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Freeze-fracture: a personal history. 冻裂:个人病史。
Pub Date : 1989-11-01 DOI: 10.1002/jemt.1060130304
R L Steere

The sequence of events leading to the development of freeze-fracture replication is described. Subsequent developments discussed include complementary replicas, replica interpretation with stereo micrograph and reversal negatives, replica reinforcement, and control of resistance evaporation.

描述了导致冻裂复制发展的事件序列。随后讨论的发展包括补充复制品,用立体显微镜和反转底片解释复制品,复制品强化和控制阻力蒸发。
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引用次数: 9
Counting and measuring IMPs and pits: why accurate counts are exceedingly rare. 计算和测量imp和凹坑:为什么精确的计数极其罕见。
Pub Date : 1989-11-01 DOI: 10.1002/jemt.1060130307
J E Rash, F D Giddings

Particle counting and measuring techniques are now widely used to characterize normal membranes and to identify molecular changes occurring during development, maturation, and aging during progression of disease and following pharmacological manipulation. However, the use of particle counting and measuring for the identification of molecular changes in membranes has been premature. We show that current procedures rarely yield replicas that are free of cryogenic or mechanical prefractures, and as a result, the "complementarity" of membrane faces is severely compromised. However, with simple alterations of procedure, combined with the resolve to recognize and discard images of pre-fractured membrane faces, a high degree of "complementarity" may be obtained. Criteria for recognizing the occurrence and relative frequency of noncomplementarity are presented and a cleaving method for avoiding a primary source of water vapor contamination is described. In such replicas, membrane pits are found in equivalent numbers and near-identical diameters as the intramembrane particles (IMPs) in the complementary-type membrane faces. When conditions of "cold fracture" and immediate replication are demonstrated, fracture faces are minimally contaminated by frozen water vapor, yielding images where 1) diameters of IMPs vs. pits are very nearly identical, 2) large diameter IMPs are very rare, and 3) the numbers of IMPs and pits are increased substantially over the numbers currently reported. Thus, we reiterate previous proposals that complementarity of membrane faces is the single most important criterion that must be met before accepting the validity of IMP counts or for attributing perceived changes in IMP density or size to conditions of experimental manipulation, to normal developmental processes, or to disease etiology.

颗粒计数和测量技术现在广泛用于表征正常膜,并识别在发育、成熟、疾病进展和药物操作过程中发生的分子变化。然而,使用颗粒计数和测量来识别膜中的分子变化还为时过早。我们发现,目前的方法很少产生没有低温或机械预断裂的复制品,因此,膜表面的“互补性”受到严重损害。然而,通过简单的程序改变,结合识别和丢弃预破裂膜面图像的决心,可以获得高度的“互补性”。提出了识别非互补性发生和相对频率的标准,并描述了一种避免水蒸气污染主要来源的切割方法。在这样的复制品中,发现膜坑与互补型膜表面的膜内颗粒(IMPs)具有相同的数量和几乎相同的直径。当“冷断裂”和立即复制的条件被证明时,裂缝面被冷冻水蒸气污染的程度最低,产生的图像中,1)imp和凹坑的直径非常接近,2)大直径imp非常罕见,3)imp和凹坑的数量比目前报道的数量大大增加。因此,我们重申先前的建议,即在接受IMP计数的有效性或将IMP密度或大小的感知变化归因于实验操作条件、正常发育过程或疾病病因之前,必须满足膜面互补性是唯一最重要的标准。
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引用次数: 8
Repairing holes and tears in the plastic substrates on slot grids. 修复槽网塑料基板上的孔洞和撕裂。
Pub Date : 1989-11-01 DOI: 10.1002/jemt.1060130314
V L St Jeor
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引用次数: 0
Transmission electron microscopy of the cytoskeleton of migratory and invasive cells. 迁移细胞和侵袭细胞的细胞骨架透射电镜。
Pub Date : 1989-11-01 DOI: 10.1002/jemt.1060130315
T McGarvey, B Persky
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引用次数: 0
Polystyrene specimen support films for the collection of ultrathin serial sections. 聚苯乙烯标本支撑膜用于超薄系列切片的收集。
Pub Date : 1989-11-01 DOI: 10.1002/jemt.1060130313
H A Owen
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引用次数: 3
Analytical scanning electron microscopy for solid surface. 固体表面分析扫描电子显微镜。
Pub Date : 1989-07-01 DOI: 10.1002/jemt.1060120305
T Ichinokawa

