Pub Date : 2016-08-01DOI: 10.1109/INSCIT.2016.7598201
Vanderson de L. Reis, P. C. Lobo, E. Gurjão, R. Freire
The development of analog-to-information converter if one the challenges in Compressed Sensing. In architectures proposed in the literature, the presence of integrators is a crucial point to the conversion. Hardware implementation of the integrators have great influence in the AIC performance, and using simulation in this work we analyze the AIC performance when some integrator parameters change. It was observed that there is a relation between cutoff frequency and AIC performance and depending on the value of this frequency low values of measurement occurs, and a high gain is necessary, what is a problem in hardware implementations.
{"title":"Influence of integrators in the performance of analog-to-information converters","authors":"Vanderson de L. Reis, P. C. Lobo, E. Gurjão, R. Freire","doi":"10.1109/INSCIT.2016.7598201","DOIUrl":"https://doi.org/10.1109/INSCIT.2016.7598201","url":null,"abstract":"The development of analog-to-information converter if one the challenges in Compressed Sensing. In architectures proposed in the literature, the presence of integrators is a crucial point to the conversion. Hardware implementation of the integrators have great influence in the AIC performance, and using simulation in this work we analyze the AIC performance when some integrator parameters change. It was observed that there is a relation between cutoff frequency and AIC performance and depending on the value of this frequency low values of measurement occurs, and a high gain is necessary, what is a problem in hardware implementations.","PeriodicalId":142095,"journal":{"name":"2016 1st International Symposium on Instrumentation Systems, Circuits and Transducers (INSCIT)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126249015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-08-01DOI: 10.1109/INSCIT.2016.7598209
Juan Sebastian Moya Baquero, F. L. Cabrera, F. Rangel de Sousa
Biomedical implant miniaturization is one of the trends that have appeared recently for health monitoring to overcome size limitations and therefore reach restricted body areas. RFID technology can be used as a tool, due to its biocompatibility with human body and non-invasive measurement capacity, as long as it is directed to miniaturization. This work presents a low-power miniaturized near-field RFID tag operating at 1.04 GHz in a standard CMOS180nm technology inside an available area of 1.5mm × 1.5 mm. An internal ROM and corresponding reading circuit was included so as to emulate information stored in the tag. The layout-extracted simulations proved that the tag backscatters a 1MHz amplitude-modulated signal when powered at -4 dBm.
{"title":"A miniaturized low-power radio frequency identification tag integrated in CMOS for biomedical applications","authors":"Juan Sebastian Moya Baquero, F. L. Cabrera, F. Rangel de Sousa","doi":"10.1109/INSCIT.2016.7598209","DOIUrl":"https://doi.org/10.1109/INSCIT.2016.7598209","url":null,"abstract":"Biomedical implant miniaturization is one of the trends that have appeared recently for health monitoring to overcome size limitations and therefore reach restricted body areas. RFID technology can be used as a tool, due to its biocompatibility with human body and non-invasive measurement capacity, as long as it is directed to miniaturization. This work presents a low-power miniaturized near-field RFID tag operating at 1.04 GHz in a standard CMOS180nm technology inside an available area of 1.5mm × 1.5 mm. An internal ROM and corresponding reading circuit was included so as to emulate information stored in the tag. The layout-extracted simulations proved that the tag backscatters a 1MHz amplitude-modulated signal when powered at -4 dBm.","PeriodicalId":142095,"journal":{"name":"2016 1st International Symposium on Instrumentation Systems, Circuits and Transducers (INSCIT)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114210134","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-08-01DOI: 10.1109/INSCIT.2016.7598212
Luciane Agnoletti S. Pedotti, Ricardo Mazza Zago, F. Fruett
The present work shows a low-cost instrument, based on MEMS accelerometer, specially designed to analyse unbalance in rotating machines. The acceleration signals, acquired using a sample rate of 817 Hz in two perpendicular axes at a free wheel shaft, were used to analyze the shaft vibration in the frequency domain by its Fast Fourier Transform (FFT). These signals from orthogonal accelerometers are also used to calculate the shaft unbalance. The instrument prototype was mounted on the shaft of a bicycle wheel, freely rotating at 120 rpm. Composing the characterization apparatus, some weights were introduced at the endings of a rim spokes to simulate a mechanical wheel unbalance. The experimental results show that both: vibration and unbalance can be measured successfully.
