{"title":"Numerical approximation of centred fan field region for the indentation of granular material by a smooth rigid wedge","authors":"S. Ayob, Nor Alisa Mohd Damanhuri","doi":"10.1063/1.5121045","DOIUrl":"https://doi.org/10.1063/1.5121045","url":null,"abstract":"","PeriodicalId":325925,"journal":{"name":"THE 4TH INNOVATION AND ANALYTICS CONFERENCE & EXHIBITION (IACE 2019)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116772010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Prediction stock price movement using subsethood and weighted subsethood fuzzy time series models","authors":"Rosnalini Mansor, Bahtiar Jamili Zaini, N. Yusof","doi":"10.1063/1.5121123","DOIUrl":"https://doi.org/10.1063/1.5121123","url":null,"abstract":"","PeriodicalId":325925,"journal":{"name":"THE 4TH INNOVATION AND ANALYTICS CONFERENCE & EXHIBITION (IACE 2019)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133105479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Over the years, there has been exponential growth in the number of Doctor of Philosophy (Ph.D) graduates in most of the universities all around the world. The increment of Ph.D students causes both university and government bodies concern about the capability of the Ph.D students to accomplish the mission of Graduate on Time (GOT) that is stipulated by the university. Therefore, this study aims to classify the Ph.D students into the group of “GOT achiever” and “non-GOT achiever” by using decision tree models. Historical data that related to all Ph.D students in a public university in Malaysia has been obtained directly from the database of Graduate Academic Information System (GAIS) in order to develop and compare the performance of decision tree models (Chi-square algorithm, Gini index algorithm, Entropy algorithm and an interactive decision tree). The result gained in four decision tree models illustrated that the attributes of English background, gender and the Ph.D students’entry Cumulative Grade Point Average (CGPA) result are the core in impacting the students’ success. Among all models, decision tree model with Entropy algorithm perform the best by scoring the highest accuracy rate (72%) and sensitivity rate (95%). Therefore, it has been selected as the best model for predicting the ability of the Ph.D students in achieving GOT. The outcome can certainly ease the burden of universities in handling and controlling the GOT issue. Also, the model can be used by the university to uncover the restriction in this issue so that better plans can be carried out to boost the number of GOT achiever in future.
{"title":"A study of graduate on time (GOT) for Ph.D students using decision tree model","authors":"Wan Yung Chin, Chee Keong Ch’ng, J. Jamil","doi":"10.1063/1.5121085","DOIUrl":"https://doi.org/10.1063/1.5121085","url":null,"abstract":"Over the years, there has been exponential growth in the number of Doctor of Philosophy (Ph.D) graduates in most of the universities all around the world. The increment of Ph.D students causes both university and government bodies concern about the capability of the Ph.D students to accomplish the mission of Graduate on Time (GOT) that is stipulated by the university. Therefore, this study aims to classify the Ph.D students into the group of “GOT achiever” and “non-GOT achiever” by using decision tree models. Historical data that related to all Ph.D students in a public university in Malaysia has been obtained directly from the database of Graduate Academic Information System (GAIS) in order to develop and compare the performance of decision tree models (Chi-square algorithm, Gini index algorithm, Entropy algorithm and an interactive decision tree). The result gained in four decision tree models illustrated that the attributes of English background, gender and the Ph.D students’entry Cumulative Grade Point Average (CGPA) result are the core in impacting the students’ success. Among all models, decision tree model with Entropy algorithm perform the best by scoring the highest accuracy rate (72%) and sensitivity rate (95%). Therefore, it has been selected as the best model for predicting the ability of the Ph.D students in achieving GOT. The outcome can certainly ease the burden of universities in handling and controlling the GOT issue. Also, the model can be used by the university to uncover the restriction in this issue so that better plans can be carried out to boost the number of GOT achiever in future.","PeriodicalId":325925,"journal":{"name":"THE 4TH INNOVATION AND ANALYTICS CONFERENCE & EXHIBITION (IACE 2019)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117309212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Semiconductor manufacturing is a complex and expensive process. The semiconductor packaging trending towards for more complex package with higher performance and lower power consumption. The silicon die is manufactured using smaller fab process technology node and packaging technology is using more complex and expensive packaging. The semiconductor packaging trend has evolved from single die packaging to multi die packaging. The multi die packaging requires more processing steps and tools in assembly process as well. All these factors cause cost per unit to increase. With this multi die packaging, it results higher loss in production yield compared to single die packaging because overall yield now is a function of multiplication of yield for each individual die. If any die from the final package tested at Class and found to be faulty not meeting the product specification, even the rest of die still passing the tests, the whole package will still be scrapped. This resulting in wasted good raw material (good die and good substrate) and manufacturing capacity used to assemble and test affected bad package. In this research work, a new framework is proposed for model training and evaluation for the machine learning application in semiconductor test with objective to screen bad die using machine learning before die attachment to package. The model training flow will have 2 classifier groupings which are control group and auto machine learning (ML) where feature selection with redundancy elimination method to be applied on input data to reduce the number of variables to minimum prior modeling flow. The control group will serve as reference. The other group, will use auto machine learning (ML) to run multiple classifiers automatically and only top 3 to be selected for next step. The performance metric used is recall rate at specified precision from ROI breakeven point. The threshold probability that correspond to fixed precision will be set as the classifier threshold during model evaluation on unseen datasets. The model evaluation flow will use 3 different non-overlapped datasets and comparison of classifiers will be based on recall rate and precision rate. This new framework will be able to provide range of possible recall rate from minimum to maximum, to identify which classifier algorithm performs the best for given dataset. The selected model can be implemented into actual manufacturing flow to screen predicted bad die for maximum cost scrapping avoidance and capacity savings.
