Sebastien Fabrie, J. Echeverri, M. Vertregt, J. P. D. Gyvez
In today's semiconductor industry we see a move towards smaller technology feature sizes. These smaller feature sizes pose a problem due to mismatch between identical cells on a single die known as local variation. In this paper a library tuning method is proposed which makes a smart selection of cells in a standard cell library to reduce the design's sensitivity to local variability. This results in a robust IC design with an identifiable behavior towards local variations. Experimental results performed on a widely used microprocessor design synthesized for a high performance timing show that we can achieve a timing spread reduction of 37% at an area increase cost of 7%.
{"title":"Standard cell library tuning for variability tolerant designs","authors":"Sebastien Fabrie, J. Echeverri, M. Vertregt, J. P. D. Gyvez","doi":"10.7873/DATE.2014.242","DOIUrl":"https://doi.org/10.7873/DATE.2014.242","url":null,"abstract":"In today's semiconductor industry we see a move towards smaller technology feature sizes. These smaller feature sizes pose a problem due to mismatch between identical cells on a single die known as local variation. In this paper a library tuning method is proposed which makes a smart selection of cells in a standard cell library to reduce the design's sensitivity to local variability. This results in a robust IC design with an identifiable behavior towards local variations. Experimental results performed on a widely used microprocessor design synthesized for a high performance timing show that we can achieve a timing spread reduction of 37% at an area increase cost of 7%.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"24 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73740409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Clemens Helfmeier, C. Boit, Dmitry Nedospasov, Shahin Tajik, Jean-Pierre Seifert
In recent years one of the most popular areas of research in hardware security has been Physically Unclonable Functions (PUF). PUFs provide primitives for implementing tamper detection, encryption and device fingerprinting. One particularly common application is replacing Non-volatile Memory (NVM) as key storage in embedded devices like smart cards and secure microcontrollers. Though a wide array of PUF have been demonstrated in the academic literature, vendors have only begun to roll out PUFs in their end-user products. Moreover, the improvement to overall system security provided by PUFs is still the subject of much debate. This work reviews the state of the art of PUFs in general, and as a replacement for key storage in particular. We review also techniques and methodologies which make the physical response characterization and physical/digital cloning of PUFs possible.
{"title":"Physical vulnerabilities of Physically Unclonable Functions","authors":"Clemens Helfmeier, C. Boit, Dmitry Nedospasov, Shahin Tajik, Jean-Pierre Seifert","doi":"10.7873/DATE.2014.363","DOIUrl":"https://doi.org/10.7873/DATE.2014.363","url":null,"abstract":"In recent years one of the most popular areas of research in hardware security has been Physically Unclonable Functions (PUF). PUFs provide primitives for implementing tamper detection, encryption and device fingerprinting. One particularly common application is replacing Non-volatile Memory (NVM) as key storage in embedded devices like smart cards and secure microcontrollers. Though a wide array of PUF have been demonstrated in the academic literature, vendors have only begun to roll out PUFs in their end-user products. Moreover, the improvement to overall system security provided by PUFs is still the subject of much debate. This work reviews the state of the art of PUFs in general, and as a replacement for key storage in particular. We review also techniques and methodologies which make the physical response characterization and physical/digital cloning of PUFs possible.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"33 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75235305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We present a novel, sound, and complete algorithm for deciding safety properties in programs with static memory allocation. The new algorithm extends the program verification paradigm using loop invariants presented in [1] with a counterexample guided abstraction refinement (CEGAR) loop [2] where the refinement is achieved by strengthening loop invariants using the QFBV generalization of Property Directed Reachability (PDR) discussed in [3, 4]. We compare the algorithm with other approaches to program verification and report experimental results.
{"title":"Property directed invariant refinement for program verification","authors":"Tobias Welp, A. Kuehlmann","doi":"10.7873/DATE.2014.127","DOIUrl":"https://doi.org/10.7873/DATE.2014.127","url":null,"abstract":"We present a novel, sound, and complete algorithm for deciding safety properties in programs with static memory allocation. The new algorithm extends the program verification paradigm using loop invariants presented in [1] with a counterexample guided abstraction refinement (CEGAR) loop [2] where the refinement is achieved by strengthening loop invariants using the QFBV generalization of Property Directed Reachability (PDR) discussed in [3, 4]. We compare the algorithm with other approaches to program verification and report experimental results.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"27 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74771297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The expected low reliability of the silicon substrate at upcoming technology nodes presents a key challenge for digital system designers. Networks-on-chip (NoCs) are especially concerning because they are often the only communication infrastructure for the chips in which they are deployed. Recently, routing reconfiguration solutions have been proposed to address this problem. However, they come at a high silicon cost, and often require suspending the normal network activity while executing a centralized, resource-hungry reconfiguration algorithm. This paper proposes a novel, fast and minimalistic routing reconfiguration algorithm, called BLINC. BLINC utilizes pre-computed routing metadata to quickly evaluate localized detours upon each fault manifestation. We showcase the efficacy of our algorithm by deploying it in a novel NoC fault detection and reconfiguration solution, where BLINC enables uninterrupted NoC operation during aggressive online testing. If a fault seems likely to occur, we circumvent it in advance with the aid of our BLINC reconfiguration algorithm. Experimental results show an 80% reduction in the average number of routers affected by a reconfiguration event, compared to state-of-the-art techniques. BLINC enables negligible performance degradation in our detection and reconfiguration solution, while solutions based on current techniques suffer a 17-fold latency increase.
