D Keith Coffman, Khalid Hattar, Jian Luo, Shen Dillon
Recent work in ultra-high temperature in situ electron microscopy has presented the need for accurate, contact-free temperature determination at the microscale. Optical measurement based on thermal radiation (pyrometry) is an attractive solution but can be difficult to perform correctly due to effects, such as emissivity and optical transmission, that must be accounted for. Here, we present a practical guide to calibrating and using a spectral pyrometry system, including example code, using a Czerny-Turner spectrometer attached to a transmission electron microscope. Calibration can be accomplished using a thermocouple or commercial heated sample holder, after which arbitrary samples can be reliably measured for temperatures above ∼600∘C. An accuracy of 2% can be expected with the possibility of sub-second temporal resolution and sub-Kelvin temperature resolution. We then demonstrate this capability in conjunction with traditional microscopic techniques, such as diffraction-based strain measurement for thermal expansion coefficient, or live-video sintering evolution.
{"title":"Spectral Pyrometry for Practical Temperature Measurement in the TEM.","authors":"D Keith Coffman, Khalid Hattar, Jian Luo, Shen Dillon","doi":"10.1093/mam/ozae114","DOIUrl":"10.1093/mam/ozae114","url":null,"abstract":"<p><p>Recent work in ultra-high temperature in situ electron microscopy has presented the need for accurate, contact-free temperature determination at the microscale. Optical measurement based on thermal radiation (pyrometry) is an attractive solution but can be difficult to perform correctly due to effects, such as emissivity and optical transmission, that must be accounted for. Here, we present a practical guide to calibrating and using a spectral pyrometry system, including example code, using a Czerny-Turner spectrometer attached to a transmission electron microscope. Calibration can be accomplished using a thermocouple or commercial heated sample holder, after which arbitrary samples can be reliably measured for temperatures above ∼600∘C. An accuracy of 2% can be expected with the possibility of sub-second temporal resolution and sub-Kelvin temperature resolution. We then demonstrate this capability in conjunction with traditional microscopic techniques, such as diffraction-based strain measurement for thermal expansion coefficient, or live-video sintering evolution.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142730362","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Judy Z Hu, Lijun Qiao, Xianhai Zhao, Chang-Jun Liu, Guo-Bin Hu
Mitochondrial division is a fundamental biological process essensial for cellular functionality and vitality. The prevailing hypothesis that dynamin related protein 1 (Drp1) provides principal control in mitochondrial division, in which it also involves the endoplasmic reticulum (ER) and the cytoskeleton, does not account for all the observations. Therefore. the hypothesis may be incomplete. Our previous study in HeLa cells led to a new hypothesis of mitochondrial division by budding. To follow-up our previous study, we employed in situ cryo-electron tomography to visualize mitochondrial budding in the intact healthy monkey kidney cells (BS-C-1 cells). Our findings reaffirm single and multiple mitochondrial budding, consistent with our observations in HeLa cells. Notably, the budding regions vary significantly in diameter and length, which may represent different stages of budding. More interestingly, neither rings nor ring-like structures, nor the wrapping of ER tubes was observed in the budding regions, suggesting mitochondrial budding is independent from Drp1 and ER. Meanwhile, we uncovered direct interactions between mitochondria and large vesicles that are distinct from small mitochondrial-derived vesicles and extracellular mitovesicles. We propose that these interacting vesicles may have mitochondrial origins.
{"title":"Continuity of Mitochondrial Budding: Insights from BS-C-1 Cells by In Situ Cryo-electron Tomography.","authors":"Judy Z Hu, Lijun Qiao, Xianhai Zhao, Chang-Jun Liu, Guo-Bin Hu","doi":"10.1093/mam/ozae122","DOIUrl":"10.1093/mam/ozae122","url":null,"abstract":"<p><p>Mitochondrial division is a fundamental biological process essensial for cellular functionality and vitality. The prevailing hypothesis that dynamin related protein 1 (Drp1) provides principal control in mitochondrial division, in which it also involves the endoplasmic reticulum (ER) and the cytoskeleton, does not account for all the observations. Therefore. the hypothesis may be incomplete. Our previous study in HeLa cells led to a new hypothesis of mitochondrial division by budding. To follow-up our previous study, we employed in situ cryo-electron tomography to visualize mitochondrial budding in the intact healthy monkey kidney cells (BS-C-1 cells). Our findings reaffirm single and multiple mitochondrial budding, consistent with our observations in HeLa cells. Notably, the budding regions vary significantly in diameter and length, which may represent different stages of budding. More interestingly, neither rings nor ring-like structures, nor the wrapping of ER tubes was observed in the budding regions, suggesting mitochondrial budding is independent from Drp1 and ER. Meanwhile, we uncovered direct interactions between mitochondria and large vesicles that are distinct from small mitochondrial-derived vesicles and extracellular mitovesicles. We propose that these interacting vesicles may have mitochondrial origins.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142979158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Tom Stoops, Annick De Backer, Ivan Lobato, Sandra Van Aert
The Bayesian genetic algorithm (BGA) is a powerful tool to reconstruct the 3D structure of mono-atomic single-crystalline metallic nanoparticles imaged using annular dark field scanning transmission electron microscopy. The number of atoms in a projected atomic column in the image is used as input to obtain an accurate and atomically precise reconstruction of the nanoparticle, taking prior knowledge and the finite precision of atom counting into account. However, as the number of parameters required to describe a nanoparticle with atomic detail rises quickly with the size of the studied particle, the computational costs of the BGA rise to prohibitively expensive levels. In this study, we investigate these computational costs and propose methods and control parameters for efficient application of the algorithm to nanoparticles of at least up to 10 nm in size.
