The realisation of large-scale quantum computing is no longer simply a hardware question. The rapid development of quantum technology has resulted in dozens of control and programming problems that should be directed towards the classical computer science and engineering community. One such problem is known as Pauli tracking. Methods for implementing quantum algorithms that are compatible with crucial error correction technology utilise extensive quantum teleportation protocols. These protocols are intrinsically probabilistic and result in correction operators that occur as byproducts of teleportation. These byproduct operators do not need to be corrected in the quantum hardware itself, but are tracked through the circuit and output results reinterpreted. This tracking is routinely ignored in quantum information as it is assumed that tracking algorithms will eventually be developed. In this work we help fill this gap and present an algorithm for tracking byproduct operators through a quantum computation.
{"title":"Software-based Pauli tracking in fault-tolerant quantum circuits","authors":"A. Paler, S. Devitt, K. Nemoto, I. Polian","doi":"10.7873/DATE.2014.137","DOIUrl":"https://doi.org/10.7873/DATE.2014.137","url":null,"abstract":"The realisation of large-scale quantum computing is no longer simply a hardware question. The rapid development of quantum technology has resulted in dozens of control and programming problems that should be directed towards the classical computer science and engineering community. One such problem is known as Pauli tracking. Methods for implementing quantum algorithms that are compatible with crucial error correction technology utilise extensive quantum teleportation protocols. These protocols are intrinsically probabilistic and result in correction operators that occur as byproducts of teleportation. These byproduct operators do not need to be corrected in the quantum hardware itself, but are tracked through the circuit and output results reinterpreted. This tracking is routinely ignored in quantum information as it is assumed that tracking algorithms will eventually be developed. In this work we help fill this gap and present an algorithm for tracking byproduct operators through a quantum computation.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"16 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72762580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Karthik Swaminathan, M. Kim, Nandhini Chandramoorthy, B. Sedighi, Robert Perricone, J. Sampson, N. Vijaykrishnan
Steep Slope devices, with Heterojunction Tunnel FETs (TFETs) in particular, have been proposed as a viable solution to overcome the subthreshold slope limitation in existing CMOS technology and achieve ultra-low voltage operation with acceptable performance. However, state-of-the-art FinFET technologies continue to demonstrate superior performance than steep slope devices in application domains demanding peak single threaded performance. In this context, we examine different computing paradigms where TFET technologies can be used, not just as a `drop in' replacement, but as an additional parameter to augment the architectural design space. This greatly widens the scope of optimizations for performance and power. We investigate the tradeoffs between device and architectures in general purpose processors when performance, power and temperature are individually constrained. We also synthesize examples of domain-specific accelerators used in computer vision using in-house TFET standard cell libraries to demonstrate the energy benefits of designing TFET-based accelerators. We demonstrate that synthesizing these accelerators using TFETs reduces energy by over 6X in comparison to an equivalent iso-voltage CMOS-based design and by over 30% in comparison to an iso-performance CMOS design.
{"title":"Modeling steep slope devices: From circuits to architectures","authors":"Karthik Swaminathan, M. Kim, Nandhini Chandramoorthy, B. Sedighi, Robert Perricone, J. Sampson, N. Vijaykrishnan","doi":"10.7873/DATE.2014.149","DOIUrl":"https://doi.org/10.7873/DATE.2014.149","url":null,"abstract":"Steep Slope devices, with Heterojunction Tunnel FETs (TFETs) in particular, have been proposed as a viable solution to overcome the subthreshold slope limitation in existing CMOS technology and achieve ultra-low voltage operation with acceptable performance. However, state-of-the-art FinFET technologies continue to demonstrate superior performance than steep slope devices in application domains demanding peak single threaded performance. In this context, we examine different computing paradigms where TFET technologies can be used, not just as a `drop in' replacement, but as an additional parameter to augment the architectural design space. This greatly widens the scope of optimizations for performance and power. We investigate the tradeoffs between device and architectures in general purpose processors when performance, power and temperature are individually constrained. We also synthesize examples of domain-specific accelerators used in computer vision using in-house TFET standard cell libraries to demonstrate the energy benefits of designing TFET-based accelerators. We demonstrate that synthesizing these accelerators using TFETs reduces energy by over 6X in comparison to an equivalent iso-voltage CMOS-based design and by over 30% in comparison to an iso-performance CMOS design.