Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327366
Dylan F. Williams, B. Alpert
A new causal power-normalized waveguide equivalent-circuit theory fixes both the magnitude and phase of the characteristic impedance of a waveguide.
一种新的因果归一化波导等效电路理论确定了波导特性阻抗的幅值和相位。
{"title":"Causality and Characteristic Impedance","authors":"Dylan F. Williams, B. Alpert","doi":"10.1109/ARFTG.1999.327366","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327366","url":null,"abstract":"A new causal power-normalized waveguide equivalent-circuit theory fixes both the magnitude and phase of the characteristic impedance of a waveguide.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"239 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125100996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327375
E. Benabe, H. Gordon, T. Weller
This paper describes the development of an equivalent circuit model for air coil inductors in the DC-4 GHz frequency range which includes substrate-dependent characteristics. The presented model is applicable to microstrip-mounted components. Limitations of the model are discussed as well as characteristics intrinsic to the inductors that greatly influence model extraction. A comparison of measured data and simulated responses is presented for the model.
{"title":"Substrate-Dependent Air-Wound Inductor Model in the DC-4 GHz Range","authors":"E. Benabe, H. Gordon, T. Weller","doi":"10.1109/ARFTG.1999.327375","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327375","url":null,"abstract":"This paper describes the development of an equivalent circuit model for air coil inductors in the DC-4 GHz frequency range which includes substrate-dependent characteristics. The presented model is applicable to microstrip-mounted components. Limitations of the model are discussed as well as characteristics intrinsic to the inductors that greatly influence model extraction. A comparison of measured data and simulated responses is presented for the model.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115111671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327371
S. Van den Bosch, L. Martens
We have implemented an active device verification procedure for noise factor measurements into existing commercially available noise measurement software. The method was used for verifying GaAs MESFET noise factor measurements. Also, an approximation was developed, providing an error on the measured 50¿ noise factors.
{"title":"Deriving Error Bounds on Measured Noise Factors Using Active Device Verification","authors":"S. Van den Bosch, L. Martens","doi":"10.1109/ARFTG.1999.327371","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327371","url":null,"abstract":"We have implemented an active device verification procedure for noise factor measurements into existing commercially available noise measurement software. The method was used for verifying GaAs MESFET noise factor measurements. Also, an approximation was developed, providing an error on the measured 50¿ noise factors.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133011371","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327381
T. Pratt
The Georgia Tech Broadband Institute of the Georgia Institute of Technology is establishing a Software Radio Laboratory in the Georgia Center for Advanced Telecommunications Technology (GCATT). The laboratory, which is planned to be operational in early 2000, has been designed as a testbed for research, development, test, and evaluation of software radio concepts. The laboratory consists of waveform generators and communications signal sources, local area networking transceivers, radio frequency (RF) channel emulators with branch diversity and smart antenna emulation capabilities, and a multichannel programmable VME-based software radio platform. The software radio platform incorporates a programmable RF front-end, digital down-converters, and multiple Quad TI-C6x DSP boards to facilitate algorithm development for intermediate frequency (IF), baseband, and bitstream processing. The laboratory promises to have capability for addressing a broad spectrum of problems including the development and test of communications modulation techniques, access methods, traffic types, channel distortion effects, transmitter diversity, receiver signal processing algorithms, coding, power control, and many other diverse topics of research.
{"title":"Georgia Tech Software Radio Laboratory","authors":"T. Pratt","doi":"10.1109/ARFTG.1999.327381","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327381","url":null,"abstract":"The Georgia Tech Broadband Institute of the Georgia Institute of Technology is establishing a Software Radio Laboratory in the Georgia Center for Advanced Telecommunications Technology (GCATT). The laboratory, which is planned to be operational in early 2000, has been designed as a testbed for research, development, test, and evaluation of software radio concepts. The laboratory consists of waveform generators and communications signal sources, local area networking transceivers, radio frequency (RF) channel emulators with branch diversity and smart antenna emulation capabilities, and a multichannel programmable VME-based software radio platform. The software radio platform incorporates a programmable RF front-end, digital down-converters, and multiple Quad TI-C6x DSP boards to facilitate algorithm development for intermediate frequency (IF), baseband, and bitstream processing. The laboratory promises to have capability for addressing a broad spectrum of problems including the development and test of communications modulation techniques, access methods, traffic types, channel distortion effects, transmitter diversity, receiver signal processing algorithms, coding, power control, and many other diverse topics of research.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131168825","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327370
D. DeGroot, K. L. Reed, J. Jargon
We use a general description of transmission lines to develop analytic descriptions for offset OSLT (Open-Short-Load-Thru) standards used to calibrate vector network analyzers. We then formulate approximations for coaxial standards that implement the equivalent circuit parameters in common use. A comparison of calibrated verification device measurements demonstrates that our representations agree well with the models used in commercial instruments.