{"title":"Obtaining 3D Atomic Reconstructions from Electron Microscopy Images Using a Bayesian Genetic Algorithm: Possibilities, Insights, and Limitations.","authors":"Tom Stoops, Annick De Backer, Ivan Lobato, Sandra Van Aert","doi":"10.1093/mam/ozae090","DOIUrl":"10.1093/mam/ozae090","url":null,"abstract":"<p><p>The Bayesian genetic algorithm (BGA) is a powerful tool to reconstruct the 3D structure of mono-atomic single-crystalline metallic nanoparticles imaged using annular dark field scanning transmission electron microscopy. The number of atoms in a projected atomic column in the image is used as input to obtain an accurate and atomically precise reconstruction of the nanoparticle, taking prior knowledge and the finite precision of atom counting into account. However, as the number of parameters required to describe a nanoparticle with atomic detail rises quickly with the size of the studied particle, the computational costs of the BGA rise to prohibitively expensive levels. In this study, we investigate these computational costs and propose methods and control parameters for efficient application of the algorithm to nanoparticles of at least up to 10 nm in size.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142365822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Integrating deep learning into image analysis for transmission electron microscopy (TEM) holds significant promise for advancing materials science and nanotechnology. Deep learning is able to enhance image quality, to automate feature detection, and to accelerate data analysis, addressing the complex nature of TEM datasets. This capability is crucial for precise and efficient characterization of details on the nano-and microscale, e.g., facilitating more accurate and high-throughput analysis of nanoparticle structures. This study investigates the influence of batch normalization (BN) and instance normalization (IN) on the performance of deep learning models for semantic segmentation of high-resolution TEM images. Using U-Net and ResNet architectures, we trained models on two different datasets. Our results demonstrate that IN consistently outperforms BN, yielding higher Dice scores and Intersection over Union metrics. These findings underscore the necessity of selecting appropriate normalization methods to maximize the performance of deep learning models applied to TEM images.
将深度学习整合到透射电子显微镜(TEM)图像分析中,对推动材料科学和纳米技术的发展大有裨益。深度学习能够提高图像质量,实现特征检测自动化,并加速数据分析,从而解决 TEM 数据集的复杂性问题。这种能力对于精确、高效地表征纳米和微米尺度的细节至关重要,例如,有助于对纳米粒子结构进行更准确、更高通量的分析。本研究探讨了批量归一化(BN)和实例归一化(IN)对高分辨率 TEM 图像语义分割深度学习模型性能的影响。利用 U-Net 和 ResNet 架构,我们在两个不同的数据集上训练了模型。我们的结果表明,IN 的性能始终优于 BN,其 Dice 分数和交集指标均高于联合指标。这些发现强调了选择适当归一化方法的必要性,以最大限度地提高应用于 TEM 图像的深度学习模型的性能。
{"title":"Enhancing Semantic Segmentation in High-Resolution TEM Images: A Comparative Study of Batch Normalization and Instance Normalization.","authors":"Bashir Kazimi, Stefan Sandfeld","doi":"10.1093/mam/ozae093","DOIUrl":"10.1093/mam/ozae093","url":null,"abstract":"<p><p>Integrating deep learning into image analysis for transmission electron microscopy (TEM) holds significant promise for advancing materials science and nanotechnology. Deep learning is able to enhance image quality, to automate feature detection, and to accelerate data analysis, addressing the complex nature of TEM datasets. This capability is crucial for precise and efficient characterization of details on the nano-and microscale, e.g., facilitating more accurate and high-throughput analysis of nanoparticle structures. This study investigates the influence of batch normalization (BN) and instance normalization (IN) on the performance of deep learning models for semantic segmentation of high-resolution TEM images. Using U-Net and ResNet architectures, we trained models on two different datasets. Our results demonstrate that IN consistently outperforms BN, yielding higher Dice scores and Intersection over Union metrics. These findings underscore the necessity of selecting appropriate normalization methods to maximize the performance of deep learning models applied to TEM images.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142469823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Correction to: Machine Learning-Enabled Image Classification for Automated Electron Microscopy.","authors":"","doi":"10.1093/mam/ozae096","DOIUrl":"10.1093/mam/ozae096","url":null,"abstract":"","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142504016","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Felipe F Morgado, Leigh T Stephenson, Shalini Bhatt, Christoph Freysoldt, Steffen Neumeier, Shyam Katnagallu, Aparna P A Subramanyam, Isabel Pietka, Thomas Hammerschmidt, François Vurpillot, Baptiste Gault
