Pub Date : 2024-05-01DOI: 10.1109/mias.2024.3387147
John F. Wade, Paul W. Brazis
{"title":"Continued Investigation of Arc Flash in Single-Phase Systems: Threshold for Possible Hazards","authors":"John F. Wade, Paul W. Brazis","doi":"10.1109/mias.2024.3387147","DOIUrl":"https://doi.org/10.1109/mias.2024.3387147","url":null,"abstract":"","PeriodicalId":50390,"journal":{"name":"IEEE Industry Applications Magazine","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2024-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140839900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-04-30DOI: 10.1109/mias.2024.3387133
Po-En Su, Po-Chen Chen, Kaynat Zia, Albert Marroquin, Wei-Jen Lee
{"title":"A Curriculum for Arc-Flash Analysis: For College Students","authors":"Po-En Su, Po-Chen Chen, Kaynat Zia, Albert Marroquin, Wei-Jen Lee","doi":"10.1109/mias.2024.3387133","DOIUrl":"https://doi.org/10.1109/mias.2024.3387133","url":null,"abstract":"","PeriodicalId":50390,"journal":{"name":"IEEE Industry Applications Magazine","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2024-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140839727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-04-26DOI: 10.1109/mias.2024.3387173
Nehad El-Sherif, Thomas A. Domitrovich
{"title":"Demystification of Arc-Fault Circuit Interrupters: Part 2: Technology and Applications","authors":"Nehad El-Sherif, Thomas A. Domitrovich","doi":"10.1109/mias.2024.3387173","DOIUrl":"https://doi.org/10.1109/mias.2024.3387173","url":null,"abstract":"","PeriodicalId":50390,"journal":{"name":"IEEE Industry Applications Magazine","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2024-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140802434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-04-26DOI: 10.1109/mias.2024.3387141
Abdulwahab Al-Abdulwahab, Rakan El-Mahayni, Johnson Thomai
{"title":"Challenges in Offshore Power Systems: Pushing HVac Transmission to the Limit","authors":"Abdulwahab Al-Abdulwahab, Rakan El-Mahayni, Johnson Thomai","doi":"10.1109/mias.2024.3387141","DOIUrl":"https://doi.org/10.1109/mias.2024.3387141","url":null,"abstract":"","PeriodicalId":50390,"journal":{"name":"IEEE Industry Applications Magazine","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2024-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140802568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-04-18DOI: 10.1109/mias.2024.3362608
Dave Durocher
IEEE Industry Applications Magazine welcomes your letters on any aspect of this magazine or industry applications. Letters may be edited for publication. Please send all letters to the editor-in-chief at eic-iam@ieee.org.
{"title":"[Letters to the Editor]","authors":"Dave Durocher","doi":"10.1109/mias.2024.3362608","DOIUrl":"https://doi.org/10.1109/mias.2024.3362608","url":null,"abstract":"<italic xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\">IEEE Industry Applications Magazine</i> welcomes your letters on any aspect of this magazine or industry applications. Letters may be edited for publication. Please send all letters to the editor-in-chief at eic-iam@ieee.org.","PeriodicalId":50390,"journal":{"name":"IEEE Industry Applications Magazine","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2024-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140629027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-04-17DOI: 10.1109/mias.2024.3378538
{"title":"Tech RXIV: Share Your Preprint Research with the World!","authors":"","doi":"10.1109/mias.2024.3378538","DOIUrl":"https://doi.org/10.1109/mias.2024.3378538","url":null,"abstract":"","PeriodicalId":50390,"journal":{"name":"IEEE Industry Applications Magazine","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2024-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140611823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-04-17DOI: 10.1109/mias.2024.3362578
Daniel R. Doan
{"title":"Contributions to the Electrical Safety Knowledge Base in 2023 [Electrical Safety]","authors":"Daniel R. Doan","doi":"10.1109/mias.2024.3362578","DOIUrl":"https://doi.org/10.1109/mias.2024.3362578","url":null,"abstract":"","PeriodicalId":50390,"journal":{"name":"IEEE Industry Applications Magazine","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2024-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140611771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-04-17DOI: 10.1109/mias.2024.3362579
Pericle Zanchetta
{"title":"Education Department Tutorials and Webinars [Education News]","authors":"Pericle Zanchetta","doi":"10.1109/mias.2024.3362579","DOIUrl":"https://doi.org/10.1109/mias.2024.3362579","url":null,"abstract":"","PeriodicalId":50390,"journal":{"name":"IEEE Industry Applications Magazine","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2024-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140611770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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