Pub Date : 2011-10-06DOI: 10.1109/HOLM.2011.6034803
Ji Gao Zhang
Particle contamination may cause serious electric contact failure. However a series of dust simulation tests could hardly reproduce the real contact problem of intermittent high resistance, i.e. very few contact failure has been found during the tests. This paper is based on testing and analyzing many practical failed connector contacts in mobile phones. The special features of the failed contacts that are due to particle contamination are then summarized. The mechanism of connector contact high resistance failure is that during micro movement, contaminated particles are accumulated and inserted at the interface instead of being pushed away. Therefore important criteria should be met: micro movement with irregular directions, variable moving lengths to wear out surface materials, stirring up particles of dust and corrosion products caused by the water soluble salts in the dust, trapping the dust particles and thus embed the particles into the contact surface, presence of some organics acting as adhesives to adhere particles together to prevent them from spreading away during micro movements. Materials within dust particles such as quartz, feldspar, mica, calcite and carbon etc. may also contribute to the contact failure. After several simulation tests it is verified that contact failure can occur only if the testing conditions and parameters include the above discussed phenomena. The testing and theoretical result have greatly convinced that further research is necessary in order to create and develop a workable simulation dust testing system for connectors.
{"title":"A Summary Report on the Mechanism of Electric Contact Failure Due to Particle Contamination","authors":"Ji Gao Zhang","doi":"10.1109/HOLM.2011.6034803","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034803","url":null,"abstract":"Particle contamination may cause serious electric contact failure. However a series of dust simulation tests could hardly reproduce the real contact problem of intermittent high resistance, i.e. very few contact failure has been found during the tests. This paper is based on testing and analyzing many practical failed connector contacts in mobile phones. The special features of the failed contacts that are due to particle contamination are then summarized. The mechanism of connector contact high resistance failure is that during micro movement, contaminated particles are accumulated and inserted at the interface instead of being pushed away. Therefore important criteria should be met: micro movement with irregular directions, variable moving lengths to wear out surface materials, stirring up particles of dust and corrosion products caused by the water soluble salts in the dust, trapping the dust particles and thus embed the particles into the contact surface, presence of some organics acting as adhesives to adhere particles together to prevent them from spreading away during micro movements. Materials within dust particles such as quartz, feldspar, mica, calcite and carbon etc. may also contribute to the contact failure. After several simulation tests it is verified that contact failure can occur only if the testing conditions and parameters include the above discussed phenomena. The testing and theoretical result have greatly convinced that further research is necessary in order to create and develop a workable simulation dust testing system for connectors.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130077727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-06DOI: 10.1109/HOLM.2011.6034823
C. Holzapfel
In this study, a simple model system is used for describing selected aspects of the electrical behavior in sliding electrical contacts. The resistance of a slip ring consists of static components (e.g. brushes), systematically varying components (effective track resistance) as well as non-periodic components (contact noise). Depending on the speed and wear state of the system the electrical behavior will be fundamentally different.
{"title":"Selected Aspects of the Electrical Behavior in Sliding Electrical Contacts","authors":"C. Holzapfel","doi":"10.1109/HOLM.2011.6034823","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034823","url":null,"abstract":"In this study, a simple model system is used for describing selected aspects of the electrical behavior in sliding electrical contacts. The resistance of a slip ring consists of static components (e.g. brushes), systematically varying components (effective track resistance) as well as non-periodic components (contact noise). Depending on the speed and wear state of the system the electrical behavior will be fundamentally different.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125232725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-06DOI: 10.1109/HOLM.2011.6034797
K. Mashimo, Y. Ishimaru
A two-dimensional computational model of fretting corrosion was proposed by the authors. The two-dimensional simulation result was reported in the previous paper. Presently, the model is extended to three-dimensional space. This paper focuses on the electrical contact resistance profile, which is caused by particle generation, oxidation, and transportation at the interface of connector terminals. The material used in the study is tin-plated copper alloy. The scope of the simulation is limited between the initial state and the first peak of resistance profile curve. The model for particle generation, oxidation, and transportation is based on cellular automata. On the other hand, the resistance profile is calculated with the model based on equivalent resistor network. In this case, the calculation of overall resistance value is equivalent to the solution of simultaneous equations. Typically, the authors used the conjugate gradient method for solving the equations. The simulated resistance profiles were compared with experimental results. The peak heights of the resistance profile agree with the experimental results. Nevertheless, further investigation is still required on the compatibility with the physical theory. The results indicate that this model can describe the resistance altering tendency and the peak heights caused by fretting corrosion.
