Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381464
Hai Yu, Varun Ratnasamy, P. Roblin, M. Rawat, C. Xie
This paper presents an algorithm for the simultaneous linearization and cancellation of modulated harmonics of broadband power amplifiers (PA). The algorithm relies on a joint system identification of the nonlinearity, memory effects and group delay of both the main and harmonic cancellation channels using a recently reported cubic spline basis. The filter-less cancellation of the modulated harmonics uses both the method of predistortion and feedforward while the synchronized PA linearization relies solely on digital predistortion. Experimental verification with a broadband PA yields a reduction of 31 dB of the third harmonic to 59 dBc below the main channel. Simultaneously the linearization provides -40 dB NMSE and 49.5 and 50 dBc ACPR at the fundamental frequency.
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Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381475
F. Mubarak, Raffaele Romano, M. Spirito
A broadband S-parameter measurement system for extreme impedance measurements is proposed and analyzed in terms of its accuracy. Measurement speed and system resolution at extreme impedance values is comparable to that of a conventional Vector Network Analyzer performance achieved for 50 Q device measurements. A dedicated one-port calibration method is modeled in a circuit simulator environment and implemented for the proposed system. Compared to the 0.05 % measurement resolution in extreme impedance measurements using a state-of-art 50 Q VNA, an almost fifty times lower 0.001 % resolution is achieved with the proposed VNA system utilizing an interferometric principle, with active compensation of reflected waves.
{"title":"Evaluation and modeling of measurement resolution of a vector network analyzer for extreme impedance measurements","authors":"F. Mubarak, Raffaele Romano, M. Spirito","doi":"10.1109/ARFTG.2015.7381475","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381475","url":null,"abstract":"A broadband S-parameter measurement system for extreme impedance measurements is proposed and analyzed in terms of its accuracy. Measurement speed and system resolution at extreme impedance values is comparable to that of a conventional Vector Network Analyzer performance achieved for 50 Q device measurements. A dedicated one-port calibration method is modeled in a circuit simulator environment and implemented for the proposed system. Compared to the 0.05 % measurement resolution in extreme impedance measurements using a state-of-art 50 Q VNA, an almost fifty times lower 0.001 % resolution is achieved with the proposed VNA system utilizing an interferometric principle, with active compensation of reflected waves.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126681483","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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