J. Yang, S. Jahdi, B. Stark, J. Ortiz-Gonzalez, Rui Wu, O. Alatise, P. Mellor
In this paper, measurements on gate threshold voltage drift by sweeping the gate voltage and both with positive and negative DC gate stressing are performed on symmetrical and asymmetrical double-trench SiC MOSFETs with comparison to SiC planar MOSFET at a range of temperatures. For the sweeping stress, the impact of sweeping speed on SiC MOSFET characteristics is also presented. In the experiments of DC gate stressing, the mobility degradation and threshold voltage drift values are obtained. Comparisons for threshold voltage drift in regard to temperature rise is made between different gate-structured SiC MOSFETs.
{"title":"Investigation on threshold voltage instability under sweeping and DC gate bias stressing of SiC symmetrical and asymmetrical double-trench MOSFETs","authors":"J. Yang, S. Jahdi, B. Stark, J. Ortiz-Gonzalez, Rui Wu, O. Alatise, P. Mellor","doi":"10.1049/icp.2022.1066","DOIUrl":"https://doi.org/10.1049/icp.2022.1066","url":null,"abstract":"In this paper, measurements on gate threshold voltage drift by sweeping the gate voltage and both with positive and negative DC gate stressing are performed on symmetrical and asymmetrical double-trench SiC MOSFETs with comparison to SiC planar MOSFET at a range of temperatures. For the sweeping stress, the impact of sweeping speed on SiC MOSFET characteristics is also presented. In the experiments of DC gate stressing, the mobility degradation and threshold voltage drift values are obtained. Comparisons for threshold voltage drift in regard to temperature rise is made between different gate-structured SiC MOSFETs.","PeriodicalId":288253,"journal":{"name":"11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125985158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Experimental spherical permanent-magnet generator","authors":"C. Brady, C. Crabtree","doi":"10.1049/icp.2022.1029","DOIUrl":"https://doi.org/10.1049/icp.2022.1029","url":null,"abstract":"","PeriodicalId":288253,"journal":{"name":"11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)","volume":"17 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132365331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"SiC MOSFET junction temperature estimation based on the principal components regressed model","authors":"J. Lin, H. Chen, J. Liu, J. Wei, B. Ji","doi":"10.1049/icp.2022.1093","DOIUrl":"https://doi.org/10.1049/icp.2022.1093","url":null,"abstract":"","PeriodicalId":288253,"journal":{"name":"11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133945161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Online MTPA tracking for optimal performance of IPMSM based compressor drives","authors":"V. Chandrasekaran, B. Jose, N. Mohan, K. Basu","doi":"10.1049/icp.2022.1094","DOIUrl":"https://doi.org/10.1049/icp.2022.1094","url":null,"abstract":"","PeriodicalId":288253,"journal":{"name":"11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134102189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Study of an electrical LNG plant with active front end drive systems for equipment failure","authors":"T. Fujii, H. Masuda, Y. Ogashi, T. Oka","doi":"10.1049/icp.2022.1008","DOIUrl":"https://doi.org/10.1049/icp.2022.1008","url":null,"abstract":"","PeriodicalId":288253,"journal":{"name":"11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131777542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Estimating the future numbers of EV&HV battery cells available for second life repurposing","authors":"M. Beatty, D. Strickland, P. Ferreira","doi":"10.1049/icp.2022.1020","DOIUrl":"https://doi.org/10.1049/icp.2022.1020","url":null,"abstract":"","PeriodicalId":288253,"journal":{"name":"11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129376093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A combination of hybrid generator and battery system for frequency support","authors":"R. Guo, N. Schofield, N. Zhao","doi":"10.1049/icp.2022.1140","DOIUrl":"https://doi.org/10.1049/icp.2022.1140","url":null,"abstract":"","PeriodicalId":288253,"journal":{"name":"11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131134545","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Experimental analysis of additively manufactured air-cooled splayed end-windings","authors":"F. E. Tocher, G. Yiannakou, N. Simpson, P. Mellor","doi":"10.1049/icp.2022.1085","DOIUrl":"https://doi.org/10.1049/icp.2022.1085","url":null,"abstract":"","PeriodicalId":288253,"journal":{"name":"11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131411019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
E. MacRae, R. Pollock, N. McNeill, D. Holliday, K. Ahmed, B. Williams
{"title":"Experimental efficiency comparison of a superjunction MOSFET, IGBT and SiC MOSFET for switched reluctance machine drives","authors":"E. MacRae, R. Pollock, N. McNeill, D. Holliday, K. Ahmed, B. Williams","doi":"10.1049/icp.2022.1118","DOIUrl":"https://doi.org/10.1049/icp.2022.1118","url":null,"abstract":"","PeriodicalId":288253,"journal":{"name":"11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)","volume":"192 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115491254","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Robinson, R. Xu, M. Littlefair, A. Gallant, A. Horsfall
{"title":"Impact of turn off transients on MOSFET failure during short circuit events","authors":"L. Robinson, R. Xu, M. Littlefair, A. Gallant, A. Horsfall","doi":"10.1049/icp.2022.1139","DOIUrl":"https://doi.org/10.1049/icp.2022.1139","url":null,"abstract":"","PeriodicalId":288253,"journal":{"name":"11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115802236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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