{"title":"Brisk and limited-impact NoC routing reconfiguration","authors":"Doowon Lee, Ritesh Parikh, V. Bertacco","doi":"10.7873/DATE2014.319","DOIUrl":"https://doi.org/10.7873/DATE2014.319","url":null,"abstract":"The expected low reliability of the silicon substrate at upcoming technology nodes presents a key challenge for digital system designers. Networks-on-chip (NoCs) are especially concerning because they are often the only communication infrastructure for the chips in which they are deployed. Recently, routing reconfiguration solutions have been proposed to address this problem. However, they come at a high silicon cost, and often require suspending the normal network activity while executing a centralized, resource-hungry reconfiguration algorithm. This paper proposes a novel, fast and minimalistic routing reconfiguration algorithm, called BLINC. BLINC utilizes pre-computed routing metadata to quickly evaluate localized detours upon each fault manifestation. We showcase the efficacy of our algorithm by deploying it in a novel NoC fault detection and reconfiguration solution, where BLINC enables uninterrupted NoC operation during aggressive online testing. If a fault seems likely to occur, we circumvent it in advance with the aid of our BLINC reconfiguration algorithm. Experimental results show an 80% reduction in the average number of routers affected by a reconfiguration event, compared to state-of-the-art techniques. BLINC enables negligible performance degradation in our detection and reconfiguration solution, while solutions based on current techniques suffer a 17-fold latency increase.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"222 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75640317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
G. Giannopoulou, N. Stoimenov, Pengcheng Huang, L. Thiele
A common trend in real-time embedded systems is to integrate multiple applications on a single platform. Such systems are known as mixed-criticality (MC) systems when the applications are characterized by different criticality levels. Nowadays, multicore platforms are promoted due to cost and performance benefits. However, certification of multicore MC systems is challenging as concurrently executed applications of different criticalities may block each other when accessing shared platform resources. Most of the existing research on multicore MC scheduling ignores the effects of resource sharing on the response times of applications. Recently, a MC scheduling strategy was proposed, which explicitly accounts for these effects. This paper discusses how to combine this policy with an optimization method for the partitioning of tasks to cores as well as the static mapping of memory blocks, i.e., task data and communication buffers, to the banks of a shared memory architecture. Optimization is performed at design time targeting at minimizing the worst-case response times of tasks and achieving efficient resource utilization. The proposed optimization method is evaluated using an industrial application.
{"title":"Mapping mixed-criticality applications on multi-core architectures","authors":"G. Giannopoulou, N. Stoimenov, Pengcheng Huang, L. Thiele","doi":"10.7873/DATE.2014.111","DOIUrl":"https://doi.org/10.7873/DATE.2014.111","url":null,"abstract":"A common trend in real-time embedded systems is to integrate multiple applications on a single platform. Such systems are known as mixed-criticality (MC) systems when the applications are characterized by different criticality levels. Nowadays, multicore platforms are promoted due to cost and performance benefits. However, certification of multicore MC systems is challenging as concurrently executed applications of different criticalities may block each other when accessing shared platform resources. Most of the existing research on multicore MC scheduling ignores the effects of resource sharing on the response times of applications. Recently, a MC scheduling strategy was proposed, which explicitly accounts for these effects. This paper discusses how to combine this policy with an optimization method for the partitioning of tasks to cores as well as the static mapping of memory blocks, i.e., task data and communication buffers, to the banks of a shared memory architecture. Optimization is performed at design time targeting at minimizing the worst-case response times of tasks and achieving efficient resource utilization. The proposed optimization method is evaluated using an industrial application.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"10 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74001210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Recently, many works have shown that adjustable delay buffer (ADB) whose delay is adjustable dynamically can effectively solve the clock skew variation problem in the designs with multiple power modes. However, all the previous works of ADB allocation inherently entail two critical limitations, which are the adjusted delays by ADB are always increments and the low cost buffer sizing has never been or not been primarily taken into account. To demonstrate how much overcoming the two limitations is effective in resolving the clock skew constraint, we characterize the two types of ADBs called CADB (capacitor based ADB) and IADB (inverter based ADB) and show that the adjusted delays by IADB can be decremented, and show that the clock skew violation in some clock trees of multiple power modes can be resolved by applying buffer sizing together with using only a small number of IADBs and CADBs.
