W. Chang, L. Lim, P. Yang, H. Moser
An extremely broad lower 2θ peak adjacent to the major (002) rhombohedral peak has been frequently observed in standard XRD profiles of bulk PZN-PT single crystals at room temperature. To understand the original and nature of this lower 2θ peak, high-resolution synchrotron X-ray diffraction study was carried out. The synchrotron (002) mapping together with a fracturing technique confirmed that the lower 2θ peak arises from a polishing-induced surface layer of "highly stressed rhombohedral state of monoclinic symmetry" which, structurally, may be likened to one full of "incipient monoclinic nuclei" of a range of lattice parameters. These "incipient" monoclinic nuclei/phases are microscopic in dimensions and are placed under intense in-plane compressive stress in the surface layer. All these contribute to the extreme broadness of the lower 2θ peak. The present work shows that deformation of relaxor single crystals occurs readily by stress-induced phase transformation of the material from the rhombohedral state to other lower symmetry states. The lower 2θ peak, and hence the "incipient" monoclinic surface layer, is fairly resistant to annealing and low-field poling but can be largely eliminated when the as-polished sample was poled to sufficiently high field (i.e., 1.5 kV/mm) at room temperature. After annealing, however, the "incipient" monoclinic surface layer became more resistant to poling such that remnant of the lower 2θ peak persisted even after high-field poling.
{"title":"COMBINED NORMAL AND HIGH-RESOLUTION SYNCHROTRON X-RAY DIFFRACTION STUDY OF SURFACE LAYER PZN-4.5%PT FERROELECTRIC SINGLE CRYSTAL","authors":"W. Chang, L. Lim, P. Yang, H. Moser","doi":"10.1142/S1793617908000082","DOIUrl":"https://doi.org/10.1142/S1793617908000082","url":null,"abstract":"An extremely broad lower 2θ peak adjacent to the major (002) rhombohedral peak has been frequently observed in standard XRD profiles of bulk PZN-PT single crystals at room temperature. To understand the original and nature of this lower 2θ peak, high-resolution synchrotron X-ray diffraction study was carried out. The synchrotron (002) mapping together with a fracturing technique confirmed that the lower 2θ peak arises from a polishing-induced surface layer of \"highly stressed rhombohedral state of monoclinic symmetry\" which, structurally, may be likened to one full of \"incipient monoclinic nuclei\" of a range of lattice parameters. These \"incipient\" monoclinic nuclei/phases are microscopic in dimensions and are placed under intense in-plane compressive stress in the surface layer. All these contribute to the extreme broadness of the lower 2θ peak. The present work shows that deformation of relaxor single crystals occurs readily by stress-induced phase transformation of the material from the rhombohedral state to other lower symmetry states. The lower 2θ peak, and hence the \"incipient\" monoclinic surface layer, is fairly resistant to annealing and low-field poling but can be largely eliminated when the as-polished sample was poled to sufficiently high field (i.e., 1.5 kV/mm) at room temperature. After annealing, however, the \"incipient\" monoclinic surface layer became more resistant to poling such that remnant of the lower 2θ peak persisted even after high-field poling.","PeriodicalId":166807,"journal":{"name":"Advances in Synchrotron Radiation","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115218455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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