Pub Date : 1994-11-01DOI: 10.1109/TJMJ.1994.4565988
Y. Sakurai;H. Kitatani;T. Ishiguro;Y. Ichinose
Monte Carlo simulations of antiferromagnetic spin configurations were performed in order to understand ferro/antiferro-exchange-coupled films. The validity of the simulation was confirmed by comparison with experimental data for bulk materials. The calculated antiferromagnetic spin configurations of the ordered ferromagnetic layer showed decayed oscillation in the spin directions. However, the calculated boundary exchange coupling was larger than the estimated experimental value, as is usual. A reasonable value for the effective boundary exchange coupling was obtained by applying a weak staggered field in the antiferromagnetic region and removing the ferromagnetic layer.
{"title":"An Investigation of Exchange-Coupled Films by 0-K Monte Carlo Simulation Using the Classical Heisenberg Model","authors":"Y. Sakurai;H. Kitatani;T. Ishiguro;Y. Ichinose","doi":"10.1109/TJMJ.1994.4565988","DOIUrl":"https://doi.org/10.1109/TJMJ.1994.4565988","url":null,"abstract":"Monte Carlo simulations of antiferromagnetic spin configurations were performed in order to understand ferro/antiferro-exchange-coupled films. The validity of the simulation was confirmed by comparison with experimental data for bulk materials. The calculated antiferromagnetic spin configurations of the ordered ferromagnetic layer showed decayed oscillation in the spin directions. However, the calculated boundary exchange coupling was larger than the estimated experimental value, as is usual. A reasonable value for the effective boundary exchange coupling was obtained by applying a weak staggered field in the antiferromagnetic region and removing the ferromagnetic layer.","PeriodicalId":100647,"journal":{"name":"IEEE Translation Journal on Magnetics in Japan","volume":"9 6","pages":"247-254"},"PeriodicalIF":0.0,"publicationDate":"1994-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TJMJ.1994.4565988","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"68041814","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-11-01DOI: 10.1109/TJMJ.1994.4565949
{"title":"Opinion","authors":"","doi":"10.1109/TJMJ.1994.4565949","DOIUrl":"https://doi.org/10.1109/TJMJ.1994.4565949","url":null,"abstract":"","PeriodicalId":100647,"journal":{"name":"IEEE Translation Journal on Magnetics in Japan","volume":"9 6","pages":"6-6"},"PeriodicalIF":0.0,"publicationDate":"1994-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TJMJ.1994.4565949","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67873530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-11-01DOI: 10.1109/TJMJ.1994.4565982
K. Kobayashi
Noise-after-write has been reported in thin film heads, although its source or sources have not yet been identified. To discover these noise sources, I observed conversions of magnetic domain structure after writing with an electron microscope. The magnetic domain observations involved lock-in image processing for back-scattered electron contrast (type II), using a JEOL 2000FX II 200 kV electron microscope. Thin-film heads were excited by a 10 mA p-p , 100 kHz driving current. The magnetic domains in the upper yokes of the heads were observed after 60 mA p-p write operations. The head with the highest noise probability, at 5.2×10 -2 , exhibited walls radiating outward from the back-gap closure, which were due to stress. The magnetic domain structure was severely deformed after writing. The head with the lowest noise probability, at 1.6×10 4 , exhibited a normal closure domain configuration, with very little conversion. These results indicate that noise-after-write is generated mainly near the backgap closure.
