Pub Date : 2007-07-08DOI: 10.1109/STYSW.2007.4559124
T. Mulln, W. Ehrhardt, K. Drue, A. Groß, L. Abahmane
The successful usage of LTCC modules within micro reaction systems especially with micro fluidic systems is state of the art since a few years. There are mixers, valves, pumpes und different kinds of micro reactors available. But one problem isn't solved yet. This is the integration of optical windows into LTCC-modules. These windows apply the ability of inline spectroscopic measurement and steering of chemical reactions in LTCC micro reactors. The best would be the integration of available commercially glasses in improved LTCC materials. These conditions allow the development of smart sensors in fluidic LTCC-micro reaction systems with all advantages of the LTCC technology. The main topic of this paper is the integration of optical windows into LTCC- modules. These windows allow a view into or through a fluidic channel or a reaction chamber. Possible applications are the monitoring and investigation of fluids and gasses and their photometric investigation. The shown LTCC modules enhance the application field of the LTCC in the micro reaction technology. A module is presented which allows a view through a reaction channel with the dimensions of 1 mm2. Photometric detection of Au nano particles in aqueous solution have been carried out.
{"title":"Optical-fluidic Sensors in LTCC- technology","authors":"T. Mulln, W. Ehrhardt, K. Drue, A. Groß, L. Abahmane","doi":"10.1109/STYSW.2007.4559124","DOIUrl":"https://doi.org/10.1109/STYSW.2007.4559124","url":null,"abstract":"The successful usage of LTCC modules within micro reaction systems especially with micro fluidic systems is state of the art since a few years. There are mixers, valves, pumpes und different kinds of micro reactors available. But one problem isn't solved yet. This is the integration of optical windows into LTCC-modules. These windows apply the ability of inline spectroscopic measurement and steering of chemical reactions in LTCC micro reactors. The best would be the integration of available commercially glasses in improved LTCC materials. These conditions allow the development of smart sensors in fluidic LTCC-micro reaction systems with all advantages of the LTCC technology. The main topic of this paper is the integration of optical windows into LTCC- modules. These windows allow a view into or through a fluidic channel or a reaction chamber. Possible applications are the monitoring and investigation of fluids and gasses and their photometric investigation. The shown LTCC modules enhance the application field of the LTCC in the micro reaction technology. A module is presented which allows a view through a reaction channel with the dimensions of 1 mm2. Photometric detection of Au nano particles in aqueous solution have been carried out.","PeriodicalId":256930,"journal":{"name":"2007 International Students and Young Scientists Workshop on Photonics and Microsystems","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122397972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-07-08DOI: 10.1109/STYSW.2007.4559128
I. Roda, E. Griese
Optical interconnects integrated into electrical printed circuit boards have to be low cost and their manufacturing process has to comply with the established printed circuit board technology. Nearly all step index waveguides developed under these premises show rough surfaces between core and cladding leading to completely different power-loss characteristics of the propagating modes. In this paper we present a model for the coupling mechanism between a laser diode (VCSEL) and an integrated weak guiding dielectric multimode waveguide with rectangular cross section. The model is based on the mode matching method.
{"title":"Analysis and optimization of the optical coupling between laser diodes and dielectric multimode waveguides","authors":"I. Roda, E. Griese","doi":"10.1109/STYSW.2007.4559128","DOIUrl":"https://doi.org/10.1109/STYSW.2007.4559128","url":null,"abstract":"Optical interconnects integrated into electrical printed circuit boards have to be low cost and their manufacturing process has to comply with the established printed circuit board technology. Nearly all step index waveguides developed under these premises show rough surfaces between core and cladding leading to completely different power-loss characteristics of the propagating modes. In this paper we present a model for the coupling mechanism between a laser diode (VCSEL) and an integrated weak guiding dielectric multimode waveguide with rectangular cross section. The model is based on the mode matching method.","PeriodicalId":256930,"journal":{"name":"2007 International Students and Young Scientists Workshop on Photonics and Microsystems","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122682400","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-07-08DOI: 10.1109/STYSW.2007.4559119
R. Henker, T. Schneider, K. Lauterbach, M. Junker, M. Ammann, A.T. Schwarzbacher
Slow- and fast-light is the control of the velocity of light in a medium by light. As a fascinating new field in physics there is a fundamental interest on this effect on the one side, but on the other side there exist a lot of practical applications for telecommunication and information systems. Among these are optical signal processing, the radio frequency-photonics, nonlinear optics and spectroscopy in time domain. Furthermore, the slow- and fast-light effect can be seen as a key technology for optical delay lines, buffers, equalizers and synchronizers in packed switched networks. To realize the effect there are different methods and material systems possible. Beside these especially the nonlinear effect of stimulated Brillouin scattering (SBS) is of special interest because it has several advantages. This article gives an overview about the fundamentals and limits of the slow-and fast-light effect in general and based on the SBS in optical fibers. Some experimental results which were achieved so far are shown.
