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Subspace Predictive Control for General Dual-Rate Sampled-Data Systems 通用双速率采样数据系统的子空间预测控制
Q4 Engineering Pub Date : 2008-03-26 DOI: 10.15017/1654537
Pan Qin, S. Kanae, Zi‐Jiang Yang, K. Wada
{"title":"Subspace Predictive Control for General Dual-Rate Sampled-Data Systems","authors":"Pan Qin, S. Kanae, Zi‐Jiang Yang, K. Wada","doi":"10.15017/1654537","DOIUrl":"https://doi.org/10.15017/1654537","url":null,"abstract":"","PeriodicalId":39314,"journal":{"name":"Research Reports on Information Science and Electrical Engineering of Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2008-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66745400","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A High Precision Current Source Circuit by Means of Switched-Capacitor and PLL for BOST 一种基于开关电容和锁相环的高精度电流源电路
Q4 Engineering Pub Date : 2008-03-26 DOI: 10.15017/1654539
Tianmao Li, H. Tashiro, Haruki Uchihata, Y. Kuroki
In this work, a high precision current source circuit by means of switched-capacitor and PLL(phase-locked loop) for BOST(build-out-self-test) is presented. A relationship between the reference current value and switching-frequency is analyzed to improve the precision of current source circuit. The proposed circuit operates under 3.3V supply with a 100pA reference current source according to Hspice simulation and shows a precision less than 0.8%.
本文提出了一种基于开关电容和锁相环的高精度电流源电路,用于自检测。分析了基准电流值与开关频率的关系,提高了电流源电路的精度。根据Hspice仿真,该电路工作在3.3V电源和100pA参考电流源下,精度小于0.8%。
{"title":"A High Precision Current Source Circuit by Means of Switched-Capacitor and PLL for BOST","authors":"Tianmao Li, H. Tashiro, Haruki Uchihata, Y. Kuroki","doi":"10.15017/1654539","DOIUrl":"https://doi.org/10.15017/1654539","url":null,"abstract":"In this work, a high precision current source circuit by means of switched-capacitor and PLL(phase-locked loop) for BOST(build-out-self-test) is presented. A relationship between the reference current value and switching-frequency is analyzed to improve the precision of current source circuit. The proposed circuit operates under 3.3V supply with a 100pA reference current source according to Hspice simulation and shows a precision less than 0.8%.","PeriodicalId":39314,"journal":{"name":"Research Reports on Information Science and Electrical Engineering of Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2008-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66745414","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Identification of lifted state-space models for a class of dual-rate systems from input-output data 基于输入-输出数据的一类双速率系统提升状态空间模型的识别
Q4 Engineering Pub Date : 2007-09-26 DOI: 10.15017/1517908
Pan Qin, S. Kanae, 金江 春植, Zi‐Jiang Yang, 楊 子江, K. Wada, 和田 清, シュンショク カナエ, ワダ キヨシ
{"title":"Identification of lifted state-space models for a class of dual-rate systems from input-output data","authors":"Pan Qin, S. Kanae, 金江 春植, Zi‐Jiang Yang, 楊 子江, K. Wada, 和田 清, シュンショク カナエ, ワダ キヨシ","doi":"10.15017/1517908","DOIUrl":"https://doi.org/10.15017/1517908","url":null,"abstract":"","PeriodicalId":39314,"journal":{"name":"Research Reports on Information Science and Electrical Engineering of Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66745774","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Satellite Link-Like Bit Error Model Based on the Received Signal Level for Link Simulator's Error Implementation 链路模拟器误差实现中基于接收信号电平的类卫星链路误码模型
Q4 Engineering Pub Date : 2006-03-24 DOI: 10.15017/1516215
F. F. Franklin, K. Fujisaki, 藤崎 清孝, T. Matsuoka, 松岡 剛志, M. Tateiba, 光生 立居場, キヨタカ フジサキ, ツヨシ マツオカ, ミツオ タテイバ
Both changes in speed and protocols in data transfer via satellite links will be an attraction for various services and will extend the terrestrial network to remote areas without the need for costly and limited terrestrial network. However, high frequency satellite links are subject to climatic impairments, especially rainfall. In varying weather conditions, these links show wide variations of bit errors and could not allow the achievement of reliable communication. In some existing systems, these problems are solved by providing the system an extra power margin. At these frequencies and above, the link margin is about 10-20dB. If this supply power is provided for a long period of time, the considered system will turn to be inefficient. It seems therefore important to conduct some experiments in order to develop new protocol or improve existing one for an efficient and reliable data transfer. The non-permanent access to satellite links for experimental purposes can be supplied by indoor apparatus or computer software that generates test conditions approximating actual or operation conditions. Up to now, some satellite link simulators are being developed [1]. These simulators use an Additive White Gaussian Noise (AWGN) to generate the channel error which is not generally the case for satellite links under climatic effects. The intent of this paper is to present and evaluate an efficient bit error generation algorithm based on the statistical analysis of the received signal level in practice. This algorithm is one of the key points for developing a satellite link simulator suitable for the design of today and future communication links[2].
