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Use of schlieren methods to study gas flow in laser technology 用纹影法研究激光技术中的气体流动
Pub Date : 2016-11-11 DOI: 10.1117/12.2257212
L. Mrňa, J. Pavelka, P. Horník, J. Hrabovsky
Laser technologies such as welding and cutting rely on process gases. We suggest to use schlieren imaging to visualize the gas flow during these processes. During the process of laser welding, the shielding gas flows to the welded area to prevent oxidation of the weld pool by surrounding air. The gas also interacts with hot plasma spurting from the key hole induced by the laser beam incident on the molten material. This interaction is quite complicated because hot plasma mixes with the cold shielding gas while the system is moving along the weld. Three shielding gases were used in the presented experiment: Ar, He and N2. Differences in dynamics of the flow are clearly visible on schlieren images. Moreover, high speed recording reveals a structure consisting of hot gas bubbles. We were also able to determine the velocity of the bubbles from the recording. During laser cutting, the process gas flows coaxially with the laser beam from the nozzle to remove the molten material out of the kerf. The gas flow is critical for the quality of the resulting edge of the cut. Schlieren method was used to study gas flow under the nozzle and then under the material being cut. This actually creates another slot nozzle. Due to the very low speed of flow below the material the schleiren method is already at the limit of its sensitivity. Therefore, it is necessary to apply a differential technique to increase the contrast. Distinctive widening of the flow shaped by the kerf was observed.
焊接和切割等激光技术依赖于工艺气体。我们建议使用纹影成像来可视化这些过程中的气体流动。在激光焊接过程中,保护气体流向焊接区,防止焊缝熔池被周围空气氧化。该气体还与入射到熔融材料上的激光束诱导的从关键孔喷出的热等离子体相互作用。这种相互作用相当复杂,因为当系统沿着焊缝移动时,热等离子体与冷保护气体混合。实验采用了氩、氦和氮气三种保护气体。流动动力学的差异在纹影图像上清晰可见。此外,高速记录揭示了一个由热气泡组成的结构。我们还能从录音中确定气泡的速度。在激光切割过程中,加工气体随激光束从喷嘴同轴流动,将熔融材料从切口中去除。气体流动对切割的最终边缘的质量至关重要。采用纹影法研究了喷嘴下和被切割材料下的气流。这实际上创造了另一个槽式喷嘴。由于材料下方的流动速度非常低,施莱伦法的灵敏度已经达到极限。因此,有必要采用差分技术来增加对比度。观察到由切口形成的水流明显变宽。
{"title":"Use of schlieren methods to study gas flow in laser technology","authors":"L. Mrňa, J. Pavelka, P. Horník, J. Hrabovsky","doi":"10.1117/12.2257212","DOIUrl":"https://doi.org/10.1117/12.2257212","url":null,"abstract":"Laser technologies such as welding and cutting rely on process gases. We suggest to use schlieren imaging to visualize the gas flow during these processes. During the process of laser welding, the shielding gas flows to the welded area to prevent oxidation of the weld pool by surrounding air. The gas also interacts with hot plasma spurting from the key hole induced by the laser beam incident on the molten material. This interaction is quite complicated because hot plasma mixes with the cold shielding gas while the system is moving along the weld. Three shielding gases were used in the presented experiment: Ar, He and N2. Differences in dynamics of the flow are clearly visible on schlieren images. Moreover, high speed recording reveals a structure consisting of hot gas bubbles. We were also able to determine the velocity of the bubbles from the recording. During laser cutting, the process gas flows coaxially with the laser beam from the nozzle to remove the molten material out of the kerf. The gas flow is critical for the quality of the resulting edge of the cut. Schlieren method was used to study gas flow under the nozzle and then under the material being cut. This actually creates another slot nozzle. Due to the very low speed of flow below the material the schleiren method is already at the limit of its sensitivity. Therefore, it is necessary to apply a differential technique to increase the contrast. Distinctive widening of the flow shaped by the kerf was observed.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"226 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130586463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Detection and magnification of bridge displacements using video images 利用视频图像检测和放大桥梁位移
Pub Date : 2016-11-11 DOI: 10.1117/12.2257218
Leticia Teran, C. Ordóñez, S. Garcia-Cortes, Agustín Menéndez
Monitoring displacements on some structures such as large bridges is essential to study their structural performance in order to avoid severe damage or even their collapse. In this work, we use images obtained with digital video cameras to estimate the displacements of a metallic bridge by means of cross-correlation. Thus, it was possible to detect millimetric displacements for distances between the camera and the bridge upper ten meters. In order to obtain a better representation of the structural displacements along the bridge and its modal shapes, a technique of video magnification was also applied. The results obtained show that the combination of both techniques can provide relevant information for a structural analysis of the bridge.
