Pub Date : 1985-09-01DOI: 10.1109/EIC.1985.7458579
C. Wade, Laura J. DiBenedetto, Julian F. Johnson, D. Damon
The results of measurement of the moisture content of XLPE cable insulation obtained from a DuPont model 903 Moisture Evolution Analyzer often disagrees with the results of the same measurements made with a Mitsubishi Moisture Meter by as much as a factor of two. The former instrument uses a cell containing P2O5 as its active element, and the latter performs an automated Karl Fisher titration. The two instruments were calibrated using the water hydration of sodium tartrate as a standard. Moisture measurements made as a function of the oven temperature for both instruments were in good agreement with weight loss measurements made by thermogravimetric analysis of the sodium tartrate. These results and others have shown that the accuracy and precision of both instruments are within ± 1% for the measurement of amounts of water of the order of 1000 micrograms. The present results show that the lack of agreement among the measurements can be explained as the result of interference by such volatile substances as acetophenone and cumyl alcohol.
{"title":"The measurement of moisture concentration in cable insulation","authors":"C. Wade, Laura J. DiBenedetto, Julian F. Johnson, D. Damon","doi":"10.1109/EIC.1985.7458579","DOIUrl":"https://doi.org/10.1109/EIC.1985.7458579","url":null,"abstract":"The results of measurement of the moisture content of XLPE cable insulation obtained from a DuPont model 903 Moisture Evolution Analyzer often disagrees with the results of the same measurements made with a Mitsubishi Moisture Meter by as much as a factor of two. The former instrument uses a cell containing P2O5 as its active element, and the latter performs an automated Karl Fisher titration. The two instruments were calibrated using the water hydration of sodium tartrate as a standard. Moisture measurements made as a function of the oven temperature for both instruments were in good agreement with weight loss measurements made by thermogravimetric analysis of the sodium tartrate. These results and others have shown that the accuracy and precision of both instruments are within ± 1% for the measurement of amounts of water of the order of 1000 micrograms. The present results show that the lack of agreement among the measurements can be explained as the result of interference by such volatile substances as acetophenone and cumyl alcohol.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116952512","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-09-01DOI: 10.1109/EIC.1985.7458618
J. Lyles
As previously stated, Reference (4), Ontario Hydro feels that as a result of an integrated approach to the problems associated with thermoset and thermoplastic insulation systems, these problems are now manageable at minimum cost.
{"title":"Procedure and experience with thermoset stator rewinds of hydraulic generators","authors":"J. Lyles","doi":"10.1109/EIC.1985.7458618","DOIUrl":"https://doi.org/10.1109/EIC.1985.7458618","url":null,"abstract":"As previously stated, Reference (4), Ontario Hydro feels that as a result of an integrated approach to the problems associated with thermoset and thermoplastic insulation systems, these problems are now manageable at minimum cost.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124073153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-09-01DOI: 10.1109/EIC.1985.7458613
E. E. Zook
Brazing of copper electrical conductors is of importance in power transformers, and uses a great amount of brazing material. The areas brazed are usually inside the coil, and consist of taps, leads, and splices. Since the brazing is done inside the coil care must be taken in the making of the joint to prevent insulation damage and annealing of the joint area due to the brazing temperatures. A new brazing foil with a lower melting temperature than the currently used AWS BCuP-5 [1] braze is on the market. This foil has an amorphous structure with a copper base, 7% phosphorous, and no silver. Due to its lower melting temperature there is less heat input in the base material during brazing, therefore, there is less likelihood of insulation damage, less annealing of the joint area, lower oxide buildup, and less time to effect a joint.
{"title":"Amorphous metal foil for brazing copper electrical joints","authors":"E. E. Zook","doi":"10.1109/EIC.1985.7458613","DOIUrl":"https://doi.org/10.1109/EIC.1985.7458613","url":null,"abstract":"Brazing of copper electrical conductors is of importance in power transformers, and uses a great amount of brazing material. The areas brazed are usually inside the coil, and consist of taps, leads, and splices. Since the brazing is done inside the coil care must be taken in the making of the joint to prevent insulation damage and annealing of the joint area due to the brazing temperatures. A new brazing foil with a lower melting temperature than the currently used AWS BCuP-5 [1] braze is on the market. This foil has an amorphous structure with a copper base, 7% phosphorous, and no silver. Due to its lower melting temperature there is less heat input in the base material during brazing, therefore, there is less likelihood of insulation damage, less annealing of the joint area, lower oxide buildup, and less time to effect a joint.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128697076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-09-01DOI: 10.1109/EIC.1985.7458586
G. Simonelli
The electrical industry uses more and more threaded rods based on insulating materials as fasteners. The threaded rods here described are machined from laminates based on epoxy resin and glass fibre reinforcement. After a short theoretical consideration, an explanation is given on the choice of the type of reinforcement. Tests are described and discussion of the results follows, before a conclusion about the possible improvements to that sort of product.