写入后的噪声已经在薄膜磁头中被报道，尽管其来源尚未确定。为了发现这些噪声源，我在用电子显微镜写作后观察了磁畴结构的转换。磁畴观测涉及使用JEOL 2000FX II 200kV电子显微镜对背散射电子对比度（II型）进行锁定图像处理。薄膜磁头由10mAP-p、100kHz的驱动电流激励。磁头的上磁轭中的磁畴是在60mAP-p写入操作之后观察到的。噪声概率最高的头部，在5.2×10-2处，由于应力的作用，其壁从后间隙闭合处向外辐射。磁畴结构在写入之后严重变形。噪声概率最低的头部，在1.6×104处，表现出正常的闭合域配置，几乎没有转换。这些结果表明，写入后的噪声主要在后间隙闭合附近产生。
{"title":"Correlation between Noise-after-Write and Magnetic Domain in Thin-Film Heads by Electron Microscopy","authors":"K. Kobayashi","doi":"10.1109/TJMJ.1994.4565982","DOIUrl":"https://doi.org/10.1109/TJMJ.1994.4565982","url":null,"abstract":"Noise-after-write has been reported in thin film heads, although its source or sources have not yet been identified. To discover these noise sources, I observed conversions of magnetic domain structure after writing with an electron microscope. The magnetic domain observations involved lock-in image processing for back-scattered electron contrast (type II), using a JEOL 2000FX II 200 kV electron microscope. Thin-film heads were excited by a 10 mA\u0000<sub>p-p</sub>\u0000, 100 kHz driving current. The magnetic domains in the upper yokes of the heads were observed after 60 mA\u0000<sub>p-p</sub>\u0000 write operations. The head with the highest noise probability, at 5.2×10\u0000<sup>-2</sup>\u0000, exhibited walls radiating outward from the back-gap closure, which were due to stress. The magnetic domain structure was severely deformed after writing. The head with the lowest noise probability, at 1.6×10\u0000<sup>4</sup>\u0000, exhibited a normal closure domain configuration, with very little conversion. These results indicate that noise-after-write is generated mainly near the backgap closure.","PeriodicalId":100647,"journal":{"name":"IEEE Translation Journal on Magnetics in Japan","volume":"9 6","pages":"210-217"},"PeriodicalIF":0.0,"publicationDate":"1994-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TJMJ.1994.4565982","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67873630","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-11-01DOI: 10.1109/TJMJ.1994.4565971
S. Ohnuma;S. Furukawa;F. Matsumoto;H. Fujimori;K. Takahiro;S. Nagata;S. Yamaguchi;T. Masumoto
The effects of the Al and N content on the structure and properties of Co .95 Fe .05 -Al-N films prepared by rf reactive magnetron sputtering using (N 2 +Ar) gas were studied. TEM observations revealed that nitrided films are composed of heterogeneous phases with a very fine network structure. It was found that the properties of films are determined mainly by the combination of the Al and N concentrations. The coercivity of films containing more than 10 at% Al decreases with increasing N content, even when the film thickness is more than 2 μm. A steep increase in the electrical resistivity and a slight decrease in the magnetization of films containing more than 15 at% Al were observed during the initial increase in the N concentration, and both electrical resistivity and magnetization decreased rapidly when the N concentration was the same as that of Al. These anomalies are attributed to intergranular materials, indicating the presence in these films of a phase rich in Al and N.
{"title":"Soft Magnetic Properties of Highly Resistive Co-Al-N Alloy Films","authors":"S. Ohnuma;S. Furukawa;F. Matsumoto;H. Fujimori;K. Takahiro;S. Nagata;S. Yamaguchi;T. Masumoto","doi":"10.1109/TJMJ.1994.4565971","DOIUrl":"https://doi.org/10.1109/TJMJ.1994.4565971","url":null,"abstract":"The effects of the Al and N content on the structure and properties of Co\u0000<sub>.95</sub>\u0000Fe\u0000<sub>.05</sub>\u0000-Al-N films prepared by rf reactive magnetron sputtering using (N\u0000<sub>2</sub>\u0000+Ar) gas were studied. TEM observations revealed that nitrided films are composed of heterogeneous phases with a very fine network structure. It was found that the properties of films are determined mainly by the combination of the Al and N concentrations. The coercivity of films containing more than 10 at% Al decreases with increasing N content, even when the film thickness is more than 2 μm. A steep increase in the electrical resistivity and a slight decrease in the magnetization of films containing more than 15 at% Al were observed during the initial increase in the N concentration, and both electrical resistivity and magnetization decreased rapidly when the N concentration was the same as that of Al. These anomalies are attributed to intergranular materials, indicating the presence in these films of a phase rich in Al and N.","PeriodicalId":100647,"journal":{"name":"IEEE Translation Journal on Magnetics in Japan","volume":"9 6","pages":"138-145"},"PeriodicalIF":0.0,"publicationDate":"1994-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TJMJ.1994.4565971","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67872979","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-11-01DOI: 10.1109/TJMJ.1994.4565993
A. Makino;Y. Hayakawa
The microstructure, crystallization behavior and electrical resistivity of different Fe-M-O (M=Hf,Zr) films prepared by the rf magnetron sputtering technique were investigated. In the as-deposited state, the structures of Fe-M-O films with a solute content of 13 to 22.7 at% Hf and 15 to 38 at% O, or of 5 to 13 at% Zr and 8 to 30 at% O, were found to consist of a bec phase with grain diameters below 10 nm and an amorphous phase containing larger amounts of M and O. The film crystallizes in two stages, corresponding to the precipitation and grain growth of the bec phase and of oxides, respectively. The amorphous phase region expanded with increasing M content, and the electrical resistivity rapidly increased, reaching 1860 μΩm for an FeHf18.2O35.6 film with a structure composed of a large amorphous phase region and a small bec phase region.
