Pub Date : 2025-01-28DOI: 10.1109/jssc.2025.3529848
Rahul Lall, Kyoungtae Lee, Adam Cunha, Rebecca Abergel, Youngho Seo, Ali M. Niknejad, Mekhail Anwar
{"title":"Single-X-Ray Sensitive Energy-Binning Dosimeter for Closed-Loop Cancer External-Beam Radiotherapy","authors":"Rahul Lall, Kyoungtae Lee, Adam Cunha, Rebecca Abergel, Youngho Seo, Ali M. Niknejad, Mekhail Anwar","doi":"10.1109/jssc.2025.3529848","DOIUrl":"https://doi.org/10.1109/jssc.2025.3529848","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"12 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143054837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-28DOI: 10.1109/JSSC.2025.3528140
{"title":"Thank You for Your Authorship","authors":"","doi":"10.1109/JSSC.2025.3528140","DOIUrl":"10.1109/JSSC.2025.3528140","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 1","pages":"364-364"},"PeriodicalIF":4.6,"publicationDate":"2025-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10856428","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143054840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-28DOI: 10.1109/JSSC.2025.3528134
{"title":"IEEE Journal of Solid-State Circuits Information for Authors","authors":"","doi":"10.1109/JSSC.2025.3528134","DOIUrl":"10.1109/JSSC.2025.3528134","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 1","pages":"C3-C3"},"PeriodicalIF":4.6,"publicationDate":"2025-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10856384","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143054833","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-28DOI: 10.1109/JSSC.2024.3515438
Wei-Zen Chen;Benton H. Calhoun;Chia-Hsiang Yang;Shreyas Sen;Jun Yang
{"title":"Guest Editorial Introduction to the Special Section on the 2024 IEEE International Solid-State Circuits Conference (ISSCC)","authors":"Wei-Zen Chen;Benton H. Calhoun;Chia-Hsiang Yang;Shreyas Sen;Jun Yang","doi":"10.1109/JSSC.2024.3515438","DOIUrl":"10.1109/JSSC.2024.3515438","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 1","pages":"5-8"},"PeriodicalIF":4.6,"publicationDate":"2025-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10856439","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143054839","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-28DOI: 10.1109/jssc.2025.3530472
Jing Wang, Jun He, Man-Kay Law, Xinzhe Wang, Futian Liang, Lin Cheng
{"title":"A 76.9 ppm/K Nano-Watt PVT-Insensitive CMOS Voltage Reference Operating From 4 to 300 K for Integrated Cryogenic Quantum Interface","authors":"Jing Wang, Jun He, Man-Kay Law, Xinzhe Wang, Futian Liang, Lin Cheng","doi":"10.1109/jssc.2025.3530472","DOIUrl":"https://doi.org/10.1109/jssc.2025.3530472","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"21 1","pages":""},"PeriodicalIF":5.4,"publicationDate":"2025-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143054938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-28DOI: 10.1109/JSSC.2025.3528136
{"title":"TechRxiv: Share Your Preprint Research With the World!","authors":"","doi":"10.1109/JSSC.2025.3528136","DOIUrl":"10.1109/JSSC.2025.3528136","url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 1","pages":"362-362"},"PeriodicalIF":4.6,"publicationDate":"2025-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10856445","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143054896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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