Pub Date : 2023-01-01DOI: 10.1587/elex.19.20220523
K. Fujita
{"title":"Impedance modeling of accelerator beams with discontinuous charge density using scattered-field physics-informed neural networks","authors":"K. Fujita","doi":"10.1587/elex.19.20220523","DOIUrl":"https://doi.org/10.1587/elex.19.20220523","url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"3 1","pages":"20220523"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90387683","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1587/elex.20.20230110
Kazuhito Onodera, H. Torikai
{"title":"A novel design method of simplified central nervous system model of C. elegans based on hybrid dynamics of sequential logic and numerical integration","authors":"Kazuhito Onodera, H. Torikai","doi":"10.1587/elex.20.20230110","DOIUrl":"https://doi.org/10.1587/elex.20.20230110","url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"339 1","pages":"20230110"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79463364","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1587/elex.20.20230014
Taisei Arima, S. Hidaka, Ryosuke Watanabe, Tomoya Akasaka, A. Kurokawa, T. Kanamoto
{"title":"A thermally optimizing method of thin film resistor trimming with machine learning","authors":"Taisei Arima, S. Hidaka, Ryosuke Watanabe, Tomoya Akasaka, A. Kurokawa, T. Kanamoto","doi":"10.1587/elex.20.20230014","DOIUrl":"https://doi.org/10.1587/elex.20.20230014","url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"15 1","pages":"20230014"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90877584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1587/elex.20.20230068
Hsin-Chieh Lin, Kuan-Chou Chen, H. Chiou
{"title":"An 8.1-W, 50.9% efficient continuous Class-F mode power amplifier developed using 0.25-μm GaN/SiC technology for 5G NR n79 band","authors":"Hsin-Chieh Lin, Kuan-Chou Chen, H. Chiou","doi":"10.1587/elex.20.20230068","DOIUrl":"https://doi.org/10.1587/elex.20.20230068","url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"7 1","pages":"20230068"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75621091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1587/elex.20.20230082
Tatsuo Furuya, H. Tsuda
{"title":"Broadband optical packet generation by multiplexing signals using a bias tee","authors":"Tatsuo Furuya, H. Tsuda","doi":"10.1587/elex.20.20230082","DOIUrl":"https://doi.org/10.1587/elex.20.20230082","url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"16 1","pages":"20230082"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78380661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}