{"title":"Computational Modeling and Analysis of a Contact Pair for the Prediction of Fretting Dependent Electrical Contact Resistance","authors":"K. Mashimo, Y. Ishimaru","doi":"10.1109/HOLM.2011.6034797","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034797","url":null,"abstract":"A two-dimensional computational model of fretting corrosion was proposed by the authors. The two-dimensional simulation result was reported in the previous paper. Presently, the model is extended to three-dimensional space. This paper focuses on the electrical contact resistance profile, which is caused by particle generation, oxidation, and transportation at the interface of connector terminals. The material used in the study is tin-plated copper alloy. The scope of the simulation is limited between the initial state and the first peak of resistance profile curve. The model for particle generation, oxidation, and transportation is based on cellular automata. On the other hand, the resistance profile is calculated with the model based on equivalent resistor network. In this case, the calculation of overall resistance value is equivalent to the solution of simultaneous equations. Typically, the authors used the conjugate gradient method for solving the equations. The simulated resistance profiles were compared with experimental results. The peak heights of the resistance profile agree with the experimental results. Nevertheless, further investigation is still required on the compatibility with the physical theory. The results indicate that this model can describe the resistance altering tendency and the peak heights caused by fretting corrosion.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122381710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Au-Au plated contact pairs have long been the most frequently used in electrical and telecommunication system due to their outstanding electrical, physical and chemical properties. However, the increasingly high cost of gold plated connectors forces the manufacturers to seek some inexpensive substitution due to serious global competition. Ni and/or Ni alloy are naturally chosen to make Ni-Au contact pairs. In this paper, Ni-Au contact pairs, that is, Ni is used as probe and gold plating as coupon, are done fretting researches. Fretting tests are finished at the condition of fretting amplitude 200 ¿Ym, fretting speed 400¿Ym/s, 3 various normal forces and 5 different number of fretting cycles, 3 repeat times for every fretting conditions. Contact resistance is recorded by capture card with speed 14 data/fretting cycle and measured at constant DC current 100mA and limited voltage 1V. Morphology and element composition of fretting wear track are observed and analyzed to study the fretting process and mechanism of Ni-Au contact pairs.
{"title":"Research on Fretting Resistance and Fretting Wear Property of Ni-Au Contact Pair","authors":"Xueyan Lin, Liang-jun Xu, Yan-Chao Shao, Guoping Luo, Hong-Xue Zhang","doi":"10.1109/HOLM.2011.6034785","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034785","url":null,"abstract":"Au-Au plated contact pairs have long been the most frequently used in electrical and telecommunication system due to their outstanding electrical, physical and chemical properties. However, the increasingly high cost of gold plated connectors forces the manufacturers to seek some inexpensive substitution due to serious global competition. Ni and/or Ni alloy are naturally chosen to make Ni-Au contact pairs. In this paper, Ni-Au contact pairs, that is, Ni is used as probe and gold plating as coupon, are done fretting researches. Fretting tests are finished at the condition of fretting amplitude 200 ¿Ym, fretting speed 400¿Ym/s, 3 various normal forces and 5 different number of fretting cycles, 3 repeat times for every fretting conditions. Contact resistance is recorded by capture card with speed 14 data/fretting cycle and measured at constant DC current 100mA and limited voltage 1V. Morphology and element composition of fretting wear track are observed and analyzed to study the fretting process and mechanism of Ni-Au contact pairs.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"176 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127176334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-06DOI: 10.1109/HOLM.2011.6034791
Takayuki Kudo, N. Wakatsuki, N. Takatsu
During breaking contact, contact voltage vc shows irregular, random, or unexpected responses after vc=Um until mechanical contact current shutdown or arc ignition. The dependencies of the phenomena on energizing current and residual inductance were confirmed. Different contact materials (Ag, Au, Ir, Pd, Pt, Zn) show the same contact current and voltage features. Measured index values are slightly different. Combined contact of Pt and Zn electrodes shows that the phenomena mainly depend on the negative electrode metal. In our paper, it is confirmed that the so-called "initial arc" phenomenon has a close relation with arc ignition, but is independent of arc phenomena.