监测某些结构(如大型桥梁)的位移对于研究其结构性能至关重要,以避免严重损坏甚至倒塌。在这项工作中,我们使用数字摄像机获得的图像,通过相互关联的方法来估计金属桥的位移。因此,有可能检测到相机和桥梁之间距离在10米以上的毫米位移。为了更好地表示桥梁沿线的结构位移及其模态振型,还采用了视频放大技术。结果表明,两种技术的结合可以为桥梁的结构分析提供相关信息。
{"title":"Detection and magnification of bridge displacements using video images","authors":"Leticia Teran, C. Ordóñez, S. Garcia-Cortes, Agustín Menéndez","doi":"10.1117/12.2257218","DOIUrl":"https://doi.org/10.1117/12.2257218","url":null,"abstract":"Monitoring displacements on some structures such as large bridges is essential to study their structural performance in order to avoid severe damage or even their collapse. In this work, we use images obtained with digital video cameras to estimate the displacements of a metallic bridge by means of cross-correlation. Thus, it was possible to detect millimetric displacements for distances between the camera and the bridge upper ten meters. In order to obtain a better representation of the structural displacements along the bridge and its modal shapes, a technique of video magnification was also applied. The results obtained show that the combination of both techniques can provide relevant information for a structural analysis of the bridge.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129569218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Control of chemical composition of PZT thin films produced by ion-beam deposition from a multicomponent target 多组分靶离子束沉积PZT薄膜化学成分的控制
Pub Date : 2016-11-11 DOI: 10.1117/12.2257331
J. Hlubuček, David Vápenka, P. Horodyska, J. Václavík
Lead zirconate titanate (PZT) is widely used for its ferroelectric and piezoelectric properties, which are conditioned by perovskite structure. Crystallization into this desired phase is determined also by a proper stoichiometry, where the lead concentration is a crucial parameter. The crystallization process takes place during annealing under high temperatures, which is linked to heavy lead losses, so the lead has to be in excess. Therefore, this paper is devoted to the control of chemical composition of PZT thin films deposited via ion beam sputtering (IBS). A commonly used approach for IBS relies on employing a multicomponent target to obtain films with the same composition as that of the target. However, in the case of PZT it is favorable to have the ability to controllably change the chemical composition of thin films in order to acquire high perovskite content. Our study revealed that the determinative lead content in PZT layers prepared by simple and dual ion-beam deposition from a multicomponent target can be easily controlled by the power of primary ion source. At the same time, the composition is also dependent on the substrate temperature and the power of assistant ion source. Thin PZT films with more than 30 % lead excess were acquired from a stoichiometric multicomponent target (i.e. a target without any lead excess). We can therefore propose several possible sets of deposition parameters suitable for the PZT deposition via IBS to obtain high perovskite content.
