Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323674
G. Engen
Historically, the accuracy achieved by the microwave metrologist has been limited by detector performance, hardware imperfections, and connector problems. Today the effect of hardware imperfections has, in many cases, been eliminated by more complete modeling as is found in the typical vector network analyzer. Moreover, the performance of the detection systems has been improved to the point where in many cases the nonideal connector behavior is the major error source. This is not to suggest that the connector art has remained static. To the contrary, important refinements have been realized and more are in the offing. however, that these refinements have not kept pace with the other developments. It is still quite possible,
{"title":"In Search of a More Realistic Accuracy Statement for Microwave Metrology","authors":"G. Engen","doi":"10.1109/ARFTG.1986.323674","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323674","url":null,"abstract":"Historically, the accuracy achieved by the microwave metrologist has been limited by detector performance, hardware imperfections, and connector problems. Today the effect of hardware imperfections has, in many cases, been eliminated by more complete modeling as is found in the typical vector network analyzer. Moreover, the performance of the detection systems has been improved to the point where in many cases the nonideal connector behavior is the major error source. This is not to suggest that the connector art has remained static. To the contrary, important refinements have been realized and more are in the offing. however, that these refinements have not kept pace with the other developments. It is still quite possible,","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115820808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323667
G. Simpson
The reference plane of current open circuit standards can vary with test port tolerances when used to calibrate Vector Automatic Network Analyzers (VANA's) with sexed connectors. This causes a significant measurement uncertainty. The improved design captivates the center contact of the open to make it independant of the test port.
{"title":"An Improved Open for Calibrating Sexed VANA Test Ports","authors":"G. Simpson","doi":"10.1109/ARFTG.1986.323667","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323667","url":null,"abstract":"The reference plane of current open circuit standards can vary with test port tolerances when used to calibrate Vector Automatic Network Analyzers (VANA's) with sexed connectors. This causes a significant measurement uncertainty. The improved design captivates the center contact of the open to make it independant of the test port.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130465333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323659
M. Little, E. Jones, David Ducharme, T. McEwen
The major characteristics of various techniques for making pulsed measurements that are capable of providing phase and amplitude data are described in this paper. A discussion of their advantages and drawbacks is presented. A summary of what improvements are still needed in pulsed microwave measurements is presented as well.
{"title":"Techniques for Pulsed Microwave Measurements","authors":"M. Little, E. Jones, David Ducharme, T. McEwen","doi":"10.1109/ARFTG.1986.323659","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323659","url":null,"abstract":"The major characteristics of various techniques for making pulsed measurements that are capable of providing phase and amplitude data are described in this paper. A discussion of their advantages and drawbacks is presented. A summary of what improvements are still needed in pulsed microwave measurements is presented as well.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115562471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323664
N. Kuhn
{"title":"New RF Test Methods Using Waveform Synthesis from Digital Data","authors":"N. Kuhn","doi":"10.1109/ARFTG.1986.323664","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323664","url":null,"abstract":"","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115655857","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323662
J. DiStefano, M. Harmon
An Acceptance Test procedure has been discussed for an automated high-power Microwave Tube Test Set. The development of test thresholds required an understanding of the MTTS capability and TUT normal and anomalous behavior. By means Paired Echo and statistical analysis, test thresholds were developed to assure software certification and MTTS Acceptance Test thresholds. During the Life Cycle of the MTTS both software/hardware changes could be certified by regression analysis using the established thresholds.
{"title":"The Effects of Test-Set Distortions on Pulsed-RF Measurements","authors":"J. DiStefano, M. Harmon","doi":"10.1109/ARFTG.1986.323662","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323662","url":null,"abstract":"An Acceptance Test procedure has been discussed for an automated high-power Microwave Tube Test Set. The development of test thresholds required an understanding of the MTTS capability and TUT normal and anomalous behavior. By means Paired Echo and statistical analysis, test thresholds were developed to assure software certification and MTTS Acceptance Test thresholds. During the Life Cycle of the MTTS both software/hardware changes could be certified by regression analysis using the established thresholds.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131276681","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1986-06-01DOI: 10.1109/ARFTG.1986.323669
O. Pitzalis, J. Marzan, S. Rosenbaum
{"title":"A DC TO 26.5 GHz Coaxial Test Fixture for MMICs and Transistors","authors":"O. Pitzalis, J. Marzan, S. Rosenbaum","doi":"10.1109/ARFTG.1986.323669","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323669","url":null,"abstract":"","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116495714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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