C. Bruchertseifer, K. Stoppek-Langner, J. Grobe, M. Deimel, A. Benninghoven
{"title":"Examination of organosilicon impregnating mixtures by static SIMS and diffuse reflectance FT-IR","authors":"C. Bruchertseifer, K. Stoppek-Langner, J. Grobe, M. Deimel, A. Benninghoven","doi":"10.1007/S002160050404","DOIUrl":"https://doi.org/10.1007/S002160050404","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"7 1","pages":"273-274"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73472261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"ESCA-Analysis of tin compounds on the surface of hydroxyapatite","authors":"K. Schenk-Meuser, H. Duschner","doi":"10.1007/S002160050402","DOIUrl":"https://doi.org/10.1007/S002160050402","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"40 1","pages":"265-267"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81641882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"On the dynamic range in depth profiling with electron-gas SNMS","authors":"W. Bock, M. Kopnarski, H. Oechsner","doi":"10.1007/S002160050412","DOIUrl":"https://doi.org/10.1007/S002160050412","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"97 1","pages":"300-303"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88412105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Characterization of Laser-Arc deposited multilayer systems by means of AES, Factor Analysis and XPS","authors":"A. John, H. Scheibe, H. Ziegele, S. Oswald","doi":"10.1007/S002160050413","DOIUrl":"https://doi.org/10.1007/S002160050413","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"21 1","pages":"304-307"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77858799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
U. v. d. Crone, M. Hänsel, W. Quadakkers, R. Vaßen
{"title":"Oxidation behavior of mechanically alloyed chromium based alloys","authors":"U. v. d. Crone, M. Hänsel, W. Quadakkers, R. Vaßen","doi":"10.1007/S002160050391","DOIUrl":"https://doi.org/10.1007/S002160050391","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"8 1","pages":"230-232"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77514342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Characterisation of adsorbed layers on sulphide minerals by photoelectron spectroscopy","authors":"A. Schaufuß, P. Rossbach, I. Uhlig, R. Szargan","doi":"10.1007/S002160050401","DOIUrl":"https://doi.org/10.1007/S002160050401","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"50 1","pages":"262-265"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83218285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
U. Zastrow, R. Loo, K. Szot, J. Moers, T. Grabolla, D. Behammer, L. Vescan
{"title":"SIMS depth profiling of vertical p-channel Si-MOS transistor structures","authors":"U. Zastrow, R. Loo, K. Szot, J. Moers, T. Grabolla, D. Behammer, L. Vescan","doi":"10.1007/S002160050384","DOIUrl":"https://doi.org/10.1007/S002160050384","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"62 1","pages":"203-207"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88281486","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Flow sorption calorimetry, a powerful tool to investigate the acid-base character of organic polymer surfaces","authors":"S. Schneider, F. Simon, D. Pleul, H. Jacobasch","doi":"10.1007/S002160050396","DOIUrl":"https://doi.org/10.1007/S002160050396","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"214 1","pages":"244-247"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89173848","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Wesner, R. Weichenhain, Wilhelm Pfleging, H. Horn, E. Kreutz
{"title":"Chemical analysis of the interface between Al thin films and polymer surfaces pretreated with KrF-excimer laser radiation","authors":"D. Wesner, R. Weichenhain, Wilhelm Pfleging, H. Horn, E. Kreutz","doi":"10.1007/S002160050397","DOIUrl":"https://doi.org/10.1007/S002160050397","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"18 1","pages":"248-250"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77025763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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