Pub Date : 2021-10-01DOI: 10.1016/j.mejo.2021.105294
Girish Kumar Mekala, Yash Agrawal, Vobulapuram Ramesh Kumar, R. Chandel
{"title":"A prominent unified crosstalk model for linear and sub-threshold regions in mixed CNT bundle interconnects","authors":"Girish Kumar Mekala, Yash Agrawal, Vobulapuram Ramesh Kumar, R. Chandel","doi":"10.1016/j.mejo.2021.105294","DOIUrl":"https://doi.org/10.1016/j.mejo.2021.105294","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"118 1","pages":"105294"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79820415","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-09-01DOI: 10.1016/j.mejo.2021.105249
Rasoul Farjaminezhad, S. Safari, A. Eftekhari-Moghadam
{"title":"Modeling of single/multiple-bit upset effects on logic circuits applying Recurrent Neural Network","authors":"Rasoul Farjaminezhad, S. Safari, A. Eftekhari-Moghadam","doi":"10.1016/j.mejo.2021.105249","DOIUrl":"https://doi.org/10.1016/j.mejo.2021.105249","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"40 1","pages":"105249"},"PeriodicalIF":0.0,"publicationDate":"2021-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76313665","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-08-01DOI: 10.1016/J.MEJO.2021.105129
A. Nejati, Sara Radfar, P. Amiri, Mohammad Hossein Maghami
{"title":"A bulk-driven differential CMOS schmitt trigger with adjustable hysteresis for ultra-low-voltage operation","authors":"A. Nejati, Sara Radfar, P. Amiri, Mohammad Hossein Maghami","doi":"10.1016/J.MEJO.2021.105129","DOIUrl":"https://doi.org/10.1016/J.MEJO.2021.105129","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"16 1","pages":"105129"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90517855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-08-01DOI: 10.1016/J.MEJO.2021.105080
Gaurav Saini, M. Baghini
{"title":"An energy harvesting system for time-varying energy transducers with FOCV based dynamic and adaptive MPPT for 30 nW to 4 mW of input power range","authors":"Gaurav Saini, M. Baghini","doi":"10.1016/J.MEJO.2021.105080","DOIUrl":"https://doi.org/10.1016/J.MEJO.2021.105080","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"55 1","pages":"105080"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86609556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-08-01DOI: 10.1016/J.MEJO.2021.105124
V. Wangkheirakpam, B. Bhowmick, P. Pukhrambam
{"title":"Noise behavior of vertical tunnel FETs under the influence of interface trap states","authors":"V. Wangkheirakpam, B. Bhowmick, P. Pukhrambam","doi":"10.1016/J.MEJO.2021.105124","DOIUrl":"https://doi.org/10.1016/J.MEJO.2021.105124","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"32 1","pages":"105124"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74930436","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}