通过卫星链路传输数据的速度和协议的变化将吸引各种服务,并将把地面网络扩展到偏远地区,而不需要昂贵和有限的地面网络。然而,高频卫星连接受到气候的损害,特别是降雨。在不同的天气条件下,这些链路显示出很大的误码变化,无法实现可靠的通信。在一些现有的系统中,这些问题是通过提供系统额外的功率余量来解决的。在这些频率及以上,链路余量约为10-20dB。如果长时间提供这种供电电源,所考虑的系统将变得低效。因此,进行一些实验以开发新协议或改进现有协议以实现高效可靠的数据传输似乎很重要。用于实验目的的卫星链路的非永久性接入可以由室内设备或计算机软件提供,这些设备或软件产生接近实际或操作条件的测试条件。到目前为止,一些卫星链路模拟器正在研制中。这些模拟器使用加性高斯白噪声(AWGN)来产生信道误差,这在气候影响下卫星链路通常不会出现。本文的目的是在实际应用中提出并评估一种基于接收信号电平统计分析的有效误码生成算法。该算法是研制适合当前和未来通信链路设计的卫星链路模拟器的关键之一。
{"title":"A Satellite Link-Like Bit Error Model Based on the Received Signal Level for Link Simulator's Error Implementation","authors":"F. F. Franklin, K. Fujisaki, 藤崎 清孝, T. Matsuoka, 松岡 剛志, M. Tateiba, 光生 立居場, キヨタカ フジサキ, ツヨシ マツオカ, ミツオ タテイバ","doi":"10.15017/1516215","DOIUrl":"https://doi.org/10.15017/1516215","url":null,"abstract":"Both changes in speed and protocols in data transfer via satellite links will be an attraction for various services and will extend the terrestrial network to remote areas without the need for costly and limited terrestrial network. However, high frequency satellite links are subject to climatic impairments, especially rainfall. In varying weather conditions, these links show wide variations of bit errors and could not allow the achievement of reliable communication. In some existing systems, these problems are solved by providing the system an extra power margin. At these frequencies and above, the link margin is about 10-20dB. If this supply power is provided for a long period of time, the considered system will turn to be inefficient. It seems therefore important to conduct some experiments in order to develop new protocol or improve existing one for an efficient and reliable data transfer. The non-permanent access to satellite links for experimental purposes can be supplied by indoor apparatus or computer software that generates test conditions approximating actual or operation conditions. Up to now, some satellite link simulators are being developed [1]. These simulators use an Additive White Gaussian Noise (AWGN) to generate the channel error which is not generally the case for satellite links under climatic effects. The intent of this paper is to present and evaluate an efficient bit error generation algorithm based on the statistical analysis of the received signal level in practice. This algorithm is one of the key points for developing a satellite link simulator suitable for the design of today and future communication links[2].","PeriodicalId":39314,"journal":{"name":"Research Reports on Information Science and Electrical Engineering of Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2006-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66745763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Solid-Phase Growth of β-FeSi_2 on Si Substrates with Different Crystal Orientations β-FeSi_2在不同晶向Si衬底上的固相生长
Q4 Engineering Pub Date : 2003-09-26 DOI: 10.15017/1515849
Y. Murakami, Yutaka Yoshikado, A. Kenjo, T. Yoshitake, T. Sadoh, T. Sado
Orientation dependent solid-phase growth of /3-FeSi2 thin films on (100), (110), and (111) Si substrates has been investigated by using a-Fe(thickness: 20 nm)/c-Si stacked structures. XRD measurements suggested that the substrate orientation dependence of the formation rate of /3-FeSi2 was as follows: (100) > (111) > (110). This dependence can be explained on the basis of the lattice mismatch between /3-FeSi2 and Si substrates, i.e., the lattice mismatch between 13-FeSi2 (100) and Si (100), / -FeSi2 (110) or (101) and Si (111), and 13-FeSi2 (010) or (001) and Si (110) are 1.4-2.0%, 5.3-5.5%, and 9.2%, respectively. The substrate orientation dependence of solid-phase growth becomes relatively remarkable for very thin films.