{"title":"Utilization in electrotechnical industry of fasteners based on insulating threaded rods","authors":"G. Simonelli","doi":"10.1109/EIC.1985.7458586","DOIUrl":"https://doi.org/10.1109/EIC.1985.7458586","url":null,"abstract":"The electrical industry uses more and more threaded rods based on insulating materials as fasteners. The threaded rods here described are machined from laminates based on epoxy resin and glass fibre reinforcement. After a short theoretical consideration, an explanation is given on the choice of the type of reinforcement. Tests are described and discussion of the results follows, before a conclusion about the possible improvements to that sort of product.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"21 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132468624","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-09-01DOI: 10.1109/EIC.1985.7458592
M. Panneerselvam, K. Dharmalingam
Solid impurities such as micronised metallic particles in a Compressed Gas Insulated System (GIS) are detrimental to system performance. Detailed studies were conducted to quantify the extent of reduction in 50 Hz power frequency breakdown strength due to the presence of free and fixed conducting particles (0.4 mm dia × 4 mm length) and variation of particle length (4 mm, 5 mm and 6 mm) in compressed air in uniform, non-uniform and co-axial fields. The stud1es were conducted for pressures varying from 100 to 500 kPa and electrode gap varying from 10 to 50 mm. The experimental results indicate that the reduction in breakdown strength (BDS) due to the presence of fixed conducting particle is predominant (> 50%) in uniform and co-axial fields, whereas, it is very nominal (<10%) in non-uniform field. The reduction is found to increase with the increase in length of the fixed conducting particle. The reduction, in general, decreases with increase in gap length and pressure, but the variation is random in non-uniform field. In case of free conducting particle the reduction is more than the fixed one in the electrode system.
{"title":"Effect of solid impurities on power frequency breakdown strength in compressed air in uniform, non-uniform and co-axial fields","authors":"M. Panneerselvam, K. Dharmalingam","doi":"10.1109/EIC.1985.7458592","DOIUrl":"https://doi.org/10.1109/EIC.1985.7458592","url":null,"abstract":"Solid impurities such as micronised metallic particles in a Compressed Gas Insulated System (GIS) are detrimental to system performance. Detailed studies were conducted to quantify the extent of reduction in 50 Hz power frequency breakdown strength due to the presence of free and fixed conducting particles (0.4 mm dia × 4 mm length) and variation of particle length (4 mm, 5 mm and 6 mm) in compressed air in uniform, non-uniform and co-axial fields. The stud1es were conducted for pressures varying from 100 to 500 kPa and electrode gap varying from 10 to 50 mm. The experimental results indicate that the reduction in breakdown strength (BDS) due to the presence of fixed conducting particle is predominant (> 50%) in uniform and co-axial fields, whereas, it is very nominal (<10%) in non-uniform field. The reduction is found to increase with the increase in length of the fixed conducting particle. The reduction, in general, decreases with increase in gap length and pressure, but the variation is random in non-uniform field. In case of free conducting particle the reduction is more than the fixed one in the electrode system.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129272575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-09-01DOI: 10.1109/EIC.1985.7458631
A. L. Lynn, W.A. Gottung, D. Johnston, J. LaForte
A corona-resistant wire enamel has been developed which gives at least an order of magnitude longer life than a conventional enamel. System tests, using this enamel in a form wound coil, have shown that the turn-to-turn capability of this magnet wire is superior to the capability of a reliable service-proven ground wall insulation.
{"title":"Corona resistant turn insulation in AC rotating machines","authors":"A. L. Lynn, W.A. Gottung, D. Johnston, J. LaForte","doi":"10.1109/EIC.1985.7458631","DOIUrl":"https://doi.org/10.1109/EIC.1985.7458631","url":null,"abstract":"A corona-resistant wire enamel has been developed which gives at least an order of magnitude longer life than a conventional enamel. System tests, using this enamel in a form wound coil, have shown that the turn-to-turn capability of this magnet wire is superior to the capability of a reliable service-proven ground wall insulation.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127651628","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-09-01DOI: 10.1109/EIC.1985.7458587
B. Schmidlin, K. Brandenberger
The impregnating resin is one of the key factors for producing form wound coils by vacuum pressure impregnation (VPI). The VPI resin influences not only the final properties of the insulation but has also an important effect on production costs. Insulating materials suppliers are searching to improve the impregnants in order to approach to the ideal VPI system with regard to essential properties and requirements. This paper describes the procedure of a development of an impregnating resin considering also the second component of an insulation system the mica paper tapes in order to obtain a VPI system with improved properties.