{"title":"Microstructure and Crystallization Behavior of Fe-M-O (M=Hf, Zr) Films with High Resistivity","authors":"A. Makino;Y. Hayakawa","doi":"10.1109/TJMJ.1994.4565993","DOIUrl":"https://doi.org/10.1109/TJMJ.1994.4565993","url":null,"abstract":"The microstructure, crystallization behavior and electrical resistivity of different Fe-M-O (M=Hf,Zr) films prepared by the rf magnetron sputtering technique were investigated. In the as-deposited state, the structures of Fe-M-O films with a solute content of 13 to 22.7 at% Hf and 15 to 38 at% O, or of 5 to 13 at% Zr and 8 to 30 at% O, were found to consist of a bec phase with grain diameters below 10 nm and an amorphous phase containing larger amounts of M and O. The film crystallizes in two stages, corresponding to the precipitation and grain growth of the bec phase and of oxides, respectively. The amorphous phase region expanded with increasing M content, and the electrical resistivity rapidly increased, reaching 1860 μΩm for an Fe<sub46.2</sub>Hf<sub>18.2</sub>O<sub>35.6</sub> film with a structure composed of a large amorphous phase region and a small bec phase region.","PeriodicalId":100647,"journal":{"name":"IEEE Translation Journal on Magnetics in Japan","volume":"9 6","pages":"281-285"},"PeriodicalIF":0.0,"publicationDate":"1994-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TJMJ.1994.4565993","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67873625","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-11-01DOI: 10.1109/TJMJ.1994.4565975
K. Takanashi;M. Ohba;H. Kurokawa;H. Fujimori
We investigated the magnetization process in Co/Pt/Gd/Pt multilayer films in order to study the indirect exchange coupling between Co and Gd through Pt. Normal spin-flop behavior was observed in samples with a Pt layer thickness t pt ≪10Å. On the other hand, a novel hysteresis loop with "negative coercivity" was observed for t Pt ≫10Å. This loop is considered to be due to the combined effect of the antiferromagnetic coupling between the Co and Gd layers, and the large magnetic anisotropy acting on the Co layer magnetization. The calculated magnetization curves agree well with experimental results. The antiferromagnetic coupling strength estimated from a comparison of calculations and experiment decays in an oscillating manner with increasing t Pt .
{"title":"Interlayer Coupling and Magnetization Process in Co/Pt/Gd/Pt Multilayers","authors":"K. Takanashi;M. Ohba;H. Kurokawa;H. Fujimori","doi":"10.1109/TJMJ.1994.4565975","DOIUrl":"https://doi.org/10.1109/TJMJ.1994.4565975","url":null,"abstract":"We investigated the magnetization process in Co/Pt/Gd/Pt multilayer films in order to study the indirect exchange coupling between Co and Gd through Pt. Normal spin-flop behavior was observed in samples with a Pt layer thickness t\u0000<inf>pt</inf>\u0000≪10Å. On the other hand, a novel hysteresis loop with \"negative coercivity\" was observed for t\u0000<inf>Pt</inf>\u0000≫10Å. This loop is considered to be due to the combined effect of the antiferromagnetic coupling between the Co and Gd layers, and the large magnetic anisotropy acting on the Co layer magnetization. The calculated magnetization curves agree well with experimental results. The antiferromagnetic coupling strength estimated from a comparison of calculations and experiment decays in an oscillating manner with increasing t\u0000<inf>Pt</inf>\u0000.","PeriodicalId":100647,"journal":{"name":"IEEE Translation Journal on Magnetics in Japan","volume":"9 6","pages":"164-170"},"PeriodicalIF":0.0,"publicationDate":"1994-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TJMJ.1994.4565975","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"68041816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-11-01DOI: 10.1109/TJMJ.1994.4565978
N. Kurita;Y. Ando;S. Ishio;T. Miyazaki
The magnetization and Curie temperature of rapidly quenched (Gd 0.7 M 0.3 ) 80 Si 12 B 2 (M=Y, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Al) amorphous alloys were investigated. The Curie temperatures of alloys with M=Mn, Fe are higher by about 70K and 120K than that of Gd 80 Si 12 B 8 amorphous alloy. The magnetic moments of Mn, Fe and Co atoms are 2,1 and 1μ B respectively. These magnetic moments are antiparallel to that of the Gd atoms. The magnetic moment of Ni atoms nearly disappears; the magnetic moments of Y and V atoms are 1.7 and 2.1μ B respectively. The magnetic moment of Y atoms is antiparallel to that of Gd atoms, while that of V atoms is parallel to the latter. We conclude that alloys with nonmagnetic elements M exhibit asperomagnetism in which the Gd moments are distributed, while alloys with magnetic elements M have a ferrimagnetic order.