采用a-Fe(厚度:20 nm)/c-Si堆叠结构,研究了/3-FeSi2薄膜在(100)、(110)和(111)Si衬底上的取向依赖固相生长。XRD测量结果表明,/3-FeSi2的形成速率与衬底取向的关系为:(100)>(111)>(110)。这种依赖性可以通过/3-FeSi2与Si衬底之间的晶格失配来解释,即13-FeSi2(100)与Si(100)、/ -FeSi2(110)或(101)与Si(111)、13-FeSi2(010)或(001)与Si(110)之间的晶格失配分别为1.4-2.0%、5.3-5.5%和9.2%。对于非常薄的薄膜,固相生长对衬底取向的依赖性变得相对显著。
{"title":"Solid-Phase Growth of β-FeSi_2 on Si Substrates with Different Crystal Orientations","authors":"Y. Murakami, Yutaka Yoshikado, A. Kenjo, T. Yoshitake, T. Sadoh, T. Sado","doi":"10.15017/1515849","DOIUrl":"https://doi.org/10.15017/1515849","url":null,"abstract":"Orientation dependent solid-phase growth of /3-FeSi2 thin films on (100), (110), and (111) Si substrates has been investigated by using a-Fe(thickness: 20 nm)/c-Si stacked structures. XRD measurements suggested that the substrate orientation dependence of the formation rate of /3-FeSi2 was as follows: (100) > (111) > (110). This dependence can be explained on the basis of the lattice mismatch between /3-FeSi2 and Si substrates, i.e., the lattice mismatch between 13-FeSi2 (100) and Si (100), / -FeSi2 (110) or (101) and Si (111), and 13-FeSi2 (010) or (001) and Si (110) are 1.4-2.0%, 5.3-5.5%, and 9.2%, respectively. The substrate orientation dependence of solid-phase growth becomes relatively remarkable for very thin films.","PeriodicalId":39314,"journal":{"name":"Research Reports on Information Science and Electrical Engineering of Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66745719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Furnace Annealing Behavior of B-doped Poly-SiGe Formed on Insulating Film 在绝缘膜上形成掺杂b的聚sige的炉内退火行为
Q4 Engineering Pub Date : 2003-09-26 DOI: 10.15017/1515848
I. Tsunoda, T. Sadoh, M. Miyao
{"title":"Furnace Annealing Behavior of B-doped Poly-SiGe Formed on Insulating Film","authors":"I. Tsunoda, T. Sadoh, M. Miyao","doi":"10.15017/1515848","DOIUrl":"https://doi.org/10.15017/1515848","url":null,"abstract":"","PeriodicalId":39314,"journal":{"name":"Research Reports on Information Science and Electrical Engineering of Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66745708","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fast Separation of DNA Fragments in On-chip Electrophoresis Microcapillary 芯片电泳微毛细管快速分离DNA片段
Q4 Engineering Pub Date : 2003-03-26 DOI: 10.15017/1515815
S. Etoh, 江藤 信一, Shinichi Eto, T. Higashi, 東 俊人, T. Fujimura, 藤村 剛, R. Hattori, 服部 励治, Y. Kuroki, 黒木 幸令
Separation of DNA fragments is performed in on-chip electrophoresis microcapillary fabricated on a photosensitive glass. Since the UV-irradiated part of the photosensitive glass has the etching rate 20 times higher than the other parts, we can obtain the channel structure with the high aspect ratio, which is valuable to the high-sensitivity detection of the signal. The confocal laser scanning microscopy (CLSM) is used to observe and detect the fluorescent sample plug in the on-chip electrophoresis microcapillary. The CLSM is a powerful tool to observe and detect the sample inside the channel since it can capture the fluorescence images and can vary the laser focal plane depth. In this study, Hydroethylcellurose (HEC) polymer solution is using in the electrophoresis as sieving matrix. Therefore the on-chip electrophoresis microcapillary with the short separation channel is able to separate DNA fragments.