{"title":"Instrument based on MEMS accelerometer for vibration and unbalance analysis in rotating machines","authors":"Luciane Agnoletti S. Pedotti, Ricardo Mazza Zago, F. Fruett","doi":"10.1109/INSCIT.2016.7598212","DOIUrl":"https://doi.org/10.1109/INSCIT.2016.7598212","url":null,"abstract":"The present work shows a low-cost instrument, based on MEMS accelerometer, specially designed to analyse unbalance in rotating machines. The acceleration signals, acquired using a sample rate of 817 Hz in two perpendicular axes at a free wheel shaft, were used to analyze the shaft vibration in the frequency domain by its Fast Fourier Transform (FFT). These signals from orthogonal accelerometers are also used to calculate the shaft unbalance. The instrument prototype was mounted on the shaft of a bicycle wheel, freely rotating at 120 rpm. Composing the characterization apparatus, some weights were introduced at the endings of a rim spokes to simulate a mechanical wheel unbalance. The experimental results show that both: vibration and unbalance can be measured successfully.","PeriodicalId":142095,"journal":{"name":"2016 1st International Symposium on Instrumentation Systems, Circuits and Transducers (INSCIT)","volume":"106 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120814715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-08-01DOI: 10.1109/INSCIT.2016.7598198
F. S. Rocha, H. O. Mota, F. Vasconcelos
Displacement measuring interferometry systems are widely used in many fields of science and can accurately provide information about several different quantities of interest. Practical interferometry systems are composed of optical elements and mechanical moving parts. In contrast with the application of conventional techniques to characterize chemical compounds, the use of spectrometers aided by interferometers leads to significant improvements in both qualitative and quantitative determination of substances. However, this better quality instrumentation calls for the elaboration of mathematical and statistical models that represent not only the physical laws, but also the measurement process, including all those quantities relevant to the determination of the uncertainty of the measurement result.
{"title":"Methodology for uncertainty evaluation of interferometry systems applied to Fourier Transform Infrared spectroscopy","authors":"F. S. Rocha, H. O. Mota, F. Vasconcelos","doi":"10.1109/INSCIT.2016.7598198","DOIUrl":"https://doi.org/10.1109/INSCIT.2016.7598198","url":null,"abstract":"Displacement measuring interferometry systems are widely used in many fields of science and can accurately provide information about several different quantities of interest. Practical interferometry systems are composed of optical elements and mechanical moving parts. In contrast with the application of conventional techniques to characterize chemical compounds, the use of spectrometers aided by interferometers leads to significant improvements in both qualitative and quantitative determination of substances. However, this better quality instrumentation calls for the elaboration of mathematical and statistical models that represent not only the physical laws, but also the measurement process, including all those quantities relevant to the determination of the uncertainty of the measurement result.","PeriodicalId":142095,"journal":{"name":"2016 1st International Symposium on Instrumentation Systems, Circuits and Transducers (INSCIT)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126871572","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-08-01DOI: 10.1109/INSCIT.2016.7598190
C. G. Souza, Henrique Cordeiro, D. W. de Lima Monteiro, Telson Emmanuel O. Crespo, Ú. Abecassis, L. P. Salles
This paper presents a simplified instrument to measure the profile of a refractive object contactlessly based on the Hartmann-Shack (H-S) method. The sensing device has been designed with a simple CMOS Position-Sensitive Detector (PSD) of the quad-cell (QC) type, comprising four Active-Pixel Sensor (APS) pixels. A collimated laser beam traverses the object and the resulting wavefront is shaped by its profile. We demonstrate the reconstruction of this wavefront, and therefore the profile of the object, by sequentially sampling the wavefront through a moving single aperture coupled to a converging lens. Notwithstanding, we propose a sequence of steps for instrument calibration, among them the focalization step, using a feature of the QC not yet explored. A target lens was used as a test structure and its sagitta was measured, presenting an average error of 4% with respect to the datasheet value.
{"title":"Wavefront Sensor for spatial scan using the Hartmann-Shack method","authors":"C. G. Souza, Henrique Cordeiro, D. W. de Lima Monteiro, Telson Emmanuel O. Crespo, Ú. Abecassis, L. P. Salles","doi":"10.1109/INSCIT.2016.7598190","DOIUrl":"https://doi.org/10.1109/INSCIT.2016.7598190","url":null,"abstract":"This paper presents a simplified instrument to measure the profile of a refractive object contactlessly based on the Hartmann-Shack (H-S) method. The sensing device has been designed with a simple CMOS Position-Sensitive Detector (PSD) of the quad-cell (QC) type, comprising four Active-Pixel Sensor (APS) pixels. A collimated laser beam traverses the object and the resulting wavefront is shaped by its profile. We demonstrate the reconstruction of this wavefront, and therefore the profile of the object, by sequentially sampling the wavefront through a moving single aperture coupled to a converging lens. Notwithstanding, we propose a sequence of steps for instrument calibration, among them the focalization step, using a feature of the QC not yet explored. A target lens was used as a test structure and its sagitta was measured, presenting an average error of 4% with respect to the datasheet value.","PeriodicalId":142095,"journal":{"name":"2016 1st International Symposium on Instrumentation Systems, Circuits and Transducers (INSCIT)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128660218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-08-01DOI: 10.1109/INSCIT.2016.7598219
Roger W. P. da Silva, V. Brusamarello, D. Eckhard, C. Pereira, J. Netto, I. Muller
Wireless sensor network nodes have been used to collect data from processes in several different areas. In most cases, these sensors and their batteries need to be recharged regularly. However, these sensors are often deployed in harsh environments that can damage them with moist and dust particles. Therefore this work aims to present a contactless inductive charger developed to avoid jack or plug holes on the sensor casing in order to prevent damage to its circuitry. This battery charger uses a resonant topology circuit and an algorithm to adjust the resonant frequency. Unlike a previous work, it measures the current through the primary coil to determine the optimal point, which yields a simpler solution. The concept has been proven to be effective while keeping low cost and simplicity, which are important aspects to wireless sensor networks.