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"24 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72660567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Built-in self-test (BIST) is a well-known design technique in which part of a circuit is used to test the circuit itself. BIST plays an important role for embedded memories, which do not have pins or pads exposed toward the periphery of the chip for testing with automatic test equipment. With the rapidly increasing number of embedded memories in modern SOCs (up to hundreds of memories in each hard macro of the SOC), product designers incur substantial costs of test time (subject to possible power constraints) and BIST logic physical resources (area, routing, power). However, only limited previous work addresses the physical design optimization of BIST logic; notably, Chien et al. [7] optimize BIST design with respect to test time, routing length, and area. In our work, we propose a new three-step heuristic approach to minimize test time as well as test physical layout resources, subject to given upper bounds on power consumption. A key contribution is an integer linear programming ILP framework that determines optimal test time for a given cluster of memories using either one or two BIST controllers, subject to test power limits and with full comprehension of available serialization and parallelization. Our heuristic approach integrates (i) generation of a hypergraph over the memories, with test time-aware weighting of hyperedges, along with top-down, FM-style min-cut partitioning; (ii) solution of an ILP that comprehends parallel and serial testing to optimize test scheduling per BIST controller; and (iii) placement of BIST logic to minimize routing and buffering costs. When evaluated on hard macros from a recent industrial 28nm networking SOC, our heuristic solutions reduce test time estimates by up to 11.57% with strictly fewer BIST controllers per hard macro, compared to the industrial solutions.
{"title":"Co-optimization of memory BIST grouping, test scheduling, and logic placement","authors":"A. Kahng, Ilgweon Kang","doi":"10.7873/DATE.2014.209","DOIUrl":"https://doi.org/10.7873/DATE.2014.209","url":null,"abstract":"Built-in self-test (BIST) is a well-known design technique in which part of a circuit is used to test the circuit itself. BIST plays an important role for embedded memories, which do not have pins or pads exposed toward the periphery of the chip for testing with automatic test equipment. With the rapidly increasing number of embedded memories in modern SOCs (up to hundreds of memories in each hard macro of the SOC), product designers incur substantial costs of test time (subject to possible power constraints) and BIST logic physical resources (area, routing, power). However, only limited previous work addresses the physical design optimization of BIST logic; notably, Chien et al. [7] optimize BIST design with respect to test time, routing length, and area. In our work, we propose a new three-step heuristic approach to minimize test time as well as test physical layout resources, subject to given upper bounds on power consumption. A key contribution is an integer linear programming ILP framework that determines optimal test time for a given cluster of memories using either one or two BIST controllers, subject to test power limits and with full comprehension of available serialization and parallelization. Our heuristic approach integrates (i) generation of a hypergraph over the memories, with test time-aware weighting of hyperedges, along with top-down, FM-style min-cut partitioning; (ii) solution of an ILP that comprehends parallel and serial testing to optimize test scheduling per BIST controller; and (iii) placement of BIST logic to minimize routing and buffering costs. When evaluated on hard macros from a recent industrial 28nm networking SOC, our heuristic solutions reduce test time estimates by up to 11.57% with strictly fewer BIST controllers per hard macro, compared to the industrial solutions.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"11 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74148028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Braojos, A. Dogan, I. Beretta, G. Ansaloni, David Atienza Alonso
Latest embedded bio-signal analysis applications, targeting low-power Wireless Body Sensor Nodes (WBSNs), present conflicting requirements. On one hand, bio-signal analysis applications are continuously increasing their demand for high computing capabilities. On the other hand, long-term signal processing in WBSNs must be provided within their highly constrained energy budget. In this context, parallel processing effectively increases the power efficiency of WBSNs, but only if the execution can be properly synchronized among computing elements. To address this challenge, in this work we propose a hardware/software approach to synchronize the execution of bio-signal processing applications in multi-core WBSNs. This new approach requires little hardware resources and very few adaptations in the source code. Moreover, it provides the necessary flexibility to execute applications with an arbitrarily large degree of complexity and parallelism, enabling considerable reductions in power consumption for all multi-core WBSN execution conditions. Experimental results show that a multi-core WBSN architecture using the illustrated approach can obtain energy savings of up to 40%, with respect to an equivalent single-core architecture, when performing advanced bio-signal analysis.
