Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90911-7
M. Hashimoto, K. Miya
{"title":"Surface flaws detection of graphite materials using eddy current testing (In Japanese: English abstract)","authors":"M. Hashimoto, K. Miya","doi":"10.1016/0308-9126(90)90911-7","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90911-7","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"479 1","pages":"361"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76371223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90887-T
S. M. Nair, J. H. Rose
{"title":"A Laplace transform based inverse method for flaw characterization by eddy currents : Review of progress in quantitative nondestructive evaluation. Vol. 8A. Edited by D.C. Thompson and D.E. Chimenti, pp. 313–320. Plenum Press (1989), ISBN 0 306 43209 9","authors":"S. M. Nair, J. H. Rose","doi":"10.1016/0308-9126(90)90887-T","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90887-T","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"61 1","pages":"359"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78871692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1007/978-1-4613-0817-1_40
S. Nair, J. H. Rose
{"title":"A Laplace Transform Based Inverse Method for Flaw Characterization by Eddy Currents","authors":"S. Nair, J. H. Rose","doi":"10.1007/978-1-4613-0817-1_40","DOIUrl":"https://doi.org/10.1007/978-1-4613-0817-1_40","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"8 1","pages":"313-320"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86172139","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90867-N
B. M. Berezyuk, L. V. Khizhnyak, Y. M. Shumkov
{"title":"Computerised analysis of wide-band eddy current transducers","authors":"B. M. Berezyuk, L. V. Khizhnyak, Y. M. Shumkov","doi":"10.1016/0308-9126(90)90867-N","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90867-N","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"141 1","pages":"357"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77233222","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90957-P
V. Cecco, F. Sharp
{"title":"NDT abstractTransmit-receive eddy current probes for heat excharger inspection : Non-destructive testing, Proceedings of the 4th european conference, London (United Kingdom), 13–17 Sep. 1987. Vol. 4, pp. 2581–2590. Edited by J.M. Farley and R.W. Nichols. Pergamon Press, 1988","authors":"V. Cecco, F. Sharp","doi":"10.1016/0308-9126(90)90957-P","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90957-P","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"37 1","pages":"364-365"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86991783","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/B978-0-444-87450-4.50076-X
S. Staikov, I. Dolaptchiev, B. Vassilev
{"title":"A NEW ALGORITHM FOR PROCESSING THE SIGNAL FROM AN EDDY CURRENT PROBE","authors":"S. Staikov, I. Dolaptchiev, B. Vassilev","doi":"10.1016/B978-0-444-87450-4.50076-X","DOIUrl":"https://doi.org/10.1016/B978-0-444-87450-4.50076-X","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"6 1","pages":"311-314"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89256555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90860-Q
P. Ciorau
{"title":"Critical comments on the use of X-rays and Ir-192 for detecting linear discontinuities","authors":"P. Ciorau","doi":"10.1016/0308-9126(90)90860-Q","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90860-Q","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"52 5","pages":"345-350"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91507208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90967-S
T. Capobianco, D. F. Vecchia
{"title":"NDT abstractCoil parameter influence on eddy current probe sensitivity : Review of progress in quantitative nondestructive evaluation, Williamsburg, Virginia (United States), 22–26 Jun. 1987. Vol. 7A, pp. 487–492. Edited by D.D. Thompson and D.E. Chimenti, Plenum Press, 1988","authors":"T. Capobianco, D. F. Vecchia","doi":"10.1016/0308-9126(90)90967-S","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90967-S","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"7 1","pages":"365-366"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84785553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90905-4
Dulcie L.L., Capobianco T.E.
{"title":"New standard test method for eddy current probes","authors":"Dulcie L.L., Capobianco T.E.","doi":"10.1016/0308-9126(90)90905-4","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90905-4","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"23 6","pages":"Page 360"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0308-9126(90)90905-4","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72116737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/B978-0-08-036221-2.50048-6
V. Cecco, F. Sharp
{"title":"Transmit-Receive Eddy Current Probes for Heat Exchanger Inspection","authors":"V. Cecco, F. Sharp","doi":"10.1016/B978-0-08-036221-2.50048-6","DOIUrl":"https://doi.org/10.1016/B978-0-08-036221-2.50048-6","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"9 1","pages":"2581-2590"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76908496","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：