{"title":"Equivalent Circuit Models for Coaxial OSLT Standards","authors":"D. DeGroot, K. L. Reed, J. Jargon","doi":"10.1109/ARFTG.1999.327370","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327370","url":null,"abstract":"We use a general description of transmission lines to develop analytic descriptions for offset OSLT (Open-Short-Load-Thru) standards used to calibrate vector network analyzers. We then formulate approximations for coaxial standards that implement the equivalent circuit parameters in common use. A comparison of calibrated verification device measurements demonstrates that our representations agree well with the models used in commercial instruments.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"305 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124344957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327363
F. Choubani, J. Schutt-Ainé, R. Baca
Wireless communication systems are expanding rapidly leading to the proliferation of RF applications in the UHF band (0.9-3 GHz). However stringent requirements are placed to make it essential for these applications to conform to strict technical standards and attain a high level of integration. These demands including low cost, low voltage, low power dissipation, low noise and low distortion cannot be achieved without fabricating high quality passive devices in the same substrate using the same technology. Therefore, recent advances in Bipolar, CMOS and BiCMOS processes have stimulated new approaches to circuit integration and architecture. This has included high conductivity multi-metal layers, low loss substrates and thick oxide to isolate components from lossy substrates. In parallel, with the insight gained from these investigations, simplified physical models and various numerical techniques have been developed to assess the performance of passive devices such as transmission lines and spiral inductors. Unfortunately, these approaches are not easily implemented in CAD tools and sometimes suffer from incompleteness. In fact, in many instances, circuits are successfully simulated but actual prototypes often fail to match the simulated results because of parasitic effects. This work describes the characterization of embedded transmission lines (ETL) and spiral inductors using scattering parameter measurements. A simple approximation allows for the extraction of the devices characteristics, taking into account capacitive and inductive coupling as well as losses. Thus calculations can be easily and quickly performed using these models.
{"title":"Characterization of Skin Effect in High-Speed Interconnects and Spiral Inductors","authors":"F. Choubani, J. Schutt-Ainé, R. Baca","doi":"10.1109/ARFTG.1999.327363","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327363","url":null,"abstract":"Wireless communication systems are expanding rapidly leading to the proliferation of RF applications in the UHF band (0.9-3 GHz). However stringent requirements are placed to make it essential for these applications to conform to strict technical standards and attain a high level of integration. These demands including low cost, low voltage, low power dissipation, low noise and low distortion cannot be achieved without fabricating high quality passive devices in the same substrate using the same technology. Therefore, recent advances in Bipolar, CMOS and BiCMOS processes have stimulated new approaches to circuit integration and architecture. This has included high conductivity multi-metal layers, low loss substrates and thick oxide to isolate components from lossy substrates. In parallel, with the insight gained from these investigations, simplified physical models and various numerical techniques have been developed to assess the performance of passive devices such as transmission lines and spiral inductors. Unfortunately, these approaches are not easily implemented in CAD tools and sometimes suffer from incompleteness. In fact, in many instances, circuits are successfully simulated but actual prototypes often fail to match the simulated results because of parasitic effects. This work describes the characterization of embedded transmission lines (ETL) and spiral inductors using scattering parameter measurements. A simple approximation allows for the extraction of the devices characteristics, taking into account capacitive and inductive coupling as well as losses. Thus calculations can be easily and quickly performed using these models.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128069319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327369
L. E. Duda
This paper describes the model and method used to obtain the periodically estimated uncertainties for measurement of the scattering parameters S11 and S22 on a Vector Network Analyzer (VNA). A thru-reflect-line (TRL) method is employed as a second tier calibration to obtain uncertainty estimates using an NIST-calibrated standard. An example of tabulated listings of these uncertainty estimates is presented and the uncertainties obtained for a VNA with 7 mm, 3.5 mm, and type N coaxial interfaces used in our laboratory over several years are summarized.