{"title":"Hardware/software approach for code synchronization in low-power multi-core sensor nodes","authors":"R. Braojos, A. Dogan, I. Beretta, G. Ansaloni, David Atienza Alonso","doi":"10.7873/DATE.2014.181","DOIUrl":"https://doi.org/10.7873/DATE.2014.181","url":null,"abstract":"Latest embedded bio-signal analysis applications, targeting low-power Wireless Body Sensor Nodes (WBSNs), present conflicting requirements. On one hand, bio-signal analysis applications are continuously increasing their demand for high computing capabilities. On the other hand, long-term signal processing in WBSNs must be provided within their highly constrained energy budget. In this context, parallel processing effectively increases the power efficiency of WBSNs, but only if the execution can be properly synchronized among computing elements. To address this challenge, in this work we propose a hardware/software approach to synchronize the execution of bio-signal processing applications in multi-core WBSNs. This new approach requires little hardware resources and very few adaptations in the source code. Moreover, it provides the necessary flexibility to execute applications with an arbitrarily large degree of complexity and parallelism, enabling considerable reductions in power consumption for all multi-core WBSN execution conditions. Experimental results show that a multi-core WBSN architecture using the illustrated approach can obtain energy savings of up to 40%, with respect to an equivalent single-core architecture, when performing advanced bio-signal analysis.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"49 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84799724","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
High-quality tests for post-silicon validation should be ready before a silicon device becomes available in order to save time spent on preparing, debugging and fixing tests after the device is available. Test coverage is an important metric for evaluating the quality and readiness of post-silicon tests. We propose an online-capture offline-replay approach to coverage evaluation of post-silicon validation tests with virtual prototypes for estimating silicon device test coverage. We first capture necessary data from a concrete execution of the virtual prototype within a virtual platform under a given test, and then compute the test coverage by efficiently replaying this execution offline on the virtual prototype itself. Our approach provides early feedback on quality of post-silicon validation tests before silicon is ready. To ensure fidelity of early coverage evaluation, our approach have been further extended to support coverage evaluation and conformance checking in the post-silicon stage. We have applied our approach to evaluate a suite of common tests on virtual prototypes of five network adapters. Our approach was able to reliably estimate that this suite achieves high functional coverage on all five silicon devices.
{"title":"Coverage evaluation of post-silicon validation tests with virtual prototypes","authors":"Kai Cong, Li Lei, Zhenkun Yang, Fei Xie","doi":"10.7873/DATE.2014.331","DOIUrl":"https://doi.org/10.7873/DATE.2014.331","url":null,"abstract":"High-quality tests for post-silicon validation should be ready before a silicon device becomes available in order to save time spent on preparing, debugging and fixing tests after the device is available. Test coverage is an important metric for evaluating the quality and readiness of post-silicon tests. We propose an online-capture offline-replay approach to coverage evaluation of post-silicon validation tests with virtual prototypes for estimating silicon device test coverage. We first capture necessary data from a concrete execution of the virtual prototype within a virtual platform under a given test, and then compute the test coverage by efficiently replaying this execution offline on the virtual prototype itself. Our approach provides early feedback on quality of post-silicon validation tests before silicon is ready. To ensure fidelity of early coverage evaluation, our approach have been further extended to support coverage evaluation and conformance checking in the post-silicon stage. We have applied our approach to evaluate a suite of common tests on virtual prototypes of five network adapters. Our approach was able to reliably estimate that this suite achieves high functional coverage on all five silicon devices.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"1 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81887018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pietro Mercati, Andrea Bartolini, Francesco Paterna, T. Simunic, L. Benini
Reliability is a major concern in multiprocessors. Dynamic Reliability Management (DRM) aims at trading off processor performance with lifetime. The state-of-the-art publications study only the theory supported by simulation. This paper presents the first complete software implementation, working on a real hardware, of a low-overhead, Android-compatible workload-aware DRM Governor for mobile multiprocessors. We discuss the design challenges and the run-time overhead involved. We show the effectiveness of our governor in guaranteeing the predefined target lifetime and show that it achieves up to 100% of lifetime improvement with respect to traditional governors, while providing comparable performance for critical applications.
