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Proceedings of the International Ocean Discovery Program最新文献

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Western Pacific Warm Pool 西太平洋暖池
Pub Date : 2018-06-08 DOI: 10.14379/IODP.PROC.363.2018
Y. Rosenthal, A. Holbourn, D. Kulhanek
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引用次数: 18
Site U1490 网站U1490
Pub Date : 2018-06-08 DOI: 10.14379/iodp.proc.363.111.2018
Y. Rosenthal, A. Holbourn, D. Kulhanek, I. Aiello, T. Babila, G. Bayon, L. Beaufort, S. C. Bova, J.-H. Chun, H. Dang, A. Drury, T. Dunkley Jones, P. Eichler, A.G.S. Fernando, K. Gibson, R. G. Hatfield, D.L. Johnson, Y. Kumagai, T. Li, B. Linsley, N. Meinicke, G. Mountain, B. Opdyke, P.N. Pearson, C. R. Poole, A. Ravelo, T. Sagawa, A. Schmitt, J. Wurtzel, J. Xu, M. Yamamoto, Y.G. Zhang
Y. Rosenthal, A.E. Holbourn, D.K. Kulhanek, I.W. Aiello, T.L. Babila, G. Bayon, L. Beaufort, S.C. Bova, J.-H. Chun, H. Dang, A.J. Drury, T. Dunkley Jones, P.P.B. Eichler, A.G.S. Fernando, K. Gibson, R.G. Hatfield, D.L. Johnson, Y. Kumagai, T. Li, B.K. Linsley, N. Meinicke, G.S. Mountain, B.N. Opdyke, P.N. Pearson, C.R. Poole, A.C. Ravelo, T. Sagawa, A. Schmitt, J.B. Wurtzel, J. Xu, M. Yamamoto, and Y.G. Zhang2
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引用次数: 4
pXRF and ICP-AES characterization of shipboard rocks and sediments: protocols and strategies 船上岩石和沉积物的pXRF和ICP-AES表征:协议和策略
Pub Date : 2018-05-29 DOI: 10.14379/IODP.PROC.366.110.2018
R. Johnston, J. Ryan
Recovered shipboard solids (rocks and sediments) may be characterized for elemental abundances on International Ocean Discovery Program (IODP) expeditions in several ways, using either the shipboard inductively coupled plasma–atomic emission spectrometer (ICP-AES) or a handheld portable X-ray fluorescence spectrometer (pXRF). These two instruments have overlapping capabilities in terms of the elements they measure but are designed to meet different analytical needs. During Expedition 366, we made extensive use of both instruments to conduct standard bulk elemental analysis of samples and in situ measurements on rock surfaces of cores. The following is a description of current shipboard measurement protocols for recovered rocks and sediments using these instruments, an analysis of the respective methodologies, and recommendations for best analytical practices. Portable X-ray fluorescence spectrometry Based on the success in using portable X-ray fluorescence spectrometry (pXRF) for core characterization during International Ocean Discovery Program (IODP) Expedition 352 (Ryan et al., 2017; Reagan et al., 2015, 2017), pXRF was used both to conduct near–real time characterization of recovered rock samples from cores and to analyze serpentinite rock powders and unconsolidated serpentinite samples during Expedition 366. A new pXRF—an Olympus DeltaX handheld instrument—was acquired by IODP for use during Expedition 366 and future expeditions. Compared to the original Fisher Niton instrument described in Ryan et al. (2017), this new instrument has overall expanded analytical capabilities. The Olympus DeltaX is a self-contained energy-dispersive XRF survey tool that includes data correction packages tailored to geological applications. The data correction methods are based on “fundamental parameters” methodology, which solves a series of nonlinear equations for each analyzed element. The parameters used in these equations comprise metrics for the X-ray source, fluorescence intensities, absorption