{"title":"Evaluation of machine learning classifiers in faulty die prediction to maximize cost scrapping avoidance and assembly test capacity savings in semiconductor integrated circuit (IC) manufacturing","authors":"Azlan Faizal Mohd Fazil, I. Shaharanee, J. Jamil","doi":"10.1063/1.5121089","DOIUrl":"https://doi.org/10.1063/1.5121089","url":null,"abstract":"Semiconductor manufacturing is a complex and expensive process. The semiconductor packaging trending towards for more complex package with higher performance and lower power consumption. The silicon die is manufactured using smaller fab process technology node and packaging technology is using more complex and expensive packaging. The semiconductor packaging trend has evolved from single die packaging to multi die packaging. The multi die packaging requires more processing steps and tools in assembly process as well. All these factors cause cost per unit to increase. With this multi die packaging, it results higher loss in production yield compared to single die packaging because overall yield now is a function of multiplication of yield for each individual die. If any die from the final package tested at Class and found to be faulty not meeting the product specification, even the rest of die still passing the tests, the whole package will still be scrapped. This resulting in wasted good raw material (good die and good substrate) and manufacturing capacity used to assemble and test affected bad package. In this research work, a new framework is proposed for model training and evaluation for the machine learning application in semiconductor test with objective to screen bad die using machine learning before die attachment to package. The model training flow will have 2 classifier groupings which are control group and auto machine learning (ML) where feature selection with redundancy elimination method to be applied on input data to reduce the number of variables to minimum prior modeling flow. The control group will serve as reference. The other group, will use auto machine learning (ML) to run multiple classifiers automatically and only top 3 to be selected for next step. The performance metric used is recall rate at specified precision from ROI breakeven point. The threshold probability that correspond to fixed precision will be set as the classifier threshold during model evaluation on unseen datasets. The model evaluation flow will use 3 different non-overlapped datasets and comparison of classifiers will be based on recall rate and precision rate. This new framework will be able to provide range of possible recall rate from minimum to maximum, to identify which classifier algorithm performs the best for given dataset. The selected model can be implemented into actual manufacturing flow to screen predicted bad die for maximum cost scrapping avoidance and capacity savings.","PeriodicalId":325925,"journal":{"name":"THE 4TH INNOVATION AND ANALYTICS CONFERENCE & EXHIBITION (IACE 2019)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116303778","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"MKSOR iterative method for the Grünwald implicit finite difference solution of one-dimensional time-fractional parabolic equations","authors":"F. A. Muhiddin, J. Sulaiman, A. Sunarto","doi":"10.1063/1.5121063","DOIUrl":"https://doi.org/10.1063/1.5121063","url":null,"abstract":"","PeriodicalId":325925,"journal":{"name":"THE 4TH INNOVATION AND ANALYTICS CONFERENCE & EXHIBITION (IACE 2019)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114237391","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Online process monitoring using multiscale principal component analysis","authors":"Muhammad Nawaz, A. Maulud, H. Zabiri","doi":"10.1063/1.5121128","DOIUrl":"https://doi.org/10.1063/1.5121128","url":null,"abstract":"","PeriodicalId":325925,"journal":{"name":"THE 4TH INNOVATION AND ANALYTICS CONFERENCE & EXHIBITION (IACE 2019)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122997660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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