锆钛酸铅(PZT)因其铁电和压电性能而被广泛应用,这些性能是由钙钛矿结构决定的。结晶成所需的相也由适当的化学计量来决定,其中铅浓度是一个关键参数。结晶过程发生在高温退火过程中,这与铅的大量损失有关,因此铅必须过量。因此,本文研究了离子束溅射沉积PZT薄膜的化学成分控制。IBS的一种常用方法是采用多组分靶来获得与靶成分相同的膜。然而,对于PZT来说,为了获得高钙钛矿含量,有能力控制改变薄膜的化学成分是有利的。我们的研究表明,用简单的双离子束沉积法制备的PZT层中的铅含量可以很容易地通过一次离子源的功率来控制。同时,其组成还取决于衬底温度和辅助离子源的功率。从化学计量多组分靶(即没有任何铅过量的靶)中获得了超过30%铅过量的PZT薄膜。因此,我们可以提出几种可能的沉积参数集,适用于通过IBS沉积PZT以获得高钙钛矿含量。
{"title":"Control of chemical composition of PZT thin films produced by ion-beam deposition from a multicomponent target","authors":"J. Hlubuček, David Vápenka, P. Horodyska, J. Václavík","doi":"10.1117/12.2257331","DOIUrl":"https://doi.org/10.1117/12.2257331","url":null,"abstract":"Lead zirconate titanate (PZT) is widely used for its ferroelectric and piezoelectric properties, which are conditioned by perovskite structure. Crystallization into this desired phase is determined also by a proper stoichiometry, where the lead concentration is a crucial parameter. The crystallization process takes place during annealing under high temperatures, which is linked to heavy lead losses, so the lead has to be in excess. Therefore, this paper is devoted to the control of chemical composition of PZT thin films deposited via ion beam sputtering (IBS). A commonly used approach for IBS relies on employing a multicomponent target to obtain films with the same composition as that of the target. However, in the case of PZT it is favorable to have the ability to controllably change the chemical composition of thin films in order to acquire high perovskite content. Our study revealed that the determinative lead content in PZT layers prepared by simple and dual ion-beam deposition from a multicomponent target can be easily controlled by the power of primary ion source. At the same time, the composition is also dependent on the substrate temperature and the power of assistant ion source. Thin PZT films with more than 30 % lead excess were acquired from a stoichiometric multicomponent target (i.e. a target without any lead excess). We can therefore propose several possible sets of deposition parameters suitable for the PZT deposition via IBS to obtain high perovskite content.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133028205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Zeeko precession for free-form polishing Zeeko进动自由形式抛光
Pub Date : 2016-11-11 DOI: 10.1117/12.2256558
F. Procháska, I. Poláková, J. Polák, O. Matousek, D. Tomka
The aim of this work is an exploration of the options for optical surface polishing using the Zeeko IRP 100 machine and raster kinematics suitable for free-form polishing. For this purpose, aspheric surfaces were polished in raster prepolishing mode and then in Precession raster 3D shape correction, which is based on the Dwell time tool movement control. It was found that shape accuracy can achieve the value of approximately 35 nm RMS. The main inaccuracy was caused by the mid-spatial frequencies generated by the kinematics of the applied tools, which also limited the achievable values of microroughness.
这项工作的目的是探索使用Zeeko IRP 100机器和适合自由形式抛光的光栅运动学进行光学表面抛光的选择。为此,采用栅格预抛光方式对非球面进行抛光,然后采用基于驻留时间刀具运动控制的进动栅格三维形状校正。结果表明,该方法的形状精度可达到35 nm左右的RMS值。主要误差是由刀具运动产生的中空间频率引起的,这也限制了微粗糙度的可实现值。
{"title":"Zeeko precession for free-form polishing","authors":"F. Procháska, I. Poláková, J. Polák, O. Matousek, D. Tomka","doi":"10.1117/12.2256558","DOIUrl":"https://doi.org/10.1117/12.2256558","url":null,"abstract":"The aim of this work is an exploration of the options for optical surface polishing using the Zeeko IRP 100 machine and raster kinematics suitable for free-form polishing. For this purpose, aspheric surfaces were polished in raster prepolishing mode and then in Precession raster 3D shape correction, which is based on the Dwell time tool movement control. It was found that shape accuracy can achieve the value of approximately 35 nm RMS. The main inaccuracy was caused by the mid-spatial frequencies generated by the kinematics of the applied tools, which also limited the achievable values of microroughness.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130966874","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Geometric calibration of rotational kaleidoscopic instrument 旋转万花筒仪器的几何定标
Pub Date : 2016-11-11 DOI: 10.1117/12.2257434
V. Havran, S. Nemcová, J. Cáp, J. Hošek, Jiří Bittner, K. Macúchová
The measurement of spatially varying surface reflectance is required for faithful reproduction of real world to allow for predictive look of computer generated images. One such proposed method uses a rotational kaleidoscopic imaging, where illumination and imaging paths are realized by subimages on kaleidoscopic mirrors and illumination is carried out by a DLP projector. We describe a novel geometric calibration method for a rotational kaleidoscope that is necessary to get aligned and accurate data from measurement. The calibration has two stages. The first stage mechanically adjusts the camera, the projector, and the autocollimator against the kaleidoscope mirrors. The second stage is based on the software. By random perturbation of camera and projector in corresponding mathematical model of the kaleidoscope we estimate better real positions of camera and projector in a physical setup, comparing the computed images from the software simulator and the acquired images from the physical setup.
