Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90877-Q
Beissner R.E., Temple J.A.G.
{"title":"A users guide and manual to the computer program PIERCE: probe impedance eddy current response to cracks","authors":"Beissner R.E., Temple J.A.G.","doi":"10.1016/0308-9126(90)90877-Q","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90877-Q","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"23 6","pages":"Page 358"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0308-9126(90)90877-Q","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72057158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90937-J
V. Gavrilin
{"title":"Non-destructive testing of thin conducting films : Proceedings of the 12th world conference on non-destructive testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1519–1521. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989","authors":"V. Gavrilin","doi":"10.1016/0308-9126(90)90937-J","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90937-J","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"12 1","pages":"363"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75650827","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90863-J
R. Churchill, J. M. Glass, H. Groger, S. Lane
{"title":"Eddy current nondestructive evaluation of laser glazed metallic surfaces : Laser Technologies in Industry. Proceedings of the Society of Photo-Optical Instrumentation Engineers, Vol. 952, pp. 334–339. ISBN 0892529873, (1989)","authors":"R. Churchill, J. M. Glass, H. Groger, S. Lane","doi":"10.1016/0308-9126(90)90863-J","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90863-J","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"116 1","pages":"357"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80848110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90865-L
S. Muller, J. Neumann, E. Wiens
{"title":"Calibration of eddy current signals for small natural surface cracks (In German: English Abstract) : Experimentalle Mechanik in Forschung und Praxis. Proceedings of the 12 Symposium 11–12 May 1989. PP157–166. VDI Verlay, 1989. ISBN 3180907312","authors":"S. Muller, J. Neumann, E. Wiens","doi":"10.1016/0308-9126(90)90865-L","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90865-L","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"28 1","pages":"357"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74792277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90951-J
M.D. MacLean
{"title":"Defect characterization by the remote-field eddy current technique in small-diameter tubing","authors":"M.D. MacLean","doi":"10.1016/0308-9126(90)90951-J","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90951-J","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"10 1","pages":"364"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78006374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90862-I
K. A. Ivashchenko, A. L. Khlyunev, S. V. Bosik
{"title":"A digital eddy-current flaw detector (In Russian) Tekhnicheskaya Diagnostika i Nerazrushayushchii Kontrol, No. 2, pp. 89–90 (1989)","authors":"K. A. Ivashchenko, A. L. Khlyunev, S. V. Bosik","doi":"10.1016/0308-9126(90)90862-I","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90862-I","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"12 1","pages":"357"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76339293","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90960-V
R. Palanisamy, K. Jackson
{"title":"NDT abstractEddy current sizing of case depth in bearing components : Nondestructive characterisation of materials 2, Montreal (Canada), 21–23 Jul. 1986. pp. 363–372. Edited by J.F. Bussiere, J.P. Monchalin, C.O. Ruud, R.E. Green Jr. Plenum Press, 1987","authors":"R. Palanisamy, K. Jackson","doi":"10.1016/0308-9126(90)90960-V","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90960-V","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"310 1","pages":"365"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77385064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1016/0308-9126(90)90950-S
A. McNab, J. Thomson
{"title":"An eddy-current-array instrument for fixed position scanning : Proceedings of the 12th world conference on non-destructive testing, Amsterdam (Netherlands) 23–28 Apr. 1989, Vol. 1, pp. 358–360. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989","authors":"A. McNab, J. Thomson","doi":"10.1016/0308-9126(90)90950-S","DOIUrl":"https://doi.org/10.1016/0308-9126(90)90950-S","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"10 1","pages":"364"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91157287","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-12-01DOI: 10.1007/978-1-4613-0979-6_87
A. Kahn, M. Mester
{"title":"An Eddy Current Sensor for the Measurement of Resistivity and Temperature of Aluminum Rod during Extrusion Processing","authors":"A. Kahn, M. Mester","doi":"10.1007/978-1-4613-0979-6_87","DOIUrl":"https://doi.org/10.1007/978-1-4613-0979-6_87","url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"20 1","pages":"1599-1605"},"PeriodicalIF":0.0,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90510547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}