A scanning electron microscope of ultra-high-vacuum (UHV-SEM) with a field emission gun (FEG) is operated at the primary electron energies of from 100 eV to 3 keV. The instrument can form the images that contain information on surface chemical composition, chemical bonding state (electronic structure), and surface crystal structure in a microscopic resolution of several hundred angstroms (A) using the techniques of scanning Auger electron microscope, scanning electron energy loss microscope, and scanning low-energy electron diffraction (LEED) microscope. A scanning tunneling microscope (STM) also has been combined with the SEM in order to obtain the atomic resolution for the solid surface. The instrumentation and examples of their applications are presented both for scanning LEED microscopy and STM.

用场发射枪(FEG)在100 eV ~ 3 keV的初级电子能量范围内进行了超高真空扫描电子显微镜(UHV-SEM)的工作。仪器采用扫描俄歇电子显微镜、扫描电子能量损失显微镜、扫描低能电子衍射(LEED)显微镜等技术,可在几百埃(a)的显微分辨率下形成包含表面化学成分、化学键态(电子结构)、表面晶体结构等信息的图像。为了获得固体表面的原子分辨率,还将扫描隧道显微镜(STM)与扫描电子显微镜(SEM)相结合。仪器和他们的应用的例子都提出了扫描LEED显微镜和STM。
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引用次数: 0
Study of temperature factors in cubic crystals by high-voltage electron diffraction. 用高压电子衍射研究立方晶体中的温度因素。
Pub Date : 1989-07-01 DOI: 10.1002/jemt.1060120309
S Matsumura, Y Tomokiyo, K Oki

The critical voltages for systematic reflections and splits of Kikuchi lines were measured using a high-voltage electron microscope to investigate the atomic temperature factors in cubic crystals. The split of the Kikuchi line at the intersection with the forbidden 222 Kikuchi line as well as the critical voltage of the 333 reflection for Si and Ge decreased steeply with temperature. The temperature dependence showed that the anharmonic contribution to the atomic-temperature factor for Si and Ge is extremely weak in the temperature range 300 approximately 1078 K. On the contrary, the B factors obtained from the measured critical voltages for Al, Cu, and Fe varied nonlinearly with temperature, suggesting the importance of the anharmonic effect in the vibration of atoms. The observed temperature dependence of the critical voltages for the metals were compared with calculations based on harmonic, quasi-harmonic, and anharmonic approximations. The quasi-harmonic approximation that takes into account the thermal expansion modification reproduces well the observed values for Fe but not those for Al and Cu. The effect of intrinsic anharmonic vibration should be considered for reproducing the results for Al and Cu. Fitting the measured critical voltages with the calculated ones, we estimated the values for coefficients of the isolated atom potentials. The results are in good agreement with those obtained by neutron and X-ray diffraction.

用高压电子显微镜测量了菊池线系统反射和分裂的临界电压,研究了立方晶体中的原子温度因素。与禁止的222菊池线相交处菊池线的劈裂以及Si和Ge的333反射临界电压随温度急剧下降。温度依赖性表明,在300 ~ 1078 K的温度范围内,Si和Ge的非调和对原子温度因子的贡献非常微弱。相反,从测量的Al、Cu和Fe的临界电压中得到的B因子随温度呈非线性变化,表明非谐波效应在原子振动中的重要性。将观察到的金属临界电压的温度依赖性与基于谐波、准谐波和非谐波近似的计算结果进行了比较。考虑热膨胀修正的准调和近似能很好地再现铁的观测值,但不能再现Al和Cu的观测值。对于Al和Cu,再现结果时应考虑本征非谐振动的影响。将测量到的临界电压与计算得到的临界电压拟合,估计出孤立原子电位系数的值。结果与中子衍射和x射线衍射结果吻合较好。
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引用次数: 9
High-resolution electron microscopy study on crystal structures of high-Tc superconductors. 高tc超导体晶体结构的高分辨率电子显微镜研究。
Pub Date : 1989-07-01 DOI: 10.1002/jemt.1060120306
K Hiraga, T Oku, D Shindo, M Hirabayashi

Recent studies of high-resolution electron microscopy on the high-Tc superconductors of Y-Ba-Cu-O and Bi-Ca-Sr-Cu-O are presented. The observed images of crystals thinner than 3 nm, taken under conditions that approached the Scherzer defocus condition, directly show the arrangements of cations and oxygen-vacant positions. The results reveal structural characteristics of the atomic scale; this offers important insights into the origin of the high-Tc superconductivity. The usefulness of high-resolution electron microscopy for studying complicated crystal structures is demonstrated for the high-Tc oxides.

