{"title":"Characterization of SiO2 protective coatings on polycarbonate","authors":"S. Jakobs, U. Schulz, A. Duparré, N. Kaiser","doi":"10.1007/S002160050395","DOIUrl":"https://doi.org/10.1007/S002160050395","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"29 1","pages":"242-244"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79177077","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Preparation of cuprite (Cu2O), paramelaconite (Cu32+Cu21+O4) and tenorite (CuO) with magnetron sputtering ion plating: characterization by EPMA, XRD, HEED and SEM","authors":"A. v. Richthofen, R. Domnick, R. Cremer","doi":"10.1007/S002160050415","DOIUrl":"https://doi.org/10.1007/S002160050415","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"32 1","pages":"312-315"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87432527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. I. Schiffmann, M. Fryda, G. Goerigk, R. Lauer, P. Hinze
{"title":"Correction of STM tip convolution effects in particle size and distance determination of metal-C:H films","authors":"K. I. Schiffmann, M. Fryda, G. Goerigk, R. Lauer, P. Hinze","doi":"10.1007/S002160050424","DOIUrl":"https://doi.org/10.1007/S002160050424","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"20 1","pages":"341-344"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78056199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
O. Anderson, C. Ottermann, R. Kuschnereit, P. Hess, K. Bange
{"title":"Density and Young’s modulus of thin TiO2 films","authors":"O. Anderson, C. Ottermann, R. Kuschnereit, P. Hess, K. Bange","doi":"10.1007/s002160050416","DOIUrl":"https://doi.org/10.1007/s002160050416","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"29 1","pages":"315-318"},"PeriodicalIF":0.0,"publicationDate":"1997-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90448506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Scratch test measurement of tribological hard coatings in practice","authors":"G. Berg, C. Friedrich, E. Broszeit, C. Berger","doi":"10.1007/S002160050407","DOIUrl":"https://doi.org/10.1007/S002160050407","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"22 1","pages":"281-285"},"PeriodicalIF":0.0,"publicationDate":"1997-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91199098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Gastel, U. Breuer, H. Holzbrecher, J. S. Becker, H. Dietze, H. Wagner
{"title":"Depth profile analysis of thin film solar cells using SNMS and SIMS","authors":"M. Gastel, U. Breuer, H. Holzbrecher, J. S. Becker, H. Dietze, H. Wagner","doi":"10.1007/S002160050385","DOIUrl":"https://doi.org/10.1007/S002160050385","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"6 1","pages":"207-210"},"PeriodicalIF":0.0,"publicationDate":"1997-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80425275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. Bubert, E. Grallath, A. Quentmeier, M. Wielunski, L. Borucki
{"title":"Comparative investigation on copper oxides by depth profiling using XPS, RBS and GDOES","authors":"H. Bubert, E. Grallath, A. Quentmeier, M. Wielunski, L. Borucki","doi":"10.1007/BF00322088","DOIUrl":"https://doi.org/10.1007/BF00322088","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"148 1","pages":"456-463"},"PeriodicalIF":0.0,"publicationDate":"1995-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76440985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Characterisation of 13C implantations in silicon by NRA [13C(p,γ)14N] and RBS","authors":"W. Theodossiu, H. Baumann, A. Markwitz, K. Bethge","doi":"10.1007/BF00322093","DOIUrl":"https://doi.org/10.1007/BF00322093","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"18 8 1","pages":"483-486"},"PeriodicalIF":0.0,"publicationDate":"1995-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82894451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-08-15DOI: 10.1016/0040-6090(95)05824-9
K. Weldige, M. Rohwerder, E. Vago, H. Viefhaus, M. Stratmann
{"title":"Adsorption of self-assembled monolayers of mercaptan on gold","authors":"K. Weldige, M. Rohwerder, E. Vago, H. Viefhaus, M. Stratmann","doi":"10.1016/0040-6090(95)05824-9","DOIUrl":"https://doi.org/10.1016/0040-6090(95)05824-9","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"33 1","pages":"329-332"},"PeriodicalIF":0.0,"publicationDate":"1995-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87927511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Quality and the development of reference materials, including the role of traceability and comparability","authors":"W. P. Reed","doi":"10.1007/BF00322337","DOIUrl":"https://doi.org/10.1007/BF00322337","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"63 1","pages":"250-254"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78209767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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