{"title":"Slow and Fast-Light in optical fibers ’ An overview","authors":"R. Henker, T. Schneider, K. Lauterbach, M. Junker, M. Ammann, A.T. Schwarzbacher","doi":"10.1109/STYSW.2007.4559119","DOIUrl":"https://doi.org/10.1109/STYSW.2007.4559119","url":null,"abstract":"Slow- and fast-light is the control of the velocity of light in a medium by light. As a fascinating new field in physics there is a fundamental interest on this effect on the one side, but on the other side there exist a lot of practical applications for telecommunication and information systems. Among these are optical signal processing, the radio frequency-photonics, nonlinear optics and spectroscopy in time domain. Furthermore, the slow- and fast-light effect can be seen as a key technology for optical delay lines, buffers, equalizers and synchronizers in packed switched networks. To realize the effect there are different methods and material systems possible. Beside these especially the nonlinear effect of stimulated Brillouin scattering (SBS) is of special interest because it has several advantages. This article gives an overview about the fundamentals and limits of the slow-and fast-light effect in general and based on the SBS in optical fibers. Some experimental results which were achieved so far are shown.","PeriodicalId":256930,"journal":{"name":"2007 International Students and Young Scientists Workshop on Photonics and Microsystems","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115806069","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-07-08DOI: 10.1109/STYSW.2007.4559113
A. Borkowska
This work presents the analysis of photoluminescence effect in TiO2 matrix doped with Eu and Nd. Thin films were prepared by high energy reactive magnetron sputtering (HE RMS) method using metallic Ti-Eu and Ti-Nd mosaic targets and deposited on Si and SiO2. After deposition selected films were additionally annealed in an air ambient at 400degC and 600degC. The results of photoluminescence (PL) and optical transmission measurements were analyzed and their correlation with microstructure was described.
{"title":"Analysis of photoluminescence in TiO2 matrix doped with Eu and Nd","authors":"A. Borkowska","doi":"10.1109/STYSW.2007.4559113","DOIUrl":"https://doi.org/10.1109/STYSW.2007.4559113","url":null,"abstract":"This work presents the analysis of photoluminescence effect in TiO2 matrix doped with Eu and Nd. Thin films were prepared by high energy reactive magnetron sputtering (HE RMS) method using metallic Ti-Eu and Ti-Nd mosaic targets and deposited on Si and SiO2. After deposition selected films were additionally annealed in an air ambient at 400degC and 600degC. The results of photoluminescence (PL) and optical transmission measurements were analyzed and their correlation with microstructure was described.","PeriodicalId":256930,"journal":{"name":"2007 International Students and Young Scientists Workshop on Photonics and Microsystems","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131797623","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-07-08DOI: 10.1109/STYSW.2007.4559127
P. Psuja, D. Hreniak, W. Stręk
The indium tin oxide and europium doped and undoped tin dioxide nanoparticles where synthesized by modified Pechini method. The powder X-ray diffraction (XRD) and transmission electro-microscopy (TEM) analyses where done in order to determined the structure and morphology of obtained materials. To determine the optical and electrical properties of the samples on the base of obtained powders thin films where fabricated by spin-coating method. The emissive properties of Eu3+:SnO2 powders sintered in different temperatures were determined earlier. The potential applications of obtained materials have been shown and discussed in this work.