{"title":"A Linux-governor based Dynamic Reliability Manager for android mobile devices","authors":"Pietro Mercati, Andrea Bartolini, Francesco Paterna, T. Simunic, L. Benini","doi":"10.7873/DATE.2014.117","DOIUrl":"https://doi.org/10.7873/DATE.2014.117","url":null,"abstract":"Reliability is a major concern in multiprocessors. Dynamic Reliability Management (DRM) aims at trading off processor performance with lifetime. The state-of-the-art publications study only the theory supported by simulation. This paper presents the first complete software implementation, working on a real hardware, of a low-overhead, Android-compatible workload-aware DRM Governor for mobile multiprocessors. We discuss the design challenges and the run-time overhead involved. We show the effectiveness of our governor in guaranteeing the predefined target lifetime and show that it achieves up to 100% of lifetime improvement with respect to traditional governors, while providing comparable performance for critical applications.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"1 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81922196","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Gnaneswara Rao Jonna, John Jose, Rachana Radhakrishnan, M. Mutyam
With the drift from computation centric designs to communication centric designs in the Chip Multi Processor (CMP) era, the interconnect fabric is gaining more importance. An efficient NoC in terms of power, area and average flit latency has a huge impact on the overall performance of a CMP. In the current work, we propose MinBSD - a minimally buffered, single cycle, deflection router. It incorporates different operations (Injection, Ejection, Preemption, Re-injection) in a single module to handle the traffic effectively and ensures smooth flow of flits through router pipeline. It performs overlapped execution of independent operations. These factors not only make MinBSD to operate in a single cycle but also to reduce the critical path latency resulting in a faster interconnect network. Experimental results show that MinBSD reduces the average flit latency on real work loads, reduces die area and power consumption when compared to the existing state-of-the-art minimally buffered deflection routers.
{"title":"Minimally buffered single-cycle deflection router","authors":"Gnaneswara Rao Jonna, John Jose, Rachana Radhakrishnan, M. Mutyam","doi":"10.7873/DATE.2014.323","DOIUrl":"https://doi.org/10.7873/DATE.2014.323","url":null,"abstract":"With the drift from computation centric designs to communication centric designs in the Chip Multi Processor (CMP) era, the interconnect fabric is gaining more importance. An efficient NoC in terms of power, area and average flit latency has a huge impact on the overall performance of a CMP. In the current work, we propose MinBSD - a minimally buffered, single cycle, deflection router. It incorporates different operations (Injection, Ejection, Preemption, Re-injection) in a single module to handle the traffic effectively and ensures smooth flow of flits through router pipeline. It performs overlapped execution of independent operations. These factors not only make MinBSD to operate in a single cycle but also to reduce the critical path latency resulting in a faster interconnect network. Experimental results show that MinBSD reduces the average flit latency on real work loads, reduces die area and power consumption when compared to the existing state-of-the-art minimally buffered deflection routers.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"22 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81808959","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
As fabrication processes exploit even deeper submicron technology, power dissipation has become a crucial issue for most electronic circuit and system designs nowadays. In particular, leakage power is becoming a dominant source of power consumption. Recently, the reconfigurable single-electron transistor (SET) array has been proposed as an emerging circuit design style for continuing Moore's Law due to its ultra-low power consumption. Several automated synthesis approaches have been developed for the reconfigurable SET array in the past few years. Nevertheless, all of those existing methods consider fabrication constraints, which are mandatory, merely in late synthesis stages. In this paper, we propose a synthesis algorithm, featuring both variable reordering and product term reordering, for area minimization. In addition, our algorithm takes those mandatory fabrication constraints into account in early stages for better outcomes. Experimental results show that our new method can achieve an area reduction of up to 24% as compared to current state-of-the-art techniques.
