Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_23
K. Tsubouchi, S. Kameda, H. Oguma, A. Taira, N. Suematsu, T. Takagi
{"title":"Extended Dependable Air: Use of Satellites in Boosting Dependability of Public Wireless Communications","authors":"K. Tsubouchi, S. Kameda, H. Oguma, A. Taira, N. Suematsu, T. Takagi","doi":"10.1007/978-4-431-56594-9_23","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_23","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132274994","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_13
H. Yasuura
{"title":"Design Automation for Reliability","authors":"H. Yasuura","doi":"10.1007/978-4-431-56594-9_13","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_13","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127203300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_6
Takashi Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Yasuo Sato, S. Kajihara, M. Yoshimoto, Jinwook Jung, Y. Kimi, H. Kawaguchi, Hajime Shimada, Jun Yao
{"title":"Time-Dependent Degradation in Device Characteristics and Countermeasures by Design","authors":"Takashi Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Yasuo Sato, S. Kajihara, M. Yoshimoto, Jinwook Jung, Y. Kimi, H. Kawaguchi, Hajime Shimada, Jun Yao","doi":"10.1007/978-4-431-56594-9_6","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_6","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130320570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_24
N. Yamasaki, Hiroyuki Chishiro, Keigo Mizotani, K. Wada
{"title":"Responsive Multithreaded Processor for Hard Real-Time Robotic Applications","authors":"N. Yamasaki, Hiroyuki Chishiro, Keigo Mizotani, K. Wada","doi":"10.1007/978-4-431-56594-9_24","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_24","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134031221","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_17
M. Yoshimoto, Y. Nakata, Y. Kimi, H. Kawaguchi, M. Nagata, K. Nii
{"title":"Design of SRAM Resilient Against Dynamic Voltage Variations","authors":"M. Yoshimoto, Y. Nakata, Y. Kimi, H. Kawaguchi, M. Nagata, K. Nii","doi":"10.1007/978-4-431-56594-9_17","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_17","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130209769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_8
H. Ishikuro, T. Kuroda, Atsutake Kosuge, M. Koyanagi, Kang-wook Lee, H. Hashimoto, M. Motoyoshi
{"title":"Connectivity in Electronic Packaging","authors":"H. Ishikuro, T. Kuroda, Atsutake Kosuge, M. Koyanagi, Kang-wook Lee, H. Hashimoto, M. Motoyoshi","doi":"10.1007/978-4-431-56594-9_8","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_8","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130394226","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_5
H. Onodera, Y. Miura, Yasuo Sato, S. Kajihara, Toshinori Sato, Ken Yano, Yuji Kunitake, K. Nii
{"title":"Variations in Device Characteristics","authors":"H. Onodera, Y. Miura, Yasuo Sato, S. Kajihara, Toshinori Sato, Ken Yano, Yuji Kunitake, K. Nii","doi":"10.1007/978-4-431-56594-9_5","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_5","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123366486","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_18
S. Tanakamaru, K. Takeuchi
{"title":"Design and Applications of Dependable Nonvolatile Memory Systems","authors":"S. Tanakamaru, K. Takeuchi","doi":"10.1007/978-4-431-56594-9_18","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_18","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129733042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：