Stacking faults (SFs) are important structural defects that play an essential role in the deformation of engineering alloys. However, direct observation of SFs at the atomic scale can be challenging. Here, we use the analytical field ion microscopy, including density functional theory-informed contrast estimation, to image local elemental segregation at SFs in a creep-deformed solid-solution single-crystal alloy of Ni-2 at% W. The segregated atoms are imaged brightly, and time-of-flight spectrometry allows for their identification as W. We also provide the first quantitative analysis of trajectory aberration, with a deviation of approximately 0.4 nm, explaining why atom probe tomography could not resolve these segregations. Atomistic simulations of substitutional W atoms at an edge dislocation in face-centered cubic Ni using an analytic bond-order potential indicate that the experimentally observed segregation is due to the energetic preference of W for the center of the SF, contrasting with, for example, Re segregating to partial dislocations. Solute segregation to SF can hinder dislocation motion, increasing the strength of Ni-based superalloys. Yet, direct substitution of Re by W, envisaged to lower the superalloys' costs, requires extra consideration in alloy design since these two solutes do not have comparable interactions with structural defects during deformation.
堆积断层(SFs)是一种重要的结构缺陷,在工程合金的变形过程中起着至关重要的作用。然而,在原子尺度上直接观测堆叠断层具有挑战性。在这里,我们使用分析场离子显微镜,包括密度泛函理论为依据的对比度估算,对蠕变变形固溶单晶合金 Ni-2 at% W 的 SFs 中的局部元素偏析进行成像。使用解析键阶势能对面心立方镍中边缘位错处的置换 W 原子进行原子模拟表明,实验观察到的偏析是由于 W 在能量上偏向于 SF 中心,这与 Re 偏析到部分位错等情况形成鲜明对比。溶质偏析到 SF 会阻碍位错运动,从而提高镍基超级合金的强度。然而,为了降低超级合金的成本而设想的用 W 直接取代 Re 的做法需要在合金设计中进行额外的考虑,因为这两种溶质在变形过程中与结构缺陷之间的相互作用并不相似。
{"title":"Stacking Fault Segregation Imaging With Analytical Field Ion Microscopy.","authors":"Felipe F Morgado, Leigh T Stephenson, Shalini Bhatt, Christoph Freysoldt, Steffen Neumeier, Shyam Katnagallu, Aparna P A Subramanyam, Isabel Pietka, Thomas Hammerschmidt, François Vurpillot, Baptiste Gault","doi":"10.1093/mam/ozae105","DOIUrl":"10.1093/mam/ozae105","url":null,"abstract":"<p><p>Stacking faults (SFs) are important structural defects that play an essential role in the deformation of engineering alloys. However, direct observation of SFs at the atomic scale can be challenging. Here, we use the analytical field ion microscopy, including density functional theory-informed contrast estimation, to image local elemental segregation at SFs in a creep-deformed solid-solution single-crystal alloy of Ni-2 at% W. The segregated atoms are imaged brightly, and time-of-flight spectrometry allows for their identification as W. We also provide the first quantitative analysis of trajectory aberration, with a deviation of approximately 0.4 nm, explaining why atom probe tomography could not resolve these segregations. Atomistic simulations of substitutional W atoms at an edge dislocation in face-centered cubic Ni using an analytic bond-order potential indicate that the experimentally observed segregation is due to the energetic preference of W for the center of the SF, contrasting with, for example, Re segregating to partial dislocations. Solute segregation to SF can hinder dislocation motion, increasing the strength of Ni-based superalloys. Yet, direct substitution of Re by W, envisaged to lower the superalloys' costs, requires extra consideration in alloy design since these two solutes do not have comparable interactions with structural defects during deformation.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142623921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We introduce a new approach to the numerical simulation of Scanning Transmission Electron Microscopy images. The Lattice Multislice Algorithm takes advantage of the fact that the electron waves passing through the specimen have limited bandwidth and therefore can be approximated very well by a low-dimensional linear space spanned by translations of a well-localized function. Just like in the PRISM algorithm recently published by C. Ophus, we utilize the linearity of the Schrödinger equation but perform the approximations with functions that are well localized in real space instead of Fourier space. This way, we achieve a similar computational speedup as PRISM, but at a much lower memory consumption and reduced numerical error due to avoiding virtual copies of the probe waves interfering with the result. Our approach also facilitates faster recomputations if local changes are made to the specimen such as changing a single atomic column.