{"title":"Area minimization synthesis for reconfigurable single-electron transistor arrays with fabrication constraints","authors":"Yi-Hang Chen, Jian-Yu Chen, Juinn-Dar Huang","doi":"10.1145/2906360","DOIUrl":"https://doi.org/10.1145/2906360","url":null,"abstract":"As fabrication processes exploit even deeper submicron technology, power dissipation has become a crucial issue for most electronic circuit and system designs nowadays. In particular, leakage power is becoming a dominant source of power consumption. Recently, the reconfigurable single-electron transistor (SET) array has been proposed as an emerging circuit design style for continuing Moore's Law due to its ultra-low power consumption. Several automated synthesis approaches have been developed for the reconfigurable SET array in the past few years. Nevertheless, all of those existing methods consider fabrication constraints, which are mandatory, merely in late synthesis stages. In this paper, we propose a synthesis algorithm, featuring both variable reordering and product term reordering, for area minimization. In addition, our algorithm takes those mandatory fabrication constraints into account in early stages for better outcomes. Experimental results show that our new method can achieve an area reduction of up to 24% as compared to current state-of-the-art techniques.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"16 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82651716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ulf Schlichtmann, V. Kleeberger, J. Abraham, A. Evans, C. Gimmler-Dumont, M. Glaß, A. Herkersdorf, S. Nassif, N. Wehn
The rapid shrinking of device geometries in the nanometer regime requires new technology-aware design methodologies. These must be able to evaluate the resilience of the circuit throughout all System on Chip (SoC) abstraction levels. To successfully guide design decisions at the system level, reliability models, which abstract technology information, are required to identify those parts of the system where additional protection in the form of hardware or software coun-termeasures is most effective. Interfaces such as the presented Resilience Articulation Point (RAP) or the Reliability Interchange Information Format (RIIF) are required to enable EDA-assisted analysis and propagation of reliability information. The models are discussed from different perspectives, such as design and test.
{"title":"Connecting different worlds — Technology abstraction for reliability-aware design and Test","authors":"Ulf Schlichtmann, V. Kleeberger, J. Abraham, A. Evans, C. Gimmler-Dumont, M. Glaß, A. Herkersdorf, S. Nassif, N. Wehn","doi":"10.7873/DATE2014.265","DOIUrl":"https://doi.org/10.7873/DATE2014.265","url":null,"abstract":"The rapid shrinking of device geometries in the nanometer regime requires new technology-aware design methodologies. These must be able to evaluate the resilience of the circuit throughout all System on Chip (SoC) abstraction levels. To successfully guide design decisions at the system level, reliability models, which abstract technology information, are required to identify those parts of the system where additional protection in the form of hardware or software coun-termeasures is most effective. Interfaces such as the presented Resilience Articulation Point (RAP) or the Reliability Interchange Information Format (RIIF) are required to enable EDA-assisted analysis and propagation of reliability information. The models are discussed from different perspectives, such as design and test.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"33 1","pages":"1-8"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80515828","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Shuang-Wang Zhang, Fan Lin, Chun-Kai Hsu, K. Cheng, Hong Wang
Virtual Probe (VP), proposed for characterization of spatial variations and for test time reduction, can effectively reconstruct the spatial pattern of a test item for an entire wafer using measurement values from only a small fraction of dies on the wafer. However, VP calculates the spatial signature of each test item separately, one item at a time, resulting in very long runtime for complex chips which often require hundreds, or even thousands, of test items in production. In this paper, we propose a new method, named Joint Virtual Probe (JVP), which can jointly derive spatial patterns of multiple test items. By simultaneously handling a large group of test items, JVP significantly reduces the overall runtime. And the prediction accuracy can also be improved because of JVP's implicit use of inter-test-item correlations in predicting spatial patterns. The experimental results on two industrial products, with 277 and 985 parametric test items in the production test programs respectively, demonstrate that, JVP achieves an average speedup of ~ 170X and ~ 50X over VP in the pre-test analysis and the test application phases respectively, as well as a slightly higher prediction accuracy than VP.
{"title":"Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction","authors":"Shuang-Wang Zhang, Fan Lin, Chun-Kai Hsu, K. Cheng, Hong Wang","doi":"10.7873/DATE.2014.240","DOIUrl":"https://doi.org/10.7873/DATE.2014.240","url":null,"abstract":"Virtual Probe (VP), proposed for characterization of spatial variations and for test time reduction, can effectively reconstruct the spatial pattern of a test item for an entire wafer using measurement values from only a small fraction of dies on the wafer. However, VP calculates the spatial signature of each test item separately, one item at a time, resulting in very long runtime for complex chips which often require hundreds, or even thousands, of test items in production. In this paper, we propose a new method, named Joint Virtual Probe (JVP), which can jointly derive spatial patterns of multiple test items. By simultaneously handling a large group of test items, JVP significantly reduces the overall runtime. And the prediction accuracy can also be improved because of JVP's implicit use of inter-test-item correlations in predicting spatial patterns. The experimental results on two industrial products, with 277 and 985 parametric test items in the production test programs respectively, demonstrate that, JVP achieves an average speedup of ~ 170X and ~ 50X over VP in the pre-test analysis and the test application phases respectively, as well as a slightly higher prediction accuracy than VP.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"59 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80458282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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