{"title":"Fabrication, properties and possible applications of pure and Eu3+ doped SnO2 and In2O3/SnO2 (ITO) nanocrystallites","authors":"P. Psuja, D. Hreniak, W. Stręk","doi":"10.1109/STYSW.2007.4559127","DOIUrl":"https://doi.org/10.1109/STYSW.2007.4559127","url":null,"abstract":"The indium tin oxide and europium doped and undoped tin dioxide nanoparticles where synthesized by modified Pechini method. The powder X-ray diffraction (XRD) and transmission electro-microscopy (TEM) analyses where done in order to determined the structure and morphology of obtained materials. To determine the optical and electrical properties of the samples on the base of obtained powders thin films where fabricated by spin-coating method. The emissive properties of Eu3+:SnO2 powders sintered in different temperatures were determined earlier. The potential applications of obtained materials have been shown and discussed in this work.","PeriodicalId":256930,"journal":{"name":"2007 International Students and Young Scientists Workshop on Photonics and Microsystems","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125941014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-07-08DOI: 10.1109/STYSW.2007.4559132
B. Werner, T. Żdanowicz
Thin-film Cu(In,Ga)Se2 (CIGS) and CdTe photovoltaic (PV) modules have the potential to become competitive to silicon PV modules both in terms of their performance as well as productions costs. However, despite of many years of investigating them, some physical processes are not well-understood yet. One of the tools which may help to discover some of these process are numerical simulations with use of equivalent diode model applied for the analysis of physical behaviour of solar cells. In the paper results of experimentally determined values of diffusion and recombination related components of diode dark saturation corresponding to double-diode model (DEM) are presented. Obtained values result from considering of p-n junction physical basics as well from numerical simulations. To fit large amount of I-V curves to one of the commonly used diode models special PC program has been developed. Its role is fast and efficient importing of I-V curves from database, immediate performing fitting procedure with subsequent storing and graphical presentation of the calculated results. Presented examples show a discrepancy between diffusion and recombination dark current components derived using both methods. The reason for this discrepancy is discussed.
{"title":"Experimental determination of physical parameters in CIGS solar cells","authors":"B. Werner, T. Żdanowicz","doi":"10.1109/STYSW.2007.4559132","DOIUrl":"https://doi.org/10.1109/STYSW.2007.4559132","url":null,"abstract":"Thin-film Cu(In,Ga)Se2 (CIGS) and CdTe photovoltaic (PV) modules have the potential to become competitive to silicon PV modules both in terms of their performance as well as productions costs. However, despite of many years of investigating them, some physical processes are not well-understood yet. One of the tools which may help to discover some of these process are numerical simulations with use of equivalent diode model applied for the analysis of physical behaviour of solar cells. In the paper results of experimentally determined values of diffusion and recombination related components of diode dark saturation corresponding to double-diode model (DEM) are presented. Obtained values result from considering of p-n junction physical basics as well from numerical simulations. To fit large amount of I-V curves to one of the commonly used diode models special PC program has been developed. Its role is fast and efficient importing of I-V curves from database, immediate performing fitting procedure with subsequent storing and graphical presentation of the calculated results. Presented examples show a discrepancy between diffusion and recombination dark current components derived using both methods. The reason for this discrepancy is discussed.","PeriodicalId":256930,"journal":{"name":"2007 International Students and Young Scientists Workshop on Photonics and Microsystems","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122267753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-07-08DOI: 10.1109/STYSW.2007.4559117
L. Gelczuk, M. Dąbrowska-szata, J. Serafińczuk, M. Motyka, J. Misiewicz
In this paper the effect of strain relaxation on the structural and optical properties of lattice mismatched InGaAs/GaAs heterostructures has been studied by means of X-ray diffractometry and photoreflectance spectroscopy. X-ray diffractometry reveals anisotropic strain relaxation, related to asymmetry in the formation of misfit dislocations, causing distortion of the epilayer unit cell and lowering its symmetry to orthorhombic. By using room temperature photoreflectance spectroscopy, we observed residual strain induced a splitting of valence band energies. The results were analyzed by means of deformation potential theory that enables us to estimate the extent of strain relaxation and the values of residual strain in the layers.
{"title":"Structural and optical measurements of residual strain and relaxation of lattice mismatched InGaAs/GaAs heterostructures","authors":"L. Gelczuk, M. Dąbrowska-szata, J. Serafińczuk, M. Motyka, J. Misiewicz","doi":"10.1109/STYSW.2007.4559117","DOIUrl":"https://doi.org/10.1109/STYSW.2007.4559117","url":null,"abstract":"In this paper the effect of strain relaxation on the structural and optical properties of lattice mismatched InGaAs/GaAs heterostructures has been studied by means of X-ray diffractometry and photoreflectance spectroscopy. X-ray diffractometry reveals anisotropic strain relaxation, related to asymmetry in the formation of misfit dislocations, causing distortion of the epilayer unit cell and lowering its symmetry to orthorhombic. By using room temperature photoreflectance spectroscopy, we observed residual strain induced a splitting of valence band energies. The results were analyzed by means of deformation potential theory that enables us to estimate the extent of strain relaxation and the values of residual strain in the layers.","PeriodicalId":256930,"journal":{"name":"2007 International Students and Young Scientists Workshop on Photonics and Microsystems","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128841148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-07-08DOI: 10.1109/STYSW.2007.4559115
N. Ekekwe
This paper presents the design and fabrication of a waveguide in silicon using traditional microfabrication and manufacturing processes. Integrated waveguide has become important owing to the need for faster computing and the problems associated with copper as technology scales into the nanometer regime. Furthermore, photonic on-chip interconnect offers better latency, higher bandwidth capacity, power efficiency, faster speed and reduced interference when compared with electrical interconnect. To test the silicon waveguide, a Gb/s communication system was assembled and laser light was coupled and transmitted through the chip.
