Pub Date : 2018-03-16DOI: 10.1177/0020294018755324
Luo Zai, Liu Hui, Li Dong, Tian Kun
As a key part of the articulated arm coordinate measuring machine, the probe can determine the measurement accuracy. Therefore, the error source and influencing factors of the equivalent diameter of the probe are studied. First, the influence of the primary factor of the measuring force on the equivalent diameter of the probe is studied by analyzing the influence degree of its error source. Second, a mathematical model of the relationship between the equivalent diameter and the measuring force of the articulated arm coordinate measuring machine is built to compensate for the equivalent diameter error caused by the measuring force by the simulated annealing method. To illustrate the application advantage of our proposed study, a simple force-measuring device is designed based on this model. The experimental result shows that the maximum error reduction is approximately 43 µm, while the average error reduction ranges from 33 to 4.0 µm, which represents an 87.7% improvement. Overall, our proposed method can ...
{"title":"Analysis and Compensation of Equivalent Diameter Error of Articulated Arm Coordinate Measuring Machine","authors":"Luo Zai, Liu Hui, Li Dong, Tian Kun","doi":"10.1177/0020294018755324","DOIUrl":"https://doi.org/10.1177/0020294018755324","url":null,"abstract":"As a key part of the articulated arm coordinate measuring machine, the probe can determine the measurement accuracy. Therefore, the error source and influencing factors of the equivalent diameter of the probe are studied. First, the influence of the primary factor of the measuring force on the equivalent diameter of the probe is studied by analyzing the influence degree of its error source. Second, a mathematical model of the relationship between the equivalent diameter and the measuring force of the articulated arm coordinate measuring machine is built to compensate for the equivalent diameter error caused by the measuring force by the simulated annealing method. To illustrate the application advantage of our proposed study, a simple force-measuring device is designed based on this model. The experimental result shows that the maximum error reduction is approximately 43 µm, while the average error reduction ranges from 33 to 4.0 µm, which represents an 87.7% improvement. Overall, our proposed method can ...","PeriodicalId":49849,"journal":{"name":"Measurement & Control","volume":"98 1","pages":"16-26"},"PeriodicalIF":2.0,"publicationDate":"2018-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73015770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-04-01DOI: 10.1177/002029401004300306
Alex W. H. Choy, B. Luk, Louis K. P. Liu, Sheng Chen
In this paper, the application of the distributed control architecture using low-cost hybrid wired/wireless control network in the electroplating line control system design is described. The feasibility of implementing condition monitoring under this proposed control platform for increasing the system reliability and reducing the scrape rate is also discussed.
{"title":"Can and Zigbee Based Distributed Control Architecture: Electroplating Applications","authors":"Alex W. H. Choy, B. Luk, Louis K. P. Liu, Sheng Chen","doi":"10.1177/002029401004300306","DOIUrl":"https://doi.org/10.1177/002029401004300306","url":null,"abstract":"In this paper, the application of the distributed control architecture using low-cost hybrid wired/wireless control network in the electroplating line control system design is described. The feasibility of implementing condition monitoring under this proposed control platform for increasing the system reliability and reducing the scrape rate is also discussed.","PeriodicalId":49849,"journal":{"name":"Measurement & Control","volume":"58 1","pages":"89-94"},"PeriodicalIF":2.0,"publicationDate":"2010-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73442583","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2008-01-01DOI: 10.1007/978-3-540-78841-6_12
K. Fujimoto, J. Scherpen
{"title":"Singular Value Analysis and Balanced Realizations for Nonlinear Systems","authors":"K. Fujimoto, J. Scherpen","doi":"10.1007/978-3-540-78841-6_12","DOIUrl":"https://doi.org/10.1007/978-3-540-78841-6_12","url":null,"abstract":"","PeriodicalId":49849,"journal":{"name":"Measurement & Control","volume":"236 1","pages":"251-272"},"PeriodicalIF":2.0,"publicationDate":"2008-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83487481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1982-02-01DOI: 10.1177/002029408201500201
W. Riemer, R. Röss
{"title":"Hygrometry: —By Means of the Infra-Red Gas Analyser Technique in the Temperature Range from −30°C to +180°C","authors":"W. Riemer, R. Röss","doi":"10.1177/002029408201500201","DOIUrl":"https://doi.org/10.1177/002029408201500201","url":null,"abstract":"","PeriodicalId":49849,"journal":{"name":"Measurement & Control","volume":"9 1","pages":"49-53"},"PeriodicalIF":2.0,"publicationDate":"1982-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77995067","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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