{"title":"Session details: Special session: Design closure for reliability","authors":"M. Fujita","doi":"10.1145/3254435","DOIUrl":"https://doi.org/10.1145/3254435","url":null,"abstract":"","PeriodicalId":316041,"journal":{"name":"Proceedings of the 47th Design Automation Conference","volume":"53 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116262613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Thermal management and optimization","authors":"G. Rose","doi":"10.1145/3254438","DOIUrl":"https://doi.org/10.1145/3254438","url":null,"abstract":"","PeriodicalId":316041,"journal":{"name":"Proceedings of the 47th Design Automation Conference","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126127998","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Reducing the cost of test","authors":"M. Soma","doi":"10.1145/3254456","DOIUrl":"https://doi.org/10.1145/3254456","url":null,"abstract":"","PeriodicalId":316041,"journal":{"name":"Proceedings of the 47th Design Automation Conference","volume":"35 3-4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132845233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Special session: WACI: wild and crazy ideas","authors":"William Joyner","doi":"10.1145/3254441","DOIUrl":"https://doi.org/10.1145/3254441","url":null,"abstract":"","PeriodicalId":316041,"journal":{"name":"Proceedings of the 47th Design Automation Conference","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133654253","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Parallel and efficient techniques in circuit simulation","authors":"Xin Li","doi":"10.1145/3254437","DOIUrl":"https://doi.org/10.1145/3254437","url":null,"abstract":"","PeriodicalId":316041,"journal":{"name":"Proceedings of the 47th Design Automation Conference","volume":"266 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133349140","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: New frontiers in routing","authors":"Minsik Cho","doi":"10.1145/3254415","DOIUrl":"https://doi.org/10.1145/3254415","url":null,"abstract":"","PeriodicalId":316041,"journal":{"name":"Proceedings of the 47th Design Automation Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122362307","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Yield-aware optimization and modeling for analog circuits","authors":"Trent McConaghy","doi":"10.1145/3254455","DOIUrl":"https://doi.org/10.1145/3254455","url":null,"abstract":"","PeriodicalId":316041,"journal":{"name":"Proceedings of the 47th Design Automation Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114363967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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