DNA片段的分离是在光敏玻璃上制作的片上电泳微毛细管中进行的。由于光敏玻璃的紫外照射部分的蚀刻速率比其他部分高20倍,我们可以获得具有高纵横比的通道结构,这对信号的高灵敏度检测有价值。采用共聚焦激光扫描显微镜(CLSM)对片上电泳微毛细管中的荧光样品进行观察和检测。由于CLSM可以捕获荧光图像,并且可以改变激光焦平面深度,因此它是观察和检测通道内样品的强大工具。在这项研究中,氢乙基纤维素(HEC)聚合物溶液作为过筛基质用于电泳。因此,具有短分离通道的片上电泳微毛细管能够分离DNA片段。
{"title":"Fast Separation of DNA Fragments in On-chip Electrophoresis Microcapillary","authors":"S. Etoh, 江藤 信一, Shinichi Eto, T. Higashi, 東 俊人, T. Fujimura, 藤村 剛, R. Hattori, 服部 励治, Y. Kuroki, 黒木 幸令","doi":"10.15017/1515815","DOIUrl":"https://doi.org/10.15017/1515815","url":null,"abstract":"Separation of DNA fragments is performed in on-chip electrophoresis microcapillary fabricated on a photosensitive glass. Since the UV-irradiated part of the photosensitive glass has the etching rate 20 times higher than the other parts, we can obtain the channel structure with the high aspect ratio, which is valuable to the high-sensitivity detection of the signal. The confocal laser scanning microscopy (CLSM) is used to observe and detect the fluorescent sample plug in the on-chip electrophoresis microcapillary. The CLSM is a powerful tool to observe and detect the sample inside the channel since it can capture the fluorescence images and can vary the laser focal plane depth. In this study, Hydroethylcellurose (HEC) polymer solution is using in the electrophoresis as sieving matrix. Therefore the on-chip electrophoresis microcapillary with the short separation channel is able to separate DNA fragments.","PeriodicalId":39314,"journal":{"name":"Research Reports on Information Science and Electrical Engineering of Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2003-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66745698","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On Parameter Estimation of Autoregressive Process in the Presence of Noise 噪声存在下自回归过程的参数估计
Q4 Engineering Pub Date : 2001-09-26 DOI: 10.15017/1515734
L. Jia, C. Jin, 金江 春植, Zi‐Jiang Yang, 楊 子江, K. Wada, 和田 清, キン シュンショク, ヨウ シコウ, ワダ キヨシ
{"title":"On Parameter Estimation of Autoregressive Process in the Presence of Noise","authors":"L. Jia, C. Jin, 金江 春植, Zi‐Jiang Yang, 楊 子江, K. Wada, 和田 清, キン シュンショク, ヨウ シコウ, ワダ キヨシ","doi":"10.15017/1515734","DOIUrl":"https://doi.org/10.15017/1515734","url":null,"abstract":"","PeriodicalId":39314,"journal":{"name":"Research Reports on Information Science and Electrical Engineering of Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66744859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
新しい自己組織化マップに基づくR*-tree : 構築と検索 基于新的自组装图谱的R*-tree:构建和搜索
Q4 Engineering Pub Date : 2001-09-01 DOI: 10.15017/1515738
Yaokai Feng, 久保 正明, Zaher Aghbari
{"title":"新しい自己組織化マップに基づくR*-tree : 構築と検索","authors":"Yaokai Feng, 久保 正明, Zaher Aghbari","doi":"10.15017/1515738","DOIUrl":"https://doi.org/10.15017/1515738","url":null,"abstract":"","PeriodicalId":39314,"journal":{"name":"Research Reports on Information Science and Electrical Engineering of Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66744868","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Comparison between Genetic Network Programing and Genetic Programming using evolution of ant's behaviors 基于蚁群行为进化的遗传网络规划与遗传规划的比较
Q4 Engineering Pub Date : 2001-06-01 DOI: 10.1541/IEEJEISS1987.121.6_1001
K. Hirasawa, Masafumi Okubo, H. Katagiri, Jinglu Hu, J. Murata
{"title":"Comparison between Genetic Network Programing and Genetic Programming using evolution of ant's behaviors","authors":"K. Hirasawa, Masafumi Okubo, H. Katagiri, Jinglu Hu, J. Murata","doi":"10.1541/IEEJEISS1987.121.6_1001","DOIUrl":"https://doi.org/10.1541/IEEJEISS1987.121.6_1001","url":null,"abstract":"","PeriodicalId":39314,"journal":{"name":"Research Reports on Information Science and Electrical Engineering of Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1541/IEEJEISS1987.121.6_1001","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67147181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 41
期刊
Research Reports on Information Science and Electrical Engineering of Kyushu University
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