{"title":"Integrated silicon waveguide for intra-chip communication: A practical experience","authors":"N. Ekekwe","doi":"10.1109/STYSW.2007.4559115","DOIUrl":"https://doi.org/10.1109/STYSW.2007.4559115","url":null,"abstract":"This paper presents the design and fabrication of a waveguide in silicon using traditional microfabrication and manufacturing processes. Integrated waveguide has become important owing to the need for faster computing and the problems associated with copper as technology scales into the nanometer regime. Furthermore, photonic on-chip interconnect offers better latency, higher bandwidth capacity, power efficiency, faster speed and reduced interference when compared with electrical interconnect. To test the silicon waveguide, a Gb/s communication system was assembled and laser light was coupled and transmitted through the chip.","PeriodicalId":256930,"journal":{"name":"2007 International Students and Young Scientists Workshop on Photonics and Microsystems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129412778","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-07-08DOI: 10.1109/STYSW.2007.4559123
A. Masalska, K. Kolanek, M. Woszczyna, P. Zawierucha, Y. Ritz, E. Zschech
Friction force measurements provide with important information for application in which moving objects are in physical contact. Mechanisms of friction, adhesion, lubrication and wear are crucial issues in case of highly advanced micro-electro-mechanical systems (MEMS) or high-density data storage devices, where minimized friction forces are required. Studies of those phenomena in nanoscale can be successfully carried out by means of an atomic force microscope using optical beam deflection sensing. However, to obtain quantitative information the calibration procedure for conversion of measured data to friction forces has to be applied. In order to calibrate our atomic force microscope we applied direct procedure called wedge calibration method. The results of friction force calibration using commercially available grating are presented in this paper. We depict experimental results for nanotribology on two different crystallographic planes of silicon, mica and highly oriented pyrolytic graphite (HOPG) as well.
{"title":"Calibration of atomic force microscope for nanoscale friction measurements","authors":"A. Masalska, K. Kolanek, M. Woszczyna, P. Zawierucha, Y. Ritz, E. Zschech","doi":"10.1109/STYSW.2007.4559123","DOIUrl":"https://doi.org/10.1109/STYSW.2007.4559123","url":null,"abstract":"Friction force measurements provide with important information for application in which moving objects are in physical contact. Mechanisms of friction, adhesion, lubrication and wear are crucial issues in case of highly advanced micro-electro-mechanical systems (MEMS) or high-density data storage devices, where minimized friction forces are required. Studies of those phenomena in nanoscale can be successfully carried out by means of an atomic force microscope using optical beam deflection sensing. However, to obtain quantitative information the calibration procedure for conversion of measured data to friction forces has to be applied. In order to calibrate our atomic force microscope we applied direct procedure called wedge calibration method. The results of friction force calibration using commercially available grating are presented in this paper. We depict experimental results for nanotribology on two different crystallographic planes of silicon, mica and highly oriented pyrolytic graphite (HOPG) as well.","PeriodicalId":256930,"journal":{"name":"2007 International Students and Young Scientists Workshop on Photonics and Microsystems","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123382075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-07-08DOI: 10.1109/STYSW.2007.4559121
T. Kuhler, I. Roda, E. Griese
The implementation of waveguides in thin glass foils results in graded index multimode waveguides. The paper presents two numerical approaches for modeling signal propagation within such waveguides.
波导在薄玻璃箔上的实现产生了梯度折射率多模波导。本文提出了两种模拟这种波导中信号传播的数值方法。
{"title":"Numerical methods for modeling signal propagation in integrated graded index multimode waveguides","authors":"T. Kuhler, I. Roda, E. Griese","doi":"10.1109/STYSW.2007.4559121","DOIUrl":"https://doi.org/10.1109/STYSW.2007.4559121","url":null,"abstract":"The implementation of waveguides in thin glass foils results in graded index multimode waveguides. The paper presents two numerical approaches for modeling signal propagation within such waveguides.","PeriodicalId":256930,"journal":{"name":"2007 International Students and Young Scientists Workshop on Photonics and Microsystems","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132608250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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