Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327365
Dylan F. Williams, K. Remley, D. DeGroot
We use SPICE simulations to determine a response function of a two-diode 20-GHz sampling circuit. We explore the validity of the SPICE simulations in a variety of operational conditions and examine differences between the actual response of an impedance-matched sampling circuit and the response function reconstructed by the nose-to-nose calibration procedure.
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Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327380
M. Ryba, J. Waltrich
Although digital systems are designed to carry video, voice and data services, testing with these inputs is not the most efficient way to determine the performance of system elements. The performance of digital components and subsystems can best be measured by quantitative testing via Bit Error Rate measurements using pseudorandom data inputs. This paper presents a discussion of test equipment and methodologies for quantifying the performance of digital hardware and systems under worst case conditions that may be found on cable and MMDS systems. The paper discusses test methods and test systems for use in both the laboratory and the field. Equipment descriptions are provided and test procedures are described.
{"title":"Test Methodologies for Evaluating Digital Signal Performance on Cable and Alternate Media","authors":"M. Ryba, J. Waltrich","doi":"10.1109/ARFTG.1999.327380","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327380","url":null,"abstract":"Although digital systems are designed to carry video, voice and data services, testing with these inputs is not the most efficient way to determine the performance of system elements. The performance of digital components and subsystems can best be measured by quantitative testing via Bit Error Rate measurements using pseudorandom data inputs. This paper presents a discussion of test equipment and methodologies for quantifying the performance of digital hardware and systems under worst case conditions that may be found on cable and MMDS systems. The paper discusses test methods and test systems for use in both the laboratory and the field. Equipment descriptions are provided and test procedures are described.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126950119","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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