{"title":"Contactless battery charger controller for wireless sensor node","authors":"Roger W. P. da Silva, V. Brusamarello, D. Eckhard, C. Pereira, J. Netto, I. Muller","doi":"10.1109/INSCIT.2016.7598219","DOIUrl":"https://doi.org/10.1109/INSCIT.2016.7598219","url":null,"abstract":"Wireless sensor network nodes have been used to collect data from processes in several different areas. In most cases, these sensors and their batteries need to be recharged regularly. However, these sensors are often deployed in harsh environments that can damage them with moist and dust particles. Therefore this work aims to present a contactless inductive charger developed to avoid jack or plug holes on the sensor casing in order to prevent damage to its circuitry. This battery charger uses a resonant topology circuit and an algorithm to adjust the resonant frequency. Unlike a previous work, it measures the current through the primary coil to determine the optimal point, which yields a simpler solution. The concept has been proven to be effective while keeping low cost and simplicity, which are important aspects to wireless sensor networks.","PeriodicalId":142095,"journal":{"name":"2016 1st International Symposium on Instrumentation Systems, Circuits and Transducers (INSCIT)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124119097","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-08-01DOI: 10.1109/INSCIT.2016.7598191
Gabriel P. Lemos, M. T. Souza, Victor F. Muniz, F. Sill Torres, L. P. Salles
Precise displacement estimation has high demands on the measurement system, but permits a wide range of applications. This paper presents a new methodology for precise micrometric displacement measurement utilizing a Quad-Cell (QC), Position Sensitive Detector (PSD) realized in a 0.35μm CMOS technology. Experimental results indicate high precision in the range of several micrometers for displacements of up to 2,400μm. Further, extracted curves permit the choice of the best trade-off between precision and maximum measureable displacement.
{"title":"Micrometric displacement measurement using CMOS 0.35µm technology Quad-Cell","authors":"Gabriel P. Lemos, M. T. Souza, Victor F. Muniz, F. Sill Torres, L. P. Salles","doi":"10.1109/INSCIT.2016.7598191","DOIUrl":"https://doi.org/10.1109/INSCIT.2016.7598191","url":null,"abstract":"Precise displacement estimation has high demands on the measurement system, but permits a wide range of applications. This paper presents a new methodology for precise micrometric displacement measurement utilizing a Quad-Cell (QC), Position Sensitive Detector (PSD) realized in a 0.35μm CMOS technology. Experimental results indicate high precision in the range of several micrometers for displacements of up to 2,400μm. Further, extracted curves permit the choice of the best trade-off between precision and maximum measureable displacement.","PeriodicalId":142095,"journal":{"name":"2016 1st International Symposium on Instrumentation Systems, Circuits and Transducers (INSCIT)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126151784","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-08-01DOI: 10.1109/INSCIT.2016.7598204
M. Hamanaka, Vinícius do Lago Pimentel, Wellington Oliveira Avelino, Viviane Nogueira Hamanaka, Fernando Fuzinatto Dall'Agnol, Gilberto Medeiros Ribeiro
We developed an apparatus to measure the work function using a field emission retarding potential (FERP) technique. In this paper, we describe the basics of FERP and the measurement procedures to determine the work function of indium tin oxide (ITO) and aluminum thin films, which are used as electrodes in a large number of Organic Electronic devices. The system developed allows for rapid screening of candidate materials and surface processes for appropriate engineering of device electronic properties.
{"title":"In-vacuum work function measurement system","authors":"M. Hamanaka, Vinícius do Lago Pimentel, Wellington Oliveira Avelino, Viviane Nogueira Hamanaka, Fernando Fuzinatto Dall'Agnol, Gilberto Medeiros Ribeiro","doi":"10.1109/INSCIT.2016.7598204","DOIUrl":"https://doi.org/10.1109/INSCIT.2016.7598204","url":null,"abstract":"We developed an apparatus to measure the work function using a field emission retarding potential (FERP) technique. In this paper, we describe the basics of FERP and the measurement procedures to determine the work function of indium tin oxide (ITO) and aluminum thin films, which are used as electrodes in a large number of Organic Electronic devices. The system developed allows for rapid screening of candidate materials and surface processes for appropriate engineering of device electronic properties.","PeriodicalId":142095,"journal":{"name":"2016 1st International Symposium on Instrumentation Systems, Circuits and Transducers (INSCIT)","volume":"195 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114972182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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