{"title":"Lattice Multislice Algorithm for Fast Simulation of Scanning Transmission Electron Microscopy Images.","authors":"Christian Doberstein, Peter Binev","doi":"10.1093/mam/ozae116","DOIUrl":"10.1093/mam/ozae116","url":null,"abstract":"<p><p>We introduce a new approach to the numerical simulation of Scanning Transmission Electron Microscopy images. The Lattice Multislice Algorithm takes advantage of the fact that the electron waves passing through the specimen have limited bandwidth and therefore can be approximated very well by a low-dimensional linear space spanned by translations of a well-localized function. Just like in the PRISM algorithm recently published by C. Ophus, we utilize the linearity of the Schrödinger equation but perform the approximations with functions that are well localized in real space instead of Fourier space. This way, we achieve a similar computational speedup as PRISM, but at a much lower memory consumption and reduced numerical error due to avoiding virtual copies of the probe waves interfering with the result. Our approach also facilitates faster recomputations if local changes are made to the specimen such as changing a single atomic column.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142979175","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In this work, samples of chromia (Cr2O3) scale have been prepared for atom probe tomography and field evaporated with deep ultraviolet laser light (258 nm wavelength). The investigated range of laser energies spans more than three orders of magnitude between 0.03 and 90 pJ. Furthermore, the effects of detection rate and temperature were investigated. Simultaneous voltage and laser pulses were employed on additional needle specimens to reduce the standing voltage and minimize background noise during the measurement. Smooth evaporation with minimal mass spectrum peak tails was maintained over the whole range of measurement parameters. High laser energies result in significant underestimation of the oxygen content. Only laser energies below 1 pJ resulted in measured values near the expected oxygen content of 60 at%, the closest being about 58 at%.
{"title":"Laser-Assisted Field Evaporation of Chromia with Deep Ultraviolet Laser Light.","authors":"Severin Jakob, Andrea Fazi, Mattias Thuvander","doi":"10.1093/mam/ozae111","DOIUrl":"10.1093/mam/ozae111","url":null,"abstract":"<p><p>In this work, samples of chromia (Cr2O3) scale have been prepared for atom probe tomography and field evaporated with deep ultraviolet laser light (258 nm wavelength). The investigated range of laser energies spans more than three orders of magnitude between 0.03 and 90 pJ. Furthermore, the effects of detection rate and temperature were investigated. Simultaneous voltage and laser pulses were employed on additional needle specimens to reduce the standing voltage and minimize background noise during the measurement. Smooth evaporation with minimal mass spectrum peak tails was maintained over the whole range of measurement parameters. High laser energies result in significant underestimation of the oxygen content. Only laser energies below 1 pJ resulted in measured values near the expected oxygen content of 60 at%, the closest being about 58 at%.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142623887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Maurits Vuijk, Gianmarco Ducci, Luis Sandoval, Markus Pietsch, Karsten Reuter, Thomas Lunkenbein, Christoph Scheurer
In catalysis research, the amount of microscopy data acquired when imaging dynamic processes is often too much for nonautomated quantitative analysis. Developing machine learned segmentation models is challenged by the requirement of high-quality annotated training data. We thus substitute expert-annotated data with a physics-based sequential synthetic data model. We study environmental scanning electron microscopy (ESEM) data collected from isopropanol oxidation to acetone over cobalt oxide as an example. Upon applying a temperature program during the reaction a phase transition occurs, reducing the catalyst selectivity toward acetone. This is accompanied on the micrometer ESEM scale by the formation of cracks between the pores of the catalyst surface. We aim to generate synthetic data to train a neural network capable of semantic segmentation (pixel-wise labeling) of this ESEM data. This analysis will lead to insights into this phase transition. To generate synthetic data that approximates this transition, our algorithm composes the ESEM images of the room-temperature catalyst with dynamically evolving synthetic cracks satisfying physical construction principles, gathered from qualitative knowledge accessible in the ESEM data. We mimic the surface crack growth propagation along surface paths, avoiding close vicinity to nearby pores. This physics-based approach results in a lowered rate of false positives compared to a random approach.