{"title":"Development of an impregnating resin having improved VPI properties","authors":"B. Schmidlin, K. Brandenberger","doi":"10.1109/EIC.1985.7458587","DOIUrl":"https://doi.org/10.1109/EIC.1985.7458587","url":null,"abstract":"The impregnating resin is one of the key factors for producing form wound coils by vacuum pressure impregnation (VPI). The VPI resin influences not only the final properties of the insulation but has also an important effect on production costs. Insulating materials suppliers are searching to improve the impregnants in order to approach to the ideal VPI system with regard to essential properties and requirements. This paper describes the procedure of a development of an impregnating resin considering also the second component of an insulation system the mica paper tapes in order to obtain a VPI system with improved properties.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"2001 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133183078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-09-01DOI: 10.1109/EIC.1985.7458576
R. V. Carmer
The precision and accuracy of a test method for measuring the dimensions of magnet wire depends upon the specific test method. There are enough discrepancies between the ASTM and IEC test methods to affect that precision and accuracy. There is a need to eliminate those discrepancies in the test methods so that there is uniformity worldwide.
{"title":"The measurement of dimensions of insulated magnet wire","authors":"R. V. Carmer","doi":"10.1109/EIC.1985.7458576","DOIUrl":"https://doi.org/10.1109/EIC.1985.7458576","url":null,"abstract":"The precision and accuracy of a test method for measuring the dimensions of magnet wire depends upon the specific test method. There are enough discrepancies between the ASTM and IEC test methods to affect that precision and accuracy. There is a need to eliminate those discrepancies in the test methods so that there is uniformity worldwide.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114722950","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-09-01DOI: 10.1109/EIC.1985.7458640
Dale M. Allison
GE's RTV-142 was determined to be a successful product for use as a particle getter. No RTV-142 related failures occurred during product line test use, 1000 hour life-testing, internal water vapor analysis, acceleration testing or radiation analysis.
{"title":"Pind getter analysis report","authors":"Dale M. Allison","doi":"10.1109/EIC.1985.7458640","DOIUrl":"https://doi.org/10.1109/EIC.1985.7458640","url":null,"abstract":"GE's RTV-142 was determined to be a successful product for use as a particle getter. No RTV-142 related failures occurred during product line test use, 1000 hour life-testing, internal water vapor analysis, acceleration testing or radiation analysis.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116428934","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-09-01DOI: 10.1109/EIC.1985.7458639
P. Neelakantaswamy, T. Sarkar, I. Turkman
Microelectronic devices and components are essentially dielectric-based monolithic structures with some additional metallization parts. These integrated circuits are highly susceptible to woundings arising from zappings due to electrical transients. presently, electrostatic discharge(ESD)-based repetitive over-stressings which may render the devices in a state of latent mode of failure are considered. 1 Such wounded or ‘rogue’ components may still be functional with deviatory characteristics, and are potentially prone to catastrophic failures on subsequent stress-repetitions. 2 The time-dependent degrading performance of wounded components is quantified via static-induced electrothermal effects in the device structure. The aging of the device is specified in terms of four possible damaging influences; namely, the elevated temperature, intensive electric field, depletory electromigration, and undue thermoelastic stresses. Based on the relative severity of these influences, a lethality endurance factor (L.E.F) is defined to estimate the failure time. Enhancement of severity due to pulsed waveform is also discussed. Lastly, the latent failure is regarded as the belated response due to slow endochronic growth of microfractures (creeping) caused by thermoelastic stresses arising from repetitive zappings.
{"title":"On the threat to dielectric-based electronic devices and components from repetitive nonsinusoidal electrical overstresses — A review","authors":"P. Neelakantaswamy, T. Sarkar, I. Turkman","doi":"10.1109/EIC.1985.7458639","DOIUrl":"https://doi.org/10.1109/EIC.1985.7458639","url":null,"abstract":"Microelectronic devices and components are essentially dielectric-based monolithic structures with some additional metallization parts. These integrated circuits are highly susceptible to woundings arising from zappings due to electrical transients. presently, electrostatic discharge(ESD)-based repetitive over-stressings which may render the devices in a state of latent mode of failure are considered. 1 Such wounded or ‘rogue’ components may still be functional with deviatory characteristics, and are potentially prone to catastrophic failures on subsequent stress-repetitions. 2 The time-dependent degrading performance of wounded components is quantified via static-induced electrothermal effects in the device structure. The aging of the device is specified in terms of four possible damaging influences; namely, the elevated temperature, intensive electric field, depletory electromigration, and undue thermoelastic stresses. Based on the relative severity of these influences, a lethality endurance factor (L.E.F) is defined to estimate the failure time. Enhancement of severity due to pulsed waveform is also discussed. Lastly, the latent failure is regarded as the belated response due to slow endochronic growth of microfractures (creeping) caused by thermoelastic stresses arising from repetitive zappings.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116452610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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