{"title":"New insights into the ZnO/a-SiC:H(B) interface using XPS analysis","authors":"E. Böhmer, F. Siebke, H. Wagner","doi":"10.1007/S002160050386","DOIUrl":"https://doi.org/10.1007/S002160050386","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"26 1","pages":"210-213"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80873865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Niebuhr, H. Bubert, H. Steffens, D. Haumann, K. Kauder, U. Dämgen
{"title":"Examination of wear mechanisms of hard coatings","authors":"T. Niebuhr, H. Bubert, H. Steffens, D. Haumann, K. Kauder, U. Dämgen","doi":"10.1007/S002160050406","DOIUrl":"https://doi.org/10.1007/S002160050406","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"19 1","pages":"278-280"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72744911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Characterization of chemically modified silica by infrared and solid state nuclear magnetic resonance spectroscopy","authors":"K. Heger, G. Marx, E. Brendler, B. Thomas","doi":"10.1007/S002160050394","DOIUrl":"https://doi.org/10.1007/S002160050394","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"27 1","pages":"240-241"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87224776","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"AES Depth profiling of semiconducting multilayer structures using an ion beam bevelling technique","authors":"M. Procop, A. Klein, I. Rechenberg, D. Krüger","doi":"10.1007/S002160050429","DOIUrl":"https://doi.org/10.1007/S002160050429","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"16 4","pages":"358-360"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91485282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of RF GDMS for trace element analysis of nonconducting La0.65Sr0.3MnO3 ceramic layers","authors":"R. Jäger, J. Becker, H. Dietze, J. Broekaert","doi":"10.1007/S002160050387","DOIUrl":"https://doi.org/10.1007/S002160050387","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"55 1","pages":"214-217"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75135435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Herion, K. Szot, S. Barzen, F. Siebke, M. Teske
{"title":"AFM and STM investigations of hydrogenated amorphous silicon: topography and barrier heights","authors":"J. Herion, K. Szot, S. Barzen, F. Siebke, M. Teske","doi":"10.1007/S002160050423","DOIUrl":"https://doi.org/10.1007/S002160050423","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"29 1","pages":"338-340"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74319760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. v. Richthofen, R. Cremer, R. Domnick, D. Neuschütz
{"title":"Preparation of polycrystalline Ti-Al-O films by magnetron sputtering ion plating: constitution, structure and morphology","authors":"A. v. Richthofen, R. Cremer, R. Domnick, D. Neuschütz","doi":"10.1007/S002160050414","DOIUrl":"https://doi.org/10.1007/S002160050414","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"55 1","pages":"308-311"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82443691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Forkel, C. Köcher, E. Schierhorn, K. Adam, F. G. Wihsmann, P. Bartos
{"title":"Topographical and microanalytical investigation of corrosion processes on the solid material in the system metal-metalloid glassy alloy (Fe,Cr)80(P,C,Si)20, aqueous FeCl3 solution, and air in the region of the “amorphous solid/liquid/air” phase interface","authors":"K. Forkel, C. Köcher, E. Schierhorn, K. Adam, F. G. Wihsmann, P. Bartos","doi":"10.1007/S002160050389","DOIUrl":"https://doi.org/10.1007/S002160050389","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"28 1","pages":"219-224"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78154338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Schöpke, B. Selle, I. Sieber, G. Reinsperger, P. Stauss, K. Herz, M. Powalla
{"title":"Characterization of the stoichiometry of coevaporated FeSix films by AES, EDX, RBS, and electron microscopy","authors":"A. Schöpke, B. Selle, I. Sieber, G. Reinsperger, P. Stauss, K. Herz, M. Powalla","doi":"10.1007/S002160050418","DOIUrl":"https://doi.org/10.1007/S002160050418","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"7 1","pages":"322-325"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73644482","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Glass fracture surfaces seen with an atomic force microscope","authors":"C. Wünsche, E. Rädlein, G. H. Frischat","doi":"10.1007/S002160050426","DOIUrl":"https://doi.org/10.1007/S002160050426","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"75 1","pages":"349-351"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74034385","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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