... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference最新文献
Pub Date : 2023-01-01DOI: 10.1109/I2MTC53148.2023.10175991
K. Elangovan, C. Anoop
{"title":"Enhanced Digital Interface Circuit for Three-wire Connected Resistance Thermometers","authors":"K. Elangovan, C. Anoop","doi":"10.1109/I2MTC53148.2023.10175991","DOIUrl":"https://doi.org/10.1109/I2MTC53148.2023.10175991","url":null,"abstract":"","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"2 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76020164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1109/I2MTC53148.2023.10176092
Ana Gleice da Silva Santos, L. Carmo, Charles Bezerra do Prado
{"title":"Classification and Clustering for predicting breathalyzer failures","authors":"Ana Gleice da Silva Santos, L. Carmo, Charles Bezerra do Prado","doi":"10.1109/I2MTC53148.2023.10176092","DOIUrl":"https://doi.org/10.1109/I2MTC53148.2023.10176092","url":null,"abstract":"","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"26 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82273771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1109/I2MTC53148.2023.10175907
K. Elangovan, S. AnoopC.
{"title":"Performance Evaluation of Simple Digital Measurement Platform for Remotely-Located RTD Applications","authors":"K. Elangovan, S. AnoopC.","doi":"10.1109/I2MTC53148.2023.10175907","DOIUrl":"https://doi.org/10.1109/I2MTC53148.2023.10175907","url":null,"abstract":"","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"10 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80930402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/I2MTC48687.2022.9806538
Jayne dos Santos Lima, J. M. M. Villanueva, S. Catunda
{"title":"Modeling a Virtual Flow Sensor in a Sugar-Energy Plant using Artificial Neural Network","authors":"Jayne dos Santos Lima, J. M. M. Villanueva, S. Catunda","doi":"10.1109/I2MTC48687.2022.9806538","DOIUrl":"https://doi.org/10.1109/I2MTC48687.2022.9806538","url":null,"abstract":"","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"8 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73319072","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1109/I2MTC48687.2022.9806448
Paulo Rannier Costa Da Silva, S. Catunda, A. W. A. Soares, A. V. Haandel
{"title":"Oxygen Uptake Rate Measurement Using Sigma Delta Modulator in the Biological Domain in Activated Sludge Systems","authors":"Paulo Rannier Costa Da Silva, S. Catunda, A. W. A. Soares, A. V. Haandel","doi":"10.1109/I2MTC48687.2022.9806448","DOIUrl":"https://doi.org/10.1109/I2MTC48687.2022.9806448","url":null,"abstract":"","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"19 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86049478","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-01-01DOI: 10.1109/I2MTC43012.2020.9129360
I. Cappelli, A. Fort, M. Mugnaini, E. Panzardi, A. Pozzebon, M. Tani, V. Vignoli
{"title":"Battery-less HF RFID sensor tag for humidity measurements based on TiO2 nanoparticles","authors":"I. Cappelli, A. Fort, M. Mugnaini, E. Panzardi, A. Pozzebon, M. Tani, V. Vignoli","doi":"10.1109/I2MTC43012.2020.9129360","DOIUrl":"https://doi.org/10.1109/I2MTC43012.2020.9129360","url":null,"abstract":"","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"11 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89426273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-01-01DOI: 10.1109/I2MTC43012.2020.9128535
T. Addabbo, A. Fort, Elia Landi, M. Mugnaini, E. Panzardi, A. Pozzebon, V. Vignoli
{"title":"Reliability and Availability Evaluation of Linear LoRaWAN Sensor Network Architectures for Pipeline Monitoring","authors":"T. Addabbo, A. Fort, Elia Landi, M. Mugnaini, E. Panzardi, A. Pozzebon, V. Vignoli","doi":"10.1109/I2MTC43012.2020.9128535","DOIUrl":"https://doi.org/10.1109/I2MTC43012.2020.9128535","url":null,"abstract":"","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"31 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81911091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-01-01DOI: 10.1109/I2MTC.2019.8827158
Kuojun Yang, Zhixiang Pan, Jiali Shi, P. Ye
{"title":"A fast baseline and trigger level calibration method in digital oscilloscope","authors":"Kuojun Yang, Zhixiang Pan, Jiali Shi, P. Ye","doi":"10.1109/I2MTC.2019.8827158","DOIUrl":"https://doi.org/10.1109/I2MTC.2019.8827158","url":null,"abstract":"","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"2 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74365163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-05-01DOI: 10.1109/I2MTC.2018.8409693
Peng Wang, Liu Jinsong, Bao Hailong
Electronic current transformer (ECT) is a new type of high-voltage instrument transformer. It constitutes more components than that of the traditional one. To locate the fault accurately and rapidly during its performance tests, this paper proposed a fault tracing method based on the failure modes and effects analysis (FMEA). From the measuring results of the ECT under test, together with its failure patterns and the test types, we can easily locate its fault in the FMEA tables, and repair them quickly. The presented method is verified to be useful in the results of the analysis on two practical examples.
{"title":"Fault tracing method for high voltage electronic current transformer during its performance test based on the FMEA","authors":"Peng Wang, Liu Jinsong, Bao Hailong","doi":"10.1109/I2MTC.2018.8409693","DOIUrl":"https://doi.org/10.1109/I2MTC.2018.8409693","url":null,"abstract":"Electronic current transformer (ECT) is a new type of high-voltage instrument transformer. It constitutes more components than that of the traditional one. To locate the fault accurately and rapidly during its performance tests, this paper proposed a fault tracing method based on the failure modes and effects analysis (FMEA). From the measuring results of the ECT under test, together with its failure patterns and the test types, we can easily locate its fault in the FMEA tables, and repair them quickly. The presented method is verified to be useful in the results of the analysis on two practical examples.","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"39 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86229937","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-01-01DOI: 10.1109/I2MTC.2018.8409755
Liansheng Liu, Datong Liu, Qing Guo, Yu Peng, Jun Liang
{"title":"SDR: Sensor data recovery for system condition monitoring","authors":"Liansheng Liu, Datong Liu, Qing Guo, Yu Peng, Jun Liang","doi":"10.1109/I2MTC.2018.8409755","DOIUrl":"https://doi.org/10.1109/I2MTC.2018.8409755","url":null,"abstract":"","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":"1 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2018-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82406016","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：