介绍了近年来高分辨率电子显微镜对高tc超导体Y-Ba-Cu-O和Bi-Ca-Sr-Cu-O的研究进展。在接近Scherzer离焦条件下,观察到的小于3 nm的晶体图像直接显示了阳离子和氧空位的排列。结果揭示了原子尺度的结构特征;这为了解高温超导的起源提供了重要的见解。高分辨率电子显微镜对高tc氧化物的复杂晶体结构的研究是有用的。
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引用次数: 16
High-resolution electron microscopy of ceramic interfaces. 陶瓷界面的高分辨率电子显微镜。
Pub Date : 1989-07-01 DOI: 10.1002/jemt.1060120307
Y Ishida, S Hagege, H Ichinose, Y Takahashi

Three observations described here were chosen not only to represent our recent interface studies in ceramics, but also to demonstrate how different the present status of interface research is with respect to the level of high-resolution electron microscopy. Certain common features may be found among the problems of ceramic interface studies. Importance of basal plane grain boundary, for example, is one of the characteristics of this type of heterogeneous compound. The crystalline heterogeneity has been ignored largely in the grain boundary structure study since it has been developed primarily for cubic metals. The new area of basic grain boundary interface structure study is opened now that description of this type of interface has become engineeringly important.

这里所描述的三个观察结果不仅代表了我们最近在陶瓷中的界面研究,而且还展示了界面研究的现状与高分辨率电子显微镜水平的不同。在陶瓷界面研究的问题中可以发现一些共同的特征。例如,基面晶界的重要性是这类非均相化合物的特征之一。由于晶体非均质性主要是针对立方金属而发展起来的,因此在晶界结构的研究中,晶体非均质性在很大程度上被忽略了。基性晶界界面结构的研究开辟了一个新的领域,对这类界面的描述具有重要的工程意义。
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引用次数: 7
Structural study of nanometer-sized iron crystallites in single crystalline iron-MgO composite films. 单晶铁氧化镁复合薄膜中纳米级铁晶体的结构研究。
Pub Date : 1989-07-01 DOI: 10.1002/jemt.1060120310
N Tanaka, M Nagao, F Yoshizaki, K Mihama

Single crystalline composite films of iron and MgO are prepared by a simultaneous vacuum deposition technique. The structures of the composite films, especially of the iron crystallites embedded, are studied by high-resolution electron microscopy and nanometer-area electron diffraction. The alpha-iron (b.c.c.) crystallites of 1 nm in size are epitaxially embedded in single crystalline MgO films, the orientation being (011)[100]Fe parallel (001)[100]MgO and (001)[110]Fe parallel (001)[100]MgO. A heat treatment of the as-grown films at 500-1,000 degrees C brings about a phase transformation of the crystallites from alpha-iron to gamma-iron (f.c.c.), followed by a grain growth of alpha-iron and finally the growth of the spinel, MgFe2O4. The gamma-iron crystallites transformed are circular plates and have strains at the periphery to accommodate the surrounding MgO-matrix. The magnetic property of the composite films is also reported.

采用真空同步沉积技术制备了铁与氧化镁单晶复合薄膜。利用高分辨率电子显微镜和纳米面积电子衍射研究了复合膜的结构,特别是包埋铁晶的结构。1 nm大小的α -铁(b.c.c)晶体外延嵌入MgO单晶薄膜中,取向分别为(011)[100]Fe平行(001)[100]MgO和(001)[110]Fe平行(001)[100]MgO。在500- 1000℃下对生长膜进行热处理,晶粒由α -铁转变为γ -铁(f.c.c),随后α -铁晶粒长大,最后尖晶石MgFe2O4长大。转变的γ -铁晶体是圆形板,在外围有应变以容纳周围的氧化镁基体。并报道了复合膜的磁性能。
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引用次数: 5
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Journal of electron microscopy technique
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