测量空间变化的表面反射率是真实世界的忠实再现所必需的,以允许计算机生成图像的预测外观。其中一种提出的方法使用旋转万花筒成像,其中通过万花筒镜上的子图像实现照明和成像路径,并且由DLP投影仪进行照明。本文提出了一种旋转万花筒几何定标的新方法,该方法是获得精确的测量数据所必需的。校准分为两个阶段。第一阶段机械地调整相机、投影仪和对准万花筒镜的自动准直仪。第二阶段是基于软件的。通过在万花筒相应的数学模型中对摄像机和投影仪进行随机扰动,对摄像机和投影仪在物理装置中的真实位置进行了较好的估计,并将软件模拟器的计算图像与物理装置的采集图像进行了比较。
{"title":"Geometric calibration of rotational kaleidoscopic instrument","authors":"V. Havran, S. Nemcová, J. Cáp, J. Hošek, Jiří Bittner, K. Macúchová","doi":"10.1117/12.2257434","DOIUrl":"https://doi.org/10.1117/12.2257434","url":null,"abstract":"The measurement of spatially varying surface reflectance is required for faithful reproduction of real world to allow for predictive look of computer generated images. One such proposed method uses a rotational kaleidoscopic imaging, where illumination and imaging paths are realized by subimages on kaleidoscopic mirrors and illumination is carried out by a DLP projector. We describe a novel geometric calibration method for a rotational kaleidoscope that is necessary to get aligned and accurate data from measurement. The calibration has two stages. The first stage mechanically adjusts the camera, the projector, and the autocollimator against the kaleidoscope mirrors. The second stage is based on the software. By random perturbation of camera and projector in corresponding mathematical model of the kaleidoscope we estimate better real positions of camera and projector in a physical setup, comparing the computed images from the software simulator and the acquired images from the physical setup.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133107575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Qualification of a 3D structured light sensor for a reverse engineering application 一种用于逆向工程应用的三维结构光传感器的鉴定
Pub Date : 2016-11-11 DOI: 10.1117/12.2257601
Alexandre Zuquete Guarato, Alexandre C. Loja, L. P. Pereira, S. Braga, T. Trevilato
This paper deals with the qualification of a 3D structured light scanning system for an application of reverse engineering of a mechanical part. As this white light scanner is an electro-optical device and based on the principle of optical triangulation, the measurement accuracy is affected by the measured part geometry and its position within the scanning window. The effects of the scan depth and the projected angle, characterizing the surface normal of the measured surface to the scanning point of view, on the measurement of accuracy are not considered in the standard calibration process of manufacturers and have been identified by experiments in the present work. The digitization errors are analyzed and characterized thanks to a measurement protocol based on quality indicators. Theses quality indicators are evaluated thanks to simple calibrated artifacts. The aim of this work is to redefine the ideal relative distance and relative angle for minimizing the digitizing errors in relation to those stated by the manufacturer for a reverse engineering application.
