Pub Date : 2024-02-01DOI: 10.1109/mdat.2023.3335431
{"title":"IEEE Design & Test Publication Information","authors":"","doi":"10.1109/mdat.2023.3335431","DOIUrl":"https://doi.org/10.1109/mdat.2023.3335431","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139685091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-02-01DOI: 10.1109/mdat.2022.3231398
{"title":"IEEE Design & Test Publication Information","authors":"","doi":"10.1109/mdat.2022.3231398","DOIUrl":"https://doi.org/10.1109/mdat.2022.3231398","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127132163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-06-01DOI: 10.1109/mdat.2022.3163648
S. Di Carlo
{"title":"TTTC News","authors":"S. Di Carlo","doi":"10.1109/mdat.2022.3163648","DOIUrl":"https://doi.org/10.1109/mdat.2022.3163648","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126025720","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3277814
Chris Partridge, M. Gorin, E. Easley, Jesse Gray
{"title":"Five Years Teaching Ethics and Computing","authors":"Chris Partridge, M. Gorin, E. Easley, Jesse Gray","doi":"10.1109/mdat.2023.3277814","DOIUrl":"https://doi.org/10.1109/mdat.2023.3277814","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121360553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3294872
Zhan Gao, Min-Chun Hu, R. Baert, B. Chehab, J. Swenton, Santosh Malagi, J. Huisken, K. Goossens, E. Marinissen
{"title":"Cell-Aware Test on Various Circuits in an Advanced 3nm Technology","authors":"Zhan Gao, Min-Chun Hu, R. Baert, B. Chehab, J. Swenton, Santosh Malagi, J. Huisken, K. Goossens, E. Marinissen","doi":"10.1109/mdat.2023.3294872","DOIUrl":"https://doi.org/10.1109/mdat.2023.3294872","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122514999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3283351
C. Bash, Kirk M. Bresniker, Paolo Faraboschi, Tiffani Jarnigan, D. Milojicic, Pam Wood
{"title":"Ethics in Sustainability","authors":"C. Bash, Kirk M. Bresniker, Paolo Faraboschi, Tiffani Jarnigan, D. Milojicic, Pam Wood","doi":"10.1109/mdat.2023.3283351","DOIUrl":"https://doi.org/10.1109/mdat.2023.3283351","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129432896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3305156
Luke Beckwith, D. Nguyen, K. Gaj
{"title":"Hardware Accelerators for Digital Signature Algorithms Dilithium and FALCON","authors":"Luke Beckwith, D. Nguyen, K. Gaj","doi":"10.1109/mdat.2023.3305156","DOIUrl":"https://doi.org/10.1109/mdat.2023.3305156","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116509752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3292208
Mridha Md Mashahedur Rahman, Shams Tarek, K. Z. Azar, M. Tehranipoor, Farimah Farahmandi
{"title":"Efficient SoC Security Monitoring: Quality Attributes and Potential Solutions","authors":"Mridha Md Mashahedur Rahman, Shams Tarek, K. Z. Azar, M. Tehranipoor, Farimah Farahmandi","doi":"10.1109/mdat.2023.3292208","DOIUrl":"https://doi.org/10.1109/mdat.2023.3292208","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132249428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：