{"title":"Periodically Estimated Reflection Coefficient Measurement Uncertainties for a Vector Network Analyzer","authors":"L. E. Duda","doi":"10.1109/ARFTG.1999.327369","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327369","url":null,"abstract":"This paper describes the model and method used to obtain the periodically estimated uncertainties for measurement of the scattering parameters S11 and S22 on a Vector Network Analyzer (VNA). A thru-reflect-line (TRL) method is employed as a second tier calibration to obtain uncertainty estimates using an NIST-calibrated standard. An example of tabulated listings of these uncertainty estimates is presented and the uncertainties obtained for a VNA with 7 mm, 3.5 mm, and type N coaxial interfaces used in our laboratory over several years are summarized.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132257030","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327364
U. Arz, H. Grabinski, Dylan F. Williams
This work investigates the broadband propagation characteristics of transmission lines fabricated on silicon substrates of different conductivities. We compare calculations to measurements and examine the sensitivity of the frequency-dependent line parameters to substrate conductivity.
{"title":"Influence of the Substrate Resistivity on the Broadband Propagation Characteristics of Silicon Transmission Lines","authors":"U. Arz, H. Grabinski, Dylan F. Williams","doi":"10.1109/ARFTG.1999.327364","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327364","url":null,"abstract":"This work investigates the broadband propagation characteristics of transmission lines fabricated on silicon substrates of different conductivities. We compare calculations to measurements and examine the sensitivity of the frequency-dependent line parameters to substrate conductivity.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133275865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327377
R. Mahmoudi, M. Spirito, P. Valk, J. Tauritz
The recent large-scale introduction of spread spectrum techniques for personal communications (PCS) in the USA, Japan and Europe is an enormous stimulus for innovation [1]. The varieties and dynamics of spread spectrum based systems such as: frequency hopping, time domain hopping, multi carrier CDMA and the direct sequence spread spectrum technique have complicated and altered the design paradigm [2]. This diversity has confronted designers with the non-trivial task of rapidly responding to the vagaries of the mobile communication business. Complex digital communications signals with broad bandwidth, varying rectified envelope power and a relatively large crest factor have rendered inadequate traditional verification methods based on the use of CW signals [3]. The attendant demands on cost, efficiency and system constraints and the growing use of balanced circuits in broadband wireless applications has increased the need for accurate modeling and characterization of the nonlinear behavior of active devices. Since the input and output terminations of these devices dictate their large signal behavior, complete device characterization including the determination of constant output power contours requires the use of source and load tuning. Furthermore, proper verification entails simulation and test at both software and hardware levels using the same stimuli [2]. This paper offers a comprehensive, automatic tuner based solution suitable for balanced and unbalanced devices driven by WCDMA based signals.
{"title":"A Novel Load and Source Tuning System for Balanced and Unbalanced WCDMA Power Amplifiers","authors":"R. Mahmoudi, M. Spirito, P. Valk, J. Tauritz","doi":"10.1109/ARFTG.1999.327377","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327377","url":null,"abstract":"The recent large-scale introduction of spread spectrum techniques for personal communications (PCS) in the USA, Japan and Europe is an enormous stimulus for innovation [1]. The varieties and dynamics of spread spectrum based systems such as: frequency hopping, time domain hopping, multi carrier CDMA and the direct sequence spread spectrum technique have complicated and altered the design paradigm [2]. This diversity has confronted designers with the non-trivial task of rapidly responding to the vagaries of the mobile communication business. Complex digital communications signals with broad bandwidth, varying rectified envelope power and a relatively large crest factor have rendered inadequate traditional verification methods based on the use of CW signals [3]. The attendant demands on cost, efficiency and system constraints and the growing use of balanced circuits in broadband wireless applications has increased the need for accurate modeling and characterization of the nonlinear behavior of active devices. Since the input and output terminations of these devices dictate their large signal behavior, complete device characterization including the determination of constant output power contours requires the use of source and load tuning. Furthermore, proper verification entails simulation and test at both software and hardware levels using the same stimuli [2]. This paper offers a comprehensive, automatic tuner based solution suitable for balanced and unbalanced devices driven by WCDMA based signals.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129396705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-12-01DOI: 10.1109/ARFTG.1999.327361
L. Martens
This paper describes a general method to derive broadband SPICE circuit models for digital interconnects and packages. The method starts from measured or simulated S-parameters of the package or interconnects under test. The parameters are extracted with minimal optimization leading to physical values.
{"title":"Broadband Measurement-Based Modeling of Digital Interconnect","authors":"L. Martens","doi":"10.1109/ARFTG.1999.327361","DOIUrl":"https://doi.org/10.1109/ARFTG.1999.327361","url":null,"abstract":"This paper describes a general method to derive broadband SPICE circuit models for digital interconnects and packages. The method starts from measured or simulated S-parameters of the package or interconnects under test. The parameters are extracted with minimal optimization leading to physical values.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130393125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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