{"title":"Transient Phenomena from Melting to Electric Discharge during Making and Breaking Operations of Electric Contacts","authors":"Takayuki Kudo, N. Wakatsuki, N. Takatsu","doi":"10.1109/HOLM.2011.6034791","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034791","url":null,"abstract":"During breaking contact, contact voltage vc shows irregular, random, or unexpected responses after vc=Um until mechanical contact current shutdown or arc ignition. The dependencies of the phenomena on energizing current and residual inductance were confirmed. Different contact materials (Ag, Au, Ir, Pd, Pt, Zn) show the same contact current and voltage features. Measured index values are slightly different. Combined contact of Pt and Zn electrodes shows that the phenomena mainly depend on the negative electrode metal. In our paper, it is confirmed that the so-called \"initial arc\" phenomenon has a close relation with arc ignition, but is independent of arc phenomena.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127440823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-06DOI: 10.1109/HOLM.2011.6034792
J. Shea, Jason B. Carrodus
The RF current produced by an air arc in a 480Vac line-line system was investigated for arcing currents in the range of 5Arms to 100Arms. Time resolved frequency maps, obtained using a real-time spectrum analyzer (RSA), were used to show how polarity and electrode material affected the measured RF intensity. In addition to the experimental data, a model was created to support a new theory explaining the origins of the RF current. This proposed theory takes into consideration the electrode surface geometry, cathode spot current density, and spot motion/stability properties to develop an electrical model of the arc. The model was used to illustrate how the RF current intensity changes with arc current magnitude. This work is useful to those who want to gain an understanding of RF currents generated in arcs, especially for those developing arc fault sensing devices.
{"title":"RF Current Produced from Electrical Arcing","authors":"J. Shea, Jason B. Carrodus","doi":"10.1109/HOLM.2011.6034792","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034792","url":null,"abstract":"The RF current produced by an air arc in a 480Vac line-line system was investigated for arcing currents in the range of 5Arms to 100Arms. Time resolved frequency maps, obtained using a real-time spectrum analyzer (RSA), were used to show how polarity and electrode material affected the measured RF intensity. In addition to the experimental data, a model was created to support a new theory explaining the origins of the RF current. This proposed theory takes into consideration the electrode surface geometry, cathode spot current density, and spot motion/stability properties to develop an electrical model of the arc. The model was used to illustrate how the RF current intensity changes with arc current magnitude. This work is useful to those who want to gain an understanding of RF currents generated in arcs, especially for those developing arc fault sensing devices.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"228 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116238847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-06DOI: 10.1109/HOLM.2011.6034774
D. Gonzalez, H. Pursch, F. Berger
Gassing polymer walls are used in circuit breakers to improve their interrupting and current limiting performance. The energy of the arc will be partially absorbed by the polymer walls, causing chemical degradation and evaporation. The evaporated gas reaches the arc plasma changing its composition and influencing its burning conditions. The resulting increase on pressure and arc voltage contributes to current limiting and reduction of arcing time. This paper deals with experimental results of the investigation of the interaction between the arc and gassing polymer walls. The simultaneous detection of pressure in the arc chamber, of arc current and voltage and the use of high speed photography and SEM analysis contribute to the characterisation of the influence of the polymer gases on the arc behaviour. The results of the ex-periments are used to verify numerical models.