{"title":"Mixed allocation of adjustable delay buffers combined with buffer sizing in clock tree synthesis of multiple power mode designs","authors":"Kitae Park, Geunho Kim, Taewhan Kim","doi":"10.7873/DATE.2014.276","DOIUrl":"https://doi.org/10.7873/DATE.2014.276","url":null,"abstract":"Recently, many works have shown that adjustable delay buffer (ADB) whose delay is adjustable dynamically can effectively solve the clock skew variation problem in the designs with multiple power modes. However, all the previous works of ADB allocation inherently entail two critical limitations, which are the adjusted delays by ADB are always increments and the low cost buffer sizing has never been or not been primarily taken into account. To demonstrate how much overcoming the two limitations is effective in resolving the clock skew constraint, we characterize the two types of ADBs called CADB (capacitor based ADB) and IADB (inverter based ADB) and show that the adjusted delays by IADB can be decremented, and show that the clock skew violation in some clock trees of multiple power modes can be resolved by applying buffer sizing together with using only a small number of IADBs and CADBs.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"28 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73118234","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Nowadays, a challenge faced by many developers is the profiling of parallel applications so that they can scale over more and more cores. This is especially critical for embedded systems powered by Multi-Processor System-on-Chip (MPSoC), where ever demanding applications have to run smoothly on numerous cores, each with modest power budget. The reasons for the lack of scalability of parallel applications are numerous, and it can be time consuming for a developer to pinpoint the correct one. In this paper, we propose a fully automatic method which detects the instructions of the code which lead to a lack of scalability. The method is based on data mining techniques exploiting low level execution traces produced by MPSoC simulators. Our experiments show the accuracy of the proposed technique on five different kinds of applications, and how the information reported can be exploited by application developers.
{"title":"Scalability bottlenecks discovery in MPSoC platforms using data mining on simulation traces","authors":"S. Lagraa, A. Termier, F. Pétrot","doi":"10.7873/DATE.2014.199","DOIUrl":"https://doi.org/10.7873/DATE.2014.199","url":null,"abstract":"Nowadays, a challenge faced by many developers is the profiling of parallel applications so that they can scale over more and more cores. This is especially critical for embedded systems powered by Multi-Processor System-on-Chip (MPSoC), where ever demanding applications have to run smoothly on numerous cores, each with modest power budget. The reasons for the lack of scalability of parallel applications are numerous, and it can be time consuming for a developer to pinpoint the correct one. In this paper, we propose a fully automatic method which detects the instructions of the code which lead to a lack of scalability. The method is based on data mining techniques exploiting low level execution traces produced by MPSoC simulators. Our experiments show the accuracy of the proposed technique on five different kinds of applications, and how the information reported can be exploited by application developers.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"86 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80012912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Cristian Andrades, Michael A. Rodriguez, C. Chiang
This work presents a new signature for 2D spatial configurations that is useful for the optimization of a hotspot detection process. The signature is a string of numbers representing changes along the horizontal and vertical slices of a configuration, which serves as the key of an inverted index that groups layout' windows with the same signature. The method extracts signatures from a compact specification of similar exact patterns with a fixed size. Then, these signatures are used as search keys of the inverted index to retrieve candidate windows that can match the patterns. Experimental results show that this simple type of signature has 100% recall and, in average, over 85% of precision in terms of the area effectively covered by the pattern and the retrieved area of the layout. In addition, the signature shows a good discriminate quality, since around 99% of the extracted signatures match each of them with a single pattern.
