Pub Date : 2021-07-07DOI: 10.9734/bpi/rtcams/v1/10368d
M. Zamzuri, M. Marina, Rabiah Ahmad, M. Salleh, C. C. Lee, Z. Nooraizedfiza, F. Mohamad, N. Hisyamudin, M. Izaki
Electrodeposited Cu2O/AZO photovoltaic (PV) devices are promising low-cost solar cells. In this research, both layers of Cu2O and AZO heterojunction architectures are studied as a function of AZO target-Cu2O substrate distance during the sputtering process. The Cu2O/AZO PV device has been constructed by electrodeposition of a -p-Cu2O layer on an Au (111)/Si wafer substrate followed by stacking the AZO layer using a sputtering technique. The Cu2O/AZO PV device showed a photovoltaic performance under AM1.5 illumination, and the performance changed depending on the target-substrate distance. It is shown that an increase in target-substrate distance during stacking the AZO layer by sputtering mitigated the damage at the Cu2O/AZO interface. As a result, we were able to improve the Voc and power conversion efficiency from 0.16 V and 0.46 % to 0.30 V and 0.64%, respectively.
{"title":"Analysing the Sputtered Al Doped ZnO on <111>-Oriented Cu2O Heterojunction Solar Cell with Improved Performance","authors":"M. Zamzuri, M. Marina, Rabiah Ahmad, M. Salleh, C. C. Lee, Z. Nooraizedfiza, F. Mohamad, N. Hisyamudin, M. Izaki","doi":"10.9734/bpi/rtcams/v1/10368d","DOIUrl":"https://doi.org/10.9734/bpi/rtcams/v1/10368d","url":null,"abstract":"Electrodeposited Cu2O/AZO photovoltaic (PV) devices are promising low-cost solar cells. In this research, both layers of Cu2O and AZO heterojunction architectures are studied as a function of AZO target-Cu2O substrate distance during the sputtering process. The Cu2O/AZO PV device has been constructed by electrodeposition of a -p-Cu2O layer on an Au (111)/Si wafer substrate followed by stacking the AZO layer using a sputtering technique. The Cu2O/AZO PV device showed a photovoltaic performance under AM1.5 illumination, and the performance changed depending on the target-substrate distance. It is shown that an increase in target-substrate distance during stacking the AZO layer by sputtering mitigated the damage at the Cu2O/AZO interface. As a result, we were able to improve the Voc and power conversion efficiency from 0.16 V and 0.46 % to 0.30 V and 0.64%, respectively.","PeriodicalId":21032,"journal":{"name":"Recent Trends in Chemical and Material Sciences Vol. 1","volume":"30 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83149062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}