{"title":"Experimental Investigation of the Interaction of Interrupting Arcs and Gassing Polymer Walls","authors":"D. Gonzalez, H. Pursch, F. Berger","doi":"10.1109/HOLM.2011.6034774","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034774","url":null,"abstract":"Gassing polymer walls are used in circuit breakers to improve their interrupting and current limiting performance. The energy of the arc will be partially absorbed by the polymer walls, causing chemical degradation and evaporation. The evaporated gas reaches the arc plasma changing its composition and influencing its burning conditions. The resulting increase on pressure and arc voltage contributes to current limiting and reduction of arcing time. This paper deals with experimental results of the investigation of the interaction between the arc and gassing polymer walls. The simultaneous detection of pressure in the arc chamber, of arc current and voltage and the use of high speed photography and SEM analysis contribute to the characterisation of the influence of the polymer gases on the arc behaviour. The results of the ex-periments are used to verify numerical models.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117002824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-06DOI: 10.1109/HOLM.2011.6034776
A. Loyd, J. Hemond, R. Martens
Graphite is well known and has been extensively characterized in its performance as a solid state lubricant, but has not typically been successfully implemented for low voltage/current electrical contacts. Recent advances have shown that both graphene and carbon nanotubes (CNT) exhibit novel properties and could find potential use as solid state lubricants. A comparison of various properties including contact resistance and friction behavior on Au, Ag, and Sn surface finishes has been undertaken to explore the similarities and differences in these different forms of carbon.
{"title":"A Preliminary Investigation of Graphite, Graphene and Carbon Nanotubes (CNT's) as Solid State Lubricants","authors":"A. Loyd, J. Hemond, R. Martens","doi":"10.1109/HOLM.2011.6034776","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034776","url":null,"abstract":"Graphite is well known and has been extensively characterized in its performance as a solid state lubricant, but has not typically been successfully implemented for low voltage/current electrical contacts. Recent advances have shown that both graphene and carbon nanotubes (CNT) exhibit novel properties and could find potential use as solid state lubricants. A comparison of various properties including contact resistance and friction behavior on Au, Ag, and Sn surface finishes has been undertaken to explore the similarities and differences in these different forms of carbon.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130657153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-06DOI: 10.1109/HOLM.2011.6034819
Y. Hattori, K. Furukawa, F. Yoshida
The reliability of a connector depends on the contact force generated by the spring in the terminal of a connector. The springs are commonly formed by stamping from a strip of spring material. Therefore, the prediction of the force - displacement relation by the finite element method (FEM) is very important for the design of terminals. For simulation, an accurate model of stress-strain (s-s) responses of the materials is required. When the materials are deformed in the forward and then the reverse directions, almost all spring materials show different s-s responses between the two directions, due to the Bauschinger effect. This phenomenon makes simulation difficult because the s-s response depends on the prior deformation of the material. In this paper, the s-s response of copper-based materials, which were measured by tension and compression testing, will be presented. The mathematical description of experimental results will also be reported with the Yoshida-Uemori model, which is a constitutive model having high capability of describing the elastic and plastic behavior of cyclic deformation. The calculated s-s responses were in good agreement with the corresponding experimental results. Therefore, the use of this model for FE simulation would be recommended for a more accurate prediction of force-displacement relation of the spring.