本文讨论了一种用于机械零件逆向工程的三维结构光扫描系统的定性。由于该白光扫描仪是一种基于光学三角测量原理的光电器件,因此测量精度受被测部件几何形状及其在扫描窗口内的位置的影响。在厂商的标准校准过程中,扫描深度和投影角度对测量精度的影响是不考虑的,而扫描深度和投影角度表征了被测表面对扫描角度的表面法线,在本工作中已经通过实验验证了这一点。利用基于质量指标的测量方案对数字化误差进行了分析和表征。通过简单的校准工件来评估这些质量指标。这项工作的目的是重新定义理想的相对距离和相对角度,以最大限度地减少与逆向工程应用中制造商所述的数字化误差。
{"title":"Qualification of a 3D structured light sensor for a reverse engineering application","authors":"Alexandre Zuquete Guarato, Alexandre C. Loja, L. P. Pereira, S. Braga, T. Trevilato","doi":"10.1117/12.2257601","DOIUrl":"https://doi.org/10.1117/12.2257601","url":null,"abstract":"This paper deals with the qualification of a 3D structured light scanning system for an application of reverse engineering of a mechanical part. As this white light scanner is an electro-optical device and based on the principle of optical triangulation, the measurement accuracy is affected by the measured part geometry and its position within the scanning window. The effects of the scan depth and the projected angle, characterizing the surface normal of the measured surface to the scanning point of view, on the measurement of accuracy are not considered in the standard calibration process of manufacturers and have been identified by experiments in the present work. The digitization errors are analyzed and characterized thanks to a measurement protocol based on quality indicators. Theses quality indicators are evaluated thanks to simple calibrated artifacts. The aim of this work is to redefine the ideal relative distance and relative angle for minimizing the digitizing errors in relation to those stated by the manufacturer for a reverse engineering application.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129345852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Scratch and dig analysis for Metis mirrors surfaces defects evaluation Metis反射镜表面缺陷评价的划痕和挖掘分析
Pub Date : 2016-11-11 DOI: 10.1117/12.2256634
M. Špína, F. Procháska, R. Melich
The presented paper aims to theoretically analyze the possibilities, advantages and drawbacks of standard methods used for the assessment of optical surface defects (the so-called Scratch and Dig analysis). Based on the acquired knowledge, we design and apply a process of SaD analysis suitable for the evaluation of optical surfaces of mirrors of the space coronagraph Metis, whose manufacturing was successfully implemented within the Centre Toptec in the past period.
本文旨在从理论上分析用于评估光学表面缺陷的标准方法(即所谓的Scratch和Dig分析)的可能性、优点和缺点。基于所获得的知识,我们设计并应用了一种适用于空间日冕仪Metis反射镜光学表面评估的SaD分析过程,该日冕仪在过去一段时间内成功地在Toptec中心实施了制造。
{"title":"Scratch and dig analysis for Metis mirrors surfaces defects evaluation","authors":"M. Špína, F. Procháska, R. Melich","doi":"10.1117/12.2256634","DOIUrl":"https://doi.org/10.1117/12.2256634","url":null,"abstract":"The presented paper aims to theoretically analyze the possibilities, advantages and drawbacks of standard methods used for the assessment of optical surface defects (the so-called Scratch and Dig analysis). Based on the acquired knowledge, we design and apply a process of SaD analysis suitable for the evaluation of optical surfaces of mirrors of the space coronagraph Metis, whose manufacturing was successfully implemented within the Centre Toptec in the past period.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121397896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Methods for refractive-index homogeneity calculation using Fourier-transform phase-shifting interferometry 傅立叶变换移相干涉法计算折射率均匀性的方法
Pub Date : 2016-11-11 DOI: 10.1117/12.2256991
O. Matousek, V. Ledl, P. Psota, P. Vojtíšek
Fourier-transform phase-shifting interferometry brings the possibility of a very precise measurement of refractive-index variation in a material. In a four surface cavity six first order interferograms are observed. In the standard way an interference between waves reflected from a front and a rear surface of a sample is used to obtain refractive-index homogeneity. But another three interferograms contain information about inner inhomogeneity and can be used for its calculation as well. In this paper all four calculation methods are presented and compared. The measurements and simulations show, the methods give us globally similar outputs. However due to calculation from different interferograms every result is affected by different undesirable effects. This difference can be used for suppression of the effects and thus to refine the results.