{"title":"Physics-Based Synthetic Data Model for Automated Segmentation in Catalysis Microscopy.","authors":"Maurits Vuijk, Gianmarco Ducci, Luis Sandoval, Markus Pietsch, Karsten Reuter, Thomas Lunkenbein, Christoph Scheurer","doi":"10.1093/mam/ozae130","DOIUrl":"10.1093/mam/ozae130","url":null,"abstract":"<p><p>In catalysis research, the amount of microscopy data acquired when imaging dynamic processes is often too much for nonautomated quantitative analysis. Developing machine learned segmentation models is challenged by the requirement of high-quality annotated training data. We thus substitute expert-annotated data with a physics-based sequential synthetic data model. We study environmental scanning electron microscopy (ESEM) data collected from isopropanol oxidation to acetone over cobalt oxide as an example. Upon applying a temperature program during the reaction a phase transition occurs, reducing the catalyst selectivity toward acetone. This is accompanied on the micrometer ESEM scale by the formation of cracks between the pores of the catalyst surface. We aim to generate synthetic data to train a neural network capable of semantic segmentation (pixel-wise labeling) of this ESEM data. This analysis will lead to insights into this phase transition. To generate synthetic data that approximates this transition, our algorithm composes the ESEM images of the room-temperature catalyst with dynamically evolving synthetic cracks satisfying physical construction principles, gathered from qualitative knowledge accessible in the ESEM data. We mimic the surface crack growth propagation along surface paths, avoiding close vicinity to nearby pores. This physics-based approach results in a lowered rate of false positives compared to a random approach.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142979177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Feng Zhu, Wanpeng Li, Man Chun Yeung, Yuxuan Zhang, Congcong Du, Bin Lin, Qi Wang, Xiaofeng Guo, Yu-Chun Hsueh, Fu-Rong Chen, Xiaoyan Zhong
High-frequency electric pulse signals are often applied to stimulate functional materials in devices. To investigate the relationship between materials structure and dynamic behavior under high-frequency electric excitation, the stroboscopic imaging mode is widely used in a transmission electron microscope (TEM). From a technical point of view, it is crucial to quantitatively determine high-frequency attenuation in an electric-pulse-excited stroboscopic TEM. Here, we propose the quantitative method to evaluate the voltage attenuation by using magnification variation of defocused bright-field transmission electron microscopy images in a stroboscopic mode when applying high-frequency electric pulse signals onto a model system of two opposite tungsten tips. The negative voltage excitation possesses higher high-frequency voltage attenuation than the positive voltage excitation due to the possible nonreciprocal transmission of the triangle waves within the circuit between the biasing sample holder and the arbitrary waveform generator. Our approach of high-frequency attenuation determination provides the experimental foundation for quantitative analysis on the dynamic evolution of materials structure and functionality under electric pulse stimuli.
{"title":"Quantitative Determination of High-Frequency Voltage Attenuation in an Electric-Pulse-Excited Stroboscopic Transmission Electron Microscope.","authors":"Feng Zhu, Wanpeng Li, Man Chun Yeung, Yuxuan Zhang, Congcong Du, Bin Lin, Qi Wang, Xiaofeng Guo, Yu-Chun Hsueh, Fu-Rong Chen, Xiaoyan Zhong","doi":"10.1093/mam/ozae132","DOIUrl":"10.1093/mam/ozae132","url":null,"abstract":"<p><p>High-frequency electric pulse signals are often applied to stimulate functional materials in devices. To investigate the relationship between materials structure and dynamic behavior under high-frequency electric excitation, the stroboscopic imaging mode is widely used in a transmission electron microscope (TEM). From a technical point of view, it is crucial to quantitatively determine high-frequency attenuation in an electric-pulse-excited stroboscopic TEM. Here, we propose the quantitative method to evaluate the voltage attenuation by using magnification variation of defocused bright-field transmission electron microscopy images in a stroboscopic mode when applying high-frequency electric pulse signals onto a model system of two opposite tungsten tips. The negative voltage excitation possesses higher high-frequency voltage attenuation than the positive voltage excitation due to the possible nonreciprocal transmission of the triangle waves within the circuit between the biasing sample holder and the arbitrary waveform generator. Our approach of high-frequency attenuation determination provides the experimental foundation for quantitative analysis on the dynamic evolution of materials structure and functionality under electric pulse stimuli.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143189962","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}