{"title":"Magnetic Properties of Rapidly Quenched (Gd-M)80Si12B8 Amorphous Alloys","authors":"N. Kurita;Y. Ando;S. Ishio;T. Miyazaki","doi":"10.1109/TJMJ.1994.4565978","DOIUrl":"https://doi.org/10.1109/TJMJ.1994.4565978","url":null,"abstract":"The magnetization and Curie temperature of rapidly quenched (Gd\u0000<sub>0.7</sub>\u0000M\u0000<sub>0.3</sub>\u0000)\u0000<sub>80</sub>\u0000Si\u0000<sub>12</sub>\u0000B\u0000<sub>2</sub>\u0000 (M=Y, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Al) amorphous alloys were investigated. The Curie temperatures of alloys with M=Mn, Fe are higher by about 70K and 120K than that of Gd\u0000<sub>80</sub>\u0000Si\u0000<sub>12</sub>\u0000B\u0000<sub>8</sub>\u0000 amorphous alloy. The magnetic moments of Mn, Fe and Co atoms are 2,1 and 1μ\u0000<sub>B</sub>\u0000 respectively. These magnetic moments are antiparallel to that of the Gd atoms. The magnetic moment of Ni atoms nearly disappears; the magnetic moments of Y and V atoms are 1.7 and 2.1μ\u0000<sub>B</sub>\u0000 respectively. The magnetic moment of Y atoms is antiparallel to that of Gd atoms, while that of V atoms is parallel to the latter. We conclude that alloys with nonmagnetic elements M exhibit asperomagnetism in which the Gd moments are distributed, while alloys with magnetic elements M have a ferrimagnetic order.","PeriodicalId":100647,"journal":{"name":"IEEE Translation Journal on Magnetics in Japan","volume":"9 6","pages":"185-190"},"PeriodicalIF":0.0,"publicationDate":"1994-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TJMJ.1994.4565978","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"68041818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-11-01DOI: 10.1109/TJMJ.1994.4565960
M. Yamaguchi;S. Yabukami;K.I. Arai
Issues related to magnetic shielding effects are discussed for inner-coil type thin-film inductors with closed magnetic circuits. The relationship between magnetic shielding effects, mutual inductance, and proximity effects are investigated using the finite integral equation method. The results show that obvious shielding effects occur in the inductors and that the mutual inductance is not influenced by the shielding effects.
{"title":"Analysis of Magnetic Shielding Effects for Thin-Film Inductors","authors":"M. Yamaguchi;S. Yabukami;K.I. Arai","doi":"10.1109/TJMJ.1994.4565960","DOIUrl":"https://doi.org/10.1109/TJMJ.1994.4565960","url":null,"abstract":"Issues related to magnetic shielding effects are discussed for inner-coil type thin-film inductors with closed magnetic circuits. The relationship between magnetic shielding effects, mutual inductance, and proximity effects are investigated using the finite integral equation method. The results show that obvious shielding effects occur in the inductors and that the mutual inductance is not influenced by the shielding effects.","PeriodicalId":100647,"journal":{"name":"IEEE Translation Journal on Magnetics in Japan","volume":"9 6","pages":"72-77"},"PeriodicalIF":0.0,"publicationDate":"1994-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TJMJ.1994.4565960","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67873540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-11-01DOI: 10.1109/TJMJ.1994.4565990
Y.H. Kim;M. Yamaguchi;K.I. Arai
The number of domain walls and the domain wall velocity of very thin (110) [001] 3% Si-Fe strip-wound cores were observed by SEM at excitation frequencies up to 5 kHz. Eddy current losses were calculated on the basis of the dynamic domain behavior using two models. a modified Pry and Bean model, and a model which considers the difference between each domain wall velocity. Both models assume sinusoidal domain wall motion. The measured eddy current losses were compared with calculated values. However, the measured losses disagreed with estimations in the frequency range from 50 to 500 Hz. The domain wall motion in each layer was estimated from the flux voltage waveform of a movable pickup coil inserted into a layer of a 3% Si-Fe strip. We found that the voltage waveform was not sinusoidal even if the secondary voltage waveform of the core was sinusoidal, and that the magnitude of the voltage in each layer was not uniform. The results mean that the domain wall motion is not uniform even in the 50 to 500 Hz range. The nonuniformity of the domain wall motion makes the eddy current losses larger than the results estimated on the basis of the two models.