傅里叶变换相移干涉法使精确测量材料折射率变化成为可能。在四面腔中观察到六个一阶干涉图。在标准的方法中,从样品的正面和背面反射的波之间的干涉被用来获得折射率均匀性。但另外三种干涉图包含了内部非均匀性的信息,也可用于计算内部非均匀性。本文对这四种计算方法进行了介绍和比较。测量和模拟结果表明,这些方法在全球范围内得到了相似的结果。然而,由于采用不同的干涉图进行计算,每个结果都会受到不同的不良影响。这种差异可以用来抑制效应,从而改进结果。
{"title":"Methods for refractive-index homogeneity calculation using Fourier-transform phase-shifting interferometry","authors":"O. Matousek, V. Ledl, P. Psota, P. Vojtíšek","doi":"10.1117/12.2256991","DOIUrl":"https://doi.org/10.1117/12.2256991","url":null,"abstract":"Fourier-transform phase-shifting interferometry brings the possibility of a very precise measurement of refractive-index variation in a material. In a four surface cavity six first order interferograms are observed. In the standard way an interference between waves reflected from a front and a rear surface of a sample is used to obtain refractive-index homogeneity. But another three interferograms contain information about inner inhomogeneity and can be used for its calculation as well. In this paper all four calculation methods are presented and compared. The measurements and simulations show, the methods give us globally similar outputs. However due to calculation from different interferograms every result is affected by different undesirable effects. This difference can be used for suppression of the effects and thus to refine the results.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125946769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Visualization and measurement of the air film close ultra-hydrophobic surfaces 超疏水表面气膜的可视化和测量
Pub Date : 2016-11-11 DOI: 10.1117/12.2260997
D. Jašíková, M. Gašić, M. Kotek, V. Kopecký
The ultra-hydrophobic surfaces have the prospect of great importance in industry, both in applications demanding easy cleaning, and they are presumed to reduce loss when the active parts of hydraulic machines are treated. Interaction of fluids with ultra-hydrophobic surface is accompanied by creation of layer of air, so called air film, which depends on the quality of the surface. The quality of the surface is influenced by the matrix roughness, the character of physical or chemical cover. This properties lead to monolithic air layer presented as air film, or lead to plurality of bubbles of various sizes seated upon the surface. The air film can be observed visually at sufficient magnification and the dynamic interaction between fluid flow and air film can be studied with Global Imaging methods, particularly Particle Image Velocimetry (PIV). There is the velocity profile in the vicinity of the air film in the main interest of the research. Here we present the visualization of air film depending on Reynolds number of flowing liquid.
超疏水表面在工业上具有非常重要的前景,无论是在要求易于清洁的应用中,还是在处理液压机的活动部件时,它们被认为可以减少损失。流体与超疏水表面的相互作用伴随着一层空气的产生,即所谓的空气膜,这取决于表面的质量。表面质量受基体粗糙度、物理或化学覆盖物特性的影响。这种特性导致整体空气层表现为气膜,或导致多个不同大小的气泡坐落在表面上。在足够的放大倍数下,可以直观地观察到气膜,并且可以使用全局成像方法,特别是粒子图像测速(PIV)来研究流体流动与气膜之间的动态相互作用。气膜附近的速度分布是研究的重点。本文提出了空气膜随流动液体雷诺数的可视化。
{"title":"Visualization and measurement of the air film close ultra-hydrophobic surfaces","authors":"D. Jašíková, M. Gašić, M. Kotek, V. Kopecký","doi":"10.1117/12.2260997","DOIUrl":"https://doi.org/10.1117/12.2260997","url":null,"abstract":"The ultra-hydrophobic surfaces have the prospect of great importance in industry, both in applications demanding easy cleaning, and they are presumed to reduce loss when the active parts of hydraulic machines are treated. Interaction of fluids with ultra-hydrophobic surface is accompanied by creation of layer of air, so called air film, which depends on the quality of the surface. The quality of the surface is influenced by the matrix roughness, the character of physical or chemical cover. This properties lead to monolithic air layer presented as air film, or lead to plurality of bubbles of various sizes seated upon the surface. The air film can be observed visually at sufficient magnification and the dynamic interaction between fluid flow and air film can be studied with Global Imaging methods, particularly Particle Image Velocimetry (PIV). There is the velocity profile in the vicinity of the air film in the main interest of the research. Here we present the visualization of air film depending on Reynolds number of flowing liquid.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133660852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sol-gel preparation of silica and titania thin films 溶胶-凝胶法制备二氧化硅和二氧化钛薄膜