coefficients, and absorption edge effects for each wavelength analyzed, together with parameters for sample geometry (e.g., van Sprang, 2000) and a Compton normalization scheme (Reynolds, 1963). The “geochemistry/soils” protocol used on the ship presumes a perpendicular sample geometry. The protocol analyzes for elements at two different filter settings to optimize results. Analysis of different core materials Generally, the pXRF instrument is operated by the shipboard scientist(s), typically from the Petrology/Core Description or Geochemistry teams, who are tasked with overseeing its use. The protocol for rock surface analyses used during Expedition 366 is as follows. Rock surface samples The primary shipboard use of the pXRF instrument during Expedition 366 was to conduct quick geochemical assessments of the cored material through direct measurements on rock surfaces of either workingor archive-half core pieces. For these measurements, rock samples that could be
尽管奥林巴斯pXRF以浓度术语(百万分率或重量百分比)表示数据,但重要的是要认识到,这些值对于所有实际目的来说都只是强度读数。有必要根据要定量测量的每个元素的公认标准参考物质对仪器进行校准(例如,Ryan等人,2017)。在远征366期间,通过pXRF测量的不同元素的校准曲线使用了用于电感耦合等离子体原子发射光谱仪(ICP-AES)分析的同一套标准参考物质,以改善仪器间数据的比较(表T1)。对每种参考材料的粉末支架进行了分析,以绘制工作曲线,并在pXRF测量未知材料期间定期检查仪器性能。在Microsoft Excel中绘制工作曲线,使用工作曲线的斜率和截距值计算未知数的浓度结果(图F2)。岩石和粉末样品都使用基于粉末的工作曲线进行分析,因为过去的结果表明岩石和粉末之间的仪器性能没有差异(Ryan等人,2017;Reagan et al., 2015)。在远征366期间,通过pXRF常规测量的定量测定元素是Ca, Mn, Fe(校准为氧化物:CaO, MnO和Fe2O3), Ni, Cr, Cu, Zn和sr。在远征352期间,通过pXRF定量分析了Ti, K和Rb, Zr和V(里根等人,2015年),这些元素在远征366材料中通常低于pXRF检测限。根据一些回收材料中石膏的可能性,尝试使用硫(见表T1)。在IODP远征366期间通过pXRF使用的标准参考物质的元素丰度数据。* =用于ICP-AES数据校准的标准,远征366。下载CSV格式的表格。氧化物(wt %)元素(ppm)分别以MnO钾含量氧化铝曹二氧化钛老铁S Cr镍铜锌Rb BHVO-2 * 7.24 13.47 49.75 0.17 0.52 11.40 2.73 12.35 150 284 120 126 102 10 393 BIR-1 * 9.69 15.43 47.83 0.17 0.03 13.27 0.96 11.33 70 398 171 122 73 0 109 DNC-1 10.09 18.32 47.10 0.15 0.23 11.38 0.48 9.95 392 278 252 98 68 4 145 JP-1 * 44.66 0.64 42.39 0.12 0.00 0.56 0.01 8.36 28 2689 2467 6 36 1 3 OKUM * 21.29 7.97 44.14 0.18 0.04 7.85 0.38 11.81 2460 886 44 61 1 UB-N 16 * 35.21 2.90 39.43 0.12 0.02 1.20 0.11 8.3428 200 2361 1971 85 4 8 # - 001 * 38.22 0.48 38.54 0.08 0.02 0.68 0.02 8.00 2780 2300 DTS-2B * 49.40 0.45 39.40 0.06 0.01 0.12 0.01 7.76 15500 3780 3 45 2 1 DTS-1 * 49.55 0.19 40.41 0.12 0.00 0.17 0.00 8.68 4045 2329 6 45 0 0还92 7.64 15.84 49.89 0.17 0.16 11.13 1.78 10.20 234 107 64 86 130 3 132 8.42 5.80 33.72 0.07 1.40 20.71 0.33 2.22 27 15 17 50 37 220 BCS-CRM 393 0.15 0.12 0.70 0.01 0.02 55.40 0.01 0.05 70 160 BCS-CRM 368 20.90 0.17 0.92 0.06 30.80 0.23 82 3 67 n13.11 10.03 38.21 0.20 1.41 13.93 2.61 12.77 308 357 268 70 121 47 1381点头a - 1 4.76 3.87 3.81 23.92 0.60 15.42 0.53 15.62 3350 32 6360 1105 589 10 1749 LKSD-4 0.92 5.90 41.60 0.08 0.81 1.80 0.38 4.09 9900 27 32 31 192 110 LKSD-1 1.72 7.80 40.10 0.19 1.12 10.80 0.50 4.11 15700 22 14 DNC-1 44 334 250 10.08 18.32 47.09 0.15 0.23 11.38 0.48 9.95 392 278 252 98 68 4 145 PACS-2 2.42 6.71 59.00 0.06 1.51 2.77 0.74 5.78 12900 91 276 310 364 39 NKT-1 14.19 10.05 37.78 0.20 1.26 12.99 3.8413.29 438 315 57 117 1175 JR-1 0.11 12.86 75.43 0.10 4.41 0.65 0.11 0.93 11 31 2 30 244 29 MRG 13.55 8.47 39.12 0.17 0.18 14.70 3.77 17.94 610 430 193 134 191 9 266图F1A.存放套内的奥林巴斯DeltaX便携式x射线荧光分析仪(pXRF)。B.通用铅屏蔽样品座。C.铅屏蔽滑芯安装。D.用于核心ID的条形码阅读器。E.戴尔笔记本电脑驱动电脑。
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引用次数: 10
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Proceedings of the International Ocean Discovery Program
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