{"title":"Domain Wall Motion and Eddy Current Losses in Very Thin 3% Si-Fe Core","authors":"Y.H. Kim;M. Yamaguchi;K.I. Arai","doi":"10.1109/TJMJ.1994.4565990","DOIUrl":"https://doi.org/10.1109/TJMJ.1994.4565990","url":null,"abstract":"The number of domain walls and the domain wall velocity of very thin (110) [001] 3% Si-Fe strip-wound cores were observed by SEM at excitation frequencies up to 5 kHz. Eddy current losses were calculated on the basis of the dynamic domain behavior using two models. a modified Pry and Bean model, and a model which considers the difference between each domain wall velocity. Both models assume sinusoidal domain wall motion. The measured eddy current losses were compared with calculated values. However, the measured losses disagreed with estimations in the frequency range from 50 to 500 Hz. The domain wall motion in each layer was estimated from the flux voltage waveform of a movable pickup coil inserted into a layer of a 3% Si-Fe strip. We found that the voltage waveform was not sinusoidal even if the secondary voltage waveform of the core was sinusoidal, and that the magnitude of the voltage in each layer was not uniform. The results mean that the domain wall motion is not uniform even in the 50 to 500 Hz range. The nonuniformity of the domain wall motion makes the eddy current losses larger than the results estimated on the basis of the two models.","PeriodicalId":100647,"journal":{"name":"IEEE Translation Journal on Magnetics in Japan","volume":"9 6","pages":"261-266"},"PeriodicalIF":0.0,"publicationDate":"1994-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TJMJ.1994.4565990","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67872878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-11-01DOI: 10.1109/TJMJ.1994.4565973
A. Maeda;S. Oikawa;M. Kume;Y. Shimizu;M. Doi
An annealing study suggested that the internal diffusion and interfacial diffusion of Ag atoms in ferromagnetic FeCo grains made negative and positive contributions, respectively, to obtaining a large magnetoresistance (MR) ratio. The magnetic saturation field (H s ) associated with MR characteristics decreased in proportion to the decrease in resistivity as the annealing temperature and/or annealing time increased. The coercive force in double-layered films with constant Co-Ag thickness decreased with increasing permalloy layer thickness. This indicates that the two layers are magnetically coupled. However, the H s was maintained to be extremely large. The MR ratio in the double-layered films was occasionally larger than that in a Co-Ag single layer.
{"title":"Giant Magnetoresistance Effect in Grain-Type Alloy Thin Films: II -Annealing and Double-Layering-","authors":"A. Maeda;S. Oikawa;M. Kume;Y. Shimizu;M. Doi","doi":"10.1109/TJMJ.1994.4565973","DOIUrl":"https://doi.org/10.1109/TJMJ.1994.4565973","url":null,"abstract":"An annealing study suggested that the internal diffusion and interfacial diffusion of Ag atoms in ferromagnetic FeCo grains made negative and positive contributions, respectively, to obtaining a large magnetoresistance (MR) ratio. The magnetic saturation field (H\u0000<inf>s</inf>\u0000) associated with MR characteristics decreased in proportion to the decrease in resistivity as the annealing temperature and/or annealing time increased. The coercive force in double-layered films with constant Co-Ag thickness decreased with increasing permalloy layer thickness. This indicates that the two layers are magnetically coupled. However, the H\u0000<inf>s</inf>\u0000 was maintained to be extremely large. The MR ratio in the double-layered films was occasionally larger than that in a Co-Ag single layer.","PeriodicalId":100647,"journal":{"name":"IEEE Translation Journal on Magnetics in Japan","volume":"9 6","pages":"153-158"},"PeriodicalIF":0.0,"publicationDate":"1994-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TJMJ.1994.4565973","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67872983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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