Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3278619
S. A. Salehi
{"title":"Area-Efficient LFSR-Based Stochastic Number Generators with Minimum Correlation","authors":"S. A. Salehi","doi":"10.1109/mdat.2023.3278619","DOIUrl":"https://doi.org/10.1109/mdat.2023.3278619","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132935445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3262741
Alexandre Joannou, Peter Rugg, Jonathan Woodruff, Franz A. Fuchs, Marno Van der Maas, Matthew Naylor, M. Roe, Robert N. M. Watson, P. Neumann, Simon W. Moore
{"title":"Randomized Testing of RISC-V CPUs using Direct Instruction Injection","authors":"Alexandre Joannou, Peter Rugg, Jonathan Woodruff, Franz A. Fuchs, Marno Van der Maas, Matthew Naylor, M. Roe, Robert N. M. Watson, P. Neumann, Simon W. Moore","doi":"10.1109/mdat.2023.3262741","DOIUrl":"https://doi.org/10.1109/mdat.2023.3262741","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116662363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3288808
S. Picek, Annelie Heuser, A. Jović, S. Bhasin, Francesco Regazzoni
{"title":"Tipping the Balance: Imbalanced Classes in Deep Learning Side-channel Analysis","authors":"S. Picek, Annelie Heuser, A. Jović, S. Bhasin, Francesco Regazzoni","doi":"10.1109/mdat.2023.3288808","DOIUrl":"https://doi.org/10.1109/mdat.2023.3288808","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126298539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3283349
K. Huang, Yu Liu, Nenad Korolija, J. Carulli, Y. Makris
{"title":"Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond","authors":"K. Huang, Yu Liu, Nenad Korolija, J. Carulli, Y. Makris","doi":"10.1109/mdat.2023.3283349","DOIUrl":"https://doi.org/10.1109/mdat.2023.3283349","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115300802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3298805
M. Moraitis, Yanning Ji, Martin Brisfors, E. Dubrova, Niklas Lindskog, H¢ªakan Englund
{"title":"Securing CRYSTALS-Kyber in FPGA Using Duplication and Clock Randomization","authors":"M. Moraitis, Yanning Ji, Martin Brisfors, E. Dubrova, Niklas Lindskog, H¢ªakan Englund","doi":"10.1109/mdat.2023.3298805","DOIUrl":"https://doi.org/10.1109/mdat.2023.3298805","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121566267","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3281733
P. Koopman, William H. Widen
— The highly tool-intensive design and validation of automated driving features brings with it significant opportunities to support ethical practices related to safety for testing and lifecycle support. This article shows how some basic principles from the IEEE 7000 standard on ethical concerns during system design can apply.
{"title":"Safety Ethics for Design & Test of Automated Driving Features","authors":"P. Koopman, William H. Widen","doi":"10.1109/mdat.2023.3281733","DOIUrl":"https://doi.org/10.1109/mdat.2023.3281733","url":null,"abstract":"— The highly tool-intensive design and validation of automated driving features brings with it significant opportunities to support ethical practices related to safety for testing and lifecycle support. This article shows how some basic principles from the IEEE 7000 standard on ethical concerns during system design can apply.","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128355810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3291331
A. Krishnakumar, Hanguang Yu, T. Ajayi, A. Alper Goksoy, V. Pandey, J. Mack, Sahil Hassan, Kuan-Yu Chen, C. Chakrabarti, D. Bliss, A. Akoglu, Hun-Seok Kim, R. Dreslinski, D. Blaauw, U. Ogras
{"title":"FALCON: An FPGA Emulation Platform for Domain-Specific Systems-on-Chip (DSSoCs)","authors":"A. Krishnakumar, Hanguang Yu, T. Ajayi, A. Alper Goksoy, V. Pandey, J. Mack, Sahil Hassan, Kuan-Yu Chen, C. Chakrabarti, D. Bliss, A. Akoglu, Hun-Seok Kim, R. Dreslinski, D. Blaauw, U. Ogras","doi":"10.1109/mdat.2023.3291331","DOIUrl":"https://doi.org/10.1109/mdat.2023.3291331","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126713696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3302809
Rob Munoz
{"title":"Furthering Moore’s Law Integration Benefits in the Chiplet Era","authors":"Rob Munoz","doi":"10.1109/mdat.2023.3302809","DOIUrl":"https://doi.org/10.1109/mdat.2023.3302809","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125486555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3298849
Somayeh Sadeghi-Kohan, S. Hellebrand, H. Wunderlich
{"title":"Workload-Aware Periodic Interconnect BIST","authors":"Somayeh Sadeghi-Kohan, S. Hellebrand, H. Wunderlich","doi":"10.1109/mdat.2023.3298849","DOIUrl":"https://doi.org/10.1109/mdat.2023.3298849","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126928437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/mdat.2023.3303435
Huili Chen, Cheng Fu, B. Rouhani, Jishen Zhao, F. Koushanfar
{"title":"Intellectual Property Protection of Deep Learning Systems via Hardware/Software Co-design","authors":"Huili Chen, Cheng Fu, B. Rouhani, Jishen Zhao, F. Koushanfar","doi":"10.1109/mdat.2023.3303435","DOIUrl":"https://doi.org/10.1109/mdat.2023.3303435","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134245259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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