{"title":"Signature indexing of design layouts for hotspot detection","authors":"Cristian Andrades, Michael A. Rodriguez, C. Chiang","doi":"10.7873/DATE.2014.371","DOIUrl":"https://doi.org/10.7873/DATE.2014.371","url":null,"abstract":"This work presents a new signature for 2D spatial configurations that is useful for the optimization of a hotspot detection process. The signature is a string of numbers representing changes along the horizontal and vertical slices of a configuration, which serves as the key of an inverted index that groups layout' windows with the same signature. The method extracts signatures from a compact specification of similar exact patterns with a fixed size. Then, these signatures are used as search keys of the inverted index to retrieve candidate windows that can match the patterns. Experimental results show that this simple type of signature has 100% recall and, in average, over 85% of precision in terms of the area effectively covered by the pattern and the retrieved area of the layout. In addition, the signature shows a good discriminate quality, since around 99% of the extracted signatures match each of them with a single pattern.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"20 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88944037","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
FinFET transistors have great advantages over traditional planar MOSFET transistors in high performance and low power applications. Major foundries are adopting the Fin-FET technology for CMOS semiconductor device fabrication in the 16 nm technology node and beyond. Edge device degradation is among the major challenges for the FinFET process. To avoid such degradation, dummy gates are needed on device edges, and the dummy gates have to be tied to power rails in order not to introduce unconnected parasitic transistors. This requires that each dummy gate must abut at least one source node after standard cell placement. If the drain nodes at two adjacent cell boundaries abut each other, additional source nodes must be inserted in between for dummy gate power tying, which costs more placement area. Usually there is some flexibility during detailed placement to horizontally flip the cells or switch the positions of adjacent cells, which has little impact on the global placement objectives, such as timing conditions and net congestion. This paper proposes a detailed placement optimization strategy for the standard cell based designs. By flipping a subset of cells in a standard cell row and switching pairs of adjacent cells, the number of drain to drain abutments between adjacent cell boundaries can be optimally minimized, which saves additional source node insertion and reduces the length of the standard cell row. In addition, the proposed graph model can be easily modified to consider more complicated design rules. The experimental results show that the optimization of 100k cells is completed within 0.1 second, verifying the efficiency of the proposed algorithm.
{"title":"Optimization of standard cell based detailed placement for 16 nm FinFET process","authors":"Yuelin Du, Martin D. F. Wong","doi":"10.7873/DATE2014.370","DOIUrl":"https://doi.org/10.7873/DATE2014.370","url":null,"abstract":"FinFET transistors have great advantages over traditional planar MOSFET transistors in high performance and low power applications. Major foundries are adopting the Fin-FET technology for CMOS semiconductor device fabrication in the 16 nm technology node and beyond. Edge device degradation is among the major challenges for the FinFET process. To avoid such degradation, dummy gates are needed on device edges, and the dummy gates have to be tied to power rails in order not to introduce unconnected parasitic transistors. This requires that each dummy gate must abut at least one source node after standard cell placement. If the drain nodes at two adjacent cell boundaries abut each other, additional source nodes must be inserted in between for dummy gate power tying, which costs more placement area. Usually there is some flexibility during detailed placement to horizontally flip the cells or switch the positions of adjacent cells, which has little impact on the global placement objectives, such as timing conditions and net congestion. This paper proposes a detailed placement optimization strategy for the standard cell based designs. By flipping a subset of cells in a standard cell row and switching pairs of adjacent cells, the number of drain to drain abutments between adjacent cell boundaries can be optimally minimized, which saves additional source node insertion and reduces the length of the standard cell row. In addition, the proposed graph model can be easily modified to consider more complicated design rules. The experimental results show that the optimization of 100k cells is completed within 0.1 second, verifying the efficiency of the proposed algorithm.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"136 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88949095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wolfgang Büter, Christof Osewold, Daniel Gregorek, A. Ortiz
The increasing requirements for bandwidth and quality-of-service motivate the use of parallel interconnect architectures with several degrees of reconfiguration. This paper presents an IP, called Distributed Channel Management (DCM), to extend existing packet-switched NoCs with a reconfigurable point-to-point network seamlessly, i.e., without the need for any modification on the routers. The configuration of the reconfigurable network takes place dynamically and autonomously, so that the topology can be changed at run time. Furthermore, the architecture is scalable due to the autonomous decentralized administration of the links. The Paper reports a thorough experimental analysis of the overhead of the approach at the gate level that considers different network parameters such as flit size and timing constraints.
{"title":"DCM: An IP for the autonomous control of optical and electrical reconfigurable NoCs","authors":"Wolfgang Büter, Christof Osewold, Daniel Gregorek, A. Ortiz","doi":"10.7873/DATE.2014.322","DOIUrl":"https://doi.org/10.7873/DATE.2014.322","url":null,"abstract":"The increasing requirements for bandwidth and quality-of-service motivate the use of parallel interconnect architectures with several degrees of reconfiguration. This paper presents an IP, called Distributed Channel Management (DCM), to extend existing packet-switched NoCs with a reconfigurable point-to-point network seamlessly, i.e., without the need for any modification on the routers. The configuration of the reconfigurable network takes place dynamically and autonomously, so that the topology can be changed at run time. Furthermore, the architecture is scalable due to the autonomous decentralized administration of the links. The Paper reports a thorough experimental analysis of the overhead of the approach at the gate level that considers different network parameters such as flit size and timing constraints.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"6 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84589470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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