Pub Date : 2022-01-17DOI: 10.1109/ARFTG52954.2022.9844065
J. Dunsmore, J. Iwai
Methods for residual measurements on mixers are difficult and require at least one other mixer making it difficult to separate the residual effects between them. Here we introduce a novel scheme that uses a system completely clocked off a single reference oscillator using pairs of DDS sources to produce an input and LO signal as well as a third DDS source to re-convert the mixer output We show the close-in phase noise is largely canceled with this method resulting in a good measure of the mixer residual phase noise somewhat independent of the raw phase noise of the DDS sources. This improvement can also be shown for close-in residual measurements of amplifiers.
{"title":"Mixer Residual Phase Noise Measurements Using Clock-locked DDS Sources and Receivers","authors":"J. Dunsmore, J. Iwai","doi":"10.1109/ARFTG52954.2022.9844065","DOIUrl":"https://doi.org/10.1109/ARFTG52954.2022.9844065","url":null,"abstract":"Methods for residual measurements on mixers are difficult and require at least one other mixer making it difficult to separate the residual effects between them. Here we introduce a novel scheme that uses a system completely clocked off a single reference oscillator using pairs of DDS sources to produce an input and LO signal as well as a third DDS source to re-convert the mixer output We show the close-in phase noise is largely canceled with this method resulting in a good measure of the mixer residual phase noise somewhat independent of the raw phase noise of the DDS sources. This improvement can also be shown for close-in residual measurements of amplifiers.","PeriodicalId":266876,"journal":{"name":"2022 98th ARFTG Microwave Measurement Conference (ARFTG)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121573225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-17DOI: 10.1109/ARFTG52954.2022.9844076
A. Hagerstrom, Angela C. Stelson, J. Jargon, Christian J.Long
We present a model and measured data to assess the uncertainties in scattering-parameter measurements due to noise floor and trace noise in the receivers of a vector network analyzer operating in the WR-15 waveguide band.
{"title":"Quantifying Noise Floor and Trace Noise in VNA Measurements for the WR-15 Waveguide Band","authors":"A. Hagerstrom, Angela C. Stelson, J. Jargon, Christian J.Long","doi":"10.1109/ARFTG52954.2022.9844076","DOIUrl":"https://doi.org/10.1109/ARFTG52954.2022.9844076","url":null,"abstract":"We present a model and measured data to assess the uncertainties in scattering-parameter measurements due to noise floor and trace noise in the receivers of a vector network analyzer operating in the WR-15 waveguide band.","PeriodicalId":266876,"journal":{"name":"2022 98th ARFTG Microwave Measurement Conference (ARFTG)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122698650","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-17DOI: 10.1109/ARFTG52954.2022.9844052
R. Kishikawa, M. Horibe, Toshiaki Ohi, A. Yamamoto, Noriyoshi Hashimoto, Ryo Takeda
This paper presents a new probe system for measuring the scattering parameters of surface mount devices in radio frequency range in response to the demand for operating power devices at higher frequencies. Two ground-source probes with 3.7 mm pitch and a probe station for controlling these probes were designed as original components of the proposed system. When used with a commercially available vector network analyzer, a de source supply, two bias-Ts, and cables, the scattering parameters with the de bias voltage supplied can be measured. This is a pioneer probe measurement system for surface mount devices in the power electronics operated at the radio frequencies. Because the probes can be used in direct contact with a surface mount device under test, precise measurement results can be obtained. The evaluation results for the stability of the developed system and contact reproducibility are also presented. Around the low reflection area, the stability of the system and the contact reproducibility of the magnitude of S11 were less than 0.00007 from 50 kHz to 300 MHz. However, these values increased at the frequencies over 1 GHz. It is confirmed that probe control is important in probe measurements especially at high frequency range.
{"title":"Probe Measurement System for Surface Mount Devices at Radio Frequencies","authors":"R. Kishikawa, M. Horibe, Toshiaki Ohi, A. Yamamoto, Noriyoshi Hashimoto, Ryo Takeda","doi":"10.1109/ARFTG52954.2022.9844052","DOIUrl":"https://doi.org/10.1109/ARFTG52954.2022.9844052","url":null,"abstract":"This paper presents a new probe system for measuring the scattering parameters of surface mount devices in radio frequency range in response to the demand for operating power devices at higher frequencies. Two ground-source probes with 3.7 mm pitch and a probe station for controlling these probes were designed as original components of the proposed system. When used with a commercially available vector network analyzer, a de source supply, two bias-Ts, and cables, the scattering parameters with the de bias voltage supplied can be measured. This is a pioneer probe measurement system for surface mount devices in the power electronics operated at the radio frequencies. Because the probes can be used in direct contact with a surface mount device under test, precise measurement results can be obtained. The evaluation results for the stability of the developed system and contact reproducibility are also presented. Around the low reflection area, the stability of the system and the contact reproducibility of the magnitude of S11 were less than 0.00007 from 50 kHz to 300 MHz. However, these values increased at the frequencies over 1 GHz. It is confirmed that probe control is important in probe measurements especially at high frequency range.","PeriodicalId":266876,"journal":{"name":"2022 98th ARFTG Microwave Measurement Conference (ARFTG)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131088157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-17DOI: 10.1109/ARFTG52954.2022.9844092
R. Sakamaki
This paper demonstrates a contactless in-situ planarity adjustment of a ground-signal-ground (GSG) probe on practical planar devices. The proposed technique completes the adjustment with minimizing footprints on the devices. Furthermore, repeatability of tilt angle was 0.6 degrees, which was compatible to a conventional manual inspection technique. No footprint was observed after the adjustment process. The proposed technique can realize in-situ planarity adjustment just above a device-under-test (DUT).
{"title":"Contactless in-situ probe planarity adjustment on co-planar devices","authors":"R. Sakamaki","doi":"10.1109/ARFTG52954.2022.9844092","DOIUrl":"https://doi.org/10.1109/ARFTG52954.2022.9844092","url":null,"abstract":"This paper demonstrates a contactless in-situ planarity adjustment of a ground-signal-ground (GSG) probe on practical planar devices. The proposed technique completes the adjustment with minimizing footprints on the devices. Furthermore, repeatability of tilt angle was 0.6 degrees, which was compatible to a conventional manual inspection technique. No footprint was observed after the adjustment process. The proposed technique can realize in-situ planarity adjustment just above a device-under-test (DUT).","PeriodicalId":266876,"journal":{"name":"2022 98th ARFTG Microwave Measurement Conference (ARFTG)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125598074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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