Pub Date : 2016-11-11 DOI: 10.1117/12.2257325
T. Thoř, J. Václavík
Thin films of silicon dioxide (SiO2) and titanium dioxide (TiO2) for application in precision optics prepared via the solgel route are being investigated in this paper. The sol-gel process presents a low cost approach, which is capable of tailoring thin films of various materials in optical grade quality. Both SiO2 and TiO2 are materials well known for their application in the field of anti-reflective and also highly reflective optical coatings. For precision optics purposes, thickness control and high quality of such coatings are of utmost importance. In this work, thin films were deposited on microscope glass slides substrates using the dip-coating technique from a solution based on alkoxide precursors of tetraethyl orthosilicate (TEOS) and titanium isopropoxide (TIP) for SiO2 and TiO2, respectively. As-deposited films were studied using spectroscopic ellipsometry to determine their thickness and refractive index. Using a semi-empirical equation, a relationship between the coating speed and the heat-treated film thickness was described for both SiO2 and TiO2 thin films. This allows us to control the final heat-treated thin film thickness by simply adjusting the coating speed. Furthermore, films’ surface was studied using the white-light interferometry. As-prepared films exhibited low surface roughness with the area roughness parameter Sq being on average of 0.799 nm and 0.33 nm for SiO2 and TiO2, respectively.
本文研究了用溶胶法制备用于精密光学的二氧化硅(SiO2)和二氧化钛(TiO2)薄膜。溶胶-凝胶工艺提供了一种低成本的方法,能够定制光学级质量的各种材料的薄膜。SiO2和TiO2都是众所周知的材料,它们在抗反射和高反射光学涂层领域的应用。为了达到精密光学的目的,涂层的厚度控制和高质量是至关重要的。在这项工作中,采用浸涂技术将正硅酸四乙酯(TEOS)和异丙醇钛(TIP)的醇盐前驱体溶液分别沉积在显微镜玻璃载玻片上。采用椭偏光谱法研究了沉积膜的厚度和折射率。利用半经验方程,描述了SiO2和TiO2薄膜的涂层速度与热处理膜厚度之间的关系。这使我们可以通过简单地调整涂层速度来控制最终热处理薄膜的厚度。此外,利用白光干涉法对薄膜表面进行了研究。制备的膜表面粗糙度较低,SiO2和TiO2的面积粗糙度参数Sq平均为0.799 nm和0.33 nm。
{"title":"Sol-gel preparation of silica and titania thin films","authors":"T. Thoř, J. Václavík","doi":"10.1117/12.2257325","DOIUrl":"https://doi.org/10.1117/12.2257325","url":null,"abstract":"Thin films of silicon dioxide (SiO2) and titanium dioxide (TiO2) for application in precision optics prepared via the solgel route are being investigated in this paper. The sol-gel process presents a low cost approach, which is capable of tailoring thin films of various materials in optical grade quality. Both SiO2 and TiO2 are materials well known for their application in the field of anti-reflective and also highly reflective optical coatings. For precision optics purposes, thickness control and high quality of such coatings are of utmost importance. In this work, thin films were deposited on microscope glass slides substrates using the dip-coating technique from a solution based on alkoxide precursors of tetraethyl orthosilicate (TEOS) and titanium isopropoxide (TIP) for SiO2 and TiO2, respectively. As-deposited films were studied using spectroscopic ellipsometry to determine their thickness and refractive index. Using a semi-empirical equation, a relationship between the coating speed and the heat-treated film thickness was described for both SiO2 and TiO2 thin films. This allows us to control the final heat-treated thin film thickness by simply adjusting the coating speed. Furthermore, films’ surface was studied using the white-light interferometry. As-prepared films exhibited low surface roughness with the area roughness parameter Sq being on average of 0.799 nm and 0.33 nm for SiO2 and TiO2, respectively.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114275310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
期刊
Optical Angular Momentum
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