{"title":"Stress-Strain Response of Copper-Based Spring Materials under Forward and Reverse Deformations and Its Mathematical Description","authors":"Y. Hattori, K. Furukawa, F. Yoshida","doi":"10.1109/HOLM.2011.6034819","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034819","url":null,"abstract":"The reliability of a connector depends on the contact force generated by the spring in the terminal of a connector. The springs are commonly formed by stamping from a strip of spring material. Therefore, the prediction of the force - displacement relation by the finite element method (FEM) is very important for the design of terminals. For simulation, an accurate model of stress-strain (s-s) responses of the materials is required. When the materials are deformed in the forward and then the reverse directions, almost all spring materials show different s-s responses between the two directions, due to the Bauschinger effect. This phenomenon makes simulation difficult because the s-s response depends on the prior deformation of the material. In this paper, the s-s response of copper-based materials, which were measured by tension and compression testing, will be presented. The mathematical description of experimental results will also be reported with the Yoshida-Uemori model, which is a constitutive model having high capability of describing the elastic and plastic behavior of cyclic deformation. The calculated s-s responses were in good agreement with the corresponding experimental results. Therefore, the use of this model for FE simulation would be recommended for a more accurate prediction of force-displacement relation of the spring.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130346022","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2011-10-06DOI: 10.1109/HOLM.2011.6034821
S. Wada, K. Sawa
Authors have developed the mechanism which gives damping vibration to electrical contacts by reciprocal hammering-oscillation and the other new mechanism which gives periodical micro-sliding to electrical contacts directly driven by a magmetostrictive actuator or a piezo-electrical one. It was shown that each mechanism was able to make a test simulate an actual degradation phenomenon on electrical contacts by the influence of micro-oscillation. Using the above mechanisms and their models they have studied the influences of a micro-oscillation on contact resistance. In this paper, first, it was shown that there was a degradation phenomenon of electrical contacts by experimental results using micro-sliding mechanism (MSM). And it was also shown that the phenomenon was depended on contact frictional force between a male-pin and a female-pin of a connector and sliding stroke. Second, it was made clear that there was the parallel degradation phenomenon of electrical contacts by experimental results using hammering oscillating mechanism (HOM). And the phenomenon was depended on the above contact frictional force and impulsive acceleration generated by a hammering ball. Finally, by comparing the above experimental results, the authors obtained that the similarity between two types of phenomena came from similar mechanical parameters like amplitude, natural frequency and damping ratio which characterized time-sequential relative displacement on an electrical contact, though the mechanism was quite different from each other, as the former by sliding and the latter by hammering. And they recognized that phenomena occurred more frequently in actual static contacts under the influence of some oscillation or vibration.
{"title":"Degradation Phenomena of Electrical Contacts Using Hammering Oscillating Mechanism and Micro-Sliding Mechanism- Contact Resistance and Its Model","authors":"S. Wada, K. Sawa","doi":"10.1109/HOLM.2011.6034821","DOIUrl":"https://doi.org/10.1109/HOLM.2011.6034821","url":null,"abstract":"Authors have developed the mechanism which gives damping vibration to electrical contacts by reciprocal hammering-oscillation and the other new mechanism which gives periodical micro-sliding to electrical contacts directly driven by a magmetostrictive actuator or a piezo-electrical one. It was shown that each mechanism was able to make a test simulate an actual degradation phenomenon on electrical contacts by the influence of micro-oscillation. Using the above mechanisms and their models they have studied the influences of a micro-oscillation on contact resistance. In this paper, first, it was shown that there was a degradation phenomenon of electrical contacts by experimental results using micro-sliding mechanism (MSM). And it was also shown that the phenomenon was depended on contact frictional force between a male-pin and a female-pin of a connector and sliding stroke. Second, it was made clear that there was the parallel degradation phenomenon of electrical contacts by experimental results using hammering oscillating mechanism (HOM). And the phenomenon was depended on the above contact frictional force and impulsive acceleration generated by a hammering ball. Finally, by comparing the above experimental results, the authors obtained that the similarity between two types of phenomena came from similar mechanical parameters like amplitude, natural frequency and damping ratio which characterized time-sequential relative displacement on an electrical contact, though the mechanism was quite different from each other, as the former by sliding and the latter by hammering. And they recognized that phenomena occurred more frequently in actual static contacts under the influence of some oscillation or vibration.","PeriodicalId":197233,"journal":{"name":"2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128391503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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