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Proceedings of the 47th Design Automation Conference最新文献

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Session details: Tools for effective post-silicon validation and test 会议细节:有效的后硅验证和测试工具
Pub Date : 2010-06-13 DOI: 10.1145/3254426
M. Tahoori
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引用次数: 0
Session details: Thermal tracking, monitoring and characterization 会议细节:热跟踪,监测和表征
Pub Date : 2010-06-13 DOI: 10.1145/3254408
S. Memik
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引用次数: 0
Session details: Special session: The analog model crisis - how can we solve it? 特别会议:模拟模型危机——我们如何解决它?
Pub Date : 2010-06-13 DOI: 10.1145/3254429
Kevin D. Jones
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引用次数: 0
Session details: Advanced clock design and flip-chip layout 会议细节:先进的时钟设计和倒装芯片布局
Pub Date : 2010-06-13 DOI: 10.1145/3254409
Yegna Parasuram
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引用次数: 0
Session details: Panel 会议详情:
Pub Date : 2010-06-13 DOI: 10.1145/3254422
Andrew Yang
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引用次数: 0
Session details: Placement: from traditional techniques to novel circuit styles 会议细节:安置:从传统的技术到新颖的电路风格
Pub Date : 2010-06-13 DOI: 10.1145/3254421
Bill Halpin
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引用次数: 0
Session details: Application and improvement of dynamic verification 会议详情:动态验证的应用与改进
Pub Date : 2010-06-13 DOI: 10.1145/3254448
D. Stoffel
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引用次数: 0
Session details: Panel 会议详情:
Pub Date : 2010-06-13 DOI: 10.1145/3254452
D. Gajski
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引用次数: 0
Session details: Joint user track panel: What will make your next design experience a much better one? 会议详情:联合用户跟踪小组:如何让您的下一个设计体验更好?
Pub Date : 2010-06-13 DOI: 10.1145/3254446
Juan-Antonio Caraballo
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引用次数: 0
Session details: Catch of the day in benchmarking and optimal synthesis 会议细节:在基准测试和最佳合成的一天捕获
Pub Date : 2010-06-13 DOI: 10.1145/3254439
Bryan Hu
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引用次数: 0
期刊
Proceedings of the 47th Design Automation Conference
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